Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
01/2004
01/06/2004US6672144 Dynamic activation for an atomic force microscope and method of use thereof
01/02/2004EP1376650A1 Scanning atom probe and analysis method using scanning atom probe
01/02/2004EP1373959A2 Multiple-source arrays with optical transmission enhanced by resonant cavities
01/01/2004US20040001371 Information storage and retrieval device using macromolecules as storage media
12/2003
12/31/2003WO2004001764A2 Method and device for recording optical near field interaction signals
12/31/2003WO2003076954A3 High resolution scanning magnetic microscope operable at high temperature
12/30/2003US6668652 Nano-substance mass measurement method and apparatus
12/30/2003US6668628 Scanning probe system with spring probe
12/30/2003US6668627 Sensor apparatus with magnetically deflected cantilever
12/25/2003US20030237064 Characterization and verification for integrated circuit designs
12/25/2003US20030235715 Electromagnetic characteristics and running durability
12/25/2003US20030234367 Electron beam control device
12/25/2003US20030234358 Piezo-noise microscope and methods for use thereof
12/25/2003US20030234237 Method of, and apparatus for, producing near field optical head
12/25/2003US20030233871 Multi-walled carbon nanotube scanning probe apparatus having a sharpened tip and method of sharpening for high resolution, high aspect ratio imaging
12/25/2003US20030233870 Multidimensional sensing system for atomic force microscopy
12/24/2003WO2003106620A2 Nucleic acid sequencing by signal stretching and data integration
12/23/2003US6667809 Scanning interferometric near-field confocal microscopy with background amplitude reduction and compensation
12/23/2003US6667467 Microprobe and scanning probe apparatus having microprobe
12/23/2003US6666075 System and method of multi-dimensional force sensing for scanning probe microscopy
12/18/2003WO2003083437A3 Method and apparatus for identifying molecular species on a conductive surface
12/18/2003US20030232346 Measuring the distance between labeled nucleotides, such as nucleotides labeled with bulky groups
12/18/2003US20030230732 Ion irradiation system
12/18/2003US20030230709 Probe, near-field light generation apparatus including probe, exposure apparatus, and exposing method using probe
12/17/2003EP1370863A2 Patch-clamping and its use in analysing subcellular features
12/17/2003EP1370839A1 Apertureless near-field scanning raman microscopy using reflection scattering geometry
12/17/2003EP1370690A2 Arrays and methods of use
12/17/2003CN2593320Y Scanning probe of scanning tunnel microscope
12/17/2003CN2593319Y Shock-absorbing scanning probe of scanning tunnel microscope
12/17/2003CN1462039A Magnetic nano-pipe
12/16/2003US6664540 Microprobe and sample surface measuring apparatus
12/11/2003WO2003102966A2 Method of forming atomic force microscope tips
12/11/2003WO2003102609A1 Direct, low frequency capacitance measurement for scanning capacitance microscopy
12/11/2003WO2003102549A1 Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using same
12/11/2003WO2003101904A1 Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof
12/11/2003WO2003101278A2 Device and method of use for detection and characterization of pathogens and biological materials
12/11/2003WO2003038033A3 Protein and peptide nanoarrays
12/11/2003US20030229881 Adjustment of masks for integrated circuit fabrication
12/11/2003US20030229880 Test masks for lithographic and etch processes
12/11/2003US20030229868 Electronic design for integrated circuits based process related variations
12/11/2003US20030229412 Electronic design for integrated circuits based on process related variations
12/11/2003US20030229410 Integrated circuit metrology
12/11/2003US20030228489 Magnetic recording tape
12/11/2003US20030226955 Fabry-perot resonator and system for measuring and calibrating displacement of a cantilever tip using the same in atomic force microscope
12/11/2003CA2487792A1 Device and method of use for detection and characterization of pathogens and biological materials
12/10/2003CN1461012A Selective growth method of integrated microprote for ultrahigh density optical memory
12/09/2003US6661004 Image deconvolution techniques for probe scanning apparatus
12/04/2003US20030224170 Magnetic carbon nanotube
12/04/2003US20030223316 Information recording and reproducing head, information recording and reproducing apparatus, and information recording method
12/04/2003US20030223087 Method and its apparatus for measuring size and shape of fine patterns
12/02/2003US6656662 Method of forming a polymer molecule chain
12/02/2003US6655196 Scanning probe microscope
11/2003
11/27/2003WO2003098208A1 Molecular topological frationation of macromolecules
11/27/2003US20030218132 Scanning probe microscope
11/27/2003US20030218115 Method of recording and reading information using molecular rotation
11/25/2003US6654114 Integrated circuit defect review and classification process
11/20/2003WO2003096429A1 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
11/20/2003WO2003096409A1 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
11/20/2003WO2003019241A3 Diffractive optical position detector
11/20/2003US20030215864 Improved DNA hybridization/conjugation
11/20/2003US20030214285 Property evaluating system and method for magnetic material
11/19/2003EP1362230A1 Balanced momentum probe holder
11/18/2003US6649902 Summing the output of an array of optical detector segments in an atomic force microscope
11/18/2003US6649901 Enhanced optical transmission apparatus with improved aperture geometry
11/18/2003US6649894 Optical near field generator
11/13/2003WO2003094173A1 Device for controlling an excitation signal from a resonant mechanical oscillating element, measuring device, method of controlling the excitation signal, method of taking measurements, computer program and storage device
11/13/2003WO2003093807A1 Near-field transform spectroscopy
11/13/2003US20030211336 Optical recording media; multilayer
11/13/2003US20030209060 Apparatus and method for isolating and measuring movement in metrology apparatus
11/12/2003EP1360538A1 Scanning near-field optical microscope
11/06/2003WO2003091455A1 Compositions and methods related to two-arm nucleic acid probes
11/06/2003US20030208340 Remote semiconductor microscopy
11/06/2003US20030207184 Method and apparatus for repairing an alternating phase shift mask
11/06/2003US20030206296 Method for the detection of dyes in fluorescence microscopy
11/05/2003CN1126950C Scanning method adapted to scanning tunnel microscope
11/04/2003US6643068 Collimators and collimator arrays employing ellipsoidal solid immersion lenses
11/04/2003US6643012 Apertureless near-field scanning raman microscopy using reflection scattering geometry
11/04/2003US6642538 Voltage controlled nonlinear spin filter based on paramagnetic ion doped nanocrystal
11/04/2003US6642517 Method and apparatus for atomic force microscopy
11/04/2003US6642129 Parallel, individually addressable probes for nanolithography
11/04/2003US6640433 Forming organic thin film by building up of monomolecular film, baking to produce amorphous carbon or graphite, microcutting, applying electroconductive film
10/2003
10/30/2003WO2003090262A1 Apparatus and method for semiconductor wafer test yield enhancement
10/30/2003US20030203502 Near-field transform spectroscopy
10/30/2003US20030200798 Atomic force microscope
10/28/2003US6639686 Method of and apparatus for real-time continual nanometer scale position measurement by beam probing as by laser beams and the like of atomic and other undulating surfaces such as gratings or the like relatively moving with respect to the probing beams
10/23/2003WO2003087859A1 Probe for magnetic force microscopy and method of preparing such a probe
10/23/2003US20030199395 High-Tc superconducting products. Completely sealed high-Tc superconducting ceramic oxide provides are made by a macroscopic process including the steps of pressing a superconducting ceramic oxide powder into a hollow body of a
10/23/2003US20030197456 Devices containing a carbon nanotube
10/23/2003US20030197130 Convergent charged particle beam apparatus and inspection method using same
10/23/2003US20030197123 Micromachined microprobe
10/23/2003US20030197120 Nanotube, near-field light detecting apparatus and near-field light detecting method
10/22/2003EP1354234A1 Optisches system und verfahren zum anregen und messen von fluoreszenz an oder in mit fluoreszensfarbstoffen behandelten proben
10/21/2003US6635870 Method and apparatus for molecular analysis of buried layers
10/16/2003WO2003033127A3 Methods of patterning a monolayer
10/16/2003WO2003025540A3 Differential tagging of polymers for high resolution linear analysis
10/16/2003WO2003006952A3 Method and apparatus for manipulating a sample
10/16/2003WO2002063368A8 Scanning near-field optical microscope
10/16/2003US20030193666 Device for measuring surface defects
10/16/2003US20030193660 Measuring module
10/16/2003US20030193023 Analysis of semiconductor surfaces by secondary ion mass spectrometry and methods
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