| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 05/03/1994 | US5308974 Scanning probe microscope using stored data for vertical probe positioning |
| 05/03/1994 | US5307693 Force-sensing system, including a magnetically mounted rocking element |
| 04/27/1994 | EP0594394A1 Electron spectroscopy analyzer and a method of correcting a shift of spectral line in electron spectroscopy |
| 04/27/1994 | EP0593835A1 Scanning near-field optical microscope |
| 04/26/1994 | US5306918 Installation for the study or the transformation of the surface of samples placed in a vacuum or in a controlled atmosphere |
| 04/19/1994 | US5304924 Edge detector |
| 04/19/1994 | US5304795 High resolution observation apparatus with photon scanning microscope |
| 04/19/1994 | US5304535 Etching of nanoscale structures on high temperature superconductors |
| 04/07/1994 | DE4233686A1 Selective optical display or marking of given atoms or mols. - uses electron flow between micro point and sample for detection to give an image signal |
| 04/05/1994 | US5301117 Method for creating a three-dimensional corporeal model from a very small original |
| 03/30/1994 | EP0589815A2 Two dimensional profiling with a contact force atomic force microscope |
| 03/29/1994 | US5299184 Information processing apparatus with held distance control on track edge detection |
| 03/29/1994 | US5298975 Combined scanning force microscope and optical metrology tool |
| 03/29/1994 | US5298760 Performance of location-selective catalytic reactions with or on the surfaces of solids in the nanometer or subnanometer range |
| 03/29/1994 | US5298748 Uncooled tunneling infrared sensor |
| 03/22/1994 | US5296704 For investigating a surface of a sample |
| 03/17/1994 | WO1994006160A1 Electromechanical positioning device |
| 03/17/1994 | WO1994006041A1 Optical waveguide device and optical instrument using the same |
| 03/17/1994 | WO1994006040A1 Micro optical fiber light source and sensor and method of fabrication thereof |
| 03/16/1994 | EP0587459A1 An ultra-low force atomic force microscope |
| 03/16/1994 | EP0587165A2 Information processing apparatus having multiprobe control circuit |
| 03/15/1994 | US5294804 Cantilever displacement detection apparatus |
| 03/15/1994 | US5294790 Probe unit for near-field optical scanning microscope |
| 03/15/1994 | US5293781 Tunnel effect measuring systems and particle detectors |
| 03/08/1994 | US5293042 Servo circuit of scanning probe microscope |
| 03/08/1994 | US5291775 Scanning force microscope with integrated optics and cantilever mount |
| 03/03/1994 | WO1994005011A1 Optoelectronic memories with photoconductive thin films |
| 03/02/1994 | EP0584440A1 Atomic force microscope |
| 03/02/1994 | EP0584233A1 Methods of fabricating integrated, aligned tunneling tip pairs |
| 03/01/1994 | US5290102 Tunnel effect measuring systems and particle detectors |
| 02/22/1994 | US5289455 Information recording and/or reproducing apparatus |
| 02/22/1994 | US5289402 Recording medium, recording method, and readout method |
| 02/22/1994 | US5289004 Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light |
| 02/22/1994 | US5288999 Manufacturing method including near-field optical microscopic examination of a semiconductor wafer |
| 02/22/1994 | US5288998 Manufacturing method including photoresist processing using a near-field optical probe |
| 02/22/1994 | US5288997 Manufacturing method, including near-field optical microscopic examination of a magnetic bit pattern |
| 02/22/1994 | US5288996 Near-field optical microscopic examination of genetic material |
| 02/16/1994 | EP0583112A1 Near field scanning optical microscope and applications thereof |
| 02/15/1994 | US5286971 Data recording using a near field optical probe |
| 02/15/1994 | US5286970 Near field optical microscopic examination of a biological specimen |
| 02/09/1994 | EP0582376A1 Displacement element, cantilever probe and information processing apparatus using cantilever probe |
| 02/09/1994 | EP0582290A2 Electron density storage device |
| 02/03/1994 | WO1994002939A1 Reading and writing stored information by means of electrochemistry |
| 02/03/1994 | WO1994002841A1 Multiple source and detection frequencies in detecting atomic or molecular spectra and/or threshold phenomena associated with the same |
| 02/03/1994 | WO1994002840A1 System for detecting atomic or molecular spectra of a substance, and/or threshold phenomena associated with the same |
| 02/02/1994 | EP0581217A1 Near field scanning optical microscope |
| 02/01/1994 | US5283442 Surface profiling using scanning force microscopy |
| 02/01/1994 | US5283437 Pneumatically and electrostatically driven scanning tunneling microscope |
| 02/01/1994 | US5282924 Containing cantilever beam |
| 01/29/1994 | CA2101386A1 Fine surface observing apparatus |
| 01/25/1994 | US5282191 Information reproducing method and information reproducing apparatus which uses the method |
| 01/25/1994 | US5281814 System for imaging and detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance by reflection of an AC electrical signal |
| 01/18/1994 | US5280341 Feedback controlled differential fiber interferometer |
| 01/11/1994 | US5278704 Information processing apparatus including magnetic material having a predetermined magnetization pattern with respect to a recording medium |
| 01/11/1994 | US5278408 Instrument and method for 3-dimensional atomic arrangement observation |
| 01/11/1994 | US5278407 Secondary-ion mass spectrometry apparatus using field limiting method |
| 01/05/1994 | EP0576972A1 Ion scattering spectroscope |
| 01/04/1994 | US5276672 Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof |
| 01/04/1994 | US5276324 Composite scanning tunneling microscope |
| 12/29/1993 | EP0576263A2 Method for fabricing nano-scale devices and nano-scale device fabricated by that method |
| 12/28/1993 | USRE34489 Atomic force microscope with optional replaceable fluid cell |
| 12/28/1993 | US5272913 Cantilever for a scanning probe microscope and a method of manufacturing the same |
| 12/21/1993 | US5272330 Optical system |
| 12/15/1993 | EP0573891A1 Charged particle beam apparatus and method of operating it |
| 12/15/1993 | EP0573421A1 Installation for the study or transformation of sample surfaces in a vacuum or controlled atmosphere. |
| 12/14/1993 | US5270543 Electronic probe and method for its manufacture |
| 12/14/1993 | US5270214 Method for sequencing DNA base pairs |
| 12/08/1993 | EP0572972A1 Probe for scanning tunneling microscope and manufacturing method thereof |
| 12/07/1993 | US5268573 System for detecting threshold phenomena associated with and/or atomic or molecular spectra of a substance |
| 12/07/1993 | US5268571 Micro-displacement element, and scanning tunneling microscope and information processing apparatus using same |
| 12/07/1993 | US5267471 Double cantilever sensor for atomic force microscope |
| 11/30/1993 | US5266896 Mechanical detection and imaging of magnetic resonance by magnetic moment modulation |
| 11/30/1993 | US5266801 Atomic force microscope for measuring a physical property of a sample |
| 11/30/1993 | US5265470 Tunnel effect measuring systems and particle detectors |
| 11/23/1993 | US5265046 Chemical labeling of the surfaces of solids on an atomic scale, and the storage of information units in the atomic range |
| 11/23/1993 | US5264794 Method of measuring magnetic fields on magnetically recorded media using a scanning tunneling microscope and magnetic probe |
| 11/23/1993 | US5264698 Nanometer dimension optical device with microimaging and nanoillumination capabilities |
| 11/23/1993 | US5264696 Cantilever chip for scanning probe microscope having first and second probes formed with different aspect ratios |
| 11/18/1993 | EP0569547A1 Microstructure array and activation system therefor |
| 11/16/1993 | US5262642 Scanning tunneling optical spectrometer |
| 11/09/1993 | US5260926 Atomic force microscope with a plurality of cantilevers for recording/reproducing information |
| 11/09/1993 | US5260824 Atomic force microscope |
| 11/09/1993 | US5260572 Scanning probe microscope including height plus deflection method and apparatus to achieve both high resolution and high speed scanning |
| 11/09/1993 | US5260567 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
| 11/02/1993 | US5258107 Method for manufacturing a cantilever with sharpened metal needle |
| 10/28/1993 | WO1993021657A1 Multi-dimensional precision micro-actuator |
| 10/27/1993 | EP0566912A1 Apparatus for retaining an electrode by a magnetically shielded magnet |
| 10/26/1993 | US5256876 Scanning tunnel microscope equipped with scanning electron microscope |
| 10/19/1993 | US5255258 Microprobe, preparation thereof and electronic device by use of said microprobe |
| 10/19/1993 | US5254854 Scanning microscope comprising force-sensing means and position-sensitive photodetector |
| 10/19/1993 | US5253516 Atomic force microscope for small samples having dual-mode operating capability |
| 10/19/1993 | US5253515 Atomic probe microscope and cantilever unit for use in the microscope |
| 10/12/1993 | US5252835 Machining oxide thin-films with an atomic force microscope: pattern and object formation on the nanometer scale |
| 10/06/1993 | EP0564088A1 Scanning force microscope with integrated optics and cantilever mount |
| 09/28/1993 | US5248912 Integrated scanning tunneling microscope |
| 09/21/1993 | US5247186 Integrated optical displacement sensor |
| 09/21/1993 | US5245863 Atomic probe microscope |
| 09/21/1993 | CA2002187C Probe unit, driving method thereof, and scanning device for detecting tunnel current having said probe unit |
| 09/16/1993 | WO1993018525A1 Scanning probe microscope |
| 09/14/1993 | US5245187 Microtip, process for preparation thereof, surface-observing apparatus and information-treating apparatus employing the same |