| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 07/31/2003 | US20030142614 Record condition extraction system and method of dielectric recording medium, and information recording apparatus |
| 07/31/2003 | US20030142456 Nanoscale grasping device, method for fabricating the same, and method for operating the same |
| 07/31/2003 | US20030141444 Near-field optical probe |
| 07/30/2003 | EP1330823A1 Afm-based data storage and microscopy |
| 07/30/2003 | EP1330742A1 Integrated verification and manufacturability tool |
| 07/30/2003 | EP1330651A2 Evaluating binding affinities by force stratification and force planning |
| 07/30/2003 | EP1250584B1 Method for characterization and quality control of porous media |
| 07/30/2003 | EP1080340B1 Force sensing cantilever for atomic force microscope |
| 07/30/2003 | EP1076803B1 Measuring intermolecular interactions by atomic force microscopy |
| 07/29/2003 | US6600856 Lensed optical fibers and unique micropipettes with subwavelength apertures |
| 07/24/2003 | US20030139066 Laser annealing method and laser annealing device |
| 07/24/2003 | US20030137772 Surface plasmon lens for heat assisted magnetic recording |
| 07/24/2003 | US20030137216 Resonant probe driving arrangement and a scanning probe microscope including such an arrangement |
| 07/24/2003 | US20030136906 Analysis of semiconductor surfaces by secondary ion mass spectrometry and methods |
| 07/23/2003 | EP1329938A2 Ion irradiation system |
| 07/23/2003 | EP1329686A2 Integrated measuring instrument |
| 07/22/2003 | US6597639 Assembly suitable for writing high density data on a ferroelectric media |
| 07/22/2003 | US6597194 Difference frequency imaging and spectroscopy to measure dopants using an alternating current scanning tunneling microscope |
| 07/22/2003 | US6597185 Apparatus for localized measurements of complex permittivity of a material |
| 07/22/2003 | US6597090 Method for manufacturing carbon nanotubes as functional elements of MEMS devices |
| 07/22/2003 | US6596992 Method of operating scanning probe microscope |
| 07/17/2003 | WO2003058641A2 Surface plasmon lens for heat assisted magnetic recording |
| 07/17/2003 | WO2003058260A1 Electrical feedback detection system for multi-point probes |
| 07/17/2003 | US20030134273 Combined molecular binding detection through force microscopy and mass spectrometry |
| 07/17/2003 | US20030133324 Memory element, method for structuring a surface, and storage device |
| 07/17/2003 | US20030132376 Tip calibration standard and method for tip calibration |
| 07/16/2003 | EP1326589A2 Nanoparticles |
| 07/16/2003 | CN1430257A Ion irradiating device |
| 07/15/2003 | US6593571 Scanning probe microscope |
| 07/15/2003 | US6593040 Analyzing defect; supplying, controlling actinic radiation |
| 07/10/2003 | WO2003056567A2 Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture |
| 07/10/2003 | WO2003056351A1 Probe for an atomic force microscope and method for making such a probe |
| 07/10/2003 | WO2002010829A8 Multiple-source arrays with optical transmission enhanced by resonant cavities |
| 07/10/2003 | US20030130823 Method for enhancement in screening throughput |
| 07/10/2003 | US20030129753 High-throughput assay; Raman spectometry; micrographs; drug screening |
| 07/10/2003 | US20030128945 Optical near-field generating element and optical apparatus including the same |
| 07/10/2003 | US20030128634 Surface plasmon lens for heat assisted magnetic recording |
| 07/10/2003 | US20030127041 Lapping, mechanical polishing, and reducing internal stress of a gallium, aluminum and indium nitride wafer by thermal annealing or chemical etching; crystallographic plane surfaces |
| 07/08/2003 | US6590703 Optical system for scanning microscope |
| 07/08/2003 | US6590208 Balanced momentum probe holder |
| 07/08/2003 | CA2307363C Enhanced optical transmission apparatus with improved inter-surface coupling |
| 07/03/2003 | US20030126581 User interface for a network-based mask defect printability analysis system |
| 07/03/2003 | US20030122073 Coated nanotube surface signal probe and method of attaching nanotube to probe holder |
| 07/03/2003 | US20030122072 Probe for scanning probe microscope |
| 07/02/2003 | CN1427445A Defect and conductivity processing method for conductive nano-structure |
| 07/01/2003 | US6587426 Recording medium having information reproducible using near-field light |
| 07/01/2003 | US6586885 Integrated microhollow cathode discharge cavity in combination with a microfluidic channel |
| 07/01/2003 | US6586734 Hyperbaric hydrothermal atomic force microscope |
| 06/26/2003 | WO2003052870A1 Optical disc head including a bowtie grating antenna and slider for optical focusing, and method for making |
| 06/26/2003 | US20030121022 Method and its apparatus for manufacturing simiconductor device |
| 06/26/2003 | US20030116710 Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device |
| 06/26/2003 | US20030115939 Scanning probe microscope |
| 06/24/2003 | US6584062 Near-field optical recording apparatus assistively heating recording medium |
| 06/24/2003 | US6583619 Squid microscope |
| 06/24/2003 | US6583411 Multiple local probe measuring device and method |
| 06/19/2003 | WO2003050821A1 Force scanning probe microscope |
| 06/19/2003 | US20030110844 Force scanning probe microscope |
| 06/18/2003 | EP1319199A2 Pinhole defect repair by resist flow |
| 06/17/2003 | US6580852 Optical fiber probe and cantilever with microscopic aperture, and method of forming microscopic openings |
| 06/17/2003 | US6580677 Information recording medium and information reproducing apparatus |
| 06/17/2003 | US6578410 Resistive cantilever spring for probe microscopy |
| 06/12/2003 | US20030108235 Method and system for quantifying the step profile characteristics semiconductor features using surface analysis data |
| 06/11/2003 | EP1015843B1 Lever arm for a scanning microscope |
| 06/11/2003 | CN1111279C Nano near-field optical clamping method |
| 06/10/2003 | US6578188 Method and apparatus for a network-based mask defect printability analysis system |
| 06/10/2003 | US6576900 Methods of sampling specimens for microanalysis |
| 06/10/2003 | US6576894 Structure for FIB based microanalysis and method for manufacturing it |
| 06/10/2003 | US6574852 Macroscopic process of forming superconductors |
| 06/05/2003 | WO2003046519A1 Delay time modulation femtosecond time-resolved scanning probe microscope apparatus |
| 06/05/2003 | WO2003045839A1 Novel tip optical effects for producing photosensitive polymer nanostructures, uses in nanophotolithography and high density data storage |
| 06/05/2003 | US20030102863 Magnetic force microscopy having a magnetic probe coated with exchange coupled magnetic multiple layers |
| 06/04/2003 | EP1315667A1 Single molecule array on silicon substrate for quantum computer |
| 06/03/2003 | US6574257 Near-field laser and detector apparatus and method |
| 06/03/2003 | US6573369 Method and apparatus for solid state molecular analysis |
| 05/30/2003 | WO2003008941A3 Combined molecular blinding detection through force microscopy and mass spectrometry |
| 05/30/2003 | WO2002014862A3 Method and device for characterising and/or for detecting a bonding complex |
| 05/29/2003 | US20030099329 System and method for scanning near-field optical tomography |
| 05/27/2003 | US6570390 Method for measuring surface leakage current of sample |
| 05/22/2003 | WO2003043051A1 Measurement device for electron microscope |
| 05/22/2003 | WO2003042627A2 Field effect transistor sensor for a screen probe microscope |
| 05/22/2003 | US20030096139 Magnetic recording medium |
| 05/22/2003 | US20030094036 Active probe for an atomic force microscope and method of use thereof |
| 05/21/2003 | CN1109239C Process for preparing mica substrate for DNA manipulation |
| 05/20/2003 | US6567770 Remote semiconductor microscopy |
| 05/20/2003 | US6566885 Multiple directional scans of test structures on semiconductor integrated circuits |
| 05/20/2003 | US6566650 Incorporation of dielectric layer onto SThM tips for direct thermal analysis |
| 05/15/2003 | US20030089858 Electron beam lithography system and method |
| 05/15/2003 | US20030089163 System for sensing a sample |
| 05/15/2003 | US20030089162 Dual stage instrument for scanning a specimen |
| 05/14/2003 | EP0752601B1 Optical fiber and its manufacture |
| 05/13/2003 | US6563782 Information recording medium having double-layer structure, and information reproducing apparatus and information recording and reproducing apparatus utilizing information recording medium having double-layer structure |
| 05/13/2003 | US6563321 Method and apparatus for detecting line-shorts by potential and temperature distribution |
| 05/13/2003 | US6562633 Assembling arrays of small particles using an atomic force microscope to define ferroelectric domains |
| 05/08/2003 | WO2003038147A2 High resolution patterning method |
| 05/08/2003 | WO2003038108A2 Pre-existing nucleic acids covalently attached to a metal surface or a metal cluster, intermediates thereof and methods of using same |
| 05/08/2003 | WO2003038033A2 Protein and peptide nanoarrays |
| 05/08/2003 | US20030088379 Electron beam test system and electron beam test method |
| 05/08/2003 | US20030086094 Microforce measurement method and apparatus |
| 05/08/2003 | US20030085351 Optical fiber probe and scanning probe microscope provided with the same |
| 05/07/2003 | CN1415963A Method and senser for detcting biomolecular conjunction through measuring shearing stress |