Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
10/2003
10/15/2003EP1353209A2 Scanning device, preferably for detecting fluorescent light
10/15/2003EP1002216B1 Microscope for compliance measurement
10/15/2003CN1449359A Single molecule array on silicon substrate for quantum computer
10/14/2003US6633711 Focused ion-beam fabrication of fiber probes for use in near field scanning optical microscopy
10/09/2003WO2003083437A2 Method and apparatus for identifying molecular species on a conductive surface
10/09/2003WO2003036767A3 Parallel, individually addressable probes for nanolithography
10/09/2003WO2003021297A3 Optically amplifying near-field optical signals
10/09/2003WO2003019238A3 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
10/09/2003WO2002101353A3 Methods and products for analyzing nucleic acids based on methylation status
10/08/2003EP1351256A2 Scanning probe system with spring probe
10/08/2003EP1350107A2 Method and device for characterising and/or for detecting a bonding complex
10/07/2003US6631227 Information recording and reproducing apparatus
10/02/2003WO2002073624A3 Memory element, method for structuring a surface, and storage device
10/02/2003US20030186625 Sharpening method of nanotubes
10/02/2003US20030186471 Method and apparatus for measuring dopant profile of a semiconductor
10/02/2003US20030186311 Using near field scanning probes and microarrays for analyzing pyhsical properties such as viscoelasticity, morphology and friction of liquid sample
10/02/2003US20030185108 Head for recording and reading optical data and method of manufacturing the same
10/02/2003US20030184332 Probe driving method, and probe apparatus
10/02/2003US20030184328 Near-field probe for use in scanning system
10/02/2003US20030183761 Scanning probe system with spring probe and actuation/sensing structure
10/02/2003US20030182993 Scanning probe system with spring probe
10/01/2003CN1445525A Detector head of doublet atomic force microscope
10/01/2003CN1445524A Method for measuring thickness of super thin section based on atomic force microscope
10/01/2003CN1445160A Reversible molecular electronic device based on technique of scan tunnel microscope and its manufacturing method
09/2003
09/30/2003US6628124 Electrocapacitive force measuring apparatus
09/30/2003US6628053 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device
09/30/2003US6627885 Method of focused ion beam pattern transfer using a smart dynamic template
09/25/2003WO2002022889A3 Direct haplotyping using carbon nanotube probes
09/25/2003US20030178580 Method for defect and conductivity engineering of a conducting nanoscaled structure
09/24/2003CN1444494A Methods utilizing scanning probe microscope tips and products therefor or produced thereby
09/24/2003CN1444217A Dielectric recording medium and its mfg. method and device
09/24/2003CN1122176C Process for preparing nano probe of scanning electrochemical microscope
09/23/2003US6625109 Near-field optical head and head support assembly having near-field optical head
09/23/2003US6624894 Scanning interferometry with reference signal
09/18/2003WO2003076954A2 High resolution scanning magnetic microscope operable at high temperature
09/18/2003WO2003016781A3 Surface plasmon enhanced illumination system
09/18/2003US20030175945 Measuring, analyzing surface of sampling; determination work function; generating configuration images
09/18/2003US20030174992 Cladding surrounding a core where the cladding is configured to preclude propagation of electromagnetic energy of a frequency less than a cutoff frequency longitudinally through the core of the zero-mode waveguide; multibiosamples
09/18/2003US20030173501 Enhanced optical transmission apparatus with imporved aperture geometry
09/18/2003US20030172726 Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof
09/17/2003CN1442693A Inspection method of foreign substance origenated from biological body
09/16/2003US6621575 Method and device for analyzing molecular reaction products in biological cells
09/16/2003US6621080 Apparatus for measuring a micro surface configuration and a method for manufacturing a probe incorporated in this measuring apparatus
09/16/2003US6621079 Having light source disposed on microscope for emitting light onto sample through hollow shaft of pipette which is opaque to prevent light emitted from light source being transmitted through walls, and optically connected image acquisition means
09/12/2003WO2003075424A1 GaN LASER ELEMENT
09/11/2003US20030170709 Method of examining foreign matter derived from living body
09/11/2003US20030169672 Dielectric recording medium, and method of and apparatus for producing the same
09/11/2003US20030168594 Integrated measuring instrument
09/11/2003US20030167830 Atomic force microscope
09/10/2003EP1342049A1 Scanning probe with digitised pulsed-force mode operation and real-time evaluation
09/10/2003CN1441420A Recording condition extracting system and method for dielectric recording medium and information record equipment
09/09/2003US6617569 Probe opening forming apparatus and near-field optical microscope using the same
09/04/2003US20030165768 Performing at least graining treatment on an aluminum plate, having on its surface a grain shape with a structure in which grained structure with medium undulation of 0.5 to 5 mu average aperture diameter
09/04/2003US20030165109 Recording medium having information reproducible using near-field light
09/03/2003EP1341183A1 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory
09/03/2003EP1289627A4 Nanodosimeter based on single ion detection
09/02/2003US6614746 Optical recording/reproducing method, recording medium used for optical recording and reproduction, and optical recording/reproducing apparatus
09/02/2003US6614540 Method and apparatus for determining feature characteristics using scatterometry
09/02/2003US6614227 Scanning microwave microscope capable of realizing high resolution and microwave resonator
09/02/2003US6614027 Method of controlling electrostatic lens and ion implantation apparatus
09/02/2003US6612161 Atomic force microscopy measurements of contact resistance and current-dependent stiction
09/02/2003US6612160 Apparatus and method for isolating and measuring movement in metrology apparatus
08/2003
08/28/2003WO2003029921A3 Methods and systems for three-dimensional motion control and tracking of a mechanically unattached magnetic probe
08/28/2003US20030160170 Methods and apparatus for atomic force microscopy
08/27/2003CN1438655A Scanning-tunnel microscope needle-tip automatic controlled etching instrument
08/26/2003US6611178 Nanometer-order mechanical vibrator, production method thereof and measuring device using it
08/21/2003WO2003069271A1 Improved scanning probe microscope
08/21/2003US20030157744 Method of producing an integrated circuit with a carbon nanotube
08/21/2003US20030157254 Providing a scanning probe microscope tip; coating the tip with a patterning compound; using coated tip to apply the compound to the substrate so as to produce a desired pattern
08/21/2003US20030156985 Carbon nanotube connected instrument
08/21/2003US20030155934 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
08/21/2003US20030155927 Multiple directional scans of test structures on srmiconductor integrated circuits
08/21/2003US20030155481 Scanning probe microscope
08/21/2003US20030155246 Activation surfaces using scanning tunnel microscope; forming deposits
08/21/2003US20030154773 Scanning atom probe and analysis method utilizing scanning atom probe
08/20/2003EP1336849A2 Analytical method and device for precise analysis with a simple sensor
08/20/2003EP1336835A1 Conductive probe for scanning microscope and machining method using the same
08/19/2003US6608306 Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structure
08/14/2003WO2003067224A1 Scanning probe microscope and specimen surface structure measuring method
08/14/2003WO2002074988A3 Arrays and methods of use
08/14/2003US20030151004 Method of controlling electrostatic lens and ion implantation apparatus
08/14/2003US20030150990 Atomic force microscopy, method of measuring surface configuration using the same, and method of producing magnetic recording medium
08/13/2003EP1335209A1 Probe driving method, and probe apparatus
08/13/2003EP0839312B1 Tapping atomic force microscope with phase or frequency detection
08/13/2003CN2566262Y Observer with atomic force microscope
08/12/2003US6606159 Optical storage system based on scanning interferometric near-field confocal microscopy
08/12/2003US6605941 Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes
08/12/2003US6605811 Electron beam lithography system and method
08/12/2003US6605344 Gas-barrier films
08/12/2003US6604295 Microscopic geometry measuring device
08/07/2003US20030148289 Modification of markers such as nanotubes form nanotube assemblies that are easily detected using a number of surface analysis devices such as atomic force microscopy
08/07/2003US20030147083 Optical storage system based on scanning interferometric near-field confocal microscopy
08/07/2003US20030146759 Nanodosimeter based on single ion detection
08/07/2003US20030146380 Sensing mode atomic force microscope
08/06/2003EP1333436A2 Record condition extraction system and method for a dielectric recording medium, and information recording apparatus
08/06/2003EP1332509A1 Focused ion beam system
08/06/2003CN1434461A Method for preparing probe tip of nano tube
08/05/2003US6603239 Micromanipulator with piezoelectric movement elements
07/2003
07/31/2003US20030143327 Depositing a catalytic material onto the apex of tip of atomic force microscope; subjecting catalytic material to chemical vapor deposition to initiate growth of carbon nanotube such that carbon nanotube extends from the apex of tip
07/31/2003US20030142620 Dielectric recording medium, and method of and apparatus for producing the same
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