| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 03/05/2015 | US20150067932 Afm-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy |
| 03/05/2015 | US20150064439 Sample fixing member for nano indenter |
| 03/05/2015 | DE102013217660A1 Messsonde und verfahren zu deren herstellung Probe and methods for their preparation |
| 03/03/2015 | US8973161 Method and apparatus for nanomechanical measurement using an atomic force microscope |
| 03/03/2015 | US8969090 DNA sequencing methods and detectors and systems for carrying out the same |
| 02/26/2015 | US20150059027 Scanning electrochemical microscopy |
| 02/25/2015 | EP2840399A1 Compound microscope |
| 02/25/2015 | EP2839298A1 Optical measurement method and device |
| 02/24/2015 | US8959980 Nanomechanical testing system |
| 02/17/2015 | US8959661 Atomic force microscope probe, method for preparing same, and uses thereof |
| 02/12/2015 | WO2015020298A1 Mrfm device for biological sample |
| 02/12/2015 | US20150047080 Compound microscope with scanning probe microscope and optical microscope combined, control device of the same, control method and control program, and storage medium |
| 02/12/2015 | US20150047079 Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus |
| 02/11/2015 | CN204154647U 一种三位一体薄膜测试装置 A thin film of the Trinity test device |
| 02/11/2015 | CN102937657B 一种用于高速原子力显微成像的实时校正方法与系统 Real-time correction method for high-speed atomic force microscopy imaging system |
| 02/10/2015 | US8955161 Peakforce photothermal-based detection of IR nanoabsorption |
| 02/05/2015 | US20150034826 Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy |
| 02/04/2015 | CN104330301A 原子力显微镜卧式材料拉伸压缩试验机丝杠驱动样品支撑台 AFM horizontal tensile and compression testing machine screw driver sample support table |
| 02/03/2015 | US8950010 Method for measuring a piezoelectric response by means of a scanning probe microscope |
| 01/29/2015 | WO2015012200A1 Magnetic head inspection device and magnetic head inspection method |
| 01/29/2015 | WO2015011743A1 Metal corrosion resistance evaluation method and evaluation device using in-liquid potential measurement |
| 01/29/2015 | DE102014011272A1 Stimmgabelbasierte Nahfeldsonde für eine spektrale Messung, Nahfeldmikroskop, das selbige verwendet, und Spektralanalyseverfahren, das ein Nahfeldmikroskop verwendet Tuning fork based probes for spectral measurement, near-field microscope, the selbige used, and spectral analysis using a near-field microscope |
| 01/28/2015 | CN104316399A 原子力显微镜用卧式材料拉伸压缩试验机杠杆型拉伸夹具 Atomic force microscopy using a horizontal tensile and compression testing machine leveraged stretched fixture |
| 01/22/2015 | WO2015008402A1 Scanning probe microscope prober employing self-sensing cantilever |
| 01/22/2015 | US20150026847 Radio-frequency reflectometry scanning tunneling microscope |
| 01/21/2015 | EP2825894A1 Methods and systems for optimizing frequency modulation atomic force microscopy |
| 01/15/2015 | US20150020245 Methods and systems for optimizing frequency modulation atomic force microscopy |
| 01/14/2015 | EP2824298A1 Inorganic fiber, method of producing inorganic fiber aggregate, holding sealing material, and exhaust gas purifying apparatus |
| 01/14/2015 | CN103197102B 基于多功能探针的单细胞/单分子成像光/电综合测试仪 Probe-based multifunctional single cell / single molecule imaging optical / electrical tester |
| 01/13/2015 | US8934683 Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures |
| 01/08/2015 | US20150013037 Thermal Measurements Using Multiple Frequency Atomic Force Microscopy |
| 01/08/2015 | US20150013036 Sample fixing member for atomic force microscope |
| 01/07/2015 | CN102830260B 半导体量子阱中载流子浓度的测量方法 Semiconductor quantum well carrier concentration measurement method |
| 01/07/2015 | CN102621352B 原子力显微镜探针及其针尖以及幽门螺杆菌与胃黏液黏附能力的检测方法 AFM probe tip and its detection of Helicobacter pylori and gastric mucus adhesion ability |
| 01/06/2015 | US8925376 Fully digitally controller for cantilever-based instruments |
| 12/31/2014 | CN104253002A 一种用于超精细纳米加工的针尖 An ultra-fine tip for nanofabrication |
| 12/30/2014 | US8923595 Method of identification of cancerous and normal cells |
| 12/30/2014 | US8920700 Telescopic nanotube device for hot nanolithography |
| 12/24/2014 | CN104237568A 一种扫描近场光学显微镜有源集成探针及其制备方法 An active integrated near-field optical microscopy scanning probe and its preparation method |
| 12/24/2014 | CN103116040B 基于扫描隧道效应的在位测量装置及扫描探针自动对中方法 Based reign measuring device and scanning probe scanning tunneling AF method |
| 12/24/2014 | CN102680743B 微纳仪器装备中模板快速逼近和原位检测装置及方法 Micro-nano instrumentation templates fast approaching and in situ detection device and method |
| 12/17/2014 | CN103267876B 一种制备扫描电化学显微镜工作电极的方法 An electrochemical method of preparing the working electrode microscope scanning |
| 12/16/2014 | US8914911 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy |
| 12/16/2014 | US8912789 Magnetic force microscope and magnetic field observation method using same |
| 12/11/2014 | US20140366229 Computer-Aided Simulation Method For Atomic-Resolution Scanning Seebeck Microscope (SSM) Images |
| 12/10/2014 | CN204008700U 一种高品质因子高共振频率的带针尖的微悬臂梁扫描器 A high quality factor with high resonance frequency of the microcantilever tip scanner |
| 12/10/2014 | CN204008699U 一种基于扫描探针显微镜的激光检测装置 Based on the laser detection scanning probe microscope apparatus |
| 12/02/2014 | US8904561 Mechanical detection of Raman resonance |
| 11/27/2014 | US20140352006 Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope |
| 11/27/2014 | US20140352005 Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope |
| 11/25/2014 | US8898810 High throughout reproducible cantilever functionalization |
| 11/25/2014 | US8898809 Method and apparatus for the combined analysis of a sample with objects to be analyzed |
| 11/25/2014 | US8895923 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing |
| 11/20/2014 | US20140345007 Measurement of depth and energy of buried trap states in dielectric films by single electron tunneling force spectroscopy |
| 11/18/2014 | US8893309 Scanning tunneling microscope assembly, reactor, and system |
| 11/04/2014 | US8881311 Method and apparatus of physical property measurement using a probe-based nano-localized light source |
| 11/04/2014 | US8878147 Method and apparatus for in situ preparation of serial planar surfaces for microscopy |
| 10/28/2014 | US8875311 Scanning probe microscopy cantilever comprising an electromagnetic sensor |
| 10/21/2014 | US8869311 Displacement detection mechanism and scanning probe microscope using the same |
| 10/21/2014 | US8866505 Measurement apparatus |
| 10/16/2014 | US20140310839 Mechanical detection of raman resonance |
| 10/16/2014 | US20140306731 Method of testing semiconductor device and semiconductor testing system |
| 10/14/2014 | US8863311 Radio-frequency reflectometry scanning tunneling microscope |
| 10/14/2014 | US8857248 Piezoelectric microcantilevers and uses in atomic force microscopy |
| 10/14/2014 | US8857247 Probe for a scanning probe microscope and method of manufacture |
| 10/09/2014 | WO2014162858A1 Scanning probe microscope and scanning probe microscopy |
| 10/09/2014 | US20140304862 Quantification method and quantification apparatus for electrode material |
| 10/09/2014 | DE102005029823B4 Verfahren und Vorrichtung zur tiefenaufgelösten Nahfeldmikroskopie Method and apparatus for depth-resolved near-field microscopy |
| 10/02/2014 | WO2014157661A1 Magnetic field value measurement device and magnetic field value measurement method |
| 10/02/2014 | WO2014155983A1 Signal detection circuit and scanning probe microscope |
| 10/02/2014 | WO2014154888A1 Device for near field and far field imaging in the microwave range |
| 10/02/2014 | US20140298548 Scanning probe microscope |
| 09/30/2014 | US8850611 Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy |
| 09/30/2014 | US8849611 Intermodulation scanning force spectroscopy |
| 09/25/2014 | US20140287958 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection |
| 09/24/2014 | EP2781925A1 Sealed-type afm cell |
| 09/23/2014 | US8844061 Scanning probe microscope |
| 09/18/2014 | WO2014144496A1 Chemical nano-identification of a sample using normalized near-field spectroscopy |
| 09/18/2014 | WO2014144018A2 Dual-probe scanning probe microscope |
| 09/17/2014 | EP2776851A1 Method and apparatus of tuning a scanning probe microscope |
| 09/16/2014 | US8839461 Potential measurement device and atomic force microscope |
| 09/12/2014 | WO2014138660A1 Method and apparatus of physical property measurement using a probe-based nano-localized light source |
| 09/11/2014 | US20140259235 Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy |
| 09/09/2014 | US8832861 Near field optical microscope |
| 09/09/2014 | US8832860 Method for measuring the force interaction that is caused by a sample |
| 09/09/2014 | US8828243 Scanning probe having integrated silicon tip with cantilever |
| 09/03/2014 | EP2772765A1 Nano electrode and manufacturing method thereof |
| 09/02/2014 | US8824516 GaN-based laser device |
| 08/28/2014 | WO2014129896A1 Terahertz scanning probe microscope |
| 08/21/2014 | WO2014124913A1 Afm probe integrated dropping and hanging mercury electrode |
| 08/20/2014 | EP2767837A1 Scanning probe microscope and control method therefor |
| 08/13/2014 | EP2765413A1 AFM probe integrated dropping and hanging mercury electrode |
| 08/13/2014 | CN103983205A 微阵列型复杂曲面光学元件的复合测量系统与测量方法 Composite measuring system microarray type complex surface of the optical element and measurement methods |
| 08/06/2014 | EP2762896A1 Dc magnetic field magnetic profile measuring device and magnetic profile measuring method |
| 08/06/2014 | EP2762895A2 Nanomechnical testing system |
| 08/06/2014 | CN103969472A 一种点蚀形成过程的原位观测装置及方法 In situ observation apparatus and method for pitting formation process |
| 08/06/2014 | CN102866266B 三维微驱四电极可置换探头 Three-dimensional micro-drive four replaceable electrode probe |
| 08/05/2014 | US8798935 Imaging method and use thereof |
| 07/30/2014 | CN103954802A 长波长扫描近场显微分析系统 Long-wavelength scanning near-field microscopy analysis system |
| 07/29/2014 | US8790934 Nanoparticles |