| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 10/31/2001 | CN1319777A Near field optical probe and near field optical microscope and photo recording/reproducing device |
| 10/30/2001 | US6310342 Optical microscope stage for scanning probe microscope |
| 10/30/2001 | US6308399 High-TC superconducting ceramic oxide products and macroscopic and microscopic methods of making the same |
| 10/25/2001 | US20010033529 Near-field optical head |
| 10/24/2001 | EP1148371A2 Optical waveguide probe and manufacturing method of the same, and scanning near field optical microscope |
| 10/24/2001 | EP1148370A2 Near-field optical probe, near-field optical microscope and optical recording/reproducing device with near-field optical probe |
| 10/23/2001 | US6307312 Immersion lens and electron beam projection system using the same |
| 10/23/2001 | US6307205 Omega energy filter |
| 10/18/2001 | US20010030938 Recording medium, near field optical head, optical recording device, and method of manufacturing thereof |
| 10/18/2001 | US20010030536 Magnetic field characteristics evaluation apparatus and magnetic field characteristics measuring method |
| 10/17/2001 | EP1146376A1 Method and apparatus for the controlled conditioning of scanning probes |
| 10/17/2001 | EP0946855B1 Method and devices for measuring distances between object structures |
| 10/16/2001 | US6304527 Near-field optical head and manufacturing method thereof and optical recording/readout system using near-field optical head |
| 10/16/2001 | US6304319 Exposure apparatus, method of producing the same, and method of producing devices |
| 10/16/2001 | US6303932 Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam |
| 10/16/2001 | US6303402 Method of manufacturing near field light generating device |
| 10/11/2001 | WO2001075427A1 Methods and apparatus for atomic force microscopy |
| 10/11/2001 | WO2001075393A1 Thickness measurement using afm for next generation lithography |
| 10/11/2001 | US20010029211 Golf ball |
| 10/11/2001 | US20010028033 Microprobe and sample surface measuring apparatus |
| 10/11/2001 | CA2404604A1 Methods and apparatus for atomic force microscopy |
| 10/10/2001 | EP1141753A1 Lensed optical fibers & unique micropipettes with subwavelength apertures |
| 10/10/2001 | EP1141673A1 Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface |
| 10/09/2001 | US6300628 Focused ion beam machining method and device thereof |
| 10/09/2001 | US6299990 Ferromagnetic material and magnetic apparatus employing the ferromagnetic material |
| 10/04/2001 | WO2001073830A2 Electrochemical nanostructuring method and device |
| 10/04/2001 | WO2001073791A1 Atomic force microscope |
| 10/04/2001 | US20010025921 Digital measuring scanner |
| 10/04/2001 | EP1139121A2 Process of producing near-field light generating element |
| 10/04/2001 | DE10015931A1 Verfahren zur elektrochemischen Nanostrukturierung Method of electrochemical nanostructuring |
| 10/02/2001 | US6297502 Method and apparatus for force control of a scanning probe |
| 09/26/2001 | EP1135792A1 Method for manufacturing carbon nanotubes as functional elements of mems devices |
| 09/26/2001 | EP1135691A1 Electrostatic force detector with cantilever and shield |
| 09/26/2001 | EP0754289B1 Measurement of AFM cantilever deflection with high frequency radiation and dopant profiler |
| 09/25/2001 | US6294774 Scanning probe microscope having graphical information |
| 09/18/2001 | US6292316 Detection and characterization of defects on surfaces of magnetic disks |
| 09/13/2001 | US20010021575 High resolution dopant/impurity incorporation in semiconductors via a scanned atomic force probe |
| 09/13/2001 | US20010021166 Memory medium |
| 09/13/2001 | US20010021159 Method of and apparatus for recording/reproducing an information signal, recording/reproducing head device, memory medium, and head element |
| 09/13/2001 | US20010021145 Apparatus and method for position control of optical system, and storage and reproduction apparatus |
| 09/11/2001 | US6288394 Highly charged ion based time of flight emission microscope |
| 09/11/2001 | US6288392 Quantitative characterization of obliquely-deposited substrates of gold by atomic force microscopy: influence of substrate topography on anchoring of liquid crystals |
| 09/11/2001 | US6288391 Method for locking probe of scanning probe microscope |
| 09/11/2001 | US6287880 Method and apparatus for high resolution profiling in semiconductor structures |
| 09/06/2001 | US20010019532 Method of and apparatus for recording/reproducing an information signal, recording/reproducing head device, memory medium, and head element |
| 09/06/2001 | US20010019108 Analysis of semiconductor surfaces by secondary ion mass spectrometry |
| 09/05/2001 | EP1130440A2 Apparatus and method for position control of optical system and storage and reproduction apparatus |
| 09/05/2001 | EP1130379A1 Optical cantilever and production method therefor |
| 09/04/2001 | US6285811 Near-field optical microscope with infrared fiber probe |
| 09/04/2001 | US6285020 Enhanced optical transmission apparatus with improved inter-surface coupling |
| 09/04/2001 | US6284552 Method and apparatus for evaluating surface roughness of an epitaxial growth layer, method and apparatus for measuring reflectance of an epitaxial growth layer, and manufacturing method of semiconductor device |
| 09/04/2001 | US6284197 Contacting analyte with recognition moiety, causing proximate mesogens to detectably switch from first orientation to second orientation |
| 08/30/2001 | WO2001063555A2 Image deconvolution techniques for probe scanning apparatus |
| 08/30/2001 | WO2001063204A1 Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device |
| 08/30/2001 | US20010018239 Laser annealing method and laser annealing device |
| 08/30/2001 | US20010017354 Micro-aperture probe evaluating apparatus |
| 08/30/2001 | US20010017054 Probe microscope |
| 08/28/2001 | US6281495 Method of producing magnetic force image and scanning probe microscope |
| 08/28/2001 | US6281491 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
| 08/28/2001 | US6280939 Method and apparatus for DNA sequencing using a local sensitive force detector |
| 08/28/2001 | US6280647 Method for sharpening a probe |
| 08/28/2001 | US6279389 AFM with referenced or differential height measurement |
| 08/23/2001 | US20010015803 Integrated circuit defect review and classification process |
| 08/23/2001 | US20010015097 Scanning system having a deflectable probe tip |
| 08/23/2001 | US20010015018 Stylus for nanotechnology and method for manufacturing the same |
| 08/21/2001 | US6278113 Scanning probe microscope |
| 08/21/2001 | US6278112 Method of setting a base energy level for an Auger electron spectroscopy analysis of a titanium nitride film, and method of analyzing the titanium nitride film |
| 08/21/2001 | US6277438 Protective fullerene (C60) packaging system for microelectromechanical systems applications |
| 08/16/2001 | WO2001059426A1 Superfine indentation tester |
| 08/16/2001 | WO2001023939A3 Device for scanning near field optical microscopy |
| 08/16/2001 | US20010013574 Intermittent contact imaging under force-feedback control |
| 08/09/2001 | WO2001057975A2 Near-field laser and detector apparatus and method |
| 08/09/2001 | WO2001057878A1 Instrument and method for combined surface topography and spectroscopic analysis |
| 08/09/2001 | US20010011895 Method of determining the doping concentration across a surface of a semiconductor material |
| 08/09/2001 | US20010011704 Near-field optical probe and manufacturing method for same, and near-field optical apparatus using the near-field probe |
| 08/09/2001 | US20010011702 Electron beam apparatus |
| 08/09/2001 | US20010011700 Method of forming a micro-aperture, projection having a micro-aperture, probe or multi-probe having such a projection and surface scanner, aligner or information processor comprising such a probe |
| 08/08/2001 | EP1122722A1 Near field optical head and method for manufacturing the same |
| 08/07/2001 | US6272083 Method of and apparatus for recording/reproducing information signal, recording/reproducing head device. Memory medium, and head element and manufacture thereof |
| 08/07/2001 | US6271519 Analysis of semiconductor surfaces by secondary ion mass spectrometry |
| 08/07/2001 | US6271513 Large area scanning tip system for near field microscope |
| 08/07/2001 | US6270946 Forming reaction product; washing to remove residues |
| 08/07/2001 | CA2118338C Optical memory medium and write and read apparatus using the same |
| 08/02/2001 | WO2001009662A3 Scanning interferometric near-field confocal microscopy |
| 08/02/2001 | US20010010676 Memory medium |
| 08/02/2001 | US20010010668 Nanometer scale data storage device and associated positioning system |
| 08/02/2001 | US20010010356 Through-the-substrate investigation of flip-chip IC's |
| 08/02/2001 | DE10003693A1 Abtastsystem mit auslenkbarer Tastspitze Scanning probe tip deflectable |
| 08/01/2001 | EP1120780A2 Recording medium, near field optical head, optical recording device, and method of manufacturing thereof |
| 08/01/2001 | CN1306201A Process for preparing nm probe of scan-type electrochemical microscope |
| 07/31/2001 | USRE37299 Atomic force microscopy |
| 07/31/2001 | US6269067 Method of and apparatus for recording/reproducing information signal recording/reproducing head device memory and head element and manufacture thereof |
| 07/31/2001 | US6268919 System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations |
| 07/31/2001 | US6267005 Dual stage instrument for scanning a specimen |
| 07/26/2001 | WO2001053870A1 Method and device for analysing molecular reaction products in biological cells |
| 07/26/2001 | US20010009460 Angle compensation method |
| 07/26/2001 | DE10001239A1 Device for measuring structures on substrate has non-optical measurement device on bearer element, whereby normal air pressure conditions exist between measurement device and substrate |
| 07/25/2001 | EP1076803A4 Apparatus and method for measuring intermolecular interactions by atomic force microscopy |
| 07/25/2001 | EP1023623A4 Producing high throughput tapered straight and cantilevered glass structures for nanodelivery and nanosensing |
| 07/25/2001 | CN1305191A Process for preparing curved needle tip of optical fibre |