| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 10/17/1996 | WO1996032622A1 Instrument for determining the topography of a surface |
| 10/17/1996 | DE19513529A1 Anordnung zur Erfassung der Topographie einer Oberfläche Arrangement for determining the topography of a surface |
| 10/09/1996 | EP0736746A1 Method of using scanning probe microscope permitting cleaning of probe microscope or of probe tip in ambient atmosphere |
| 10/03/1996 | WO1996030927A1 Combined scanning probe and scanning energy microscope |
| 10/03/1996 | WO1996030797A1 Micro-optical probe for a scanning microscope |
| 10/03/1996 | WO1996030717A1 Micromechanical probe for a scanning microscope |
| 10/03/1996 | CA2213970A1 Combined scanning probe and scanning energy microscope |
| 10/02/1996 | EP0584233A4 Methods of fabricating integrated, aligned tunneling tip pairs |
| 10/02/1996 | EP0478666B1 Microfabricated microscope assembly |
| 10/02/1996 | DE19531466A1 Mikromechanische Sonde für Rastermikroskope Micromechanical probe for scanning microscopes |
| 10/02/1996 | DE19531465A1 Mikrooptische Sonde für Rastermikroskope Micro-optical probe for scanning microscopes |
| 10/01/1996 | US5560244 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 09/24/1996 | US5559907 Method of controlling polarization properties of a photo-induced device in an optical waveguide and method of investigating structure of an optical waveguide |
| 09/24/1996 | US5559330 Scanning tunneling microscope |
| 09/24/1996 | US5559328 Apparatus for analyzing samples |
| 09/19/1996 | WO1996028751A1 Method for particle wave reconstruction in a particle-optical apparatus |
| 09/19/1996 | WO1996028706A1 Magnetic modulation of force sensor for ac detection in an atomic force microscope |
| 09/19/1996 | DE19509903A1 Prodn. of tip used in optical electron beam scanning microscope |
| 09/18/1996 | EP0732584A2 An assembly and a method suitable for identifying a code sequence of a biomolecule |
| 09/17/1996 | US5557156 Scan control for scanning probe microscopes |
| 09/12/1996 | WO1996027895A1 Electrochemical identification of molecules in a scanning probe microscope |
| 09/11/1996 | EP0712533A4 Probe microscopy |
| 09/10/1996 | US5554851 Parallel plane holding mechanism and apparatus using such a mechanism |
| 09/10/1996 | US5553487 Methods of operating atomic force microscopes to measure friction |
| 09/10/1996 | US5553486 Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system |
| 08/29/1996 | DE19604363A1 Auxiliary fibre optic focussing module for microscopy |
| 08/28/1996 | EP0729006A2 Information processing apparatus with probe undergoing circular motion |
| 08/28/1996 | EP0728322A1 Microscopic electromagnetic radiation transmitter or detector |
| 08/27/1996 | USRE35317 Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
| 08/27/1996 | US5550948 Method of determining changes in the refractive index of an optical waveguide |
| 08/27/1996 | US5549954 Magnetic disc |
| 08/21/1996 | EP0727814A1 Scanning probe for investigating electronic, magnetic and topographic structures of the order of sub-micron resolution and method of fabricating the same |
| 08/21/1996 | EP0727660A2 Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same |
| 08/21/1996 | EP0727659A2 Method and apparatus for analyzing minute foreign substances, and process for manufacturing semiconductor or LCD elements |
| 08/21/1996 | EP0727639A1 Method of chemically differentiated imaging by means of atomic force microscopy |
| 08/20/1996 | US5548117 Probe for a scanning tunneling microscope and method of manufacturing a probe |
| 08/20/1996 | US5548113 For examining a sample |
| 08/16/1996 | CA2169522A1 Chemically differentiated imaging by scanning atomic force microscopy |
| 08/15/1996 | WO1996024946A1 Scanning probe microscope for use in fluids |
| 08/15/1996 | WO1996024819A1 Cantilever deflection sensor and use thereof |
| 08/15/1996 | WO1996024689A1 Method and apparatus for determining the sequence of polynucleotides |
| 08/14/1996 | EP0726567A2 Semiconductor layer structure as a recording medium |
| 08/14/1996 | EP0726480A2 Probe for an optical near-field microscope |
| 08/14/1996 | EP0726444A1 Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof |
| 08/14/1996 | EP0465515B1 Process and device for monitoring ion assisted machining processes on wafers |
| 08/13/1996 | US5546375 Method of manufacturing a tip for scanning tunneling microscope using peeling layer |
| 08/13/1996 | US5546374 Information recording and/or reproducing apparatus using probe |
| 08/13/1996 | US5546223 Method for external excitation of subwavelength light sources that is integrated into feedback methodologies |
| 08/08/1996 | WO1996024026A1 Tapping atomic force microscope with phase or frequency detection |
| 08/06/1996 | US5543614 Scanning probe microscope capable of suppressing probe vibration caused by feedback control |
| 08/01/1996 | DE19502822A1 Distance dependent signal extraction to regulate distance between probe point and probed surface for raster probe microscopy |
| 07/30/1996 | US5540958 Coating a substrates, patterning a material and coating with a second material |
| 07/24/1996 | EP0723039A2 Compound semiconductor substrate and process of producing same |
| 07/24/1996 | EP0722574A1 Near-field optical microscope |
| 07/23/1996 | US5539203 Single ion implantation system |
| 07/23/1996 | US5539197 Scanning near-field optical microscope having a medium denser than air in the gap between the probe chip and the sample being measured |
| 07/23/1996 | US5538898 Method suitable for identifying a code sequence of a biomolecule |
| 07/23/1996 | US5537863 Scanning probe microscope having a cantilever used therein |
| 07/17/1996 | EP0722077A2 Information processing apparatus effecting probe position control with electrostatic force |
| 07/10/1996 | EP0721101A2 Method and apparatus for identifying and characterizing a material |
| 07/09/1996 | US5535185 Information recording/reproduction apparatus using probe |
| 07/09/1996 | US5534359 Silicon wafer with ridges and grooves, electron microscopes |
| 07/09/1996 | US5533387 Method of evaluating silicon wafers |
| 07/04/1996 | WO1996020406A1 Elementary analysis method by scanning probe microscope and ultra-short pulse high-voltage application method used for said method |
| 07/02/1996 | US5531343 Cylindrical fiber probe devices and methods of making them |
| 06/25/1996 | US5530253 Sample stage for scanning probe microscope head |
| 06/18/1996 | US5528716 Method of determining and investigating the physical structure of a light guiding body |
| 06/18/1996 | US5528156 IC analysis system and electron beam probe system and fault isolation method therefor |
| 06/18/1996 | US5528034 Method of ultra high sensitivity hydrogen detection with slow multiply-charged ions |
| 06/18/1996 | US5528033 To measure critical dimensions of a submicron device |
| 06/12/1996 | EP0716417A2 Information processing apparatus provided with mechanism for controlling position of probe |
| 06/12/1996 | EP0715714A1 A measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium |
| 06/11/1996 | US5526334 Information processing apparatus with multiple probes and method therefor |
| 06/05/1996 | EP0715147A2 Microscope with aligning function |
| 06/05/1996 | DE4435635A1 Microfabrication of cantilever stylus for atomic force microscopy |
| 05/28/1996 | US5520769 Quantitative analysis of dopes in semiconductors, etching an oxide, measurement of topography |
| 05/22/1996 | EP0712533A1 Probe microscopy |
| 05/21/1996 | US5519686 Encoder for controlling measurements in the range of a few angstroms |
| 05/21/1996 | US5519212 Tapping atomic force microscope with phase or frequency detection |
| 05/15/1996 | EP0712047A2 Method of forming a resist pattern |
| 05/14/1996 | US5517482 Information recording/reproducing apparatus having fuzzy operating unit |
| 05/14/1996 | US5517027 Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these |
| 05/14/1996 | US5515719 Controlled force microscope for operation in liquids |
| 05/09/1996 | WO1996013744A1 Method and device for determining substance-specific parameters of one or a plurality of molecules by correlation-spectroscopy |
| 05/08/1996 | EP0711029A2 Microstructure and method of forming the same |
| 05/08/1996 | EP0710370A1 Intelligent sensor for near field optical device |
| 05/07/1996 | US5513518 For generating a signal corresponding to a scanned sample |
| 05/02/1996 | WO1996012930A1 Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system |
| 05/02/1996 | DE4438391A1 Verfahren und Vorrichtung zur Bestimmung stoffspezifischer Parameter eines oder weniger Moleküle mittels Korrelations-Spektroskopie Method and apparatus for determining material-specific parameters of one or less molecules using correlation spectroscopy |
| 05/01/1996 | EP0709704A1 Optical probe microscope for nondestructive metrology of large sample surfaces |
| 05/01/1996 | EP0708976A1 Process for operating a time-of-flight secondary ion mass spectrometer |
| 04/30/1996 | US5513168 Optical information read/write apparatus |
| 04/30/1996 | US5512746 Micro-pattern measuring apparatus |
| 04/30/1996 | US5511931 Micromotion stage |
| 04/25/1996 | WO1996012206A1 Fiber optic probe for near field optical microscopy |
| 04/23/1996 | US5510858 Television receiver having an STM memory |
| 04/23/1996 | US5510617 Particle-optical instrument comprising a deflection unit for secondary electrons |
| 04/23/1996 | US5510614 Solid surface observation method and apparatus therefor, and electronic apparatus formed of the solid surface observation apparatus and method of forming the electronic apparatus |
| 04/16/1996 | US5508805 Interferometer, optical scanning type tunneling microscope and optical probe |
| 04/16/1996 | US5508527 Method of detecting positional displacement between mask and wafer, and exposure apparatus adopting the method |