| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 01/19/1999 | US5861624 Atomic force microscope for attachment to optical microscope |
| 01/19/1999 | US5861550 Scanning force microscope |
| 01/19/1999 | CA2069702C Micro-displacement element, and scanning tunneling microscope and information processing apparatus using same |
| 01/19/1999 | CA2065593C Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
| 01/14/1999 | DE19826984A1 Miniature positioning arrangement |
| 01/13/1999 | EP0890821A1 Scanning probe microscope |
| 01/13/1999 | EP0890820A1 Scanning probe microscope |
| 01/12/1999 | US5859814 Magneto-optic recording system and method |
| 01/12/1999 | US5859364 Scanning probe microscope |
| 01/12/1999 | US5858256 Depositing a metal layer on the tip but not the sides of a column extending from a substrate, etching the substrate to remove metal from tip to form a pit, etching from the back to form an aperture; reproducable; field scanning microscopes |
| 01/12/1999 | US5857341 For use in a microscope having a scanning probe |
| 01/07/1999 | EP0855045A4 High resolution fiber optic probe for near field optical microscopy |
| 01/07/1999 | DE19728357A1 Stabilising deformation of probe tip in raster force microscope |
| 01/05/1999 | US5856967 Atomic force microscopy data storage system with tracking servo from lateral force-sensing cantilever |
| 01/05/1999 | US5856617 Atomic force microscope system with cantilever having unbiased spin valve magnetoresistive strain gauge |
| 12/30/1998 | WO1998044343A3 Method for producing and using eddy currents to detect magnetic and electrical properties of materials |
| 12/30/1998 | EP0886758A1 Cantilever structures |
| 12/29/1998 | US5854495 Preparation of nucleated silicon surfaces |
| 12/29/1998 | US5854488 Ion beam machining method and device thereof |
| 12/29/1998 | US5854487 Scanning probe microscope providing unobstructed top down and bottom up views |
| 12/23/1998 | WO1998058288A1 Scanning probe optical microscope using a solid immersion lens |
| 12/22/1998 | US5852232 Instrument for sensing a sample |
| 12/22/1998 | US5851902 Semiconductor layer structure and recording medium for a large capacity memory |
| 12/17/1998 | WO1998057363A1 Exposure system, process for manufacturing the exposure system, and process for fabricating devices |
| 12/16/1998 | EP0884759A1 Secondary ion mass spectrometer with apertured mask |
| 12/16/1998 | EP0884617A1 Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe |
| 12/16/1998 | EP0884557A2 Conductive micro-probe and memory device |
| 12/15/1998 | US5850038 Scanning probe microscope incorporating an optical microscope |
| 12/08/1998 | US5847488 Apparatus having drive device using electromechanical transducer |
| 12/08/1998 | US5847383 Approaching device of scanning probe microscope |
| 12/08/1998 | US5846870 Method of measuring a semiconductor device and a method of making a semiconductor device |
| 12/02/1998 | EP0710370B1 Intelligent sensor for near field optical device |
| 11/25/1998 | EP0880043A2 Scanning near field optical microscope |
| 11/24/1998 | US5841129 Device for optical scanning of objects on a scanning surface and process for operating it |
| 11/24/1998 | CA2145018C Scanning near-field optic/atomic force microscope |
| 11/19/1998 | WO1998052193A1 Optical disc data storage system using optical waveguide |
| 11/17/1998 | US5838005 In a method for forming a sensor |
| 11/17/1998 | US5838000 Method device and system for optical near-field scanning microscopy of test specimens in liquids |
| 11/17/1998 | US5836996 Artificial retina |
| 11/11/1998 | EP0877413A2 Method and apparatus for selectively marking a semiconductor wafer |
| 11/11/1998 | EP0805946A4 Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system |
| 11/10/1998 | US5834644 Automatic atomic force microscope with piezotube scanner |
| 11/10/1998 | US5833749 Compound semiconductor substrate and process of producing same |
| 11/05/1998 | WO1998034092A3 Object inspection and/or modification system and method |
| 11/03/1998 | US5831961 Information processing apparatus with probe undergoing circular motion |
| 11/03/1998 | US5831181 Automated tool for precision machining and imaging |
| 10/28/1998 | EP0874216A2 Optical probe, method of manufacturing an optical probe, and scanning probe microscope |
| 10/28/1998 | EP0873574A1 Method to determine depth profiles in an area of thin coating |
| 10/22/1998 | WO1998046813A1 Etching method |
| 10/22/1998 | DE19816914A1 Scanning microscope with stage observing=evaluating parameters of sample surface |
| 10/21/1998 | EP0872707A1 Apparatus for measuring exchange force |
| 10/21/1998 | CN1196481A Method of measuring exchange force and method of evaluating magnetism using exchange force |
| 10/20/1998 | US5825020 Atomic force microscope for generating a small incident beam spot |
| 10/20/1998 | US5824470 Protection of detectors by passivation and deprotection in a microscopic environment |
| 10/15/1998 | DE19816480A1 Scanning microscope with orthogonally displaced scanning head |
| 10/14/1998 | EP0871166A1 Apparatus for machining, recording, or reproducing, using scanning probe microscope |
| 10/14/1998 | EP0871006A1 Scanning probe microscope |
| 10/13/1998 | US5821549 Through-the-substrate investigation of flip-chip IC's |
| 10/13/1998 | US5821410 Scanning tip microwave near field microscope |
| 10/13/1998 | US5821409 Scanning near-field optic/atomic-force microscope with observing function in liquid |
| 10/10/1998 | CA2231224A1 Apparatus for machining, recording, and reproducing, using scanning probe microscope |
| 10/09/1998 | CA2231310A1 Scanning probe microscope |
| 10/08/1998 | WO1998044343A2 Method for producing and using eddy currents to detect magnetic and electrical properties of materials |
| 10/08/1998 | WO1998037440A3 Glass structures for nanodelivery and nanosensing |
| 10/08/1998 | DE19713746A1 Sensor for simultaneous raster scan microscopy and optical short distance microscopy |
| 10/08/1998 | DE19713418A1 Erzeugung und Einsatz von Wirbelströmen zur Erfassung von magnetischen und elektrischen Materialeigenschafen Production and use of eddy currents for detecting magnetic and electrical material properties sheep |
| 10/07/1998 | EP0869354A1 Method of measuring exchange force and method of evaluating magnetism using the exchange force |
| 10/07/1998 | EP0869329A2 Torsion type probe and scanning probe microscope using the same |
| 10/07/1998 | EP0868648A1 Integrated silicon profilometer and afm head |
| 10/06/1998 | US5818042 Apparatus for creating three-dimensional physical models of characteristics of microscopic objects |
| 10/01/1998 | DE19714346A1 Method of optical microscopy with sub-wavelength resolution |
| 09/29/1998 | US5815253 Method and apparatus for estimating performance of gas tube |
| 09/23/1998 | EP0866341A2 Alternating current magnetic force microscopy system with probe having integrated coil |
| 09/23/1998 | EP0866307A2 Magnetic force microscopy probe |
| 09/22/1998 | US5812724 Optical fiber having core with sharpened tip protruding from light-shielding coating |
| 09/22/1998 | US5812723 Optical fiber with tapered end of core protruding from clad |
| 09/22/1998 | US5812722 Optical fiber and method for manufacturing the same |
| 09/22/1998 | US5812516 Information recording system |
| 09/22/1998 | US5811802 Scanning probe microscope with hollow pivot assembly |
| 09/22/1998 | US5811796 Optical probe microscope having a fiber optic tip that receives both a dither motion and a scanning motion, for nondestructive metrology of large sample surfaces |
| 09/22/1998 | US5811017 Cantilever for use in a scanning probe microscope and method of manufacturing the same |
| 09/22/1998 | CA2116497C Information recording and reproducing apparatus using probe |
| 09/16/1998 | EP0864899A2 Scanning near-field optical microscope |
| 09/16/1998 | EP0864898A1 Near-field optical microscope |
| 09/16/1998 | EP0864846A2 Scanning probe microscope |
| 09/15/1998 | US5808790 Integrated microscope providing near-field and light microscopy |
| 09/15/1998 | US5808311 Method for detecting displacement of atoms on material surface and method for local supply of heteroatoms |
| 09/12/1998 | CA2229221A1 Scanning near-field optical microscope |
| 09/09/1998 | EP0863543A2 Through-the-substrate investigation of flip-chip IC's |
| 09/09/1998 | EP0722574B1 Near-field optical microscope |
| 09/08/1998 | US5804710 Atomic force microscope system with multi-directional voice coil actuator for controlling the stylus |
| 09/08/1998 | US5804709 For measuring a force used in atomic force microscopy |
| 09/08/1998 | US5804708 Atomic force microscope and method of analyzing frictions in atomic force microscope |
| 09/03/1998 | WO1998038501A1 Scanning probe microscope providing unobstructed top down and bottom up views |
| 09/02/1998 | EP0862046A1 Scanning probe microscope |
| 09/02/1998 | EP0862045A2 Atomic force microscope with optional replaceable fluid cell. |
| 08/27/1998 | WO1998037440A2 Glass structures for nanodelivery and nanosensing |
| 08/27/1998 | DE19807911A1 Coarse probe adjustment for raster microscope |
| 08/27/1998 | DE19708749A1 Distance sensor for dynamic raster microscope |
| 08/27/1998 | DE19706973A1 Test system for examining smooth surface of sample using laser beam |