| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 08/10/2004 | US6775349 System and method for scanning near-field optical tomography |
| 08/10/2004 | US6775009 Differential interferometric scanning near-field confocal microscopy |
| 08/10/2004 | US6774692 Apparatus and method for providing square wave to atomic force microscope |
| 08/10/2004 | US6773789 A radiation-curing resin undercoatings on a support and covering with a magnetic ferromagnetic powder layer; electromagnetics and durability |
| 08/05/2004 | WO2004065901A1 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques |
| 08/05/2004 | WO2004033480A3 Peptide and protein arrays and direct-write lithographic printing of peptides and proteins |
| 08/05/2004 | US20040150896 Optical device, optical system, method of production of same, and mold for production of same |
| 08/05/2004 | US20040150895 Optical device, optical system, method of production of same, and mold for production of same |
| 08/05/2004 | US20040150413 Scanning microscope; detector for scanning sample; electrode; dielectric; conductive wire |
| 08/05/2004 | DE19902235B4 Nahfeldoptische Sonde und nahfeldoptisches Mikroskop Near-field optical microscope probe and nahfeldoptisches |
| 08/05/2004 | DE19902234B4 Kombinationsmikroskop Combination of microscope |
| 08/04/2004 | EP1443337A2 Electro-optic measuring instrument |
| 08/04/2004 | EP1018011B1 Metal ion specific capacity affinity sensor |
| 08/04/2004 | CN2630837Y Apparatus for forming nano air bubble o nmica surface based on alcohol-water substitution |
| 08/03/2004 | US6770889 Method of controlling electrostatic lens and ion implantation apparatus |
| 08/03/2004 | US6770887 Aberration-corrected charged-particle optical apparatus |
| 07/29/2004 | WO2004063723A1 Scanning type probe microscope, and method of observing changes in molecular structure |
| 07/29/2004 | WO2004038430A3 Nanotube cantilever probes for nanoscale magnetic microscopy |
| 07/29/2004 | US20040145824 Flying height measurement method and system |
| 07/28/2004 | CN1515890A Optical spectrum offset type nano proximity device |
| 07/28/2004 | CN1159749C Method for controlling electrostatic lens and ion implantation device |
| 07/27/2004 | US6768556 Near-field optical probe, near-field optical microscope and optical recording/reproducing device with near-field optical probe |
| 07/27/2004 | US6768095 Near-field optical probe having cantilever and probe formed of transparent material, method for manufacturing near-field optical probe, and optical apparatus having near-field optical probe |
| 07/22/2004 | WO2004061427A1 Measuring method and device for vibration frequency of multi-cantilever |
| 07/22/2004 | WO2004060044A2 Method and apparatus for molecular analysis in small sample volumes |
| 07/22/2004 | US20040142106 Patterning magnetic nanostructures |
| 07/22/2004 | US20040141186 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques |
| 07/22/2004 | US20040140427 Patch-clamping and its use in analysing subcellular features |
| 07/22/2004 | US20040140426 Scanning probe microscope with improved probe head mount |
| 07/22/2004 | US20040140424 Scanning probe microscope with improved probe tip mount |
| 07/22/2004 | DE10300988A1 Scanning probe microscope for determining topological and electrical characteristics has two electrical conductors separated at probe tip to form electric field |
| 07/22/2004 | CA2512181A1 Method and apparatus for molecular analysis in small sample volumes |
| 07/21/2004 | EP1438128A2 Methods of patterning a monolayer |
| 07/15/2004 | WO2004059244A1 High-powered microscope observation device |
| 07/15/2004 | US20040137663 Method of reducing internal stress in materials |
| 07/15/2004 | US20040135096 Microfabrication apparatus and microfabrication method |
| 07/15/2004 | US20040134515 providing a semiconductor wafer comprising patterns for electronic circuitry and contaminant particles on a surface of the wafer and forming a solid sacrificial film on the surface of the wafer then performing supercritical fluid cleaning |
| 07/15/2004 | US20040134265 Multi-dimensional force sensing for scanning probe microscopy using carbon nanotube tips and carbon nanotube oscillators |
| 07/15/2004 | US20040134264 Apparatus and method for isolating and measuring movement in a metrology apparatus |
| 07/14/2004 | EP1436424A2 Differential tagging of polymers for high resolution linear analysis |
| 07/13/2004 | US6763322 Method for enhancement in screening throughput |
| 07/13/2004 | US6762402 Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof |
| 07/13/2004 | US6762397 Method of recording and reading information using molecular rotation |
| 07/13/2004 | US6762056 Rapid method for determining potential binding sites of a protein |
| 07/13/2004 | US6761618 Defect-free magnetic stampers/imprinters for contact patterning of magnetic media |
| 07/13/2004 | US6761074 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 07/08/2004 | WO2004057303A2 Fully digital controller for cantilever-based instruments |
| 07/08/2004 | US20040129064 Topography and recognition imaging atomic force microscope and method of operation |
| 07/08/2004 | CA2510968A1 Fully digital controller for cantilever-based instruments |
| 07/07/2004 | EP1435003A2 Dielectric constant measuring apparatus and dielectric constant measuring method |
| 07/07/2004 | EP1292361A4 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 07/07/2004 | CN1510696A Method for controlling electrostatic lens and ion implantation device |
| 07/07/2004 | CN1510694A Fibre-optical probe with excellent vibration characteristic and producing method thereof |
| 07/06/2004 | US6759653 Probe for scanning microscope produced by focused ion beam machining |
| 07/01/2004 | US20040127025 Processes for fabricating conductive patterns using nanolithography as a patterning tool |
| 07/01/2004 | US20040126820 Using nanoparticles to identify and/or sequence biomolecules; forensic analysis; medical diagnostics |
| 07/01/2004 | US20040126073 Method of manufacturing light-propagating probe for near-field microscope |
| 07/01/2004 | US20040125460 Near-field objective lens for an optical head |
| 07/01/2004 | US20040123651 Scanning probe system with spring probe |
| 07/01/2004 | DE10084431T5 Aktive Sonde für ein Rasterkraftmikroskop mit atomarer Auflösung sowie Verfahren zur Verwendung derselben Active probe for an atomic force microscope with atomic resolution and methods of using same |
| 06/30/2004 | EP1157386A4 Nanocapsules containing charged particles, their uses and methods of forming the same |
| 06/30/2004 | CN1156012C Film-like composite structure and meethod of manufacture thereof |
| 06/29/2004 | US6757645 Visual inspection and verification system |
| 06/29/2004 | US6756791 Method for measuring film thickness using capacitance technique |
| 06/29/2004 | US6756584 Electrical atomic force microscopy; metallization; cantilever beams; etching, patterning |
| 06/29/2004 | US6755075 Ultra micro indentation testing apparatus |
| 06/24/2004 | WO2004053928A2 Methods of measuring integrated circuit structure and preparation thereof |
| 06/24/2004 | WO2004052489A2 Methods for assembly and sorting of nanostructure-containing materials and related articles |
| 06/24/2004 | US20040119490 Parallel, individually addressable probes for nanolithography |
| 06/24/2004 | US20040118193 System for sensing a sample |
| 06/24/2004 | US20040118192 Fluid delivery for scanning probe microscopy |
| 06/24/2004 | US20040118191 Alignment-tolerant lens structures for acoustic force actuation of cantilevers |
| 06/23/2004 | EP1430486A2 Method and device for analysing a sample by means of a raster scanning probe microscope |
| 06/23/2004 | EP1430485A2 Device and method for scanning probe microscope |
| 06/22/2004 | US6754163 Recording apparatus |
| 06/22/2004 | US6753970 Transducer for generating optical contrasts |
| 06/22/2004 | US6753968 Optical storage system based on scanning interferometric near-field confocal microscopy |
| 06/22/2004 | US6753194 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 06/17/2004 | US20040116034 Method of manufacturing an electronic device containing a carbon nanotube |
| 06/17/2004 | US20040113621 Nanotube cantilever probes for nanoscale magnetic microscopy |
| 06/16/2004 | EP1428058A2 Diffractive optical position detector |
| 06/16/2004 | EP1427983A2 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes |
| 06/15/2004 | US6750450 Scanning magnetism detector and probe |
| 06/15/2004 | US6749776 Making ceramic materials for fluorescent lamps |
| 06/15/2004 | US6748795 Pendulum scanner for scanning probe microscope |
| 06/10/2004 | US20040110360 Methods of Forming Regions of Differing Composition Over a Substrate |
| 06/10/2004 | US20040110087 Optical information recording medium |
| 06/10/2004 | US20040110038 has good transport durability, coating smoothness, electromagnetic conversion characteristics, and long-term storability |
| 06/10/2004 | US20040108864 Method of measuring electrical capacitance |
| 06/09/2004 | EP1426927A1 Magnetic recording medium |
| 06/09/2004 | EP1425729A1 Graphical automated machine control and metrology |
| 06/09/2004 | EP1425595A1 Scanning squid microscope with improved spatial resolution |
| 06/09/2004 | EP1269112B1 Thickness measurement using an atomic force microscope |
| 06/08/2004 | US6747265 Optical cantilever having light shielding film and method of fabricating the same |
| 06/08/2004 | US6746566 Transverse magnetic field voltage isolator |
| 06/08/2004 | US6746144 Scanning tunneling microscope light emitting/condensing device |
| 06/08/2004 | US6745618 Scanning probe microscope |
| 06/08/2004 | US6745617 Scanning probe microscope |
| 06/05/2004 | WO2004038430A2 Nanotube cantilever probes for nanoscale magnetic microscopy |
| 06/05/2004 | CA2499370A1 Nanotube cantilever probes for nanoscale magnetic microscopy |