| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 10/03/1989 | US4871938 Positioning device for a scanning tunneling microscope |
| 09/27/1989 | EP0334677A1 Information recording device and information recording and reproducing process |
| 09/26/1989 | US4870352 Contactless current probe based on electron tunneling |
| 09/19/1989 | US4868396 Cell and substrate for electrochemical STM studies |
| 09/19/1989 | CA1259710A1 Kinematic arrangement for the micro-movements of objects |
| 09/12/1989 | US4866271 Relative displacement control apparatus |
| 09/08/1989 | WO1989007259A3 Integrated scanning tunneling microscope |
| 09/08/1989 | WO1989007258A3 Integrated scanning tunneling microscope |
| 09/06/1989 | EP0331148A2 Microscope apparatus |
| 09/05/1989 | US4864228 Electron beam test probe for integrated circuit testing |
| 08/29/1989 | US4861990 Tunneling susceptometry |
| 08/23/1989 | EP0328869A2 Electron beam testing of electronic components |
| 08/10/1989 | WO1989007259A2 Integrated scanning tunneling microscope |
| 08/10/1989 | WO1989007258A2 Integrated scanning tunneling microscope |
| 08/10/1989 | WO1989007256A1 An integrated mass storage device |
| 07/25/1989 | US4851671 Oscillating quartz atomic force microscope |
| 07/18/1989 | US4849629 Charged particle analyzer |
| 06/27/1989 | US4843238 Method for identifying a blistered film in layered films |
| 06/20/1989 | US4841148 Variable temperature scanning tunneling microscope |
| 06/06/1989 | US4837445 Coarse adjusting device of scanning tunneling microscope |
| 06/06/1989 | US4837435 Tunneling scanning microscope having light source |
| 05/31/1989 | EP0318289A2 Apparatus and method for detecting tunnel current and electro-chemical reaction |
| 05/31/1989 | EP0317952A2 Device having superlattice structure, and method of and apparatus for manufacturing the same |
| 05/16/1989 | US4831255 Variable-attenuation parallel detector |
| 05/09/1989 | US4829243 Electron beam testing of electronic components |
| 04/20/1989 | WO1989003510A1 Analyzer |
| 04/18/1989 | US4823004 Method of interacting carriers |
| 04/18/1989 | CA1252918A1 Scanning tunneling microscope |
| 03/29/1989 | EP0309236A2 Microprobe, preparation thereof and electronic device by use of said microprobe |
| 03/29/1989 | EP0308537A1 Sensor for converting a distance to optical and further to electrical energy, and surface scanning apparatus using same |
| 03/21/1989 | US4814622 High speed scanning tunneling microscope |
| 03/14/1989 | US4812650 Growth rate monitor for molecular beam epitaxy |
| 03/01/1989 | EP0304893A2 Encoder |
| 02/23/1989 | WO1989001603A1 Scanning type tunnel microscope |
| 02/21/1989 | US4806755 Micromechanical atomic force sensor head |
| 02/21/1989 | US4806754 High luminosity spherical analyzer for charged particles |
| 02/07/1989 | US4803355 Mass spectrometer |
| 01/24/1989 | US4800274 High resolution atomic force microscope |
| 01/17/1989 | US4798989 Scanning tunneling microscope installed in electron microscope |
| 12/28/1988 | EP0296871A2 Tunnelling scanning microscope |
| 12/28/1988 | EP0296262A1 Method for investigating surfaces at nanometer and picosecond resolution and laser-sampled scanning tunneling microscope for performing said method |
| 12/21/1988 | EP0295653A2 High luminosity spherical analyzer for charged particles |
| 11/17/1988 | EP0290648A1 Atomic force sensor head for investigating the topography of a surface |
| 11/17/1988 | EP0290647A1 Oscillating quartz atomic force microscope |
| 11/15/1988 | US4785177 Kinematic arrangement for the micro-movements of objects |
| 10/18/1988 | CA1243231A1 Optical near-field scanning microscope |
| 09/20/1988 | US4772817 Cathode mounting a high-frequency piezoelectric chip |
| 08/09/1988 | US4762996 Coarse approach positioning device |
| 07/27/1988 | EP0275881A2 Method for writing or reading information in electrically polarizable layers by using a scanning tunnelling microscope |
| 06/21/1988 | US4752685 Electronic spectrometer for identifying element conditions of a sample surface by utilizing an energy spectrum of charged particles |
| 05/31/1988 | US4747698 Scanning thermal profiler |
| 05/25/1988 | EP0268232A2 Charged particle analyzer |
| 04/06/1988 | EP0262253A1 Micromechanical atomic force sensor head |
| 02/24/1988 | EP0256968A1 Automatic process for the contactless three-dimensional measurement of objects with large dimensions |
| 02/16/1988 | US4725727 Waveguide for an optical near-field microscope |
| 02/09/1988 | US4724318 Atomic force microscope and method for imaging surfaces with atomic resolution |
| 01/13/1988 | EP0252745A2 Relative displacement control apparatus |
| 12/09/1987 | EP0248233A2 Cathode mounting a high-frequency piezoelectric chip |
| 11/19/1987 | EP0245660A2 Scanning thermal profiler and method for investigating surface structures |
| 09/30/1987 | EP0239085A2 Device for micro-movement of objects |
| 06/03/1987 | EP0223918A2 Method and atomic force microscope for imaging surfaces with atomic resolution |
| 05/26/1987 | US4668865 Scanning tunneling microscope |
| 05/05/1987 | US4662747 Method and apparatus for production and use of nanometer scale light beams |
| 04/21/1987 | US4659429 High resolution optical microscopy and lithography |
| 10/08/1986 | EP0196958A2 Electron beam test probe for integrated-circuit testing |
| 09/17/1986 | EP0194323A1 Scanning tunneling microscope |
| 08/05/1986 | US4604520 Optical near-field scanning microscope |
| 07/02/1986 | EP0185782A1 Waveguide for an optical near-field microscope |
| 03/18/1986 | US4577147 Arrangement and method for voltage measurement at a buried test subject |
| 11/06/1984 | US4481616 Scanning capacitance microscope |
| 07/04/1984 | EP0112401A1 Optical near-field scanning microscope |
| 04/04/1984 | EP0104478A1 Device and method for measuring the voltage of a hidden object |
| 08/10/1982 | US4343993 Scanning tunneling microscope |
| 11/17/1981 | US4301365 Apparatus for contactless measurement of the thickness of a sheet material |
| 04/29/1981 | EP0027517A1 Scanning apparatus for surface analysis using vacuum-tunnel effect at cryogenic temperatures |
| 12/30/1980 | US4242586 Specimen holder for electron microscopy and electron diffraction |
| 11/04/1980 | CA1089113A1 Ion implantation apparatus for controlling the surface potential of a target surface |
| 10/21/1980 | US4229652 Backscatter apparatus and method for measuring thickness of a continuously moving coated strip of substrate material |
| 07/15/1980 | CA1081452A1 Stereoscopic image observing apparatus |
| 03/18/1980 | US4194114 Device for non-contact gauging of thickness or weight per unit area of sheet and like materials |
| 02/26/1980 | US4190770 Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material |
| 01/08/1980 | US4182954 Method and apparatus for measuring material properties related to radiation attenuation |
| 05/08/1979 | US4153334 Stereoscopic image observing apparatus |
| 02/13/1979 | US4139668 Film-grid composite substrate for electron microscopy |
| 01/16/1979 | US4135097 Ion implantation apparatus for controlling the surface potential of a target surface |
| 11/21/1978 | US4126782 Electrostatic charged-particle analyzer |
| 09/19/1978 | US4115690 Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material |
| 05/09/1978 | US4089054 Device for measuring the thickness of layers with a radionuclide irradiating the layer |
| 12/13/1977 | US4063089 X-ray chemical analyzer for field applications |
| 05/17/1977 | US4024394 Method and apparatus for measuring and regulating the density of rod-like fillers consisting of tobacco or the like |
| 12/21/1976 | US3999097 Ion implantation apparatus utilizing multiple aperture source plate and single aperture accel-decel system |
| 08/10/1976 | US3974390 Method of producing excited states of atomic nuclei |
| 06/15/1976 | US3963922 X-ray fluorescence device |
| 04/13/1976 | US3950646 Portable apparatus for measurement of nuclear radiation |
| 01/27/1976 | US3935454 Electron collection in electron spectrometers |