Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
12/1999
12/28/1999US6006594 Scanning probe microscope head with signal processing circuit
12/28/1999US6006593 Method using cantilever to measure physical properties
12/21/1999US6005251 Voice coil scanner for use in scanning probe microscope
12/21/1999US6005246 Scanning probe microscope
12/16/1999WO1999064909A1 Near-field optical inspection apparatus
12/15/1999EP0964443A2 Method for heat treatment of silicon wafer and silicon wafer
12/15/1999EP0964251A1 Optical waveguide probe and its manufacturing method
12/14/1999US6002471 High resolution scanning raman microscope
12/14/1999US6002136 Microscope specimen holder and grid arrangement for in-situ and ex-situ repeated analysis
12/14/1999US6000947 Method of fabricating transistor or other electronic device using scanning probe microscope
12/14/1999US6000281 Method and apparatus for measuring critical dimensions on a semiconductor surface
12/09/1999WO1999063329A1 Optical amplification of molecular interactions using liquid crystals
12/09/1999CA2334238A1 Optical amplification of molecular interactions using liquid crystals
12/08/1999EP0962958A1 Ion scattering spectrometer
12/07/1999US5999005 Voltage and displacement measuring apparatus and probe
12/07/1999CA2008941C Tunnel probe and apparatus for simultaneously measuring electrochemical reaction and a tunneling current
12/02/1999WO1999061949A1 Optical near-field microscope
11/1999
11/30/1999US5995704 Information processing apparatus capable of readily changing resolution
11/30/1999US5994750 Microstructure and method of forming the same
11/30/1999US5994698 Microprobe, preparation thereof and electronic device by use of said microprobe
11/30/1999US5994691 Near-field scanning optical microscope
11/30/1999US5994160 Forming oxide film on walls of mold; vapor deposition of diamond particles; removal substrate
11/30/1999US5992226 Apparatus and method for measuring intermolecular interactions by atomic force microscopy
11/30/1999US5992225 Cantilever probe and scanning type probe microscope utilizing the cantilever probe
11/25/1999WO1999060330A1 Force sensing probe for scanning probe microscopy
11/25/1999DE19922653A1 Focussed ion beam control method for semiconductor device manufacture
11/25/1999DE19822871A1 Optical near-field probe for scanning near field microscopy
11/25/1999DE19822869A1 Optical near-field microscope
11/25/1999DE19822634A1 Nano-atomic force microscope for rapid and sensitive surface interatomic or intermolecular force measurement
11/23/1999US5990477 Apparatus for machining, recording, and reproducing, using scanning probe microscope
11/23/1999US5990474 Near field optical probe for simultaneous phase and enhanced amplitude contrast in reflection mode using path matched differential interferometry and method of making it
11/18/1999WO1999059149A1 Near-field optical head
11/18/1999WO1999059147A1 Near field optical head and reproduction method
11/18/1999WO1999058926A1 Scanning force microscope with high-frequency cantilever
11/18/1999WO1999058922A1 Apparatus and method for measuring intermolecular interactions by atomic force microscopy
11/17/1999EP0957333A1 Correlation sample for scanning probe microscope and method of processing the correlation sample
11/16/1999US5986267 Asymmetrically split charged coupled device
11/16/1999US5986263 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same
11/16/1999US5986262 Probe array for a scanning probe microscope
11/16/1999US5986261 Tapered structure suitable for microthermocouples microelectrodes, field emission tips and micromagnetic sensors with force sensing capabilities
11/16/1999US5986256 Scanning probe microscope using fluorescent light
11/16/1999US5985166 Immersing fiber into etchant solution flowing convectively around lower fiber portion to be etched to form tapered probe tip whereby a fiber-protective solvent having equal interfacial surface tension covers etchant solution surface
11/16/1999US5983713 Scanning probe microscope
11/16/1999US5983712 Microscope for compliance measurement
11/11/1999WO1999010705A3 A scanning probe microscope system removably attached to an optical microscope objective
11/09/1999US5982716 Magneto-optic recording system employing near field optics
11/09/1999US5982409 Optical probe element, and a recording and reproduction device using the optical probe element
11/03/1999EP0829017B1 Process for producing a probe with a coated point
11/02/1999US5978326 Information processing apparatus using an offset signal to control the position of a probe
11/02/1999US5978256 Non-volatile memory device using AFM and method for operating the device
11/02/1999US5975757 Method and apparatus for providing surface images
10/1999
10/26/1999US5973316 Sub-wavelength aperture arrays with enhanced light transmission
10/21/1999WO1999053483A1 Aromatic polyamide film for high-density magnetic recording medium
10/21/1999WO1999052973A1 Gas-barrier films
10/19/1999US5969848 Micromachined electrostatic vertical actuator
10/19/1999US5969821 Optical waveguide probe and optical system and atomic force microscope using the optical waveguide probe
10/19/1999US5969355 Focused ion beam optical axis adjustment method and focused ion beam apparatus
10/19/1999US5969345 Micromachined probes for nanometer scale measurements and methods of making such probes
10/19/1999US5969238 Thermoelectric microprobe
10/19/1999US5968677 Nonmagnetic substrate and ferromagnetic film for electroconductors
10/19/1999US5966787 Piezoelectric actuator,
10/14/1999WO1999052133A1 Depositing a material of controlled, variable thickness across a surface for planarization of that surface
10/14/1999DE19915572A1 Immersion lens for electron beam projection system
10/13/1999EP0948741A1 Method and apparatus for high spatial resolution spectroscopic microscopy
10/13/1999CN1231728A Process for identifying active substance
10/13/1999CN1231727A Contact macroradiography characterization of doped optical fibers
10/12/1999US5966482 Optical near-field probe and process for its manufacture
10/12/1999US5966053 Apparatus and method for controlling a mechanical oscillator
10/12/1999US5965881 Scanning probe microscope and processing apparatus
10/12/1999US5965218 Forming apertures where probe tips are to be; unbiased plasma chemical vapor deposition of a second material forms sharp probe tips in apertures, and a sacrificial layer that acts as shadow mask during deposition to give sharp profile
10/06/1999EP0946855A1 Method and devices for measuring distances between object structures
10/05/1999US5963367 Micromechanical xyz stage for use with optical elements
09/1999
09/30/1999WO1999049463A1 Near-field optical head
09/30/1999WO1999049462A1 Near-field optical head
09/30/1999WO1999049459A1 Recording apparatus
09/30/1999DE19822286A1 Acoustic microscope, especially with thermoacoustic wave stimulator and detector
09/29/1999EP0945904A1 Film-like composite structure and method of manufacture thereof
09/28/1999US5960255 Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it
09/28/1999US5960147 Probe, manufacturing method therefor and scanning probe microscope
09/28/1999US5959957 Probe and a cantilever formed with same material
09/28/1999US5959458 Method and apparatus for measuring electrical waveforms using atomic force microscopy
09/28/1999US5959447 Non-contact measurement of electrical waveforms on the surface of a sample using time domain gating
09/28/1999US5958701 Measurement intramolecular forces on supports
09/23/1999DE19811347A1 Surface defect detector and classifier for magnetic discs
09/21/1999US5955661 Optical profilometer combined with stylus probe measurement device
09/21/1999US5955660 Method of controlling probe microscope
09/21/1999CA2070359C Scanning probe microscope
09/14/1999US5952657 Atomic force microscope with integrated optics for attachment to optical microscope
09/07/1999US5949070 For examining surface contours of a specimen
09/07/1999US5948972 For sensing a sample
09/02/1999WO1999044198A1 Near field optical memory head
08/1999
08/31/1999CA2076925C Information processing apparatus and scanning tunnel microscope
08/26/1999DE19906591A1 Measuring method for scanning probe microscope
08/25/1999EP0938012A1 Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope
08/25/1999EP0937962A2 Method and device for micro-mechanically examining the adhesion of surface micro-particles
08/19/1999WO1999041765A1 Focused particle beam systems and methods using a tilt column
08/19/1999WO1999041741A1 Information recording apparatus
08/19/1999CA2320149A1 Focused particle beam systems and methods using a tilt column
08/18/1999EP0936291A1 Crystal growth observing apparatus
08/17/1999US5939719 Scanning probe microscope with scan correction
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