| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 06/20/2000 | US6078174 Apparatus for measuring exchange force |
| 06/20/2000 | US6078045 Process for analysis of a sample |
| 06/15/2000 | WO2000034810A1 Lensed optical fibers & unique micropipettes with subwavelength apertures |
| 06/15/2000 | WO2000034340A1 Hydrogenated polymers, resin composition, and process for producing substrate for information-recording medium |
| 06/15/2000 | WO2000025165A8 Monolithic integration of a detection system for near-field microscopy based on optical feedback in a vertical cavity surface emitting laser |
| 06/15/2000 | DE19956725A1 Scanning probe microscope for imaging sample surface; has feedback loop to generate drive signal for controlling probe and imaging device that uses probe signal, drive signal and relation between two signals |
| 06/14/2000 | EP1008870A1 Enhanced optical transmission apparatus utilizing metal films having apertures and periodic surface topography |
| 06/13/2000 | US6075585 Vibrating probe for a scanning probe microscope |
| 06/13/2000 | US6074485 Crystal growth observing apparatus using a scanning tunneling microscope |
| 06/13/2000 | US6073485 Scanning microscope for image topography and surface potential |
| 06/08/2000 | WO2000033052A1 Electronic device surface signal control probe and method of manufacturing the probe |
| 06/06/2000 | US6072574 Integrated circuit defect review and classification process |
| 05/31/2000 | EP0927349B1 Contact macroradiography characterization of doped optical fibers |
| 05/24/2000 | EP1003156A1 Aromatic polyamide film for high-density magnetic recording medium |
| 05/24/2000 | EP1003026A2 Scanning depletion microscopy for carrier profiling |
| 05/24/2000 | EP1002216A1 Microscope for compliance measurement |
| 05/23/2000 | US6067153 Pattern defect inspecting apparatus |
| 05/18/2000 | WO2000028536A1 Near-field optical head and production method thereof |
| 05/18/2000 | WO2000028338A1 Electrostatic force detector with cantilever and shield |
| 05/18/2000 | WO2000028299A1 Optical cantilever and production method therefor |
| 05/18/2000 | WO2000028276A1 Line based characterization of a complex surface |
| 05/18/2000 | DE19852833A1 Scanning microscope probe distance evaluation method, e.g. for scanning near-field optical microscopy; uses detected oscillation amplitude, frequency or phase of probe subjected to lateral and superimposed vertical oscillation |
| 05/16/2000 | US6064060 Near-field scanning optical microscope |
| 05/10/2000 | EP0998689A1 Optical near-field microscope |
| 05/10/2000 | CA2253728A1 Intermittent contact imaging under force-feedback control |
| 05/04/2000 | WO2000025165A1 Monolithic integration of a detection system for near-field microscopy based on optical feedback in a vertical cavity surface emitting laser |
| 05/02/2000 | US6057914 Method for detecting and identifying a lens aberration by measurement of sidewall angles by atomic force microscopy |
| 05/02/2000 | US6057547 Scanning probe microscope with scan correction |
| 05/02/2000 | US6057546 Kinematically mounted probe holder for scanning probe microscope |
| 04/27/2000 | WO2000023989A1 Device and method for information recording/reproducing using near-field light |
| 04/27/2000 | WO2000023840A1 Near field optical scanning system employing microfabricated solid immersion lens |
| 04/26/2000 | EP0996122A1 Near-field optical head |
| 04/26/2000 | EP0996117A1 Near field optical head and reproduction method |
| 04/26/2000 | EP0783670B1 Electromechanical transducer |
| 04/25/2000 | US6054710 Method and apparatus for obtaining two- or three-dimensional information from scanning electron microscopy |
| 04/25/2000 | US6053034 Method for measuring fracture toughness of thin films |
| 04/18/2000 | US6052238 Near-field scanning optical microscope having a sub-wavelength aperture array for enhanced light transmission |
| 04/18/2000 | US6051825 Conducting scanning probe microscope with environmental control |
| 04/13/2000 | WO2000020823A2 Atomic force microscope for profiling high aspect ratio samples |
| 04/12/2000 | EP0650629B1 Reading and writing stored information by means of electrochemistry |
| 04/11/2000 | US6049078 Transmitting tip for scanning tunneling microscopy system |
| 04/11/2000 | US6048992 Metallocene compounds from amino alcohol-derived ligands |
| 04/06/2000 | WO2000019494A1 Method for manufacturing carbon nanotubes as functional elements of mems devices |
| 04/06/2000 | WO2000019166A1 Multidimensional sensing system for atomic force miscroscopy |
| 04/05/2000 | EP0990910A1 Method of producing probe of tunnel scanning microscope and the probe |
| 04/04/2000 | US6046972 Method and producing probe with minute aperture, scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe |
| 04/04/2000 | US6046457 Charged particle beam apparatus having anticontamination means |
| 04/04/2000 | US6046448 Scanning near field optical microscope based on the use of polarized light |
| 04/04/2000 | US6046061 Method of inspecting wafer water mark |
| 03/30/2000 | WO2000017868A1 Information recording medium, information reproducing device, and information recording/reproducing device |
| 03/30/2000 | WO2000017853A2 Multi-pulse sampling of signals using force sampling |
| 03/28/2000 | US6043485 Sample analyzer |
| 03/23/2000 | WO2000015544A1 Aperture in a semiconductor material, and the production and use thereof |
| 03/23/2000 | DE19926601A1 Aperture, e.g. for a scanning probe microscopy sensor element, particle sieve or liquid or gas dosing and-or injection matrix, is produced by etching through an oxide layer in a depression exposed by semiconductor wafer back face etching |
| 03/21/2000 | US6039000 Focused particle beam systems and methods using a tilt column |
| 03/16/2000 | DE19841931A1 Illumination device for microscope; has probe of scanning microscope in bore through lens system |
| 03/15/2000 | EP0986058A1 Near-field optical head |
| 03/15/2000 | EP0986057A1 Near-field optical head |
| 03/08/2000 | EP0984444A2 Probe and information recording/reproduction apparatus using the same |
| 03/08/2000 | EP0984438A1 Recording apparatus |
| 03/08/2000 | EP0693135B1 Fast dna sequence determination method and use thereof in sequencing and diagnostics |
| 03/08/2000 | EP0640963B1 Recording and reproducing method and apparatus using a scanning probe |
| 03/07/2000 | US6033921 Method for depositing a material of controlled, variable thickness across a surface for planarization of that surface |
| 03/07/2000 | US6032518 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 03/02/2000 | WO1999053483A9 Aromatic polyamide film for high-density magnetic recording medium |
| 03/01/2000 | EP0868648A4 Integrated silicon profilometer and afm head |
| 03/01/2000 | EP0847590A4 A scanning probe microscope having automatic probe exchange and alignment |
| 03/01/2000 | EP0839383A4 Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities |
| 02/29/2000 | US6031615 System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness |
| 02/29/2000 | US6031229 Automatic sequencing of FIB operations |
| 02/24/2000 | WO2000009443A1 Carbon nanotube structures made using catalyst islands |
| 02/24/2000 | DE19902235A1 Near field probe for near field optical microscope |
| 02/24/2000 | DE19902234A1 Combination microscope with arrangement for holding a sample |
| 02/24/2000 | DE19838054A1 Optical microscope for use in either near field mode or conventional, confocal mode, where near field probe casing is interchangeable with objective system |
| 02/24/2000 | DE19838053A1 Near field optical probe for optical microscope, for use in either near field or conventional mode; has near field optical probe holder that also houses near field probe tip, where whole casing is interchangeable with objective system |
| 02/23/2000 | EP0981051A1 Optical probe for proximity field |
| 02/23/2000 | CN1245587A Film-like composite structure and method of manufacture thereof |
| 02/22/2000 | US6028305 Dual cantilever scanning probe microscope |
| 02/16/2000 | EP0979414A1 Multi-probe test head |
| 02/09/2000 | EP0978829A1 Near field optical memory head |
| 02/08/2000 | US6021665 Cantilever tracking type scanning probe microscope |
| 02/02/2000 | EP0975828A1 Etching method |
| 01/25/2000 | US6017618 Substrate coated with polymer whereby polymer molecule chains have been mechanically oriented into an pattern of parallel stacks representing written information such as a bar code; atomic scale resolution, high speed, room temperature |
| 01/25/2000 | US6017590 Used to insulate the tips with soft polymer coating material to ensure very low tip leakage current |
| 01/20/2000 | WO2000003302A1 Low-cost, simple mass production of light-guiding tips |
| 01/19/2000 | EP0972190A2 Method for producing and using eddy currents to detect magnetic and electrical properties of materials |
| 01/18/2000 | US6016376 Tapered coherent fiber bundle imaging device for near-field optical microscopy |
| 01/18/2000 | CA2075855C Scanning microscope comprising force-sensing means |
| 01/13/2000 | WO2000002200A1 Information recording medium and information reproducing apparatus |
| 01/13/2000 | WO2000002194A1 Optical recording / reproducing method, recording medium used for optical recording and reproduction, and optical recording / reproducing apparatus |
| 01/11/2000 | USRE36488 Tapping atomic force microscope with phase or frequency detection |
| 01/11/2000 | US6014166 Stereoscopic photon tunneling microscope |
| 01/11/2000 | US6013573 Method of manufacturing an air bridge type structure for supporting a micro-structure |
| 01/11/2000 | US6013396 Fabrication of chrome/phase grating phase shift mask by interferometric lithography |
| 01/04/2000 | US6011261 Probe formed of mono-crystalline SI, the manufacturing method thereof, and an information processing device using the probe |
| 12/29/1999 | WO1999067828A1 Magnetic tunnel device, method of manufacture thereof, and magnetic head |
| 12/29/1999 | WO1999067648A1 Probe with optical waveguide and method of producing the same |
| 12/28/1999 | US6008491 Time-of-flight SIMS/MSRI reflectron mass analyzer and method |
| 12/28/1999 | US6008489 Method for improving the operation of oscillating mode atomic force microscopes |
| 12/28/1999 | US6006595 Device for vibrating cantilever |