| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 05/27/1997 | US5633495 Process for operating a time-of-flight secondary-ion mass spectrometer |
| 05/27/1997 | US5633455 Method of detecting particles of semiconductor wafers |
| 05/22/1997 | DE19636232A1 Measurement probe device for generating surface image, esp. for atomic force microscopy |
| 05/21/1997 | CN1150253A 原子力显微镜 AFM |
| 05/20/1997 | US5631731 Method and apparatus for aerial image analyzer |
| 05/20/1997 | US5631463 Cantilever detector having piezoelectric film of zinc oxide or aluminum nitride and platinum or palladium electrodes with controlled crystal orientation, for scanning tunneling microscopes |
| 05/20/1997 | US5631410 Vibrating probe atomic force microscope |
| 05/20/1997 | US5630932 Sodium hydroxide etching by immersion in solutions |
| 05/07/1997 | EP0715714B1 A measuring device for measuring the intensity and/or polarization of electromagnetic radiation, for determining physical properties of a preparation, and for reading information from a storage medium |
| 05/07/1997 | DE19541079A1 Differential conductivity and/or derivative spectrum determination of material sample |
| 05/07/1997 | DE19541058A1 Tunnel spectroscopy method for electronic condition and density of material |
| 05/06/1997 | US5627922 Micro optical fiber light source and sensor and method of fabrication thereof |
| 05/06/1997 | US5627815 Precision machining method precision machining apparatus and data storage apparatus using the same |
| 05/06/1997 | US5627365 Scanning near-field optic/atomic force microscope in which imaging light is controlled in relation to a vibrating position of an optical fiber probe |
| 05/06/1997 | US5626812 Method of producing carbon material by bending at least one carbon atom layer of graphite |
| 05/02/1997 | EP0619872B1 Piezoresistive cantilever for atomic force microscopy |
| 04/29/1997 | US5625617 Near-field optical apparatus with a laser having a non-uniform emission face |
| 04/29/1997 | US5624845 Detection of code sequences of biomolecules, super resolution |
| 04/23/1997 | EP0769158A1 Device for optically scanning objects on a scanning surface and process for operating it |
| 04/23/1997 | EP0497788B1 Examination of objects of macromolecular size |
| 04/22/1997 | US5623339 Interferometric measuring method based on multi-pole sensing |
| 04/22/1997 | US5623338 For providing near-field measurements of a workpiece |
| 04/22/1997 | US5623295 Information recording reproducing apparatus using probe |
| 04/22/1997 | US5623205 Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field |
| 04/22/1997 | US5622787 Mask for transferring a pattern for use in a semiconductor device and method of manufacturing the same |
| 04/17/1997 | WO1997014067A1 High resolution fiber optic probe for near field optical microscopy |
| 04/15/1997 | US5621652 System and method for verifying process models in integrated circuit process simulators |
| 04/15/1997 | US5621211 Scanning tunneling atom-probe microscope |
| 04/15/1997 | US5621210 Microscope for force and tunneling microscopy in liquids |
| 04/15/1997 | US5620854 Measuring time-varying micromotion |
| 04/10/1997 | DE19537586A1 Surface and volume measuring instrument using confocal image |
| 04/08/1997 | US5619139 Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof |
| 04/08/1997 | US5619035 System for analyzing surfaces of samples |
| 04/08/1997 | US5618760 Method of etching a pattern on a substrate using a scanning probe microscope |
| 04/02/1997 | EP0766060A1 Micromechanical part having at least one tip consisting of diamond, and manufacturing method for such parts. |
| 04/01/1997 | US5616916 Configuration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic force |
| 03/27/1997 | WO1997010901A1 Tips and substrates for scanning probe microscopy |
| 03/26/1997 | EP0764261A1 Instrument for determining the topography of a surface |
| 03/25/1997 | US5614663 Cantilever for use with atomic force microscope and process for the production thereof |
| 03/19/1997 | EP0763844A1 Method of manufacturing micro-tip and female mold substrate therefor, and method of manufacturing probe with micro-tip |
| 03/19/1997 | EP0763742A1 Optical fiber and its manufacture |
| 03/19/1997 | EP0763215A1 Micro-optical probe for a scanning microscope |
| 03/18/1997 | US5612491 Formation of a magnetic film on an atomic force microscope cantilever |
| 03/18/1997 | US5611942 Method for producing tips for atomic force microscopes |
| 03/12/1997 | EP0762566A1 Near-field optical apparatus with laser source |
| 03/11/1997 | US5609744 Assembly suitable for identifying a code sequence of a biomolecule in a gel embodiment |
| 03/06/1997 | WO1997008733A1 A scanning probe microscope having automatic probe exchange and alignment |
| 03/06/1997 | DE19532838A1 Non contact scanning force microscope |
| 03/06/1997 | DE19531802A1 Scanning near field optical microscope |
| 03/05/1997 | EP0760109A1 Method for particle wave reconstruction in a particle-optical apparatus |
| 03/04/1997 | US5607568 Assembly suitable for identifying a code sequence of a biomolecule in a free-solution embodiment |
| 02/26/1997 | EP0759537A2 A scanning force microscope with optical device |
| 02/26/1997 | EP0759536A1 Atomic force microscope and measuring head thereof |
| 02/11/1997 | US5602329 Method and apparatus for measuring fracture toughness of a material |
| 02/11/1997 | US5602323 For calibration of region of recesses and projections |
| 02/11/1997 | US5601982 Method and apparatus for determining the sequence of polynucleotides |
| 02/06/1997 | WO1997004449A1 Nanometer scale data storage device and associated positioning system |
| 02/05/1997 | EP0757271A2 Interferometric near-field apparatus and method |
| 01/23/1997 | DE19526775A1 Probes for scanning force microscopy and needles for scanning tunnelling microscopy |
| 01/22/1997 | EP0754289A1 Cantilever deflection sensor and use thereof |
| 01/21/1997 | US5596194 Single-wafer tunneling sensor and low-cost IC manufacturing method |
| 01/21/1997 | US5595942 Method of fabricating cantilever for atomic force microscope having piezoresistive deflection detector |
| 01/15/1997 | EP0753824A1 Recording/reproducing apparatus and method for recording/reproducing information using probe |
| 01/15/1997 | EP0753736A2 Contamination evaluating apparatus |
| 01/14/1997 | US5594166 Cantilever for use with atomic force microscope and process for the production thereof |
| 01/08/1997 | EP0752601A1 Optical fiber and its manufacture |
| 01/07/1997 | US5592413 Microstructure array and activation system therefor |
| 01/07/1997 | US5591903 Reconstructing the shape of an atomic force microscope probe |
| 12/31/1996 | US5589780 IC Analysis system and electron beam probe system and fault isolation method therefor |
| 12/31/1996 | US5589686 Method of an apparatus for real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces |
| 12/31/1996 | CA2048365C Information processing device and information processing method |
| 12/27/1996 | EP0750298A2 Probe and recording medium for information recording apparatus, and information recording apparatus utilizing the same |
| 12/24/1996 | US5587523 Atomic force microscope employing beam tracking |
| 12/17/1996 | US5585734 Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope |
| 12/11/1996 | EP0746857A1 Scanning probe microscope |
| 12/10/1996 | US5583446 For measuring high speed signals with a low speed measurement instrument |
| 12/10/1996 | US5583344 Process method and apparatus using focused ion beam generating means |
| 12/10/1996 | US5583286 Integrated sensor for scanning probe microscope |
| 12/05/1996 | WO1996038705A1 Probes for sensing and manipulating microscopic environments and structures |
| 12/05/1996 | DE19520457A1 Sensing element for probe used to measure topography of sample surface in raster scan microscope |
| 12/04/1996 | EP0745987A2 Probe for memory device having movable media |
| 12/03/1996 | US5581538 Recording/reproducing apparatus with a probe to detect data recorded in pits and projections of a recording medium |
| 12/03/1996 | US5581364 Method for recording and/or reproducing image signals and an apparatus therefor utilizing two dimensional scanning of a recording medium by a probe |
| 12/03/1996 | US5581193 Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra |
| 12/03/1996 | US5581083 Method for fabricating a sensor on a probe tip used for atomic force microscopy and the like |
| 12/03/1996 | US5581082 Combined scanning probe and scanning energy microscope |
| 11/28/1996 | WO1996037788A1 Process for producing a probe with a coated point |
| 11/28/1996 | DE19519478A1 Herstellungsverfahren für Sonde mit beschichteter Spitze sowie verfahrensgemäß hergestellte Sonde Production method for sensor with a coated tip and procedural prepared according probe |
| 11/26/1996 | CA2070946C Cantilever type displacement element, and scanning tunneling microscope or information processing apparatus using same |
| 11/12/1996 | US5574279 Probe with torsion lever structure, and scanning probe microscope and record/reproducing apparatus utilizing the same |
| 11/12/1996 | US5574278 For determining properties of a sample surface |
| 11/07/1996 | WO1996035225A1 Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities |
| 11/07/1996 | WO1996035136A1 Device for optically scanning objects on a scanning surface and process for operating it |
| 11/07/1996 | CA2194268A1 Device for optically scanning objects on a scanning surface and process for operating it |
| 10/29/1996 | US5570441 Cylindrical fiber probes and methods of making them |
| 10/29/1996 | US5570336 Information recording and reproducing apparatus having a slider formal of single crystal silicon body and cantilever |
| 10/29/1996 | US5569919 X-ray analytical apparatus |
| 10/22/1996 | US5568004 Electromechanical positioning device |
| 10/22/1996 | US5567872 Scanning atomic force microscope |
| 10/17/1996 | WO1996032623A1 Apparatus and method for controlling a mechanical oscillator |