| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 06/02/2004 | CN1501063A Scanning device of tunnel scanning microscope |
| 06/02/2004 | CN1501062A Scanning device with buffer for tunnel scanning microscope |
| 06/01/2004 | US6744708 Near-field optical head |
| 06/01/2004 | US6744058 Geometric compensation method for charged particle beam irradiation |
| 06/01/2004 | US6744057 Convergent charged particle beam apparatus and inspection method using same |
| 06/01/2004 | US6744030 Optical waveguide probe and manufacturing method of the same, and scanning near-field optical microscope |
| 05/27/2004 | WO2004015455A9 Improved method and system for scanning apertureless fluorescence microscope |
| 05/27/2004 | US20040102050 Method of patterning the surface of an article using positive microcontact printing |
| 05/27/2004 | US20040101469 Apparatus, materials, and methods for fabrication and catalysis |
| 05/26/2004 | EP1421025A1 Substituted donor atoms in silicon crystal for quantum computer |
| 05/25/2004 | US6740876 Scanning probe microscope |
| 05/21/2004 | WO2004042741A2 Topography and recognition imaging atomic force microscope and method of operation |
| 05/20/2004 | US20040094711 Non-contact scanning apparatus using frequency response separation scheme and scanning method thereof |
| 05/20/2004 | US20040093935 Scanning probe microscope and operation method |
| 05/19/2004 | DE10259118A1 Scanning probe microscopy is based on detection and spectral analysis of natural thermal electromagnetic near fields on surface |
| 05/19/2004 | CN2617003Y Horizontal atomic force microscope probe |
| 05/18/2004 | US6738338 Near-field optical head, method of fabricating same, and optical drive using same |
| 05/18/2004 | US6737880 Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions |
| 05/18/2004 | US6737331 Force sensing devices with multiple filled and/or empty channels and other attributes |
| 05/18/2004 | US6737167 Can resolve the optical information on sample surface without diffraction limit; optically transparent dielectric thin film covering nanostructured layer for localized nonlinear near-field optical interactions |
| 05/18/2004 | US6736705 Polishing process for glass or ceramic disks used in disk drive data storage devices |
| 05/13/2004 | WO2004006302A3 Software synchronization of multiple scanning probes |
| 05/13/2004 | WO2003058641A3 Surface plasmon lens for heat assisted magnetic recording |
| 05/13/2004 | US20040091815 Information recording medium and information recording device |
| 05/13/2004 | US20040090903 Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording / reproducing apparatus |
| 05/13/2004 | US20040089816 Method and system for scanning apertureless fluorescence microscope |
| 05/13/2004 | US20040089059 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 05/12/2004 | EP1417448A1 Scanning interferometry with reference signal |
| 05/11/2004 | US6734451 Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same |
| 05/11/2004 | US6734438 Scanning probe microscope and solenoid driven cantilever assembly |
| 05/11/2004 | US6734425 Scanning probe system with spring probe and actuation/sensing structure |
| 05/06/2004 | WO2004038504A2 Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrication |
| 05/06/2004 | WO2002010828A9 Control of position and orientation of sub-wavelength aperture array in near-field microscopy |
| 05/06/2004 | US20040086883 Method and device for characterising and/or for detecting a bonding complex |
| 05/06/2004 | US20040086808 To record and reproduce information in a highly precise manner; efficiency |
| 05/06/2004 | US20040085862 Near-field optical probe and optical near-field generator |
| 05/06/2004 | US20040085065 Hybrid Hall vector magnetometer |
| 05/06/2004 | US20040084737 SPM cantilever and fabricating method thereof |
| 05/06/2004 | US20040084618 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 05/04/2004 | US6730905 Covering layer containing electrically conductive polymer and catalyst; dna sequence determination |
| 04/29/2004 | WO2003102966A3 Method of forming atomic force microscope tips |
| 04/29/2004 | US20040079673 Electroconductive container of a nanotube product |
| 04/29/2004 | US20040079252 Support for lithographic printing plate and presensitized plate |
| 04/29/2004 | US20040079142 Apparatus and method for isolating and measuring movement in metrology apparatus |
| 04/29/2004 | DE10296461T5 Vorrichtung und Verfahren zum Isolieren und Messen einer Bewegung in einer messtechnischen Vorrichtung Apparatus and method for isolating and measuring a movement in a metrological device |
| 04/28/2004 | EP1412728A1 Apparatus for parallel detection of the behaviour of mechanical micro-oscillators |
| 04/27/2004 | US6727911 Method and apparatus for observing specimen image on scanning charged-particle beam instrument |
| 04/22/2004 | WO2004033480A2 Peptide and protein arrays and direct-write lithographic printing of peptides and proteins |
| 04/22/2004 | US20040074288 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 04/21/2004 | EP1411341A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
| 04/21/2004 | EP1410436A2 Parallel, individually addressable probes for nanolithography |
| 04/21/2004 | CN1490606A 扫描探针显微镜 Scanning probe microscopy |
| 04/20/2004 | US6724718 Near field optical head and method for manufacturing thereof |
| 04/20/2004 | US6724712 Nanometer scale data storage device and associated positioning system |
| 04/20/2004 | US6724199 Pin and cup devices for measuring film thickness |
| 04/15/2004 | WO2004031769A1 Interaction detecting method and bioassay device, and bioassay-use substrate |
| 04/15/2004 | WO2004031071A1 Method for preparing silver nano-structure by means of scanning tunneling microscopy |
| 04/15/2004 | WO2003023423A3 Dielectric constant measuring apparatus and dielectric constant measuring method |
| 04/15/2004 | US20040071394 Optical system and method for exciting and measuring fluorescence on or in samples treated with fluorescent pigments |
| 04/15/2004 | US20040069959 Charged particle beam irradiation equipment and control method thereof |
| 04/15/2004 | US20040069944 Balanced momentum probe holder |
| 04/15/2004 | US20040069052 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 04/14/2004 | EP1408327A2 Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
| 04/14/2004 | CN1488521A Supporting body for lithographic printing plate and lithographic printing original plate |
| 04/13/2004 | US6721051 Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation |
| 04/13/2004 | US6720728 Devices containing a carbon nanotube |
| 04/13/2004 | US6720553 Tip calibration standard and method for tip calibration |
| 04/13/2004 | US6719602 Nanotube length control method |
| 04/08/2004 | WO2004007692A3 Methods and compositions for analyzing polymers using chimeric tags |
| 04/08/2004 | WO2003106620A3 Nucleic acid sequencing by signal stretching and data integration |
| 04/08/2004 | US20040065821 Intermittent contact imaging under force-feedback control |
| 04/07/2004 | EP1404902A1 High surface quality gan wafer and method of fabricating same |
| 04/06/2004 | US6717671 System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern |
| 04/06/2004 | US6717419 Liquid dielectric capacitor for film thickness mapping |
| 04/06/2004 | US6717402 Probe having at least one magnetic resistive element for measuring leakage magnetic field |
| 04/06/2004 | US6717142 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same |
| 04/06/2004 | US6716409 Fabrication of nanotube microscopy tips |
| 04/06/2004 | US6715346 Atomic force microscopy scanning methods |
| 04/06/2004 | US6715345 Coaxial probe with cantilever and scanning micro-wave microscope including the same |
| 04/01/2004 | WO2004027791A1 Patterning magnetic nanostructures |
| 04/01/2004 | WO2004027095A1 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (spm) reading |
| 04/01/2004 | US20040062477 Optical waveguide device |
| 03/31/2004 | EP1402071A2 Methods and products for analyzing nucleic acids based on methylation status |
| 03/31/2004 | EP1402069A1 Methods and products for analyzing nucleic acids using nick translation |
| 03/30/2004 | US6713760 Analysis of semiconductor surfaces by secondary ion mass spectrometry and methods |
| 03/30/2004 | US6713743 Fabry-perot resonator and system for measuring and calibrating displacement of a cantilever tip using the same in atomic force microscope |
| 03/25/2004 | WO2004025350A1 Surface-plasmon-generated light source and its use |
| 03/25/2004 | WO2003009305A3 Measurement head for atomic force microscopy and other applications |
| 03/25/2004 | WO2002014862A8 Method and device for characterising and/or for detecting a bonding complex |
| 03/25/2004 | US20040058328 Using oligonucleotide probes for detection, identification and/or sequencing of nucleic acids and/or biomolecules; for use in medical diagnostics, forensics, toxicology, pathology, biological warfare |
| 03/25/2004 | US20040057370 Recording apparatus |
| 03/24/2004 | EP1399781A1 Repair of amplitude defects in a multilayer coating |
| 03/24/2004 | CN1143376C Charging measuring device |
| 03/23/2004 | US6710888 Method of measuring dishing |
| 03/23/2004 | US6710338 Focused ion beam system |
| 03/23/2004 | US6710331 Near-field microscope |
| 03/23/2004 | US6708556 Atomic force microscope and driving method therefor |
| 03/18/2004 | WO2004023490A2 Fluid delivery for scanning probe microscopy |
| 03/18/2004 | WO2003038108A3 Pre-existing nucleic acids covalently attached to a metal surface or a metal cluster, intermediates thereof and methods of using same |
| 03/18/2004 | US20040053399 Optical evaluation of conjugated nucleotide sequence probes; diagnostic beacons for genetic analysis |