| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 02/07/2002 | WO2002010830A2 Multiple-source arrays for confocal and near-field microscopy |
| 02/07/2002 | WO2002010829A2 Multiple-source arrays with optical transmission enhanced by resonant cavities |
| 02/07/2002 | WO2002010828A2 Control of position and orientation of sub-wavelength aperture array in near-field microscopy |
| 02/07/2002 | WO2002009836A2 Methods for solid phase nanoextraction and desorption |
| 02/07/2002 | US20020014090 Low-reflection glass article |
| 02/06/2002 | EP1178299A1 Superfine indentation tester |
| 02/05/2002 | US6344257 Aromatic polyamide film for high-density magnetic recording media |
| 02/05/2002 | US6344150 Etching method |
| 01/31/2002 | WO2002008774A1 Probe driving method, and probe apparatus |
| 01/31/2002 | US20020012813 Magnetic recording media; detectors |
| 01/30/2002 | CN1333875A Electrostatic fource detector with cantilever and shield |
| 01/24/2002 | US20020009632 Rewritable data storage using carbonaceous material and writing/reading method thereof |
| 01/24/2002 | US20020009262 Information recording and reproducing apparatus |
| 01/24/2002 | US20020008304 Scanning probe microscope (SPM) probe having field effect transistor channel and method of fabricating the same |
| 01/24/2002 | US20020007667 Method and apparatus for the controlled conditioning of scanning probes |
| 01/24/2002 | US20020007651 Method of manufacturing an optical head |
| 01/22/2002 | US6340813 Variable-aperture optical near-field probe |
| 01/22/2002 | US6339955 Thickness measurement using AFM for next generation lithography |
| 01/16/2002 | EP1171791A2 Optical microscopy and its use in the study of cells |
| 01/16/2002 | CN1331413A Process for preparing mica substrate for DNA manipulation |
| 01/15/2002 | US6339217 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
| 01/10/2002 | US20020004216 Optical amplification of molecular interactions using liquid crystals |
| 01/10/2002 | US20020003211 Nanometer scale data storage device and associated positioning system |
| 01/08/2002 | US6337479 Object inspection and/or modification system and method |
| 01/08/2002 | US6337478 Electrostatic force detector with cantilever and shield for an electrostatic force microscope |
| 01/08/2002 | US6337477 Probe having micro-projection and manufacturing method thereof |
| 01/03/2002 | WO2002001222A2 Method and device for detecting dyes in the field of fluorescence microscopy |
| 01/03/2002 | US20020001283 Method for forming aperture, near field optical head and method for fabricating the same and information recording/reading apparatus |
| 01/03/2002 | US20020000511 High sensitivity deflection sensing device |
| 01/02/2002 | EP1167313A1 Low-reflection glass article |
| 01/02/2002 | CN1329338A Method for controlling electrostatic lens and ion implantation device |
| 01/01/2002 | US6335532 Convergent charged particle beam apparatus and inspection method using same |
| 01/01/2002 | US6335522 Optical probe having a refractive index micro-lens and method of manufacturing the same |
| 12/27/2001 | US20010055151 Scanning probe microscope and method of processing signals in the same |
| 12/27/2001 | US20010054691 Optical system for scanning microscope |
| 12/26/2001 | CN1328254A Scan mode for scan tunnel microscope |
| 12/25/2001 | US6333497 Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe |
| 12/20/2001 | WO2001097096A1 Integrated verification and manufacturability tool |
| 12/20/2001 | WO2001096888A2 Difference frequency imaging and spectroscopy to measure dopants using an alternating current scanning tunneling microscope |
| 12/20/2001 | WO2001096447A1 Method of forming polymer molecule chain |
| 12/20/2001 | US20010053444 Management technique of friction coefficient based on surface roughness, substrate for information recording medium, information recording medium and manufacture method thereof |
| 12/20/2001 | US20010052744 Monochrometer for electron beam |
| 12/18/2001 | US6331238 Method of patterning a substrate with an atomic mask |
| 12/18/2001 | US6330824 Photothermal modulation for oscillating mode atomic force microscopy in solution |
| 12/18/2001 | CA2218483C Microspheres with fluorescent spherical zones |
| 12/13/2001 | WO2001094927A1 Method and apparatus for measuring electron injection energy barrier at interface between metal and organic material |
| 12/13/2001 | WO2001094877A1 Sample for simultaneously conducting electro-chemical and topographic near-field microscopy |
| 12/13/2001 | WO2001004611A3 Method and apparatus for enhancing yield of secondary ions |
| 12/13/2001 | US20010051337 Analyzing miniature deposits |
| 12/13/2001 | US20010049959 Integrated silicon profilometer and AFM head |
| 12/12/2001 | EP1162605A2 Method for forming aperture, near field optical head and method for fabricating the same and information recording/reading apparatus |
| 12/12/2001 | EP1161669A1 Deconvolving far-field images using scanned probe data |
| 12/12/2001 | CN2465175Y Multi-prober holder for atomic microscope |
| 12/06/2001 | WO2001091993A1 Method for applying a layer containing at least polymeric material |
| 12/06/2001 | WO2001091855A1 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 12/06/2001 | US20010048076 Surface analyzing apparatus |
| 12/06/2001 | US20010048068 Probe opening forming apparatus and near-field optical microscope using the same |
| 12/06/2001 | US20010047682 Dual stage instrument for scanning a specimen |
| 12/06/2001 | DE10112316A1 Mikrostrukturmessgerät Microstructure meter |
| 12/05/2001 | EP1160611A2 Probe opening forming apparatus and near-field optical microscope using the same |
| 12/05/2001 | EP0975828B1 Etching method |
| 12/04/2001 | US6325904 Nanoelectrode arrays |
| 11/29/2001 | WO2001090761A2 Methods of sampling specimens for microanalysis |
| 11/29/2001 | WO2001090749A2 Scanning kelvin microprobe system and process for biomolecule microassay |
| 11/29/2001 | WO2001090730A2 Scanning kelvin microprobe system and process for analyzing a surface |
| 11/29/2001 | CA2447960A1 Scanning kelvin microprobe system and process for biomolecule microassay |
| 11/29/2001 | CA2447929A1 Scanning kelvin microprobe system and process for analyzing a surface |
| 11/28/2001 | EP1157386A1 Nanocapsules containing charged particles, their uses and methods of forming the same |
| 11/27/2001 | US6323484 Method and apparatus for sample current spectroscopy surface measurement |
| 11/27/2001 | US6323483 High bandwidth recoiless microactuator |
| 11/27/2001 | US6322935 Method and apparatus for repairing an alternating phase shift mask |
| 11/24/2001 | CA2309412A1 Scanning of biochemical microassays by kelvin microprobe |
| 11/22/2001 | WO2001027581A3 Force sensing devices with multiple filled and/or empty channels and other attributes |
| 11/22/2001 | US20010044156 Forming specimen from semiconductor wafer, analyzing raised regions via atom probe |
| 11/22/2001 | US20010044106 Method and apparatus for solid state molecular analysis |
| 11/22/2001 | US20010043545 Method of recording/reproducing an information signal |
| 11/22/2001 | DE10110933A1 Mikrosonde und diese verwendende Vorrichtung des Abtastsondentyps Microprobe and use this device of Abtastsondentyps |
| 11/21/2001 | EP0886758B1 Cantilever structures |
| 11/21/2001 | CN1323066A Rewritable data storage with carbon material and its writing/reading method |
| 11/20/2001 | US6320655 Defect-position identifying method for semiconductor substrate |
| 11/20/2001 | US6319838 Lever arm for a scanning microscope |
| 11/20/2001 | US6319643 Conductive photoresist pattern for long term calibration of scanning electron microscope |
| 11/20/2001 | US6318159 Scanning force microscope with automatic surface engagement |
| 11/15/2001 | WO2001018846A3 High dynamic range mass spectrometer |
| 11/15/2001 | US20010040456 Method and apparatus for detecting line-shorts by potential and temperature distribution |
| 11/14/2001 | EP1154422A2 Rewritable data storage using carbonaceous material and writing/reading method therof |
| 11/14/2001 | EP1153262A1 Method of information collection and processing of sample's surface |
| 11/11/2001 | CA2308015A1 Method for manufacturing carbon nanotubes as functional elements of mems devices |
| 11/08/2001 | US20010038954 Analyzing defect; supplying, controlling actinic radiation |
| 11/08/2001 | US20010038282 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes |
| 11/08/2001 | US20010038072 Image deconvolution techniques for probe scanning apparatus |
| 11/08/2001 | US20010038063 Optical waveguide probe and manufacturing method of the same, and scanning near-field optical microscope |
| 11/07/2001 | EP1151796A2 Immersion lens, optical system incorporating same, method of production of same, and mold for production of same |
| 11/07/2001 | EP1151274A2 Method and device for the optical detection of a particle |
| 11/01/2001 | WO2001081857A2 Resonant probe driving arrangement and scanning probe microscope |
| 11/01/2001 | WO2001080980A1 Nanodosimeter based on single ion detection |
| 11/01/2001 | WO2000048195A9 Nanocapsules containing charged particles, their uses and methods of forming the same |
| 11/01/2001 | CA2406407A1 Resonant probe driving arrangement and scanning probe microscope |
| 10/31/2001 | EP1150286A2 Near-field optical head |
| 10/31/2001 | DE10106854A1 Mikro-Tastkopf und Vorrichtung zum Messen einer Probenoberfläche Micro-probe and apparatus for measuring a sample surface |