Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
12/1991
12/04/1991EP0459392A2 Method and apparatus for processing a minute portion of a specimen
11/1991
11/21/1991EP0457253A2 Cantilever stylus for use in an atomic force microscope and method of making same
11/20/1991CN1056354A Discriminating spectroscopy of optical profile of transparent object obtained by frustrated evanescent field scanning optical microscopy
11/19/1991US5066858 Scanning tunneling microscopes with correction for coupling effects
11/14/1991WO1991017429A1 Installation for the study or transformation of sample surfaces in a vacuum or controlled atmosphere
11/12/1991US5065103 Scanning capacitance - voltage microscopy
11/12/1991US5065020 Energy dispersive X-ray spectrometer
11/05/1991US5063293 Positron microscopy
10/1991
10/29/1991US5061851 Inspection method and device for an aperture in a focused ion beam generating apparatus
10/23/1991EP0453225A1 Method and apparatus for detecting trace contaminants
10/23/1991EP0452852A2 Information Recording/Reproducing Apparatus
10/23/1991EP0452851A1 Information recording/reproducing apparatus
10/22/1991US5059793 Scanning tunneling microscope having proper servo control function
10/17/1991WO1991015752A1 Scanning tunneling microscope
10/08/1991US5055680 Scanning tunneling microscope
10/02/1991EP0449221A2 Scanning probe microscope
10/02/1991EP0448985A1 Scanning capacitance - voltage microscopy
10/01/1991US5053995 Tunnel current data storage apparatus having separate lever bodies
09/1991
09/24/1991US5051977 Scanning tunneling microscope memory utilizing optical fluorescence of substrate for reading
09/24/1991US5051594 Fine positioning device, as for the stage of a scanning tunneling microscope
09/24/1991US5051379 Coating an inorganic material on a wafer, masking for a beam pattern photoresists
09/17/1991US5049461 Scanning tunneling microscope
09/11/1991EP0445825A2 Information recording method/apparatus and information reproducing method/apparatus
09/10/1991US5047637 Atomic probe type microscope apparatus
09/10/1991US5047633 Imaging apparatus and method
09/04/1991EP0444697A2 Atomic probe microscope and cantilever unit for use in the microscope
08/1991
08/21/1991EP0442630A2 Combined scanning electron and scanning tunnelling microscope apparatus and method
08/21/1991EP0442536A2 Atomic force sensor head for measuring the properties of a data store
08/20/1991US5041783 Probe unit for an atomic probe microscope
08/20/1991US5041725 Secondary ion mass spectrometry apparatus
08/14/1991EP0441311A2 Surface microscope apparatus
08/14/1991EP0440901A2 Ion beam apparatus as well as a process to perform potential measurements by means of an ion beam
08/07/1991EP0440268A2 Atomic force sensor head with interferometric measurement of the properties of a data store
08/07/1991EP0439534A1 Photon scanning tunneling microscopy.
08/06/1991US5038322 Method of and device for sub-micron processing a surface
08/06/1991US5038034 Scanning tunneling microscope
07/1991
07/31/1991EP0438675A2 Interferometric sensor to measure distance-variations of a small surface
07/30/1991US5036490 Memory device with dual cantilever means
07/30/1991US5036196 Surface microscope
07/17/1991EP0437275A2 Microprobe, method for producing the same, and information input and/or output apparatus utilizing the same
07/17/1991EP0436982A2 Scanning tip for a scanning tunnelling apparatus
07/12/1991CA2033836A1 Microprobe, method for producing the same, and information receiving and providing apparatus utilizing the same
07/11/1991WO1991010344A1 Etching of nanoscale structures
07/03/1991EP0435645A1 Recording medium, recording method, and readout method
07/02/1991US5028778 Surface analysis method and a device therefor
06/1991
06/26/1991EP0433604A2 Electrical probe incorporating scanning proximity microscope
06/25/1991US5026437 Cantilevered microtip manufacturing by ion implantation and etching
06/25/1991US5025658 Compact atomic force microscope
06/19/1991CN1052373A Process for pinpoint spectroscopic analysis of light diffracted or absorbed by substance placed in near field
06/18/1991US5025153 Scanning tunneling spectroscope and a spectroscopic information detection method
06/18/1991US5025147 Laser light
06/12/1991EP0431623A2 Method for forming probe and apparatus therefor
06/12/1991EP0431553A2 Microscopic grinding method and microscopic grinding device
06/11/1991US5023452 Method and apparatus for detecting trace contaminents
06/05/1991EP0429773A1 Atomic photo-absorption force microscope
06/04/1991US5021672 Ablation of one or more molecular layers of metal chalcogenide with tunneling current in an air atmosphere
05/1991
05/28/1991US5019707 High speed waveform sampling with a tunneling microscope
05/28/1991US5018865 Photon scanning tunneling microscopy
05/21/1991US5017266 Piezoelectric transducer
05/21/1991US5017010 High sensitivity position sensor and method
05/15/1991EP0427443A2 Process and structure wherein atoms are repositioned on a surface using a scanning tunnelling microscope
05/14/1991US5015850 Microfabricated microscope assembly
05/08/1991EP0426571A1 Method for punctual spectroscopic analysis of a light, diffracted or absorbed by a substance in a near field
05/08/1991EP0426559A1 Spectroscopic method for the discrimination of the optical profile of a transparent object by frustrated evanescent field scanning optical microscopy
05/04/1991WO1991006884A1 Method for localized spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field
05/04/1991CA2072628A1 Method for localized spectroscopid analysis of the light diffracted of absorbed by a substance placed in a near field
05/02/1991EP0425204A2 Secondary ion mass analyzing apparatus
05/01/1991WO1991006844A1 Discriminating spectroscopy of the optical profile of a transparent object using frustrated vanishing field scanning optical microscopy
05/01/1991CA2072111A1 Discriminating spectroscopy of the optical profile of a transparent object using frustrated vanishing field scanning optical microscopy
04/1991
04/23/1991US5010250 System for surface temperature measurement with picosecond time resolution
04/23/1991US5010249 Diamond probe and forming method thereof
04/17/1991EP0422548A2 Atomic force microscope
04/17/1991EP0422449A2 A scanning tunneling potentiospectroscopic microscope and a data detecting method
04/10/1991EP0421437A2 Scanning tunneling microscope having proper servo control function
04/10/1991EP0421355A2 Scanning tunneling microscope
04/10/1991EP0421354A2 Scanning tunneling microscope
04/10/1991EP0366746A4 A variable temperature scanning tunneling microscope
04/09/1991US5006814 Current amplifier
04/04/1991WO1991004507A1 Examination of objects of macromolecular size
04/02/1991US5004307 Near field and solid immersion optical microscope
04/02/1991US5003815 Spectroscopic apparatus
03/1991
03/27/1991CN1050266A Near field reflection microscopy process and microscope
03/21/1991WO1991003757A1 Microscopy method and reflexion near field microscope
03/19/1991US5001409 Surface metrological apparatus
03/12/1991US4999495 Scanning tunneling microscope
03/06/1991EP0415838A1 Microscopic method and "near-field" reflection microscope
03/06/1991EP0415764A2 Scanning tunneling microscope memory utilizing optical fluorescence of substrate for reading
03/06/1991EP0415763A2 Scanning tunneling microscope utilizing optical fluorescent for reading
03/05/1991US4998016 Probe unit, driving method thereof, and scanning device for detecting tunnel current having said probe unit
03/01/1991CA2065263A1 Microscopy method and reflexion near field microscope
03/01/1991CA2022407A1 Scanning tunneling microscope memory utilizing optical fluorescence of substrate for reading
03/01/1991CA2021582A1 Scanning tunneling microscope utilizing optical fluorescent for reading
02/1991
02/20/1991EP0413042A1 Method of producing micromechanical sensors for the AFM/STM profilometry and micromechanical AFM/STM sensor head
02/20/1991EP0413041A1 Method of producing micromechanical sensors for the AFM/STM profilometry and micromechanical AFM/STM sensor head
02/20/1991EP0413040A1 Method of producing ultrafine silicon tips for the AFM/STM profilometry
02/12/1991US4992728 Electrical probe incorporating scanning proximity microscope
02/12/1991US4992660 Scanning tunneling microscope
02/12/1991US4992659 Near-field lorentz force microscopy
01/1991
01/30/1991EP0410618A2 Method for visualizing the base sequence of nucleic acid polymers
01/30/1991EP0410131A1 Near-field Lorentz force microscopy
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