| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 04/16/1996 | US5508517 Scanning probe type microscope apparatus |
| 04/16/1996 | US5507179 Synchronous sampling scanning force microscope |
| 04/10/1996 | EP0706052A2 Sensor using tunnel current |
| 04/09/1996 | US5506829 Cantilever probe and apparatus using the same |
| 04/09/1996 | US5506400 Scanning type probe microscope |
| 04/03/1996 | EP0611485B1 Electromechanical positioning device |
| 04/02/1996 | US5504366 System for analyzing surfaces of samples |
| 04/02/1996 | US5504340 Process method and apparatus using focused ion beam generating means |
| 04/02/1996 | US5503010 Directional atomic force microscope and method of observing a sample with the microscope |
| 03/27/1996 | EP0703429A2 Probe with torsion lever structure, and scanning probe microscope and record/reproducing apparatus utilizing the same |
| 03/26/1996 | US5502786 Method of forming photo-induced device and product |
| 03/21/1996 | WO1996008701A1 Electromechanical transducer |
| 03/20/1996 | EP0702204A2 A method of evaluating silicon wafers |
| 03/14/1996 | WO1996007946A1 Microscopic electromagnetic radiation transmitter or detector |
| 03/13/1996 | EP0701135A1 Single-wafer tunneling sensor and low-cost IC manufacturing method |
| 03/13/1996 | EP0701102A1 Scanning near-field optic/atomic-force microscope with observing function in liquid |
| 03/12/1996 | US5497656 Method of measuring a surface profile using an atomic force microscope |
| 03/06/1996 | EP0699341A1 Particle-optical instrument comprising a deflection unit for secondary electrons |
| 03/05/1996 | US5497000 Method of electrochemical detection/identification of single organic molecules using scanning tunneling microscopy |
| 03/05/1996 | US5496999 Scanning probe microscope |
| 02/28/1996 | EP0698296A1 Preparation of nucleated silicon surfaces |
| 02/27/1996 | US5495109 Electrochemical identification of molecules in a scanning probe microscope |
| 02/22/1996 | WO1996005531A1 Method and apparatus for performing near-field optical microscopy |
| 02/13/1996 | US5491338 High resolution imaging and measuring dynamic surface effects of substrate surfaces |
| 02/13/1996 | CA2007618C Reproducing apparatus |
| 02/08/1996 | WO1996003641A1 Scanning probe microscope assembly |
| 02/07/1996 | EP0695432A1 Scattered-light laser microscope |
| 02/06/1996 | US5490132 Apparatus including at least one probe for being displaced relative to a recording medium for recording and/or reproducing information |
| 02/06/1996 | US5489774 Combined atomic force and near field scanning optical microscope with photosensitive cantilever |
| 02/06/1996 | US5489339 Microelectronic processing machine |
| 01/30/1996 | US5488305 System and method for high-speed potentiometry using scanning probe microscope |
| 01/24/1996 | EP0693135A1 Fast dna sequence determination method and use thereof in sequencing and diagnostics |
| 01/16/1996 | US5485536 Fiber optic probe for near field optical microscopy |
| 01/16/1996 | US5485451 Information processing apparatus |
| 01/16/1996 | US5484558 Method for making flexible transducers for use with photon tunneling microscopes |
| 01/16/1996 | US5483822 For use in an atomic force microscope |
| 01/09/1996 | US5483064 Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopy |
| 01/09/1996 | US5482002 Microprobe, preparation thereof and electronic device by use of said microprobe |
| 01/02/1996 | US5481529 Scanning probe microscope for observing a sample surface while applying an AC bias voltage between the sample and a probe |
| 01/02/1996 | US5481528 Information processor and method using the information processor |
| 01/02/1996 | US5481527 Information processing apparatus with ferroelectric rewritable recording medium |
| 01/02/1996 | US5481522 Recording/reproducing method and apparatus using probe |
| 01/02/1996 | US5481521 Information recording and reproducing apparatus utilizing a tunneling current or interatomic forces |
| 01/02/1996 | US5481491 Electroconductive oxide film between substrate and insulating oxide |
| 01/02/1996 | US5480049 Method for making a fiber probe device having multiple diameters |
| 01/02/1996 | US5480046 Fiber probe fabrication having a tip with concave sidewalls |
| 12/26/1995 | US5479024 Method and apparatus for performing near-field optical microscopy |
| 12/26/1995 | US5479013 For examining a surface of a sample |
| 12/26/1995 | US5477732 Adhesion measuring method |
| 12/20/1995 | EP0687897A1 Method for making specimen and apparatus thereof |
| 12/20/1995 | EP0687889A2 Method for detecting displacement of atoms on material surface and method for local supply of heteroatoms |
| 12/19/1995 | US5476006 Crystal evaluation apparatus and crystal evaluation method |
| 12/12/1995 | US5475319 Method of measuring electric charge of semiconductor wafer |
| 12/12/1995 | US5475218 Instrument and method for 3-dimensional atomic arrangement observation |
| 12/07/1995 | WO1995033207A1 Optical fiber and its manufacture |
| 12/05/1995 | US5473157 Variable temperature near-field optical microscope |
| 12/05/1995 | US5472881 Thiol labeling of DNA for attachment to gold surfaces |
| 11/28/1995 | US5471458 Multi-probe information recording/reproducing apparatus including a probe displacement control circuit |
| 11/28/1995 | US5471064 Precision machining method, precision machining apparatus and data storage apparatus using the same |
| 11/28/1995 | US5470707 Hydrogen bond labeling and base sequence determination methods for DNA or RNA |
| 11/28/1995 | US5469733 Cantilever for atomic force microscope and method of manufacturing the cantilever |
| 11/28/1995 | CA2054334C Near field scanning optical microscope and applications thereof |
| 11/23/1995 | WO1995031693A1 Resonant measurement value sensor |
| 11/23/1995 | DE4417132A1 Resonanter Meßwertaufnehmer Resonant transducer |
| 11/23/1995 | DE4416413A1 Verfahren zum Betreiben eines Flugzeit-Sekundärionen-Massenspektrometers A method of operating a Time of Flight Secondary Ion Mass Spectrometer |
| 11/21/1995 | US5468967 Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons |
| 11/21/1995 | US5468959 Scanning probe microscope and method for measuring surfaces by using this microscope |
| 11/16/1995 | WO1995031000A1 Process for operating a time-of-flight secondary ion mass spectrometer |
| 11/14/1995 | US5466935 Programmable, scanned-probe microscope system and method |
| 11/14/1995 | US5465611 Sensor head for use in atomic force microscopy and method for its production |
| 11/07/1995 | US5465046 Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits |
| 11/07/1995 | US5464977 Scanning optical detection apparatus and method, and photoelectric conversion medium applied thereto |
| 11/07/1995 | US5463897 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 10/31/1995 | US5461907 Imaging, cutting, and collecting instrument and method |
| 10/25/1995 | EP0678752A1 Method for opens/shorts testing of capacity coupled networks in substrates using electron beams |
| 10/25/1995 | EP0406413B1 Scanning type tunnel microscope |
| 10/24/1995 | US5459939 Apparatus and method for measuring width of micro gap |
| 10/19/1995 | DE4412383A1 Scanning atomic force microscope |
| 10/11/1995 | EP0676749A2 Information reproducing device and method |
| 10/03/1995 | US5455419 Micromechanical sensor and sensor fabrication process |
| 10/03/1995 | CA2066343C Information processor |
| 09/28/1995 | WO1995026041A1 Particle-optical instrument comprising a deflection unit for secondary electrons |
| 09/28/1995 | WO1995025972A1 Optical fiber and its manufacture |
| 09/27/1995 | EP0674366A2 A microfine light source |
| 09/27/1995 | EP0674200A1 Scanning near-field optic/atomic force microscope |
| 09/27/1995 | EP0674170A1 Inter-atomic measurement techniques |
| 09/26/1995 | US5453970 Molecular memory medium and molecular memory disk drive for storing information using a tunnelling probe |
| 09/20/1995 | EP0672922A2 Method of controlling polarization properties of a photo-induced device in an optical waveguide and method of investigating structure of an optical waveguide |
| 09/19/1995 | US5452382 Optical waveguide device and optical microscope using the same |
| 09/12/1995 | US5449909 Method of measuring inertial forces acting on an object in space |
| 09/12/1995 | US5449903 Methods of fabricating integrated, aligned tunneling tip pairs |
| 09/12/1995 | US5449901 Fine surface observing apparatus |
| 09/05/1995 | US5448514 Ultra high density dimer memory device |
| 09/05/1995 | US5448421 Method for positioning an information processing head by detecting a magnetization pattern on a magnetic material positioned relative to a recording medium and a process for forming a recording and/or reproducing cantilever type probe |
| 09/05/1995 | US5448399 Optical system for scanning microscope |
| 08/30/1995 | CN1107577A Image dissection method and apparatus by photon tunnel scan |
| 08/29/1995 | US5446720 Information recording method and apparatus recording two or more changes in topographical and electrical states |
| 08/29/1995 | CA2046474C Information detection apparatus and displacement information measurement apparatus |
| 08/22/1995 | US5444260 Atomic-level imaging, processing and characterization of semiconductor surfaces |
| 08/22/1995 | US5444244 Piezoresistive cantilever with integral tip for scanning probe microscope |