Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
05/2013
05/16/2013US20130122421 Hybrid photoresist composition and pattern forming method using thereof
05/16/2013US20130122420 Alkali-developable photosensitive resin composition
05/16/2013US20130122419 (meth)acrylate derivative, polymer and photoresist composition having lactone structure, and method for forming pattern by using it
05/16/2013US20130122404 Method of forming photomasks and photomasks formed by the same
05/16/2013US20130122403 Mask for exposure and method of fabricating substrate using said mask
05/16/2013US20130122247 Spacer Wafer For Wafer-Level Camera And Method For Manufacturing Same
05/16/2013US20130120732 Cylindrical magnetic levitation stage and lithography
05/16/2013US20130120731 Stage unit, exposure apparatus, and exposure method
05/16/2013US20130120729 Inspection method for imprint lithography and apparatus therefor
05/16/2013US20130120728 Catadioptric projection objective with mirror group
05/16/2013US20130120727 Exposure system
05/16/2013US20130120726 Method of structuring a photosensitive material
05/16/2013US20130120725 Imprint lithography method and imprintable medium
05/16/2013US20130120723 Exposure apparatus and measuring device for a projection lens
05/16/2013DE102012219169A1 Strahlregelungsvorrichtung für einen Beleuchtungsstrahl sowie Metrologiesystem mit einem eine solche Strahlregelungsvorrichtung enthaltenden optischen System Beam control apparatus for an illuminating beam and metrology system with a control device containing such a beam optical system
05/16/2013DE102011118532A1 Exposure device for exposing stainless steel plate coated with photoresist to manufacture measuring scale, has turning device turning elongated thin plate at preset degree, where turning device supports thin plate over whole length
05/16/2013DE102011086513A1 Projection exposure method for exposure of semiconductor wafer with image of pattern of reticle for manufacturing semiconductor component, involves heating mask corresponding to two-dimensional heating profile by heating device
05/16/2013DE102011086345A1 Spiegel Mirror
05/16/2013DE102011086328A1 Spiegel zum Einsatz zur Führung von Beleuchtungs- und Abbildungslicht in der EUV-Projektionslithografie Mirrors are used to guide light illumination and imaging in EUV projection lithography
05/15/2013EP2592477A1 Continuous process for preparation of a substrate with a relief structure
05/15/2013EP2592476A1 Antireflective coating forming composition containing vinyl ether compound and polyimide
05/15/2013EP2592475A1 Photosensitive composition, lithographic printing plate precursor, lithographic printing method, and novel cyanine dyes
05/15/2013EP2592131A2 Aqueous cerium-containing solution having an extended bath lifetime for removing mask material
05/15/2013EP2591400A1 A method and apparatus for printing a periodic pattern with large depth of focus
05/15/2013EP2590757A1 Method for producing finely structured surfaces
05/15/2013CN103109235A Lithographic printing plate original
05/15/2013CN103109234A Light-sensitive resin composition, a dry film solder resist and a circuit substrate
05/15/2013CN103109233A Method for producing flexographic printing plates using uv-led irradiation
05/15/2013CN103109225A Imaging optical system
05/15/2013CN103108945A Processes and compositions for removing substances from substrates
05/15/2013CN103108481A Light focusing system anti-pollution protection device
05/15/2013CN103108480A Extreme ultraviolet (EUV) light source pollutant collecting device
05/15/2013CN103107133A Array substrate, manufacturing method thereof and displaying device
05/15/2013CN103107066A Photoresist removal method and semiconductor production method
05/15/2013CN103105744A Etch features with reduced line edge roughness
05/15/2013CN103105743A Mask table system with plane diffraction grating measurement and having six freedom degrees macro platform
05/15/2013CN103105742A Mask table system of six-degree-of-freedom coarse table with photoelectric position detector measurement function
05/15/2013CN103105741A Alignment compensation device and exposure device
05/15/2013CN103105740A Solid-liquid combined target-based extreme ultraviolet source generator and light source system
05/15/2013CN103105739A Exposure apparatus and exposure method
05/15/2013CN103105738A Exposure method and mask plate for exposure
05/15/2013CN103105737A Photolithography apparatus adopting spliced multiple light sources
05/15/2013CN103105736A Photolithography method and etching method
05/15/2013CN103105735A Colored curable resin composition
05/15/2013CN103105734A Photosensitive resin composition
05/15/2013CN103105733A Colored photosensitive resin composition
05/15/2013CN103105732A Polyimide precursor composition and wiring circuit board employing the composition
05/15/2013CN103105731A Photosensitive resin composition and color filter using the same
05/15/2013CN103105730A Spacer wafer for wafer-level camera and method for manufacturing same
05/15/2013CN103105729A Photolithography method capable of preventing ground silicon dust from polluting wafers
05/15/2013CN103105724A Quantum dot exposure plate and photolithography technique with the same
05/15/2013CN103105666A Exposure projection objective lens
05/15/2013CN103105664A Photoetching projective objective glass
05/15/2013CN103105638A Etching method of blazing concave surface holographic grating subarea reaction ion beams
05/15/2013CN103105127A Detector, imprint apparatus, and article manufacturing method
05/15/2013CN103102439A Photopolymerization of crystalline-state monomers and application thereof in reducing volume shrinkage
05/15/2013CN103102251A Radiation-sensitive composition
05/15/2013CN102308258B Ultra low post exposure bake photoresist materials
05/15/2013CN102209935B Methods for model gauge design for lithography calibration
05/15/2013CN102143981B Low outgassing photoresist compositions
05/15/2013CN102053498B Positive photosensitive resin composition
05/15/2013CN102023439B TFT (Thin Film Transistor) array structure and manufacturing method thereof
05/15/2013CN101957567B Position calibration of alignment heads in a multi-head alignment system
05/15/2013CN101807000B Photosensitive resin composition and method for producing same
05/15/2013CN101772734B Positive photosensitive resin composition, cured film, protective film, insulating film and semiconductor device
05/15/2013CN101713929B Lithographic apparatus and device manufacturing method
05/15/2013CN101675389B Determining a process model that models the impact of car/peb on the resist profile
05/15/2013CN101424883B Exposure system and device producing method
05/14/2013US8440734 Positive photosensitive resin composition, cured film, protecting film, insulating film, and semiconductor device and display device using the same
05/14/2013US8440389 Stripper solutions effective for back-end-of-line operations
05/14/2013US8440388 Method to restore hydrophobicity in dielectric films and materials
05/14/2013US8440387 Graded topcoat materials for immersion lithography
05/14/2013US8440386 Patterning process, resist composition, and acetal compound
05/14/2013US8440385 Positive resist composition, method of forming resist pattern and polymeric compound
05/14/2013US8440384 Compound, salt, and radiation-sensitive resin composition
05/10/2013WO2013067442A1 Method and apparatus for thermal treatment of printing surface in relief printing
05/10/2013WO2013067422A1 A method and an apparatus having a compressible collar for thermally treating a photosensitive precursor
05/10/2013WO2013067414A1 Method for thermal treatment of relief surface for a relief printing form
05/10/2013WO2013067395A2 Method and apparatus for improving ink deposition
05/10/2013WO2013066067A1 Phenol monomer, polymer for forming a resist underlayer film including same, and composition for a resist underlayer film including same
05/10/2013WO2013065878A1 Method of forming pattern and composition for crosslinked layer formation to be used in the method
05/10/2013WO2013065853A1 Method for recycling plate-making processing waste solution
05/10/2013WO2013065693A1 Photosensitive resin composition, photosensitive element using same, cured product, method for forming partition wall of image display device, method for manufacturing image display device, and image display device
05/10/2013WO2013065451A1 Substrate processing unit and method for processing substrate
05/10/2013WO2013065429A1 Substrate processing apparatus and substrate processing method
05/10/2013WO2013064892A2 Nanocomposite positive photosensitive composition and use thereof
05/10/2013WO2013064890A2 Nanocomposite negative photosensitive composition and use thereof
05/10/2013WO2013064782A1 Method for avoiding charge effects for lithography and electron microscopy
05/10/2013WO2013064298A1 Lithographic apparatus and device manufacturing method
05/10/2013WO2013064025A1 Method for improving gate photo-etching key size uniformity on wafer
05/10/2013WO2013027936A3 Black photosensitive resin composition and image display device having same
05/10/2013WO2012173506A8 Procedure of 2d and 3d optically assisted fountain pen nanolithography and aperture pen nanolithography
05/10/2013CA2854205A1 Metering apparatus for the manually-controlled metering of a light-curing material, kit and method
05/09/2013US20130116159 Photoresist and post etch residue cleaning solution
05/09/2013US20130115559 Methods of forming photolithographic patterns by negative tone development
05/09/2013US20130115558 Selective photo-induced protein immobilization using bovine serum albumin
05/09/2013US20130115557 Actinic-ray- or radiation-sensitive resin composition, actinic-ray- or radiation-sensitive film and method of forming pattern
05/09/2013US20130115555 Resist composition and method of forming resist pattern
05/09/2013US20130115554 Resist composition, method of forming resist pattern and polymeric compound
05/09/2013US20130115553 Topcoat compositions and photolithographic methods