Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
08/1998
08/26/1998EP0860726A1 Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe
08/25/1998CA2050120C An apparatus and a method for positioning coarse movement of a probe
08/20/1998DE19705308A1 Sub-microscopic point light source material
08/18/1998US5796909 All-fiber, high-sensitivity, near-field optical microscopy instrument employing guided wave light collector and specimen support
08/18/1998US5796102 Measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium
08/11/1998US5793040 Information processing aparatus effecting probe position control with electrostatic force
08/06/1998WO1998034092A2 Object inspection and/or modification system and method
08/04/1998US5789742 Near-field scanning optical microscope probe exhibiting resonant plasmon excitation
08/04/1998US5789666 Resonant sensor for determining multiple physical values
07/1998
07/29/1998EP0855045A1 High resolution fiber optic probe for near field optical microscopy
07/28/1998US5786219 Polymeric microsphere displaying distinct fluorescent ring concentric with and within said sphere; labels, calibrating microscopes
07/22/1998EP0854350A1 Probe array for a scanning probe microscope
07/16/1998WO1998030866A1 Optical profilometer combined with stylus probe measurement device
07/15/1998EP0853251A2 Microprobe chip for detecting evanescent waves and method for making the same, probe provided with the microprobe chip and method for making the same, and evanescent wave detector, nearfield scanning optical microscope, and information regenerator provided with the microprobe chip
07/14/1998US5780851 Detection probe for scanning tunneling microscope
07/14/1998US5780727 Electromechanical transducer
07/09/1998WO1998029707A1 Acoustic sensor as proximity detector
07/07/1998US5778134 Apparatus for recording and reproducing image information in a recording medium wherein scanning probes are controlled based on editing information
07/07/1998US5777977 Recording and reproducing apparatus
07/02/1998WO1998028592A1 Method and devices for measuring distances between object structures
06/1998
06/30/1998US5773174 Method of forming a resist pattern utilizing correlation between latent image height, resist pattern linewidth and surface modification layer width
06/30/1998US5772325 Apparatus for providing surface images and method for making the apparatus
06/23/1998US5770856 Near field sensor with cantilever and tip containing optical path for an evanescent wave
06/23/1998US5770855 Microscopic electromagnetic radiation transmitter or detector
06/18/1998DE19651636A1 Vibration-free, or damped suspension for appts such as raster tunnel microscope
06/17/1998EP0848248A1 Cantilever and method of manufacturing the same
06/17/1998EP0847590A1 A scanning probe microscope having automatic probe exchange and alignment
06/17/1998EP0847543A1 Dark field, photon tunneling imaging systems and methods
06/17/1998EP0847309A2 Tips and substrates for scanning probe microscopy
06/16/1998US5767891 Method of manufacturing an optical probe element
06/16/1998US5767514 Sensing electron flow between a tip and a surface of a sample
06/11/1998WO1998025308A1 Film-like composite structure and method of manufacture thereof
06/10/1998EP0846932A2 Scanning near-field optic/atomic force microscope
06/10/1998EP0809858A4 Scanning probe microscope for use in fluids
06/09/1998US5764364 Scattered-light laser microscope
06/09/1998US5763933 Nanofabricated structures having a region of changeable conductivity
06/09/1998US5763768 Analytical method using modified scanning probes
06/09/1998US5763767 For examining surface properties of a sample surface
06/09/1998US5763124 Method of forming a resist pattern utilizing correlation between latent image height, resist pattern linewidth and thermal annealing parameter
06/04/1998DE19723264A1 Semiconductor device especially DRAM measurement
06/03/1998EP0845491A2 Laminate film
06/03/1998EP0813675A4 Magnetic modulation of force sensor for ac detection in an atomic force microscope
06/02/1998US5760300 For measuring a profile of a sample
05/1998
05/26/1998US5756997 Scanning probe/optical microscope with modular objective/probe and drive/detector units
05/26/1998US5756242 Method of forming a resist pattern utilizing correlation between latent image height, resist pattern linewidth and exposure parameter
05/20/1998EP0843175A1 Scanning probe microscope and signal processing apparatus
05/19/1998US5753912 Cantilever chip
05/19/1998US5753911 Electrostatic actuator, probe using the actuator, scanning probe microscope, processing apparatus, and recording/reproducing apparatus
05/19/1998US5753814 Magnetically-oscillated probe microscope for operation in liquids
05/13/1998EP0841532A1 Method and apparatus for measuring electrical waveforms using atomic force microscopy
05/12/1998US5751686 Scanning probe tip covered with an electrical resistance to limit recording/reproducing current
05/12/1998US5751685 Probe for memory device having movable media
05/12/1998US5751684 Recording/reproducing apparatus and method for recording/reproducing information using probe
05/12/1998US5751683 Nanometer scale data storage device and associated positioning system
05/12/1998US5750990 Method for measuring critical dimension of pattern on sample
05/12/1998US5750989 Scanning probe microscope for use in fluids
05/06/1998EP0839383A1 Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities
05/06/1998EP0839312A1 Tapping atomic force microscope with phase or frequency detection
05/05/1998US5746826 Using crystal growing technique
04/1998
04/30/1998WO1998018122A1 Magneto-optic recording system and method
04/29/1998EP0838658A1 Tunnel effect sensor, particularly for measuring the topography of a surface
04/28/1998US5744704 Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy
04/23/1998WO1998016948A1 Method to determine depth profiles in an area of thin coating
04/21/1998US5742377 Cantilever for scanning probe microscope including piezoelectric element and method of using the same
04/21/1998US5742172 Scanning probe microscope and method for obtaining topographic image, surface potential image, and electrostatic capacitance distribution image
04/21/1998US5741614 Atomic force microscope measurement process for dense photoresist patterns
04/16/1998DE19641981A1 Verfahren zur Bestimmung von Tiefenprofilen im Dünnschichtbereich Method for the determination of depth profiles in thin-film
04/16/1998DE19635264C1 Thermoelectric microprobe for thermomicroscopic measurement
04/14/1998US5740101 Time-stable labeling of individual atoms or groups of atoms in the surface of a solid, and the storage of information units in the atomic range
04/14/1998US5739527 Near-field optical microscope for angle resolved measurements
04/08/1998EP0834069A1 Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
04/07/1998US5736745 Contamination evaluating apparatus
04/02/1998WO1998013663A1 Atomic force microscope probe
04/01/1998EP0833125A2 Scanning probe microscope with hollow pivot assembly
03/1998
03/26/1998WO1998012544A1 Contact macroradiography characterization of doped optical fibers
03/26/1998DE19638977A1 Kraftmikroskopiesonde Force microscopy probe
03/24/1998US5732053 Information recording method information recording apparatus
03/24/1998US5730940 Detection dna base arrangement
03/18/1998EP0829722A2 Method for screening active agents using scanning force microscopy
03/18/1998EP0829017A1 Process for producing a probe with a coated point
03/17/1998US5729026 For scanning the surface of a sample
03/12/1998WO1998010458A1 Atomic force microscope for generating a small incident beam spot
03/12/1998WO1998010296A1 Optical fiber probe and its manufacturing method
03/12/1998CA2264747A1 Atomic force microscope for generating a small incident beam spot
03/10/1998US5726454 Tripod for polishing a sample and for viewing the sample under a microscope
03/05/1998DE19737101A1 Non-linear optical microscope
03/03/1998US5723982 Apparatus for analyzing thin film property
03/03/1998US5723981 Method for measuring the electrical potential in a semiconductor element
03/03/1998US5723775 Atomic force microscope under high speed feedback control
02/1998
02/26/1998DE19633546A1 Device for contactless scanning of surface
02/24/1998US5721721 Two scanning probes information recording/reproducing system with one probe to detect atomic reference location on a recording medium
02/19/1998WO1998007147A1 Magneto-optic recording system employing near field optics
02/12/1998WO1998005963A1 Active substance screening process
02/12/1998CA2262506A1 Active substance screening process
02/10/1998US5717630 Magnetic memory device
02/10/1998US5717132 Cantilever and process for fabricating it
02/10/1998CA2071726C Recording medium, information-processing apparatus using same, and information-erasing method
02/05/1998DE19631395A1 Verfahren zum Wirkstoff-Screening Technique for drug screening
02/05/1998DE19630650A1 Optical fibre probe for optical near field microscope
02/04/1998EP0822435A1 Device and method for scanning near field optical microscopy of samples in fluids
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