G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof

Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
12/2002
12/19/2002	US20020191181 Integrated circuit defect review and classification process
12/19/2002	US20020189330 Caliper method, system, and apparatus
12/19/2002	DE10224212A1 Selbstdetektierender SPM-Messkopf Selbstdetektierender SPM probe
12/18/2002	EP1266197A2 Method and arrangement for optical detection of characteristic variables of the wavelength-dependent behaviour of an illuminated sample
12/17/2002	US6495826 Monochrometer for electron beam
12/12/2002	WO2002077627A3 Patch-clamping and its use in analysing subcellular features
12/12/2002	US20020187508 Analysis of preferential nucleotide sequences for use in human therapeutics; obtain nucleic acid sequences, incubate with cutting enzyme, expose to primers, amplify, evaluate for preferential genetic disorders
12/12/2002	US20020185054 High surface quality gan wafer and method of fabricating same
12/11/2002	EP1264169A1 Method and assembly for increasing the spectral and spatial resolution of a detector
12/10/2002	US6493065 Alignment system and alignment method in exposure apparatus
12/10/2002	US6491425 Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
12/05/2002	WO2002073125B1 Apparatus and method for isolating and measuring movement in a metrology apparatus
12/05/2002	US20020183963 Method of characterizing a semiconductor surface
12/05/2002	US20020182109 Gene sequence-reading instrument
12/05/2002	US20020181344 Recording apparatus
12/05/2002	US20020180983 Shape measuring apparatus, shape measuring method, and aligning method
12/05/2002	US20020179833 SPM physical characteristic measuring method, measurement program, and SPM device
12/05/2002	US20020179434 Carbon nanotube devices
12/05/2002	US20020178846 Carbon nanotubes and methods of fabrication thereof using a catalyst precursor
12/05/2002	US20020178802 Scanning probe microscope and method of processing signals in the same
12/05/2002	US20020178801 Self-detecting type SPM probe
12/05/2002	US20020178800 Apparatus for evaluating electrical characteristics
12/05/2002	US20020178799 SPM cantilever
12/03/2002	US6489792 Charge-up measuring apparatus
12/03/2002	US6489611 Atomic force microscope for profiling high aspect ratio samples
12/03/2002	US6488767 High surface quality GaN wafer and method of fabricating same
11/2002
11/28/2002	US20020174715 Cantilever for scanning probe microscope
11/28/2002	US20020174714 System for sensing a sample
11/28/2002	DE10123443A1 Sequencing atoms/molecules using a screen tunnel microscope with an excitation signal directed at the sample, for the luminescence to be detected and evaluated
11/26/2002	US6487515 Method and apparatus for measuring thermal and electrical properties of thermoelectric materials
11/26/2002	US6486654 Calibration of magnetic force or scanning hall probe microscopes by measuring sample images and calculating instrument response functions
11/21/2002	WO2002093615A1 Scanning atom probe and analysis method using scanning atom probe
11/21/2002	WO2002093585A1 Actuating and sensing device for scanning probe microscopes
11/21/2002	US20020173222 Polishing process for glass or ceramic disks used in disk drive data storage devices
11/21/2002	US20020172943 Device and method of use for detection and characterization of pathogens and biological materials
11/21/2002	US20020171969 Optical equipment assemblies and techniques
11/21/2002	US20020171038 Scanning type probe microscope probe and method of producing the same, and a scanning type probe microscope having this probe and polymer processing method using the same
11/20/2002	EP1257780A1 Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device
11/14/2002	WO2002073126B1 Apparatus and method for isolating and measuring movement in metrology apparatus
11/14/2002	US20020167889 Recovering recorded information from an optical disk
11/14/2002	US20020167327 Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions
11/14/2002	US20020167008 Enhanced probe for gathering data from semiconductor devices
11/14/2002	US20020166957 Near-field light-generating element, near-field optical recording device, and near-field optical microscope
11/14/2002	US20020166368 Specimen observation method in atomic force microscopy and atomic force microscope
11/13/2002	EP1256962A1 Actuating and sensing device for scanning probe microscopes
11/12/2002	US6479980 Thin film spin probe
11/12/2002	US6479892 Enhanced probe for gathering data from semiconductor devices
11/12/2002	US6479820 Electrostatic charge reduction of photoresist pattern on development track
11/12/2002	US6479817 Cantilever assembly and scanning tip therefor with associated optical sensor
11/12/2002	US6479816 Near-field optical probe
11/07/2002	US20020164505 Substrate for information recording medium, information recording medium, and method for controlling surface of substrate for information recording medium
11/07/2002	US20020162960 Hyperbaric hydrothermal atomic force microscope
11/05/2002	US6477132 Probe and information recording/reproduction apparatus using the same
11/05/2002	US6476386 Method and device for tunnel microscopy
11/05/2002	US6475650 Ferromagnetic material and magnetic apparatus employing the ferromagnetic material
10/2002
10/31/2002	WO2002010831A3 Differential interferometric scanning near-field confocal microscopy
10/31/2002	US20020158637 Method and apparatus for self-calibration of capacitive sensors
10/31/2002	US20020158197 AFM-based lithography metrology tool
10/31/2002	US20020157457 Method and apparatus for performing atomic force microscopy measurements
10/30/2002	EP1252634A1 Instrument and method for combined surface topography and spectroscopic analysis
10/30/2002	EP1252542A1 Method and device for analysing molecular reaction products in biological cells
10/30/2002	CN2519270Y Lens of high precision scanning tunnel microscope
10/30/2002	CN1376906A Magnetic scanning detector and probe thereof
10/29/2002	US6473351 Nanocapsules containing charged particles, their uses and methods of forming same
10/29/2002	US6470738 Rotating probe microscope
10/24/2002	WO2002084210A1 Scanning probe microscope provided with a liquid cell
10/24/2002	US20020154859 Near field light probe, near field optical microscope, near field light lithography apparatus, and near field light storage apparatus that have the near field light probe
10/24/2002	US20020154301 Apertureless near-field scanning raman microscopy using reflection scattering geometry
10/24/2002	US20020152804 Cantilever for scanning probe microscopy
10/23/2002	EP1251383A2 Near-field light-generating element, near-field optical recording device, and near-field optical microscope
10/23/2002	EP1250584A2 Method for characterization and quality control of porous media
10/23/2002	CN1375891A Electric connecting structure, its producing method and electric wiring method
10/22/2002	US6469293 Multiprobe and scanning probe microscope
10/22/2002	US6469288 Near field optical microscope and probe for near field optical microscope
10/17/2002	US20020150398 Flexure based macro motion translation stage
10/17/2002	US20020149362 Scanning magnetism detector and probe
10/17/2002	US20020148955 Multiple-source arrays with optical transmission enhanced by resonant cavities
10/17/2002	US20020148954 Signal detector and probe microscope using the same
10/15/2002	US6466895 Defect reference system automatic pattern classification
10/15/2002	US6466537 Recording apparatus
10/15/2002	US6466039 Ferroelectric film property measuring device, measuring method therefor and measuring method for semiconductor memory units
10/15/2002	US6465965 Method and system for energy conversion using a screened-free-electron source
10/15/2002	US6464600 Golf ball
10/10/2002	WO2002080216A1 Method and system for energy conversion using a screened-free-electron source
10/10/2002	WO2002080187A1 Array and method for quasi-parallel probe microscopy
10/10/2002	WO2002080186A1 Afm cantilevers and methods for making and using same
10/10/2002	WO2001096888A9 Difference frequency imaging and spectroscopy to measure dopants using an alternating current scanning tunneling microscope
10/10/2002	US20020146714 Detecting single nucleotide polymorphism in gene sample; obtain sample, place on microscope, generate image, analyze and detect nucleotide sequence adjustment
10/10/2002	DE10115690A1 Quasi-Paralleles Rasterkraftmikroskop Quasi-Parallel scanning force microscope
10/08/2002	US6461726 Laminate film with organic particulate for a magnetic recording medium
10/08/2002	US6461528 Method of fabricating lateral nanopores, directed pore growth and pore interconnects and filter devices using the same
10/03/2002	WO2002077627A2 Patch-clamping and its use in analysing subcellular features
10/03/2002	WO2002063613A3 A system and method for high resolution optical imaging, data storage, lithography, and inspection
10/03/2002	WO2002001222A3 Method and device for detecting dyes in the field of fluorescence microscopy
10/03/2002	US20020142453 Optical amplification of molecular interactions using liquid crystals
10/03/2002	US20020139923 Scanning probe microscope with probe integrated in an optical system
10/03/2002	US20020139178 Submerged sample observation apparatus and method
10/02/2002	EP0769158B1 Device for optically scanning objects on a scanning surface and process for operating it
10/01/2002	US6459280 Capacitance devices for film thickness mapping, measurement methods using same
10/01/2002	US6459082 Focused ion beam system

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