| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 02/27/2003 | WO2003016880A1 Microfluidic and microhollow cathode discharge apparatus |
| 02/27/2003 | WO2003016874A1 Vibration type probe sensor |
| 02/27/2003 | WO2003016781A2 Surface plasmon enhanced illumination system |
| 02/27/2003 | US20030039429 Scattering type near-field probe, and method of manufacturing the same |
| 02/27/2003 | US20030038233 Probe opening fabricating apparatus, and near-field optical microscope using the same |
| 02/27/2003 | US20030037605 Conductive transparent probe and probe control apparatus |
| 02/26/2003 | EP0650593B1 System for detecting atomic or molecular spectra of a substance, and/or threshold phenomena associated with the same |
| 02/25/2003 | US6525316 Multiaxis actuator and measuring head, especially for a scanning probe microscope |
| 02/20/2003 | WO2002022889A9 Direct haplotyping using carbon nanotube probes |
| 02/20/2003 | US20030036204 Surface plasmon enhanced illumination system |
| 02/20/2003 | US20030035238 Optical to magnetic alignment in magnetic tape system |
| 02/20/2003 | US20030034740 MHCD and microfluidic apparatus and method |
| 02/20/2003 | US20030034453 Coaxial probe and scanning micro-wave microscope including the same |
| 02/20/2003 | US20030033863 Atomic force microscopy for high throughput analysis |
| 02/18/2003 | US6521921 Scanning probe microscope (SPM) probe having field effect transistor channel and method of fabricating the same |
| 02/18/2003 | US6521890 Focused ion beam machining method and focused ion beam machining apparatus |
| 02/18/2003 | US6521466 Apparatus and method for semiconductor wafer test yield enhancement |
| 02/18/2003 | US6520005 System for sensing a sample |
| 02/13/2003 | WO2002080216A9 Method and system for energy conversion using a screened-free-electron source |
| 02/13/2003 | WO2002010830A3 Multiple-source arrays for confocal and near-field microscopy |
| 02/13/2003 | US20030032076 Monitoring enzyme activity in sample; obtain enzyme sample, insert into resealable apparatus, expose to substrate, measure enzyme activity |
| 02/13/2003 | US20030032046 Peelable and resealable devices for biochemical assays |
| 02/13/2003 | US20030030449 Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
| 02/13/2003 | US20030029996 Probe for scanning microscope produced by focused ion beam machining |
| 02/12/2003 | CN1397012A Probe for scanning microscope produced by focused ion beam machining |
| 02/12/2003 | CN1397011A Cantilever for vertical scanning microscope and probe for vertical scan microscope using it |
| 02/12/2003 | CN1397010A Conductive probe for scanning microscope and machining method using the same |
| 02/11/2003 | US6519221 High-density data storage using atomic force microscope |
| 02/11/2003 | US6518872 High resolution scanning thermal probe and method of manufacturing thereof |
| 02/11/2003 | US6518571 Through-the-substrate investigation of flip-chip IC's |
| 02/11/2003 | US6518570 Sensing mode atomic force microscope |
| 02/06/2003 | WO2002048678A3 High capacity and scanning speed system for sample handling and analysis |
| 02/06/2003 | US20030025498 Scanning probe microscope |
| 02/05/2003 | EP1282121A2 Optical near-field generating element and optical apparatus including the same |
| 02/05/2003 | EP1280654A1 Method for applying a layer containing at least polymeric material |
| 02/05/2003 | CN1395681A Scanning type probe microscope probe and method of producing the same, and scanning type probe microscope having this probe and polymer processing method using the same |
| 02/04/2003 | US6515898 Memory element, method for structuring a surface, and storage device |
| 02/04/2003 | US6515277 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
| 02/04/2003 | US6515274 Near-field scanning optical microscope with a high Q-factor piezoelectric sensing element |
| 01/30/2003 | WO2003009305A2 Measurement head for atomic force microscopy and other applications |
| 01/30/2003 | WO2003008941A2 Combined molecular blinding detection through force microscopy and mass spectrometry |
| 01/30/2003 | US20030022470 Parallel, individually addressable probes for nanolithography |
| 01/23/2003 | WO2003007328A1 Device for reducing the impact of distortions in a microscope |
| 01/23/2003 | WO2003006952A2 Method and apparatus for manipulating a sample |
| 01/23/2003 | WO2002010832A3 Scanning interferometric near-field confocal microscopy with background amplitude reduction and compensation |
| 01/23/2003 | WO2002010829A3 Multiple-source arrays with optical transmission enhanced by resonant cavities |
| 01/23/2003 | WO2001063555A3 Image deconvolution techniques for probe scanning apparatus |
| 01/23/2003 | US20030015653 Measurement head for atomic force microscopy and other applications |
| 01/23/2003 | US20030015651 Optical apparatuses using the near-field light |
| 01/22/2003 | EP1278205A2 Method of fabricating near-field light-generating element |
| 01/22/2003 | EP1278056A1 Probe for scanning microscope produced by focused ion beam machining |
| 01/22/2003 | EP1278055A1 Cantilever for vertical scanning microscope and probe for vertical scan microscope using it |
| 01/21/2003 | US6510120 Method for writing and/or erasing high density data on a media |
| 01/21/2003 | US6509569 Deflection arrangement for separating two particle beams |
| 01/21/2003 | US6508110 Atomic force microscope |
| 01/16/2003 | US20030013111 Method and apparatus for solid state molecular analysis |
| 01/16/2003 | US20030011722 Method of fabricating near-field light-generating element |
| 01/16/2003 | US20030011389 Nano-substance mass measurement method and apparatus |
| 01/16/2003 | US20030010911 Instrument and method for combined surface topography and spectroscopic analysis |
| 01/16/2003 | US20030010755 Nanotube length control method |
| 01/16/2003 | US20030010100 Cantilever for vertical scanning microscope and probe for vertical scan microscope |
| 01/16/2003 | US20030010099 Scanning probe microscope |
| 01/15/2003 | EP1274966A2 Resonant probe driving arrangement and scanning probe microscope |
| 01/15/2003 | EP1038171A4 Nanoelectrode arrays |
| 01/14/2003 | US6507553 Nanometer scale data storage device and associated positioning system |
| 01/14/2003 | US6507552 AFM version of diode-and cathodoconductivity-and cathodoluminescence-based data storage media |
| 01/14/2003 | US6507474 Using localized ionizer to reduce electrostatic charge from wafer and mask |
| 01/14/2003 | US6507197 Electrostatic force detector with cantilever for an electrostatic force microscope |
| 01/14/2003 | US6507017 Near-field optical inspection apparatus |
| 01/09/2003 | WO2003003119A1 Repair of amplitude defects in a multilayer coating |
| 01/09/2003 | US20030006214 Method to repair localized amplitude defects in a EUV lithography mask blank |
| 01/09/2003 | US20030005755 Enhanced scanning probe microscope |
| 01/07/2003 | US6504386 Liquid dielectric capacitor for film thickness mapping, measurement methods using same |
| 01/07/2003 | US6504365 Magnetic force microscope |
| 01/07/2003 | US6504164 Electron beam apparatus |
| 01/03/2003 | WO2003001145A1 Scanning interferometry with reference signal |
| 01/03/2003 | WO2002018266A8 Single molecule array on silicon substrate for quantum computer |
| 01/03/2003 | WO2002010828A3 Control of position and orientation of sub-wavelength aperture array in near-field microscopy |
| 01/02/2003 | US20030004905 System and method for deconvoluting the effect of topography on scanning probe microscopy measurements |
| 01/02/2003 | US20030003676 Ultra-fine alignment system and method using acoustic-AFM interaction |
| 01/02/2003 | US20030001641 Apparatus and method for providing square wave to atomic force microscope |
| 01/02/2003 | US20030001091 Conductive probe for scanning microscope and machining method using the same |
| 01/02/2003 | EP1271554A2 Scanning probe microscope |
| 01/02/2003 | EP1271135A2 System and method for deconvoluting the effect of topography on scanning probe microscopy measurements |
| 01/02/2003 | EP1269480A1 Atomic force microscope |
| 01/02/2003 | EP1269168A1 Methods and apparatus for atomic force microscopy |
| 01/02/2003 | EP1269112A1 Thickness measurement using afm for next generation lithography |
| 12/31/2002 | US6501725 Method of recording/reproducing an information signal |
| 12/31/2002 | US6499340 Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope |
| 12/27/2002 | WO2002103328A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
| 12/27/2002 | WO2002102523A1 Method and apparatus for solid state molecular analysis |
| 12/27/2002 | WO2002068919A8 Apertureless near-field scanning raman microscopy using reflection scattering geometry |
| 12/26/2002 | US20020197639 Methods and products for analyzing nucleic acids based on methylation status |
| 12/26/2002 | US20020196450 Scanning interferometry with reference signal |
| 12/26/2002 | US20020195553 High sensitivity deflection sensing device |
| 12/24/2002 | US6498776 Near field light emitting element and optical head |
| 12/24/2002 | US6497194 Focused particle beam systems and methods using a tilt column |
| 12/19/2002 | WO2002101353A2 Methods and products for analyzing nucleic acids based on methylation status |
| 12/19/2002 | WO2002101121A1 High surface quality gan wafer and method of fabricating same |
| 12/19/2002 | WO2002101095A1 Methods and products for analyzing nucleic acids using nick translation |