| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 08/22/1995 | US5444191 Information processing apparatus and device for use in same |
| 08/18/1995 | CA2141075A1 Method of controlling polarization properties of a photo-induced device in an optical waveguide and method of investigating structure of an optical waveguide |
| 08/15/1995 | US5442443 Stereoscopic photon tunneling microscope |
| 08/15/1995 | US5442300 Ultrafast electrical scanning force microscope probe |
| 08/15/1995 | US5441343 Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen |
| 08/15/1995 | US5440920 Scanning force microscope with beam tracking lens |
| 08/08/1995 | US5440122 Surface analyzing and processing apparatus |
| 08/08/1995 | US5440121 Scanning probe microscope |
| 08/02/1995 | EP0665417A2 Atomic force microscope combined with optical microscope |
| 08/01/1995 | US5438206 Positioning device |
| 08/01/1995 | US5438196 Scanning tunneling microscope |
| 07/26/1995 | EP0664540A2 Substrate independent superpolishing process and slurry |
| 07/26/1995 | EP0664468A1 Fibre probe having a tip with concave sidewalls |
| 07/26/1995 | EP0664448A2 Tunnel unit and scanning head for scanning tunneling microscope |
| 07/25/1995 | US5436452 Uncooled tunneling infrared sensor |
| 07/25/1995 | US5436448 Surface observing apparatus and method |
| 07/18/1995 | US5434842 Reading and writing stored information by means of electrochemistry |
| 07/18/1995 | US5434422 Sample position controller in focused ion beam system |
| 07/11/1995 | US5432771 Information recording/reproducing apparatus for performing recording/reproduction of information by using probe |
| 07/11/1995 | US5432346 Relative position change amount detecting apparatus having bi-directional probe with compensated movement |
| 07/11/1995 | US5431055 Surface measuring apparatus using a probe microscope |
| 07/05/1995 | EP0661570A1 Fibre probe device having multiple diameters |
| 06/28/1995 | EP0660183A2 Mask for transferring a pattern for use in a semiconductor device and method for manufacturing the same |
| 06/22/1995 | WO1995008181A3 A system for analyzing surfaces of samples |
| 06/21/1995 | EP0658888A2 High-density recording medium and recording and reproducing apparatus there-for using tunnel current |
| 06/20/1995 | US5426302 Optically guided macroscopic-scan-range/nanometer resolution probing system |
| 06/20/1995 | US5425616 Micromotion stage |
| 06/13/1995 | US5424974 Optoelectric memories with photoconductive thin films |
| 06/13/1995 | US5423514 Alignment assembly for aligning a spring element with a laser beam in a probe microscope |
| 05/30/1995 | US5420796 Method of inspecting planarity of wafer surface after etchback step in integrated circuit fabrication |
| 05/23/1995 | US5418363 In an atomic force microscope |
| 05/17/1995 | EP0653628A1 Sample stage for scanning probe microscope head |
| 05/16/1995 | US5416331 For fabricaing the surface of a specimen at an atomic scale |
| 05/16/1995 | US5416327 Ultrafast scanning probe microscopy |
| 05/16/1995 | US5415027 Method of operating an atomic force microscope |
| 05/10/1995 | EP0652414A1 Scanning near-field optic/atomic force microscope |
| 05/09/1995 | US5414690 Moving apparatus, a moving method and an information detection and/or input apparatus using the same |
| 05/09/1995 | US5414260 Scanning probe microscope and method of observing samples by using the same |
| 05/09/1995 | US5412980 Tapping atomic force microscope |
| 05/04/1995 | WO1995012121A1 Method and apparatus for measuring distribution of radionuclide in sample |
| 05/03/1995 | EP0650629A1 Reading and writing stored information by means of electrochemistry |
| 05/03/1995 | EP0650593A1 System for detecting atomic or molecular spectra of a substance, and/or threshold phenomena associated with the same |
| 05/02/1995 | US5412641 Information recording/reproducing apparatus for recording/reproducing information with probes |
| 05/02/1995 | US5410910 Cryogenic atomic force microscope |
| 04/26/1995 | EP0650067A1 Electrooptic instrument |
| 04/26/1995 | EP0650029A2 Atomic force microscope with optional replaceable fluid cell |
| 04/25/1995 | US5410151 Fiber optic probe and method of making same |
| 04/20/1995 | DE4437081A1 Device and method for adhesion measurement and method for producing semiconductor devices |
| 04/19/1995 | EP0649135A1 Optical memory medium and write and read apparatuses using the same |
| 04/18/1995 | US5408094 Atomic force microscope with light beam emission at predetermined angle |
| 04/18/1995 | US5406833 Atomic force microscope |
| 04/18/1995 | US5406832 Synchronous sampling scanning force microscope |
| 04/13/1995 | WO1995010060A1 Near-field optical microscope |
| 04/11/1995 | US5406080 Process for monitoring ion-assisted processing procedures on wafers and an apparatus for carrying out the same |
| 04/05/1995 | EP0646913A2 Encoder using the tunnel current effect |
| 04/05/1995 | EP0646787A1 Cantilever for use with atomic force microscope and process for the production thereof |
| 03/29/1995 | EP0569547A4 Microstructure array and activation system therefor. |
| 03/28/1995 | US5402410 High density storage of information on a substrate with multiple depth and height |
| 03/28/1995 | US5401965 Secondary ion mass spectrometer for analyzing positive and negative ions |
| 03/28/1995 | US5400647 Methods of operating atomic force microscopes to measure friction |
| 03/23/1995 | WO1995008181A2 A system for analyzing surfaces of samples |
| 03/23/1995 | WO1995008109A1 A measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium |
| 03/22/1995 | EP0644529A2 A magnetic memory device |
| 03/14/1995 | US5398229 Method of manufacturing cantilever drive mechanism, method of manufacturing probe drive mechanism, cantilever drive mechanism, probe drive mechanism and electronic device which uses the same |
| 03/14/1995 | US5397896 Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra |
| 03/07/1995 | US5396066 Displacement element, cantilever probe and information processing apparatus using cantilever probe |
| 03/07/1995 | US5394741 Atomic probe microscope |
| 03/02/1995 | WO1995006138A1 Microscopic method for detecting micromotions |
| 03/01/1995 | EP0640963A1 Recording/reproducing method and apparatus using probe |
| 03/01/1995 | EP0640829A2 Scanning probe microscope |
| 03/01/1995 | EP0407460B1 An integrated mass storage device |
| 02/28/1995 | US5394500 Fiber probe device having multiple diameters |
| 02/28/1995 | US5394388 Multiple microprobe arrays for recording and reproducing encoded information |
| 02/28/1995 | US5393977 Charged particle beam apparatus and it's operating method |
| 02/22/1995 | EP0338083B1 Scanning tunneling microscope with means for correcting surface data |
| 02/21/1995 | US5391871 For measuring surface status of a sample by scanning with a probe |
| 02/16/1995 | WO1995005000A1 Probe microscopy |
| 02/14/1995 | US5390161 Microprobe, method for producing the same, and information input and/or output apparatus utilizing the same |
| 02/14/1995 | US5389779 For collecting information from a surface of a sample |
| 02/14/1995 | US5389475 Optical recording media |
| 02/14/1995 | US5388323 Method of forming a probe for an atomic force microscope |
| 02/07/1995 | US5386720 Integrated AFM sensor |
| 02/02/1995 | WO1995003561A1 Intelligent sensor for near field optical device |
| 02/02/1995 | DE4403768A1 Analysis system for integrated circuits, electron-beam measuring sensor system, and associated fault isolation methods |
| 02/01/1995 | EP0636914A1 Reflective feedback probe for optical near-field detection |
| 02/01/1995 | EP0439534B1 Photon scanning tunneling microscopy |
| 01/31/1995 | US5386110 Method of making cantilever chip for scanning probe microscope |
| 01/24/1995 | US5383354 Process for measuring surface topography using atomic force microscopy |
| 01/18/1995 | EP0634681A1 Cylindrical fiber probe devices and methods of making them |
| 01/17/1995 | US5382796 Apparatus for morphological observation of a sample |
| 01/17/1995 | US5382795 Ultrafine silicon tips for AFM/STM profilometry |
| 01/17/1995 | US5382789 Near field scanning optical microscope |
| 01/12/1995 | WO1995001646A1 Method for imaging an atomic-level of semiconductor |
| 01/11/1995 | EP0633450A2 Method for detecting and examining slightly irregular surface states, and scanning probe microscope therefor |
| 01/10/1995 | US5381400 Information carrier, information recording and/or reproducing apparatus, and information detecting apparatus |
| 01/10/1995 | US5381101 System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies |
| 01/03/1995 | US5378983 Scanning tunneling potentio-spectroscopic microscope and a data detecting method |
| 12/27/1994 | US5376790 Scanning probe microscope |
| 12/22/1994 | WO1994029894A1 Piezoresistive cantilever with integral tip |
| 12/20/1994 | US5375033 Multi-dimensional precision micro-actuator |