| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 07/25/2002 | US20020096633 Light-emitting apparatus and molecule for use therein |
| 07/25/2002 | US20020095765 Macroscopic process of forming superconductors |
| 07/24/2002 | EP1224686A2 High dynamic range mass spectrometer |
| 07/24/2002 | EP0805946B1 Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system |
| 07/23/2002 | US6424421 Method and devices for measuring distances between object structures |
| 07/23/2002 | US6423967 Detection apparatus and detection method to be used for scanning probe and observation apparatus and observation method |
| 07/23/2002 | US6422069 Self-exciting and self-detecting probe and scanning probe apparatus |
| 07/23/2002 | CA2170860C Near-field optical microscope |
| 07/18/2002 | US20020093349 Method and Apparatus for Reducing the Parachuting of a Probe |
| 07/18/2002 | US20020092985 Focused ion beam machining method and focused ion beam machining apparatus |
| 07/18/2002 | US20020092982 High frequency dithering probe for high speed scanning probe microscope |
| 07/18/2002 | US20020092359 Sensor apparatus and cantilever for it |
| 07/17/2002 | EP1222439A1 Method and apparatus for molecular analysis of buried layers |
| 07/17/2002 | CN1359468A Atomic force microscope and driving method therefor |
| 07/11/2002 | US20020089339 Scanning probe microscope |
| 07/11/2002 | US20020088937 Scanning probe microscope |
| 07/11/2002 | US20020088919 Light probe microscope |
| 07/10/2002 | EP1221606A1 Scanning tunneling microscope light emitting/condensing device |
| 07/09/2002 | US6417673 Scanning depletion microscopy for carrier profiling |
| 07/09/2002 | US6417505 Near-field optical heterodyne measurement system using near-field fiber-optic probe |
| 07/04/2002 | WO2001031656A9 Technique and process for the imaging and formation of various devices and surfaces |
| 07/04/2002 | US20020084426 Focused ion beam system |
| 07/03/2002 | EP1220585A1 Apparatus for charged-particle beam irradiation, and method of control thereof |
| 07/03/2002 | EP1218947A2 Force sensing devices with multiple filled and/or empty channels and other attributes |
| 07/03/2002 | EP1218726A1 Method for direct measurement of polycarbonate composition by fluorescence |
| 07/02/2002 | US6414307 Method and apparatus for enhancing yield of secondary ions |
| 06/27/2002 | US20020082172 Accurate etching of an strontium titanate single crystal substrate by forming a patterned silica protective film and etching with phosphoric acid; superconducting quantum interfers; magnetic/electric field sensors; microscope probes |
| 06/27/2002 | US20020080710 High speed/high density optical storage system using one-dimensional multi-function/multiple probe columns |
| 06/27/2002 | US20020079446 Scanning probe microscope |
| 06/27/2002 | US20020079445 Probe and method of manufacturing mounted AFM probes |
| 06/27/2002 | DE10062049A1 Verfahren zur Abbildung einer Probenoberfläche mit Hilfe einer Rastersonde sowie Rastersondenmikroskop Method for imaging a sample surface using a scanning probe and scanning probe microscope |
| 06/25/2002 | US6411111 Electron-electro-optical debug system E2ODS |
| 06/20/2002 | WO2002048682A1 Measurement method for characteristics of a near-surface magnetic field using a scanning probe microscope |
| 06/20/2002 | WO2002048678A2 High capacity and scanning speed system for sample handling and analysis |
| 06/20/2002 | WO2002048644A1 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 06/20/2002 | US20020076184 Optical fiber probe and cantilever with microscopic aperture, and method of forming microscopic openings |
| 06/20/2002 | US20020075569 Method of fabricating optical aperture and method of fabricating probe for near field light device |
| 06/20/2002 | US20020074517 High capacity and scanning speed system for sample handling and analysis |
| 06/20/2002 | US20020074493 Multiple-source arrays for confocal and near-field microscopy |
| 06/18/2002 | US6408123 Near-field optical probe having surface plasmon polariton waveguide and method of preparing the same as well as microscope, recording/regeneration apparatus and micro-fabrication apparatus using the same |
| 06/18/2002 | US6408122 Probe for irradiating with or detecting light and method for manufacturing the same |
| 06/18/2002 | US6407806 Angle compensation method |
| 06/18/2002 | US6407558 Method of determining the doping concentration across a surface of a semiconductor material |
| 06/18/2002 | US6405584 Probe for scanning probe microscopy and related methods |
| 06/13/2002 | WO2002031464A3 Evaluating binding affinities by force stratification and force planning |
| 06/13/2002 | US20020069505 Nanotube cartridge and a method for manufacturing the same |
| 06/12/2002 | EP1213744A2 Ion implantation systems and methods |
| 06/12/2002 | EP1213716A2 Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof |
| 06/11/2002 | US6405137 Method and apparatus for performing chemical analysis using imaging by scanning thermal microscopy |
| 06/11/2002 | US6404207 Scanning capacitance device for film thickness mapping featuring enhanced lateral resolution, measurement methods using same |
| 06/11/2002 | US6401526 Carbon nanotubes and methods of fabrication thereof using a liquid phase catalyst precursor |
| 06/06/2002 | US20020068196 Thermoplastic resin and first coated film layer present on surface of film, film layer containing binder resin and organic filler; high density magnetic recording medium, durability |
| 06/06/2002 | US20020067634 AFM version of diode- and cathodoconductivity - and cathodoluminescence-based data storage media |
| 06/06/2002 | US20020067170 Scanning microwave microscope capable of realizing high resolution and microwave resonator |
| 06/06/2002 | US20020067131 Method and system for energy conversion using a screened-free-electron source |
| 06/06/2002 | US20020067120 Method for rapid screening of emission-mix using a combinatorial chemistry approach |
| 06/06/2002 | US20020066872 Ion implantation system and ion implantation method |
| 06/06/2002 | US20020066855 Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof |
| 06/06/2002 | US20020066307 Apparatus for forming optical aperture |
| 06/05/2002 | EP1211694A2 Apparatus for forming optical aperture |
| 06/05/2002 | EP1211680A2 Data storage device |
| 06/05/2002 | EP1211504A2 Apparatus for localized measurement of complex permittivity of a material |
| 06/04/2002 | US6398940 Method for fabricating nanoscale patterns on a surface |
| 05/30/2002 | WO2002042743A1 Probe for scanning microscope produced by focused ion beam machining |
| 05/30/2002 | WO2002042742A1 Cantilever for vertical scanning microscope and probe for vertical scan microscope using it |
| 05/30/2002 | WO2002042741A1 Conductive probe for scanning microscope and machining method using the same |
| 05/30/2002 | WO2001090761A3 Methods of sampling specimens for microanalysis |
| 05/30/2002 | US20020063213 Non-contact type atomic microscope and observation method using it |
| 05/30/2002 | US20020063212 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 05/30/2002 | US20020062684 Dynamic activation for an atomic force microscope and method of use thereof |
| 05/29/2002 | EP1209690A2 Method of fabricating optical aperture and method of fabricating probe for near field light device |
| 05/29/2002 | DE10033180A1 Process for optically detecting the emission and/or absorption behavior of samples used in e.g. laser scanning microscopy comprises determining a spectral centroid and/or a maximum of emission radiation and/or absorbed radiation |
| 05/28/2002 | US6396261 Scanning AC hall microscope |
| 05/28/2002 | US6396063 Radiofrequency gaseous detection device (RF-GDD) |
| 05/28/2002 | US6396054 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
| 05/28/2002 | US6396050 Self-emitting optical probe, method for producing the same, and scanning near-field optical microscope |
| 05/23/2002 | WO2001096888A3 Difference frequency imaging and spectroscopy to measure dopants using an alternating current scanning tunneling microscope |
| 05/23/2002 | US20020061603 Method of manufacturing a glass substrate for an information recording medium, and method of manufacturing an information recording medium |
| 05/21/2002 | US6392978 Method of forming light emitting portion of light spot forming device and optical element |
| 05/21/2002 | US6392229 AFM-based lithography metrology tool |
| 05/21/2002 | US6389886 Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample |
| 05/16/2002 | WO2002017383A3 Flexure based translation stage |
| 05/16/2002 | WO2001049897B1 Method for characterization and quality control of porous media |
| 05/16/2002 | US20020058343 Evaluation method of ferroelectric capacitor and wafer mounted with evaluation element |
| 05/16/2002 | US20020057433 Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation |
| 05/16/2002 | US20020057085 Squid Microscope |
| 05/16/2002 | US20020056816 Surface plasmon enhanced illumination system |
| 05/16/2002 | US20020056807 Near-field microscope |
| 05/16/2002 | DE10053034A1 SQUID microscope, has SQUID, SQUID holder, specimen holder and container that is open at top for accommodating SQUID holder, SQUID and specimen holder |
| 05/15/2002 | EP1205939A2 Near-field microscope |
| 05/14/2002 | US6389210 Probe with optical waveguide and method of producing the same |
| 05/14/2002 | US6388268 Semiconducting YBCO device and superconducting YBCO device locally converted by AFM tip and manufacturing methods therefor |
| 05/14/2002 | US6388252 Self-detecting type of SPM probe and SPM device |
| 05/14/2002 | US6388249 Surface analyzing apparatus |
| 05/14/2002 | US6388239 Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope |
| 05/14/2002 | US6387851 Strontium titanate |
| 05/14/2002 | US6387712 Process for preparing ferroelectric thin films |
| 05/10/2002 | WO2002037488A1 Afm-based data storage and microscopy |
| 05/10/2002 | WO2002037090A1 Apparatus for parallel detection of the behaviour of mechanical micro-oscillators |
| 05/09/2002 | US20020053643 Convergent charged particle beam apparatus and inspection method using same |