Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176) |
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12/21/1999 | US6004047 Method of and apparatus for processing photoresist, method of evaluating photoresist film, and processing apparatus using the evaluation method |
12/21/1999 | US6003828 Means for supporting a mask |
12/21/1999 | US6003230 Magnetic positioner having a single moving part |
12/21/1999 | US6003223 Common alignment target image field stitching method for step and repeat alignment in photoresist |
12/16/1999 | WO1999065066A1 Transfer method and aligner |
12/16/1999 | WO1999064933A1 Crossed grating photonic crystals and multiple exposure processes for making them |
12/16/1999 | WO1999064932A1 193 nm positive-working photoresist composition |
12/16/1999 | WO1999064931A1 Photocurable elastomeric compositions |
12/16/1999 | WO1999064930A1 Offset printing plate having a high support stability |
12/16/1999 | WO1999064929A1 Methods of making optical microstructures which can have profile heights exceeding fifteen microns |
12/16/1999 | WO1999064817A1 Interferometer |
12/16/1999 | WO1999064642A1 Method for fabricating metal nanostructures |
12/16/1999 | WO1999064471A1 Photopolymerizable resin composition and use thereof |
12/16/1999 | WO1999056157A3 Optical system with anti-reflection coating |
12/16/1999 | DE19919795A1 New photoresist polymer useful for manufacturing semiconductors in the top surface image process |
12/16/1999 | DE19826377A1 Druckmaschine und Druckverfahren Press and printing method |
12/16/1999 | DE19825828A1 Kontrollelement für ein strahlungsempfindliches Aufzeichnungsmaterial und Verfahren zum Bestimmen der Belichtungsenergie für ein strahlungsempfindliches Aufzeichnungsmaterial mittels eines Kontrollelements Control element for a radiation-sensitive recording material and method for determining the exposure energy for a radiation-sensitive recording material by means of a control element |
12/16/1999 | DE19825716A1 Baugruppe aus optischem Element und Fassung Assembly of optical element and mount |
12/16/1999 | DE19825244A1 Offsetdruckplatte mit hoher Auflagenstabilität Offset printing plate with high circulation stability |
12/16/1999 | CA2334692A1 Crossed grating photonic crystals and multiple exposure processes for making them |
12/16/1999 | CA2333998A1 Photocurable elastomeric compositions |
12/15/1999 | EP0964317A1 Total internal reflection holographic recording and imaging apparatus and a method of forming a hologram and reconstructing an image therefrom |
12/15/1999 | EP0964308A2 Exposure method and apparatus and device manufacturing method using the same |
12/15/1999 | EP0964307A2 Projection exposure apparatus and method |
12/15/1999 | EP0964306A1 Control strip for lightsensitive recording element; process for determining the exposure energy for a photosensitive recording element using a control strip |
12/15/1999 | EP0964305A1 Method of making a photonic crystal |
12/15/1999 | EP0964282A2 Projection exposure apparatus with a catadioptric projection optical system |
12/15/1999 | EP0964281A1 Assembly comprising an optical element and its mounting |
12/15/1999 | EP0963840A1 Method and apparatus for laser imaging |
12/15/1999 | EP0963839A1 Printing machine and printing process |
12/15/1999 | EP0963573A1 Alignment device and lithographic apparatus comprising such a device |
12/15/1999 | EP0963572A1 POSITIONING DEVICE HAVING THREE COIL SYSTEMS MUTUALLY ENCLOSING ANGLES OF 120o, AND LITHOGRAPHIC DEVICE COMPRISING SUCH A POSITIONING DEVICE |
12/15/1999 | EP0963552A1 System for detecting amine and other basic molecular contamination in a gas |
12/15/1999 | EP0963257A1 Method and apparatus for temperature controlled spin-coating systems |
12/15/1999 | EP0644059B1 Seal manufacturing apparatus |
12/15/1999 | CN1238474A Apparatus and method for drying photosensitive material using radiant heat and air flow passages |
12/15/1999 | CN1238461A Method and apparatus for reducing measurement error for inspection measurements |
12/15/1999 | CN1238344A Polymer and forming method of micro pattern using the same |
12/14/1999 | US6002987 Methods to control the environment and exposure apparatus |
12/14/1999 | US6002744 Method and apparatus for generating X-ray or EUV radiation |
12/14/1999 | US6002740 Method and apparatus for X-ray and extreme ultraviolet inspection of lithography masks and other objects |
12/14/1999 | US6002487 Alignment method for performing alignment between shot areas on a wafer |
12/14/1999 | US6002467 Exposure apparatus and method |
12/14/1999 | US6002466 Lithography exposure device |
12/14/1999 | US6002465 Stage device, exposure apparatus using the same, and device production method |
12/14/1999 | US6002108 Baking apparatus and baking method |
12/14/1999 | US6001739 Forming organic insulating film of low dielectric constant on surface of silicon wafer, forming a photoresist film on insulating film, exposing photoresist film to light to form pattern, reacting silicon compound, reactive ion etching |
12/14/1999 | US6001542 Removal beads of photoresist on semiconductor using solvent;high speed spinning |
12/14/1999 | US6001535 Monomers with cyclic carbonate groups |
12/14/1999 | US6001534 Photosensitive resin composition |
12/14/1999 | US6001533 Light-shielding layer contains an alkali-soluble binder, a photopolymerizable monomer, a photoinitiator, a solvent, and a pigment comprises mixed oxide of copper-manganese in which a part of manganese is replaced with iron, cobalt or nickel |
12/14/1999 | US6001532 Consists of strippable cover sheet; a photosensitive layer; an essentially non-photosensitive, non-tacky layer of block or random polymer of an aromatic monomer and a nonaromatic monomer; and a support |
12/14/1999 | US6001517 Positive photosensitive polymer composition, method of forming a pattern and electronic parts |
12/14/1999 | US6001513 Method for forming a lithographic mask used for patterning semiconductor die |
12/14/1999 | US6001512 Method of blind border pattern layout for attenuated phase shifting masks |
12/14/1999 | US6001511 Exposure mask having a thickness profile for controlling the amount of charged particles per unit area passing through the mask; forms a uniform pattern on a semiconductor wafer by correcting a proximity effect |
12/14/1999 | US6001488 Composition of epoxy group-containing cycloolefin resin |
12/14/1999 | US6001417 Resist coating method and resist coating apparatus |
12/14/1999 | US6001298 Method for making a mould |
12/14/1999 | US6001168 For pigmenting high molecular mass material, such as for inks, toners, coating materials, color filters and cosmetics, resins, caseins, cellulose ethers, celulose esters, polymers, polyolefins |
12/14/1999 | US6000999 Preparatory abrading method for support of lithographic plate |
12/14/1999 | US6000947 Method of fabricating transistor or other electronic device using scanning probe microscope |
12/14/1999 | US6000862 Substrate developing method and apparatus |
12/14/1999 | US6000411 Cleaning compositions for removing etching residue and method of using |
12/14/1999 | US6000337 Method and apparatus for an automated plate handler with elevator and table support mechanism |
12/09/1999 | WO1999063790A1 Laser-excited plasma light source, exposure apparatus and its manufacturing method, and device manufacturing method |
12/09/1999 | WO1999063585A1 Scanning aligner, method of manufacture thereof, and method of manufacturing device |
12/09/1999 | WO1999063536A2 Very-high-density memory device utilizing a scintillating data-storage medium |
12/09/1999 | WO1999063407A1 Lithographic printing plate precursors |
12/09/1999 | WO1999063404A1 Polymer remover/photoresist stripper |
12/09/1999 | WO1999063386A1 Multiple parallel source scanning device |
12/09/1999 | WO1999063385A1 Digital optical chemistry micromirror imager |
12/09/1999 | WO1999063010A1 Composition for reflection reducing coating |
12/09/1999 | WO1999062964A1 PURIFIED METHYL α-CHLOROACRYLATE/α-METHYLSTYRENE COPOLYMER AND ELECTRON BEAM RESIST COMPOSITION CONTAINING THE SAME |
12/09/1999 | WO1999062962A1 Novel photoinitiators and applications therefor |
12/09/1999 | WO1999062961A1 Novel photoinitiators and their applications |
12/09/1999 | WO1999032938A3 Illumination system for projector |
12/09/1999 | DE19919794A1 New photoresist polymer useful for manufacturing semiconductors in the top surface image process |
12/09/1999 | DE19824546A1 Herstellung vernetzbarer wasserlöslicher oder wasserdispergierbarer Zusammensetzungen und daraus erhältlicher strahlungsempfindlicher Gemische Preparation of crosslinkable soluble or water compositions and obtainable therefrom radiation-sensitive mixtures |
12/09/1999 | CA2298468A1 Novel photoinitiators and applications therefor |
12/08/1999 | EP0963104A1 System and method for proofing |
12/08/1999 | EP0962962A2 Patterning technique using a template, and a ink jet system |
12/08/1999 | EP0962830A1 Ringfield four mirror system with convex primary mirror for EUV lithography |
12/08/1999 | EP0962829A1 Protective layer for color proofs |
12/08/1999 | EP0962828A1 Production of water-soluble or water-dispersible compositions and light-sensitive materials containing such compositions |
12/08/1999 | EP0962827A2 Photoimageable composition having improved photoinitiator system |
12/08/1999 | EP0962826A1 A positive resist composition |
12/08/1999 | EP0962825A1 Photosensitive resin composition and process for producing the same |
12/08/1999 | EP0962824A2 Optimizing workflow in a prepress printing system |
12/08/1999 | EP0962823A1 Apparatus and method for drying photosensitive material using radiant heat and air flow passages |
12/08/1999 | EP0961954A1 Repetitively projecting a mask pattern using a time-saving height measurement |
12/08/1999 | EP0961953A1 Chemical microreactors and method for producing same |
12/08/1999 | EP0783728B1 Radiation-sensitive adducts comprising diazonium cations, quaternary cations, and sulfonated polyester anions |
12/08/1999 | EP0656378B1 Photosensitive resin composition for corrugated board printing plate |
12/08/1999 | CN2352976Y Focusing device for sumillimeter photoetching machine |
12/08/1999 | CN2352975Y Optical grating diffraction coaxial alignment device of submillimeter photoetching machine |
12/08/1999 | CN2352974Y Phase optical grating off axis illumination optical system for etching machine |
12/08/1999 | CN1237927A Inverted stamping process |
12/08/1999 | CN1237720A Photoimageable composition having improved photoinitiator system |
12/08/1999 | CN1237719A Positive resist composition |