| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 11/10/1992 | US5162653 Scanning tunneling microscope and surface topographic observation method |
| 11/04/1992 | EP0511763A2 Cantilever type probe, and scanning tunnel microscope and information processing apparatus employing the same |
| 11/04/1992 | EP0511662A1 Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method |
| 10/28/1992 | EP0511145A2 Method for determining the thickness of an interfacial polysilicon/silicon oxide film |
| 10/28/1992 | EP0510895A2 Information processor |
| 10/27/1992 | US5159196 Apparatus and method for discharging a specimen disposed in an evacuated chamber |
| 10/21/1992 | EP0509856A1 Scanning probe type microscope combined with an optical microscope |
| 10/21/1992 | EP0509716A1 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
| 10/20/1992 | US5156976 For spectrophotometric assays of fluid analytes; having shell with surfaces to propagate radiation between by internal reflection |
| 10/13/1992 | US5155715 Reproducing apparatus |
| 10/13/1992 | US5155412 Method for selectively scaling a field emission electron gun and device formed thereby |
| 10/13/1992 | US5155361 Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
| 10/13/1992 | US5155359 For imaging a surface |
| 10/13/1992 | CA1308574C Atomic force sensor head |
| 10/07/1992 | EP0507628A2 Near field scanning optical microscope |
| 09/22/1992 | US5150392 For providing precise alignment |
| 09/15/1992 | US5148307 Nanometer dimension optical device with microimaging and nanoillumination capabilities |
| 09/15/1992 | US5148027 Method of microarea analysis with a focused cesium ion beam |
| 09/08/1992 | US5146090 Particle beam apparatus having an immersion lens arranged in an intermediate image of the beam |
| 09/08/1992 | US5146089 Ion beam device and method for carrying out potential measurements by means of an ion beam |
| 09/08/1992 | US5144833 Atomic force microscopy |
| 09/03/1992 | DE4106548A1 Wire probe as sub-microscopic transceiver EM radiation - is of length one or more times wavelength of light used with curved spike at one end and leading to light conductive structure at other end |
| 09/02/1992 | EP0501750A1 Single crystal microtip, preparation and applications thereof |
| 09/02/1992 | EP0501257A2 Ion scattering spectrometer |
| 09/02/1992 | EP0500980A1 Cantilevered microtip |
| 09/01/1992 | US5144581 Apparatus including atomic probes utilizing tunnel current to read, write and erase data |
| 09/01/1992 | US5144148 Process for repositioning atoms on a surface using a scanning tunneling microscope |
| 09/01/1992 | US5144128 Surface microscope and surface microscopy |
| 09/01/1992 | CA1307057C Electron beam testing of electronic components |
| 08/25/1992 | US5142145 Composite scanning tunneling microscope |
| 08/25/1992 | US5141319 Displacement detection device with adjacent semiconductor diode lasers |
| 08/20/1992 | WO1992014250A1 Microstructure array and activation system therefor |
| 08/18/1992 | US5140164 Ic modification with focused ion beam system |
| 08/13/1992 | DE4203410A1 Lithography device for wafer structuring - has wafer support table, SXM base with reference structure, and jibs, each with STM sensor |
| 08/12/1992 | EP0497788A1 Examination of objects of macromolecular size. |
| 08/11/1992 | US5138256 Method and apparatus for determining the thickness of an interfacial polysilicon/silicon oxide film |
| 08/11/1992 | US5138174 Nanometer-scale structures and lithography |
| 08/11/1992 | US5138159 Scanning tunneling microscope |
| 08/05/1992 | EP0497288A2 Probe scanning system |
| 08/04/1992 | US5136162 Measuring device in a scanning probe microscope |
| 08/04/1992 | CA1305872C Micromechanical atomic force sensor head |
| 07/28/1992 | US5134605 Optically readable media utilizing scanning tunneling microscope for excitation |
| 07/23/1992 | WO1992012528A1 Surface atom machining method and apparatus |
| 07/23/1992 | WO1992012398A1 Piezoresistive cantilever for atomic force microscopy |
| 07/22/1992 | EP0495262A2 Integrated circuits modification with focused ion beam system |
| 07/21/1992 | US5132533 Method for forming probe and apparatus therefor |
| 07/15/1992 | EP0494415A2 Method for chemical marking of solid state surfaces at atomic level and use of such a method to store information units in an atomic range |
| 07/14/1992 | US5129132 Method of making an integrated scanning tunneling microscope |
| 07/07/1992 | US5128544 Scanning probe microscope |
| 07/01/1992 | EP0492915A1 Cantilever probe and apparatus using the same |
| 07/01/1992 | EP0491973A1 Integrated pneumatically and electrostatically controlled scanning tunneling microscope and method of making the same |
| 06/09/1992 | US5120959 Apparatus for simultaneously effecting electrochemical measurement and measurement of tunneling current and tunnel probe therefor |
| 06/03/1992 | EP0488133A1 Method of making a cantilever stylus for use in an atomic force microscope |
| 06/03/1992 | EP0488067A2 Ion-scattering spectrometer |
| 05/27/1992 | EP0487233A2 Near field scanning optical microscope and applications thereof |
| 05/26/1992 | US5117110 Composite scanning tunnelling microscope with a positioning function |
| 05/26/1992 | US5116782 Method and apparatus for processing a fine pattern |
| 05/26/1992 | US5116462 Cantilever beam; coating, masking, etching |
| 05/14/1992 | WO1992008336A1 Etching of nanoscale structures on high temperature superconductors |
| 05/12/1992 | US5113072 Device having superlattice structure, and method of and apparatus for manufacturing the same |
| 05/06/1992 | EP0483579A2 Nanometer scale probe for an atomic force microscope, and method for making the same |
| 04/21/1992 | US5107114 Fine scanning mechanism for atomic force microscope |
| 04/21/1992 | US5107112 Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof |
| 04/21/1992 | US5106729 Replacing oxygen in polymer with sulfur, then complexing with metal; measuring difference in electroconductivity with tip of scanning probe microscope |
| 04/15/1992 | EP0480645A1 Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same |
| 04/15/1992 | EP0480136A1 Atomic force microscopy |
| 04/14/1992 | US5105305 Near-field scanning optical microscope using a fluorescent probe |
| 04/08/1992 | EP0478666A1 Microfabricated microscope assembly. |
| 04/07/1992 | US5103174 Magnetic field sensor and device for determining the magnetostriction of a material based on a tunneling tip detector and methods of using same |
| 04/07/1992 | US5103094 Compact temperature-compensated tube-type scanning probe with large scan range |
| 04/02/1992 | DE4107605C1 Sensor for atomic force raster microscope - has opto-electronic distance measurer for ascertaining movement of probe tip at distal end of extendable arm |
| 03/31/1992 | CA1298416C High stability bimorph scanning tunneling microscope |
| 03/24/1992 | US5099117 Scanning tunnel microscope capable of detecting electrons emanating from a specimen |
| 03/18/1992 | EP0475564A1 Fine scanning mechanism for atomic force microscope |
| 03/18/1992 | EP0475559A2 Cantilever for use in atomic force microscope and manufacture method therefor |
| 03/11/1992 | EP0474433A1 Information processing method and apparatus |
| 03/10/1992 | US5095208 Charged particle generating device and focusing lens therefor |
| 03/10/1992 | US5094975 Conductive crystals epitaxially grown in square holes |
| 03/03/1992 | US5092163 Precision small scale force sensor |
| 02/26/1992 | EP0472342A2 Micro-displacement type information detection probe device and microscope and information processing device by use thereof |
| 02/19/1992 | EP0471511A2 Cantilever type probe and information processing device equipped with said probe |
| 02/17/1992 | CA2049197C Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof |
| 02/12/1992 | EP0470370A1 Information detection apparatus and method |
| 02/05/1992 | EP0469879A2 Information recording device and information recording method |
| 02/05/1992 | EP0469314A2 Method and apparatus for neutralizing electric charges built up on a specimen in a vacuum chamber |
| 02/04/1992 | US5086227 Secondary ion mass analyzing apparatus |
| 02/04/1992 | US5085070 Capacitive force-balance system for measuring small forces and pressures |
| 01/29/1992 | EP0468456A2 Information recording and/or reproducing apparatus |
| 01/29/1992 | EP0468071A1 Method of producing micromechanical sensors for the AFM/STM/MFM profilometry and micromechanical AFM/STM/MFM sensor head |
| 01/21/1992 | US5083022 Scanning tunneling microscope |
| 01/15/1992 | EP0465515A1 Process and device for monitoring assisted ion machining processes on wafers. |
| 01/14/1992 | US5081353 Combined scanning electron and scanning tunnelling microscope apparatus and method |
| 01/08/1992 | EP0464537A2 Method for temporarily stable marking of isolated atoms or groups of atoms on a solid state body surface and use of the same for storing information units at an atomic level |
| 01/04/1992 | CA2046065A1 Time-stable labeling of individual atoms or groups of atoms in the surface of a solid, and the storage of information units in the atomic range |
| 12/31/1991 | US5076026 Microscopic grinding method and microscopic grinding device |
| 12/25/1991 | CN1057363A Installation for study or transformation of surface of samples placed in vacuum or in controlled atmosphere |
| 12/24/1991 | US5075548 Tunnel current probe moving mechanism having parallel cantilevers |
| 12/18/1991 | EP0461442A2 Particle beam apparatus |
| 12/18/1991 | EP0461393A1 Scanning tunnel microscope |
| 12/10/1991 | US5072116 Microprobe preparation thereof and electronic device by use of said microprobe |