| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 03/18/2004 | US20040053308 Probe immobilized substrate and method for manufacturing the same, and analytical method |
| 03/18/2004 | US20040052729 Immobilization carbohydrates; calibration; diagnosis; antiinflammatory agents, bactericides |
| 03/18/2004 | US20040052687 Apparatus for parallel detection of the behaviour of mechanical micro-oscillators |
| 03/18/2004 | US20040051542 Scanning probe microscope |
| 03/18/2004 | US20040051524 Superconductive quantum interference microscope; cryogenic detector |
| 03/17/2004 | EP1398780A2 Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording / reproducing apparatus |
| 03/17/2004 | EP1398656A1 Surface-plasmon-generated light source and its use |
| 03/17/2004 | CN1482623A Equipment and method for preparing fibre-optical microprobe by siphon lifting method corrosion |
| 03/17/2004 | CN1482473A 光波导装置 Waveguide devices |
| 03/16/2004 | US6706427 Management technique of friction coefficient based on surface roughness, substrate for information recording medium, information recording medium and manufacture method thereof |
| 03/16/2004 | US6705154 Cantilever for vertical scanning microscope and probe for vertical scan microscope |
| 03/11/2004 | WO2004020328A1 Thermal movement sensor |
| 03/11/2004 | US20040047245 Pickup device |
| 03/11/2004 | DE10237627A1 Verfahren zur Bestimmung tribologischer Eigenschaften einer Probenoberfläche mittels eines Rasterkraftmikroskops (RKM) sowie ein diesbezügliches RKM A method for determining tribological properties of a sample surface using an atomic force microscope (AFM) as well as a related RKM |
| 03/10/2004 | EP1396348A2 Support for lithographic printing plate and presensitized plate |
| 03/09/2004 | US6703626 Defect observed with the atomic force microscope (afm) and a pattern putting together the shape and position of the defect is extracted from and afm image. the extracted pattern is then converted to a shape format for a for an ion beam defect |
| 03/09/2004 | US6703615 Light receiving and emitting probe and light receiving and emitting probe apparatus |
| 03/09/2004 | US6703614 Method for determining the distance of a near-field probe from a specimen surface to be examined, and near-field microscope |
| 03/09/2004 | US6703258 Enhanced probe for gathering data from semiconductor devices |
| 03/09/2004 | US6702186 Assembly comprising a plurality of media probes for writing/reading high density magnetic data |
| 03/04/2004 | WO2004019012A1 Probe unit and its controlling method |
| 03/04/2004 | WO2004019011A1 Probe unit |
| 03/04/2004 | WO2004018963A2 Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope |
| 03/04/2004 | WO2003056567A3 Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture |
| 03/04/2004 | DE10337255A1 Abtastverfahren für die Atomkraftmikroskopie Scanning for atomic force microscopy |
| 03/04/2004 | DE10296462T5 Vorrichtung und Verfahren zum Isolieren und Messen einer Bewegung in einer Messtechnischen Vorrichtung Apparatus and method for isolating and measuring a movement in a measuring device of Technology |
| 03/03/2004 | CN1140905C Process for preparing curved needle tip of optical fibre |
| 03/02/2004 | US6700852 Information recording medium with recording film with cobalt oxide crystalline particles, and information recording device including the same |
| 03/02/2004 | US6700670 Method of measuring dishing using relative height measurements |
| 03/02/2004 | US6700121 Methods of sampling specimens for microanalysis |
| 02/26/2004 | WO2004017329A1 Sensor with cantilever and optical resonator |
| 02/26/2004 | WO2004017019A1 Method for locally highly resolved, mass-spectroscopic characterisation of surfaces using scanning probe technology |
| 02/26/2004 | US20040037959 Nanolithography, forming a pattern on a substrate by using a coated tip pen, coated with a compound, atomic force microscope imaging, drawing |
| 02/26/2004 | US20040036403 Fabrication method of carbon nanotubes |
| 02/26/2004 | DE10236150A1 Method for forming opening in semiconductor substrate layer for manufacture of calibration standard for scanning microscopy, micromechanical sensor or other components |
| 02/26/2004 | CA2493212A1 Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology |
| 02/25/2004 | EP1390975A2 Flexure based translation stage |
| 02/24/2004 | US6697322 Recording medium, optical recording device utilizing recording medium, and method of manufacturing recording medium |
| 02/24/2004 | US6694817 Method and apparatus for the ultrasonic actuation of the cantilever of a probe-based instrument |
| 02/24/2004 | US6694805 Cantilever for scanning probe microscopy |
| 02/19/2004 | WO2004015455A2 Improved method and system for scanning apertureless fluorescence microscope |
| 02/19/2004 | WO2004014785A2 Method for producing at least one small opening in a layer on a substrate and components produced according to said method |
| 02/19/2004 | WO2003042627A3 Field effect transistor sensor for a screen probe microscope |
| 02/19/2004 | US20040031315 Atomic force microscopy scanning methods |
| 02/18/2004 | CN1138980C Electrostatic force detector with cantilever for electrostatic force microscope and its detecting method |
| 02/12/2004 | WO2003028038A3 Method and device for analysing a sample by means of a raster scanning probe microscope |
| 02/12/2004 | WO2003028037A3 Device and method for scanning probe microscope |
| 02/12/2004 | US20040029131 A system and a process incorporating SKM for analysis of biomolecule interactions on a substrate surface |
| 02/12/2004 | US20040028119 Temperature measurement probe and temperature measurement apparatus |
| 02/12/2004 | US20040027889 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory |
| 02/12/2004 | US20040026618 Submerged sample observation apparatus and method |
| 02/12/2004 | US20040026616 Atmospheric pressure, glow discharge, optical emission source for the direct sampling of liquid media |
| 02/12/2004 | US20040026007 Method and apparatus for direct fabrication of nanostructures |
| 02/12/2004 | US20040025579 Submerged sample observation apparatus and method |
| 02/12/2004 | US20040025578 Software synchronization of multiple scanning probes |
| 02/10/2004 | US6690008 Probe and method of manufacturing mounted AFM probes |
| 02/10/2004 | US6689545 Method of fabricating near-field light-generating element |
| 02/05/2004 | US20040023519 Single molecule array on silicon substrate for quantum computer |
| 02/05/2004 | US20040022943 Prongs that are grown, via chemical vapor deposition, from patches of catalytic material deposited on a surface of a tip of the tweezer. |
| 02/05/2004 | US20040020284 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 02/05/2004 | US20040020279 Method and apparatus for the actuation of the cantilever of a probe-based instrument |
| 02/04/2004 | EP1386324A1 Actuating and sensing device for scanning probe microscopes |
| 02/04/2004 | CN1473330A AFM-based data storage and micrascopy |
| 02/03/2004 | US6684686 Non-contact type atomic microscope and observation method using it |
| 02/03/2004 | US6684676 Apparatus for forming optical aperture |
| 01/29/2004 | WO2004010475A2 Method of reducing internal stress in materials |
| 01/29/2004 | US20040016291 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 01/29/2004 | US20040016286 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 01/29/2004 | US20040016285 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 01/28/2004 | EP1385175A1 Probe tip design for optical near-field microscope |
| 01/27/2004 | US6683451 Magnetic resonance force microscope for the study of biological systems |
| 01/27/2004 | US6683320 Through-the-lens neutralization for charged particle beam system |
| 01/27/2004 | US6682951 Arrangements of microscopic particles for performing logic computations, and method of use |
| 01/27/2004 | CA2309450C Nanoelectrode arrays |
| 01/27/2004 | CA2225315C Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy |
| 01/22/2004 | WO2004007692A2 Methods and compositions for analyzing polymers using chimeric tags |
| 01/22/2004 | DE10230657A1 Verfahren und Vorrichtung zur Positionierung und Verformung von schmelzbaren Partikeln an Messspitzen Method and apparatus for positioning and deformation of the fusible particles of probe tips |
| 01/22/2004 | DE10228123A1 Verfahren und Vorrichtungen zur Erfassung von optischen Nahfeldwechselwirkungssignalen Methods and apparatus for detection of optical near-field interaction |
| 01/20/2004 | US6680617 Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
| 01/15/2004 | WO2004006302A2 Software synchronization of multiple scanning probes |
| 01/15/2004 | WO2004005845A2 Apparatus and method of operating a probe-based instrument in a torsional |
| 01/15/2004 | WO2004005844A2 Scanning probe microscope |
| 01/15/2004 | US20040009308 Method of producing a branched carbon nanotube for use with an atomic force microscope |
| 01/15/2004 | US20040008042 Direct, low frequency capacitance measurement for scanning capacitance microscopy |
| 01/15/2004 | CA2491404A1 Scanning probe microscope |
| 01/14/2004 | EP1381073A1 Aberration-corrected charged-particle optical apparatus |
| 01/14/2004 | EP1381042A2 Recording / reproducing head and method of producing the same |
| 01/13/2004 | US6677697 Force scanning probe microscope |
| 01/13/2004 | US6677567 Scanning probe microscope with improved scan accuracy, scan speed, and optical vision |
| 01/13/2004 | US6676814 Substrate coated with an MgO layer |
| 01/13/2004 | US6676813 Technology for fabrication of a micromagnet on a tip of a MFM/MRFM probe |
| 01/08/2004 | WO2004003931A1 Method of manufacturing optical fiber probe, and method of finishing micro material |
| 01/08/2004 | WO2004003519A1 Infrared focusing device |
| 01/08/2004 | US20040004484 System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes |
| 01/08/2004 | US20040004192 Aberration-corrected charged-particle optical apparatus |
| 01/08/2004 | US20040004182 Sample for simultaneously conducting electro-chemical and topographic near-field microscopy |
| 01/07/2004 | EP1377794A1 Improved scanning probe microscope |
| 01/07/2004 | CN1466707A Pinhole defect repair by resist blow |
| 01/06/2004 | US6674074 Enhanced scanning probe microscope |
| 01/06/2004 | US6674057 Optical near-field microscope |