Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
11/2000
11/14/2000US6146913 Method for making enhanced performance field effect devices
11/14/2000US6146227 Method for manufacturing carbon nanotubes as functional elements of MEMS devices
11/14/2000US6145374 Scanning force microscope with high-frequency cantilever
11/09/2000WO2000067290A2 Integrated microcolumn and scanning probe microscope arrays
11/09/2000CA2336670A1 Integrated microcolumn and scanning probe microscope arrays
11/08/2000EP1050741A1 Calibration of magnetic force or scanning hall probe microscopes
11/07/2000US6144028 Scanning probe microscope assembly and method for making confocal, spectrophotometric, Near-Field, and Scanning probe measurements and associated images
11/07/2000US6143190 Method of producing a through-hole, silicon substrate having a through-hole, device using such a substrate, method of producing an ink-jet print head, and ink-jet print head
11/02/2000WO2000065406A1 Method of correcting phase shift mask and focused ion beam device
11/02/2000WO2000020823B1 Atomic force microscope for profiling high aspect ratio samples
11/02/2000EP1049080A1 Device and method for information recording/reproducing using near-field light
11/02/2000DE10007617A1 Magnetic field characterization process, especially for magnetic read/write heads, comprises providing a magnetosensitive layer between a component surface and a scanning force microscope sensor
10/2000
10/31/2000US6140654 Charged beam lithography apparatus and method thereof
10/31/2000US6139937 Magnetic recording medium
10/26/2000WO2000063736A2 Optical microscopy and its use in the study of cells
10/24/2000US6134955 Magnetic modulation of force sensor for AC detection in an atomic force microscope
10/19/2000DE19912814A1 Raster tunneling microscope images magnetic structure of test samples
10/18/2000EP1045380A2 Near field optical recording/reproducing device
10/18/2000EP1045253A2 Prober for electrical measurements and method of measuring electrical characteristics with said prober
10/17/2000US6133742 Multi-pulse sampling of signals using electrostatic force sampling
10/10/2000US6130749 System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation
10/10/2000US6130427 Scanning probe microscope with multimode head
10/05/2000WO2000058759A2 Active probe for an atomic force microscope and method of use thereof
10/05/2000WO2000058323A1 Metallocene compounds with siloxazol ligands
10/03/2000US6128073 Device and method for examining the smoothness of a sample surface
10/03/2000US6127682 Scanning probe microscope and method of analyzing sample using same
10/03/2000US6127681 Scanning tunnel microscope
09/2000
09/30/2000CA2303473A1 Prober for electrical measurement and method of measuring electrical characteristics with said prober
09/27/2000EP1038171A1 Nanoelectrode arrays
09/26/2000US6124142 Method for analyzing minute foreign substance elements
09/26/2000US6123819 Nanoelectrode arrays
09/21/2000WO2000055597A1 Optical micro cantilever, method of manufacture thereof, and micro cantilever holder
09/21/2000WO2000023840A8 Near field optical scanning system employing microfabricated solid immersion lens
09/21/2000WO2000020823A3 Atomic force microscope for profiling high aspect ratio samples
09/20/2000EP1037009A1 Multi-axial actuator and probe head for a scanning probe microscope
09/19/2000US6122562 Method and apparatus for selectively marking a semiconductor wafer
09/19/2000US6121647 A perovskite crystalline lead, titanium and a rare earth oxide used in a semiconductor device, e.g., nonvolatile memories; infrared sensors; optical modulators, switches, integrated circuits; reduced leakage; reverse polarity
09/19/2000US6121611 Force sensing probe for scanning probe microscopy
09/19/2000US6121604 Optical probe, method of manufacturing an optical probe, and scanning probe microscope
09/19/2000US6121060 Method of measuring a concentration profile
09/13/2000EP1034557A1 Radiofrequency gaseous detection device (rf-gdd)
09/12/2000US6118122 Ion beam working apparatus
09/12/2000US6118121 Probe scanning mechanism for a scanning probe microscope
09/08/2000WO2000052439A1 Capacitive force gauge
09/08/2000WO2000017853A9 Multi-pulse sampling of signals using force sampling
09/06/2000EP1032828A1 Electrostatic force detector with cantilever for an electrostatic force microscope
08/2000
08/31/2000DE19906960A1 Forming metal structures in NM range on conductive surfaces of substrates for miniature electronic components
08/29/2000US6110579 Recording medium used in information processing apparatus using probe
08/22/2000US6107629 Method to determine depth profiles in an area of thin coating
08/17/2000WO2000048195A1 Nanocapsules containing charged particles, their uses and methods of forming the same
08/17/2000WO2000047978A1 Deconvolving far-field images using scanned probe data
08/15/2000US6104030 Optical probe having tapered wave guide and scanning near-field optical microscope utilizing optical probe
08/10/2000WO2000046569A1 System and method of multi-dimensional force sensing for atomic force microscopy
08/10/2000WO2000046568A2 Method of information collection and processing of sample's surface
08/09/2000EP1026674A1 Near-field optical recording apparatus assistively heating recording medium
08/09/2000EP1025416A1 Method and apparatus for obtaining improved vertical metrology measurements
08/08/2000US6100534 Microscopic area scanning apparatus
08/08/2000US6100524 Torsion type probe and scanning probe microscope using the same
08/08/2000US6100523 Micro goniometer for scanning microscopy
08/08/2000US6099945 Atomic mask and method of patterning a substrate with the atomic mask
08/03/2000WO2000044938A1 Method for measuring intramolecular forces by atomic force microscopy
08/03/2000DE19900114A1 Verfahren und Vorrichtung zur gleichzeitigen Bestimmung der Adhäsion, der Reibung und weiterer Materialeigenschaften einer Probenoberfläche Method and apparatus for the simultaneous determination of adhesion, friction, and other material properties of a sample surface
08/02/2000EP1023623A2 Producing high throughput tapered straight and cantilevered glass structures for nanodelivery and nanosensing
08/01/2000US6097473 Exposure apparatus and positioning method
08/01/2000US6097197 Scanning probe microscope
08/01/2000US6096434 The conductive oxide thin film is an epitaxial film composed of strontium ruthenate formed on silicon substrate
08/01/2000US6095679 Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
08/01/2000US6094972 Sampling scanning probe microscope and sampling method thereof
08/01/2000US6094971 Scanning-probe microscope including non-optical means for detecting normal tip-sample interactions
07/2000
07/27/2000WO2000017853A3 Multi-pulse sampling of signals using force sampling
07/26/2000EP1022733A1 Information recording medium and information reproducing apparatus
07/26/2000EP0813675B1 Magnetic modulation of force sensor for ac detection in an atomic force microscope
07/20/2000WO2000041457A2 Method and device for the optical detection of a particle
07/20/2000DE19901381A1 Verfahren und Vorrichtung zur optischen Detektion eines Partikels Method and device for optical detection of a particle
07/18/2000US6091124 Micromechanical sensor for AFM/STM profilometry
07/13/2000WO2000040946A1 Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface
07/13/2000DE10000361A1 Means for detection of microstructure defects in semiconductor wafers around through contact holes using a charged particle beam scanning system which involves negatively charging the zone around the contact hole prior to scanning
07/12/2000EP1018138A1 Scanning evanescent electro-magnetic microscope
07/12/2000EP1018011A1 Metal ion specific capacity affinity sensor
07/11/2000US6085580 Differential force microscope
07/06/2000DE19859399A1 Verfahren und Vorrichtung zur quantitativen und qualitativen Bestimmung von Stoffen Method and apparatus for quantitative and qualitative determination of substances
07/05/2000EP1016868A1 Probe, method of its manufacturing, and probe-type memory
07/05/2000EP1015843A1 Lever arm for a scanning microscope
07/04/2000US6083624 Graphite sheet with hole of regular geometric shape in top atomic layer; microstrips
06/2000
06/28/2000EP1014457A2 Micro-fabrication method and sensor using the same
06/28/2000EP1014456A2 Wavelength-tunable light emitting device
06/28/2000EP1014345A1 Optical recording / reproducing method, recording medium used for optical recording and reproduction, and optical recording / reproducing apparatus
06/28/2000EP1014081A2 Method and device for the quantitative and qualitative determination of substances
06/28/2000EP1012862A1 Atomic force microscope for generating a small incident beam spot
06/28/2000EP1012670A1 Low-cost, simple mass production of light-guiding tips
06/28/2000EP1012584A2 Object inspection and/or modification system and method
06/27/2000US6081394 Recorded magnetization state measuring method and device
06/27/2000US6081115 Method of measuring exchange force and method of evaluating magnetism using the exchange force
06/27/2000US6081113 Cantilever magnetic force sensor for magnetic force microscopy having a magnetic probe coated with a hard-magnetic material
06/27/2000US6080986 Secondary ion mass spectrometer with aperture mask
06/27/2000US6079255 Mechanically coupled alternatively usable cantilever structures for scanning a surface
06/27/2000US6079254 Scanning force microscope with automatic surface engagement and improved amplitude demodulation
06/22/2000WO2000036395A1 Magnetic resonance exchange interaction force microscope and method for measuring exchange interaction force using the same
06/21/2000EP1010983A1 Probe with optical waveguide and method of producing the same
06/21/2000DE19858490A1 Near-field optical analysis of biological objects employs matrix of light micro- or nano-sources excited by scanning laser or free electron beam, causing secondary optical emissions
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