| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 08/17/1999 | US5939715 For placing a probe tip opposite to a sample |
| 08/17/1999 | US5939709 Scanning probe optical microscope using a solid immersion lens |
| 08/17/1999 | US5939623 Atomic force microscope |
| 08/12/1999 | WO1999040445A1 Optical probe for proximity field |
| 08/11/1999 | EP0935137A1 Scanning probe microscope |
| 08/10/1999 | US5937118 Quantum synthesizer, THz electromagnetic wave generation device, optical modulation device, and electron wave modulation device |
| 08/10/1999 | US5936243 Conductive micro-probe and memory device |
| 08/10/1999 | US5936237 Combined topography and electromagnetic field scanning probe microscope |
| 08/05/1999 | WO1999039215A1 Multi-probe test head |
| 08/05/1999 | CA2281932A1 Multi-probe test head |
| 08/03/1999 | US5933233 Method and device for the determination of material-specific parameters of one or a few molecules by means of correlation spectroscopy |
| 08/03/1999 | US5933211 Charged beam lithography apparatus and method thereof |
| 08/03/1999 | US5932876 Tunnel effect sensor, suitable for determining the topography of a surface |
| 07/28/1999 | EP0932020A1 Micro surface measuring apparatus and probe manufacturing |
| 07/28/1999 | CN1044409C Image dissection method by photon tunnel scanning |
| 07/27/1999 | US5930434 Optical disc data storage system using optical waveguide |
| 07/27/1999 | US5929438 Cantilever and measuring apparatus using it |
| 07/27/1999 | US5928525 Method for optical fiber with tapered end core protruding from clad |
| 07/20/1999 | US5925465 Graphite-based carbon material obtained by bending at least one carbon atom layer of graphite in a selected region along lines; the bending can be accomplished with a probes of an atomic force microscope; nanostructure for microelectronics |
| 07/20/1999 | CA2098420C Near field scanning optical microscope |
| 07/14/1999 | EP0928950A2 Method for detecting and examining slightly irregular surface states, and its use for fabricating liquid crystal display devices |
| 07/13/1999 | US5923637 For use in a scanning probe microscope or information recording apparatus |
| 07/07/1999 | EP0927349A1 Contact macroradiography characterization of doped optical fibers |
| 07/06/1999 | US5920068 Analysis of semiconductor surfaces by secondary ion mass spectrometry |
| 06/29/1999 | US5918274 Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope |
| 06/29/1999 | US5917186 Focused ion beam optical axis adjustment method and focused ion beam apparatus |
| 06/24/1999 | WO1999031514A1 Optical waveguide probe and its manufacturing method |
| 06/23/1999 | EP0924529A1 Method of producing magnetic force image and scanning probe microscope |
| 06/23/1999 | EP0924524A1 Optical fiber probe and its manufacturing method |
| 06/17/1999 | WO1999030171A1 Method of producing probe of tunnel scanning microscope and the probe |
| 06/16/1999 | EP0922930A1 Scanning probe microscope with integrated deflection sensor |
| 06/15/1999 | US5912461 Probe scanning mechanism for a scanning probe microscope |
| 06/09/1999 | EP0920625A1 Active substance screening process |
| 06/08/1999 | US5910837 Photomechanical transducer |
| 06/03/1999 | WO1999027559A1 Radiofrequency gaseous detection device (rf-gdd) |
| 06/03/1999 | WO1999015851A9 Method and apparatus for obtaining improved vertical metrology measurements |
| 06/01/1999 | US5908562 Etching an end of an optical fiber made of core and cladding covering to form conically sharpened tip; forming a light-shielding coating layer; forming an aperture for exposing the tip |
| 05/26/1999 | EP0917713A1 Magneto-optic recording system employing near field optics |
| 05/25/1999 | US5907096 Detecting fields with a two-pass, dual-amplitude-mode scanning force microscope |
| 05/25/1999 | CA2118637C Information recording method and information recording apparatus |
| 05/20/1999 | WO1999024823A1 Nanoelectrode arrays |
| 05/18/1999 | US5905573 System for measuring the dimensions of structures on an object |
| 05/14/1999 | WO1999023483A1 Electrostatic force detector with cantilever for an electrostatic force microscope |
| 05/11/1999 | US5903085 Tester for testing a recording head |
| 05/06/1999 | WO1999022226A1 Method and apparatus for high spatial resolution spectroscopic microscopy |
| 05/06/1999 | WO1999014706A3 Visual inspection and verification system |
| 05/06/1999 | EP0913508A2 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device |
| 05/04/1999 | US5900729 Magnetic force microscopy probe with integrated coil |
| 05/04/1999 | US5900728 Alternating current magnetic force microscopy system with probe having integrated coil |
| 05/04/1999 | US5900618 Near-field scanning microwave microscope having a transmission line with an open end |
| 04/28/1999 | EP0911860A2 Particle beam apparatus with energy filter |
| 04/27/1999 | US5898176 Element analyzing method with a scanning type probe microscope and super short high voltage pulse applying method using the element analyzing method |
| 04/27/1999 | US5898106 Method and apparatus for obtaining improved vertical metrology measurements |
| 04/21/1999 | EP0909937A1 Semiconductor strain sensor, method of manufacturing the sensor, and scanning probe microscope |
| 04/15/1999 | DE19752202C1 Micromechanical device production involving ion deposition on substrate region |
| 04/13/1999 | US5894349 Manufacturing method including near-field optical microscopic examination of a semiconductor substrate |
| 04/13/1999 | US5894122 Scanning near field optical microscope |
| 04/07/1999 | EP0907076A2 Methods of fabricating integrated, aligned tunneling tip pairs |
| 04/06/1999 | US5892223 Multilayer microtip probe and method |
| 04/01/1999 | WO1999016102A1 Scanning evanescent electro-magnetic microscope |
| 04/01/1999 | WO1999015851A1 Method and apparatus for obtaining improved vertical metrology measurements |
| 03/31/1999 | EP0905475A1 Semiconductor strain sensor, method of manufacturing the sensor, and scanning probe microscope |
| 03/31/1999 | CN1212365A Apparatus for measuring exchange force |
| 03/30/1999 | US5888371 Method of fabricating an aperture for a near field scanning optical microscope |
| 03/30/1999 | CA2111769C Image signal processing apparatus |
| 03/25/1999 | WO1999014706A2 Visual inspection and verification system |
| 03/25/1999 | WO1999014597A1 Metal ion specific capacity affinity sensor |
| 03/25/1999 | WO1999014555A1 Lever arm for a scanning microscope |
| 03/25/1999 | DE19740763A1 Cantilever arm manufacturing method for atomic force microscope (AFM) |
| 03/25/1999 | CA2302739A1 Lever arm for a scanning microscope |
| 03/24/1999 | EP0903606A2 Micromechanical XYZ stage for use with optical elements |
| 03/24/1999 | EP0712533B1 Probe microscopy |
| 03/24/1999 | CN1211811A Chemically differentiated imaging by scanning atomic force microscopy |
| 03/23/1999 | US5885434 Measuring and storing surface topography of the workpiece during a first scan with a fine tip probe, then using the stored information to control probe position during a second scan in which an electrochemical reaction is performed |
| 03/18/1999 | DE19741122A1 Interferometric near-field device, e.g. near-field microscope for measuring and structuring material |
| 03/17/1999 | EP0584233B1 Submicron tip structure with opposed tips |
| 03/16/1999 | US5883705 Atomic force microscope for high speed imaging including integral actuator and sensor |
| 03/16/1999 | US5883387 SPM cantilever and a method for manufacturing the same |
| 03/10/1999 | EP0901120A2 Reading and writing stored information by means of electrochemistry |
| 03/09/1999 | US5880360 Method for imaging liquid and dielectric materials with scanning polarization force microscopy |
| 03/09/1999 | US5880012 Method for making semiconductor nanometer-scale wire using an atomic force microscope |
| 03/04/1999 | WO1999010705A2 A scanning probe microscope system removably attached to an optical microscope objective |
| 03/03/1999 | EP0899561A1 Microscope system equipped with an electron microscope and a scanning probe microscope |
| 03/03/1999 | EP0728322B1 Microscopic electromagnetic radiation transmitter or detector |
| 03/02/1999 | US5877891 Scanning probe microscope having a single viewing device for on-axis and oblique optical views |
| 03/02/1999 | US5877412 Probe for atomic force microscope and atomic force microscope |
| 03/02/1999 | US5877035 Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same |
| 02/23/1999 | US5874734 Atomic force microscope for measuring properties of dielectric and insulating layers |
| 02/23/1999 | US5874726 For viewing a biological cell containing fluorescent dye |
| 02/23/1999 | US5874668 Atomic force microscope for biological specimens |
| 02/11/1999 | WO1999006793A1 Microscope for compliance measurement |
| 02/10/1999 | EP0896201A1 Scanning probe microscope |
| 02/04/1999 | WO1999005530A1 Probe, method of its manufacturing, and probe-type memory |
| 02/02/1999 | US5866935 Tunneling device |
| 02/02/1999 | US5866805 Cantilevers for a magnetically driven atomic force microscope |
| 02/02/1999 | US5866328 Fast DNA sequence determination method by measuring energy of base pairing or unpairing of nucleic acid sequences and use thereof in sequencing and diagnostics |
| 02/02/1999 | US5866321 Accuracy |
| 02/02/1999 | US5866021 Method of manufacturing micro-tip and female mold substrate therefor, and method of manufacturing probe with micro-tip and the probe |
| 02/02/1999 | US5865839 Artificial retina |
| 01/26/1999 | CA2040701C Information recording/reproducing apparatus |