| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 12/13/1994 | US5372930 Force transducer, tip coupled to transducer, and substrate wherein tip and substrate are chemically modified |
| 12/06/1994 | US5371366 Ion scattering spectroscope |
| 12/06/1994 | US5371365 Scanning probe microscopy |
| 11/29/1994 | US5369372 Method for resistance measurements on a semiconductor element with controlled probe pressure |
| 11/24/1994 | WO1994027323A1 Preparation of nucleated silicon surfaces |
| 11/22/1994 | US5367165 Cantilever chip for scanning probe microscope |
| 11/15/1994 | US5365073 Nanofabricated structures |
| 11/15/1994 | US5363697 Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method |
| 11/10/1994 | WO1994025888A1 Optically guided macroscopic-scan-range/nanometer resolution probing system |
| 11/09/1994 | EP0623805A1 Method of manufacturing reference samples for calibrating amount of measured displacement and reference sample, and measuring instrument and calibration method |
| 11/08/1994 | US5362963 Nanometer dimension optical device with microimaging and nanoillumination capabilities |
| 11/08/1994 | US5362653 Examination of objects of macromolecular size |
| 11/08/1994 | CA2039108C Method and apparatus for detecting trace contaminents |
| 11/02/1994 | EP0622652A1 Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe |
| 11/02/1994 | EP0622608A1 Scanning apparatus for investigating surface structures with a resolution of microns and method of its manufacture |
| 11/01/1994 | US5361314 Micro optical fiber light source and sensor and method of fabrication thereof |
| 11/01/1994 | US5360978 Multiple-tip scanning tunneling microscopy |
| 11/01/1994 | US5360977 Compound type microscope |
| 10/27/1994 | WO1994024600A1 Scattered-light laser microscope |
| 10/27/1994 | WO1994024575A1 Electrooptic instrument |
| 10/25/1994 | US5359199 Specific modification of the surfaces of solids in the nanometer range by local delamination, and the storage of information units |
| 10/19/1994 | EP0620458A1 Optical waveguide device and optical instrument using the same |
| 10/19/1994 | EP0619872A1 Piezoresistive cantilever for atomic force microscopy. |
| 10/18/1994 | US5357109 Probe for scanning tunneling microscope and manufacturing method thereof |
| 10/18/1994 | US5357108 Cantilever type displacement element, and scanning tunneling microscope or information processing apparatus using same |
| 10/18/1994 | US5357105 Light modulated detection system for atomic force microscopes |
| 10/18/1994 | US5356756 Arrays of microfabricated hotplates |
| 10/18/1994 | US5356218 Probe for providing surface images |
| 10/13/1994 | WO1994023445A1 Method and apparatus for forming fine structure |
| 10/13/1994 | WO1994023065A1 Fast dna sequence determination method and use thereof in sequencing and diagnostics |
| 10/13/1994 | CA2160031A1 Rapid process for identifying a dna sequence and use thereof for sequencing and diagnostic |
| 10/13/1994 | CA2120975A1 Scanning near-field optic/atomic-force microscope, probe for use in same, and method of fabricating said probe |
| 10/11/1994 | US5354985 Near field scanning optical and force microscope including cantilever and optical waveguide |
| 10/11/1994 | US5353632 Probe for atomic force microscope usable for scanning tunneling microscope |
| 10/05/1994 | EP0618425A1 Sensor head and method for its manufacture |
| 10/04/1994 | US5352898 Method and apparatus for preparing slurry specimens for cryo-scanning electron microscopy |
| 10/04/1994 | US5352894 Electron spectroscopy analyzer and a method of correcting a shift of spectral line in electron spectroscopy |
| 10/04/1994 | CA2031733C Method for forming probe and apparatus therefor |
| 09/27/1994 | US5349735 Information detection apparatus and displacement information measurement apparatus |
| 09/21/1994 | EP0616193A1 Force-sensing system, including a magnetically mounted rocking element |
| 09/21/1994 | EP0616192A1 Scanning probe microscope and method for measuring surfaces by using this microscope |
| 09/20/1994 | US5349443 Flexible transducers for photon tunneling microscopes and methods for making and using same |
| 09/20/1994 | US5348638 Chemical adsorption |
| 09/20/1994 | US5347854 Method of two dimensional profiling of a sample surface |
| 09/14/1994 | EP0615235A2 Information recording method and information recording apparatus |
| 09/14/1994 | EP0573421B1 Installation for the study or transformation of sample surfaces in a vacuum or controlled atmosphere |
| 09/13/1994 | US5345816 Integrated tip strain sensor for use in combination with a single axis atomic force microscope |
| 09/13/1994 | US5345815 Atomic force microscope having cantilever with piezoresistive deflection sensor |
| 09/08/1994 | DE4306603A1 Acoustic microscope |
| 09/07/1994 | EP0614177A2 Information recording and reproducing apparatus using probe |
| 09/07/1994 | EP0404799B1 Integrated scanning tunneling microscope |
| 08/31/1994 | EP0613130A1 Carbon material originating from graphite and method of producing same |
| 08/31/1994 | EP0397799B1 A piezoelectric motion transducer and an integrated scanning tunneling microscope using the same |
| 08/30/1994 | USRE34708 Scanning ion conductance microscope |
| 08/30/1994 | US5343460 Information processing device and information processing method |
| 08/30/1994 | US5343042 Selective modification of individual nanometer and subnamometer structures in the surface of a solid |
| 08/24/1994 | EP0611945A1 Force microscope and method for measuring atomic forces in several directions |
| 08/24/1994 | EP0611485A1 Electromechanical positioning device. |
| 08/23/1994 | US5340981 Rear field reflection microscopy process and apparatus |
| 08/16/1994 | US5338932 Method and apparatus for measuring the topography of a semiconductor device |
| 08/09/1994 | US5337324 Method for controlling movement of neutral atom and apparatus for carrying out the same |
| 08/09/1994 | US5336369 Forming film on surface of substrate, forming resist thin film, and isotropically etching |
| 08/03/1994 | EP0608655A1 Integrated tip strain sensor for use in combination with a single axis atomic force microscope |
| 08/02/1994 | US5334835 Probe drive mechanism and electronic device which uses the same |
| 08/02/1994 | US5333495 Method and apparatus for processing a minute portion of a specimen |
| 08/02/1994 | CA2011913C Recording-reproducing apparatus, and recording-reproducing method |
| 08/02/1994 | CA1331219C Information recording device and information recording and reproducing process |
| 07/19/1994 | US5331589 Magnetic STM with a non-magnetic tip |
| 07/19/1994 | US5329808 Atomic force microscope |
| 07/12/1994 | US5329515 Information carrier, information recording and/or reproducing apparatus, and information detecting apparatus |
| 07/12/1994 | US5329513 Angular relationship detection device and method |
| 07/12/1994 | US5329236 Apparatus for estimating charged and polarized states of functional groups in a solution |
| 07/12/1994 | US5329122 Information processing apparatus and scanning tunnel microscope |
| 07/07/1994 | DE4244268A1 High resolution optical system with sensing tip |
| 07/05/1994 | US5327373 Optoelectronic memories with photoconductive thin films |
| 07/05/1994 | US5327223 Method and apparatus for generating high resolution optical images |
| 07/05/1994 | EP0619872A4 Piezoresistive cantilever for atomic force microscopy. |
| 06/29/1994 | EP0603705A2 Image signal processing apparatus |
| 06/28/1994 | US5325010 For imparting microscopic/macroscopic movements to an object |
| 06/28/1994 | US5324950 Charged particle beam apparatus |
| 06/28/1994 | US5324935 Scanning probe microscope having a directional coupler and a Z-direction distance adjusting piezoelectric element |
| 06/28/1994 | CA1330452C Oscillating quartz atomic force microscope |
| 06/21/1994 | US5323376 Atomic scale electronic switch |
| 06/21/1994 | US5323375 Information storage apparatus |
| 06/21/1994 | US5321977 Integrated tip strain sensor for use in combination with a single axis atomic force microscope |
| 06/15/1994 | EP0601852A2 An information recording and reproducing apparatus and a method for manufacturing a slider used in the same |
| 06/14/1994 | US5321685 Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same |
| 06/14/1994 | US5319977 Near field acoustic ultrasonic microscope system and method |
| 06/08/1994 | EP0600452A1 Scanning probe instrument using stored topographical data |
| 06/07/1994 | US5319197 Process for monitoring ion-assisted processing procedures on wafers and an apparatus for carrying out the same |
| 05/31/1994 | US5317533 Integrated mass storage device |
| 05/31/1994 | US5317153 Scanning probe microscope |
| 05/31/1994 | US5317152 Cantilever type probe, and scanning tunnel microscope and information processing apparatus employing the same |
| 05/31/1994 | US5317141 Apparatus and method for high-accuracy alignment |
| 05/26/1994 | DE4329985A1 Microscopic transmitter or detector of electromagnetic radiation - has two or more faces of tip coated with thin electromagnetic radiation absorbing layers, with point and edge uncoated |
| 05/24/1994 | US5315373 Method of measuring a minute displacement |
| 05/24/1994 | US5315247 Method and apparatus for measuring a magnetic field using a deflectable energized loop and a tunneling tip |
| 05/17/1994 | US5313451 Information recording/reproducing apparatus with STM cantilever probe having a strain gauge |
| 05/11/1994 | WO1994010821A1 Application of microsubstrates for materials processing |
| 05/05/1994 | DE4314301C1 Surface scanning sensor - has a sensor point of a photo-structurable glass |