Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2013
01/23/2013CN101073036B 正型干膜光致抗蚀剂 Positive-type dry film photoresist
01/22/2013US8357484 Multilayer dry film resist, method of manufacturing the resist, and method of manufacturing display plate for liquid crystal display panel using the resist
01/22/2013US8357483 Photosensitive resin composition comprising a polymer prepared by using macromonomer as alkali soluble resin
01/22/2013US8357477 Color filter substrate, electronic apparatus and manufacturing method thereof
01/22/2013US8357476 Method for producing a base material for screen printing, and base material of this type
01/17/2013WO2013010111A2 Nanoimprint lithography
01/17/2013WO2013008950A1 Exposure apparatus, exposure method, measurement method and device manufacturing method
01/17/2013WO2013008912A1 Composition for forming fine pattern and method for forming fined pattern using same
01/17/2013WO2013008700A1 Actinic ray-sensitive or radiation-sensitive resin composition, resist film and pattern forming method each using the composition, manufacturing method of electronic device and electronic device
01/17/2013WO2013008652A1 Photopolymerization initiator, photosensitive composition, and cured article
01/17/2013WO2013008631A1 Photosensitive composition
01/17/2013WO2013008146A1 Method of impression-based production of a filter for an electromagnetic radiation
01/17/2013WO2013007922A1 Facility for exposing photopolymer plates
01/17/2013WO2013007731A1 Illumination optical unit for projection lithography
01/17/2013WO2013007442A1 Lithographic patterning process and resists to use therein
01/17/2013WO2013007363A1 Process for the production of a layered body and layered bodies without masking obtainable therefrom
01/17/2013WO2013007362A1 Process for the production of a layered body and layered bodies obtainable therefrom
01/17/2013WO2013007214A1 Alkali-soluble resin and photosensitive resin composition containing same and use thereof
01/17/2013WO2012159968A3 Illumination optical unit
01/17/2013US20130017637 Method for forming pattern and method for manufacturing display device by using the same
01/17/2013US20130017636 Composition for removing a photoresist and method of manufacturing a thin-film transistor substrate using the composition
01/17/2013US20130017501 Method of forming resist pattern
01/17/2013US20130017500 Method of forming resist pattern
01/17/2013US20130017499 Process for production of photoresist pattern
01/17/2013US20130017498 Tunable two-mirror interference lithography system
01/17/2013US20130017497 Synthesis and applications of soluble pentacene precursors and related compounds
01/17/2013US20130017496 Method for manufacturing recording head
01/17/2013US20130017495 Interference exposure apparatus, interference exposure method, and manufacturing method of semiconductor device
01/17/2013US20130017494 Photoresist Processing Methods
01/17/2013US20130017492 Patterning process and resist composition
01/17/2013US20130017491 Fluorine-free fused ring heteroaromatic photoacid generators and resist compositions containing the same
01/17/2013US20130017490 Fluorine-free fused ring heteroaromatic photoacid generators and resist compositions containing the same
01/17/2013US20130017489 Fluorine-free fused ring heteroaromatic photoacid generators and resist compositions containing the same
01/17/2013US20130017488 Self-Imageable Layer Forming Polymer and Compositions Thereof
01/17/2013US20130017487 Compositions and processes for photolithography
01/17/2013US20130017486 Process of making a lithographic structure using antireflective materials
01/17/2013US20130017485 Lithographic printing plate precursor and method of producing thereof
01/17/2013US20130017484 Polymerizable ester compound, polymer, resist composition, and patterning process
01/17/2013US20130017483 Electrode and method for manufacturing the same
01/17/2013US20130017476 Measuring apparatus, drawing apparatus, and article manufacturing method
01/17/2013US20130017378 Apparatus and Method for Providing Resist Alignment Marks in a Double Patterning Lithographic Process
01/17/2013US20130017377 Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the same
01/17/2013US20130017376 Negative resist composition, method for producing relief pattern using the same, and electronic component using the same
01/17/2013US20130017375 Developing solution for photoresist on substrate including conductive polymer, and method for forming pattern
01/17/2013US20130017374 Carbon nanotubes nanocomposites for microfabrication applications
01/17/2013US20130015562 Actinic-ray- or radiation-sensitive resin composition, actinic-ray- or radiation-sensitive film therefrom and method of forming pattern using the composition
01/17/2013US20130014658 Developer for processing lithographic printing plate precursor, method for manufacturing lithographic printing plate by using the developer, and printing method
01/17/2013DE112011100591T5 Sulfonamid-enthaltende Deckschicht- und Fotoresist-Zusatzstoff-Zusammensetzung und Verfahren zur Vermeidung Sulfonamide-containing supersized and photoresist additive composition and procedures to avoid
01/17/2013DE102011088740A1 Optical system for micro-lithographic projection exposure system, has optical element and correction radiation source, over which optical element supplies electromagnetic correction radiation for correcting temperature profile
01/17/2013DE102011078928A1 Beleuchtungsoptik für die Projektionslithografie Illumination optics for projection lithography
01/16/2013EP2546864A1 Collector mirror assembly and extreme ultraviolet light source device using said collector mirror assembly
01/16/2013EP2546697A2 Photosensitive organic insulation composition for an oled device
01/16/2013EP2545413A1 Radiation source, lithographic apparatus and device manufacturing method
01/16/2013EP2545412A1 Actinic ray-sensitive or radiation-sensitive resin composition, and resist film and pattern forming method using the same
01/16/2013EP2545095A1 Methods for producing photosensitive microparticles, non-aqueous dispersions thereof and articles prepared therewith
01/16/2013CN202677062U Printing plate head-tail bridge exposure system
01/16/2013CN202677061U Objective lens protection device
01/16/2013CN202677060U Reticle stage beam for photoetching machine
01/16/2013CN202677059U Double-side photoetching structure of ceramic wafer
01/16/2013CN102884609A Inspecting apparatus and inspecting method
01/16/2013CN102884480A Illumination system of a microlithographic projection exposure apparatus
01/16/2013CN102884479A Negative photoresist composition, and method for patterning device
01/16/2013CN102884396A Method and system for measurng in patterned structures
01/16/2013CN102884094A Adamantyl (meth)acrylate monomer and (meth)acrylic polymer that contains repeating units derived from the monomer
01/16/2013CN102880892A Method for adding barcodes in real time during exposure of mask-free photoetching machine
01/16/2013CN102880370A Touch inductor for capacitive touch screen with film structure and manufacturing method thereof
01/16/2013CN102880018A Reference grating space image adjusting device used for alignment system and adjusting method
01/16/2013CN102880017A Stripping liquid composition for photoresist and preparation and applications of stripping liquid composition
01/16/2013CN102880016A Stair-type self-adaptive air sealing device used for immersed type photoetching machine
01/16/2013CN102880015A Micro-displacement measurement method and sensing device for dual-workpiece platforms of photoetching machine
01/16/2013CN102880014A Device and method for photoetching illumination of active deformable mirror based on active optical technology
01/16/2013CN102880013A Reticle stage worktable
01/16/2013CN102880012A Exposure method capable of improving process registration accuracy
01/16/2013CN102880011A Detection method of registration precision of interlayer graph
01/16/2013CN102880010A Surface plasma ultra-diffraction photoetching method based on tip-insulator-metal structure
01/16/2013CN102880009A Six-degree-of-freedom micro-motion worktable
01/16/2013CN102880008A A lithographic apparatus, a projection system and a device manufacturing method
01/16/2013CN102880007A Fluid handling structure, a lithographic apparatus and a device manufacturing method
01/16/2013CN102880006A Fluid handling structure, lithographic apparatus and device manufacturing method
01/16/2013CN102880005A Interference exposure apparatus, interference exposure method, and manufacturing method of semiconductor device
01/16/2013CN102880004A Photoinduced polymer holographic recording material and preparation method thereof
01/16/2013CN102880003A Laser write-through organic thermal etching material and preparation method thereof
01/16/2013CN102880002A Black photosensitive resin composition, display panel and liquid crystal display
01/16/2013CN102880001A Laser thermal lithography organic photoresist and preparation method of photoresist
01/16/2013CN102880000A 固化性树脂组合物及其用途 The curable resin composition and uses thereof
01/16/2013CN102879999A Positive-working photoimageable bottom antireflective coating
01/16/2013CN102879998A Method for etching touch screen
01/16/2013CN102879996A Method for manufacturing phase shift photomask
01/16/2013CN102879947A Color filter, method for manufacturing same, semi-transparent and semi-reflecting liquid crystal display device
01/16/2013CN102879846A Color filter, liquid crystal display components and color filter manufacturing method
01/16/2013CN102879845A Method for manufacturing nanoscale grating based on polydimethylsiloxane (PDMS)
01/16/2013CN102879067A Mass calibration method for workpiece table
01/16/2013CN102875745A Alkali soluble resin, photosensitive resin composition containing it and application thereof
01/16/2013CN102314078B Photoetching method
01/16/2013CN102194663B Wet processing apparatus, wet processing method and storage medium
01/16/2013CN102193324B Joint debugging device and joint debugging method for workpiece table interferometer and mask table interferometer
01/16/2013CN102193319B Double-platform exchange system for wafer stage of photoetching machine
01/16/2013CN102169294B Method for measuring scanning inclination of mask table in scanning mask aligner
01/16/2013CN102141739B Double-stage exchange system for lithography machine silicon wafer stages
01/16/2013CN102141734B Gravity compensator and micropositioner adopting same