G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof

Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
12/2004
12/21/2004	US6832508 Atomic force microscopy measurements of contact resistance and current-dependent stiction
12/16/2004	WO2004005845A3 Apparatus and method of operating a probe-based instrument in a torsional
12/16/2004	US20040253816 High resolution patterning method
12/16/2004	US20040253758 Preparation of field emission array comprising nanostructures
12/16/2004	DE10321931A1 Verfahren und Vorrichtung zur berührungslosen Anregung von Torsionsschwingungen in einem einseitig eingespannten Federbalken eines Rasterkraftmikroskops Method and apparatus for contactless excitation of torsional vibrations in a cantilever cantilever of an atomic force microscope
12/15/2004	EP1203257B1 Scanning interferometric near-field confocal microscopy
12/14/2004	US6831887 Recording medium having information reproducible using near-field light
12/14/2004	US6831282 Methods and devices for evaluating beam blur in a charged-particle-beam microlithography apparatus
12/09/2004	US20040248318 Apparatus for microfluidic processing and reading of biochip arrays
12/09/2004	US20040248144 Arrays and methods of use
12/09/2004	US20040248134 Pre-existing nucleic acids covalently attached to a metal surface of a metal cluster, intermediates thereof and methods of using same
12/09/2004	US20040246879 Recording/reproducing head and method of producing the same
12/09/2004	US20040245224 Nanospot welder and method
12/09/2004	US20040244672 Substituted donor atoms in silicon crystal for quantum computer
12/09/2004	US20040244470 Method and systems for three-dimensional motion control and tracking of a mechanically unattached magnetic probe
12/08/2004	EP1483595A2 High resolution scanning magnetic microscope operable at high temperature
12/08/2004	CN1554119A Parallel, individually addressable probes for nanolithography
12/07/2004	US6828804 Method of measuring electrical capacitance
12/07/2004	US6828554 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same
12/07/2004	US6827979 Improving imaging resolution; coating with hydrophobic material that overcomes water condensation interference
12/02/2004	WO2004105046A2 Scanning probe microscopy probe and method for scanning probe contact printing
12/02/2004	WO2004104516A2 Spring constant calibration device
12/02/2004	WO2004023490A3 Fluid delivery for scanning probe microscopy
12/02/2004	US20040243320 Visual inspection and verification system
12/02/2004	US20040239318 High resolution scanning magnetic microscope operable at high temperature
12/01/2004	EP1482297A1 Scanning probe microscope and specimen surface structure measuring method
11/2004
11/30/2004	US6825995 Optical device, optical system, method of production of same, and mold for production of same
11/30/2004	US6823724 Method and apparatus for measuring values of physical property
11/30/2004	US6823723 Method and apparatus for performing atomic force microscopy measurements
11/30/2004	US6823713 Scanning tip orientation adjustment method for atomic force microscopy
11/25/2004	WO2004102601A2 Nanopost welder and method
11/25/2004	WO2004102583A1 Method and device for the contactless excitation of torsional oscillations in a sprung cantilever, fixed on one side, of an atomic force microscope
11/25/2004	WO2004102582A1 Carbon nanotube-based probes, related devices and methods of forming the same
11/25/2004	WO2004101429A1 Probe
11/25/2004	US20040235014 Using differential tagging with peptide nuclei acids or locked nucleic acid specific markers to detect, separate and resolve biopolymer
11/25/2004	US20040232321 Scanning near-field optical microscope
11/23/2004	US6822247 Ion irradiation system
11/23/2004	US6821603 Magnetic recording tape
11/18/2004	WO2004099712A2 Nanomanipulation on a sample surface using atomic force microscopy
11/18/2004	WO2004099107A2 Dna-based memory device and method of reading and writing same
11/18/2004	WO2004098384A2 Parallel analysis of molecular interactions
11/18/2004	US20040229389 Manufacturing method of semiconductor device
11/18/2004	US20040228962 Scanning probe microscopy probe and method for scanning probe contact printing
11/18/2004	US20040227075 Scanning probe microscopy probe and method for scanning probe contact printing
11/18/2004	US20040226464 Scanning probe microscopy probe and method for scanning probe contact printing
11/18/2004	US20040226351 Non-destructive evaluation of thermal barrier coatings in gas turbine engines
11/17/2004	EP1077367B1 Capacitive force gauge
11/17/2004	CN1546984A Nanometer-particle microscope
11/16/2004	US6819649 Electroluminescent multilayer optical information storage medium with integrated readout and compositions of matter for use therein
11/16/2004	US6819588 Memory element, method for structuring a surface, and storage device
11/16/2004	US6818907 Surface plasmon enhanced illumination system
11/16/2004	US6818902 Positron source
11/16/2004	US6818891 Sensing mode atomic force microscope
11/16/2004	US6817231 Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof
11/11/2004	WO2004057303A3 Fully digital controller for cantilever-based instruments
11/10/2004	EP1474546A2 High resolution patterning method
11/10/2004	EP1360538B1 Scanning near-field optical microscope
11/10/2004	CN1545485A Substituted donor atoms in silicon crystal for quantum computer
11/09/2004	US6816806 Method of characterizing a semiconductor surface
11/09/2004	US6816451 Recovering recorded information from an optical disk
11/04/2004	WO2004068502A3 Probe for an optical near field microscope with improved scattered light suppression and method for producing the same
11/04/2004	WO2004068501A3 Probe for an optical near field microscope and method for producing the same
11/04/2004	WO2004038504A3 Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrication
11/04/2004	US20040219596 Modified carbon nanotubes as molecular labels with application to DNA sequencing
11/04/2004	US20040219392 Magnetic recording medium
11/04/2004	US20040218507 AFM-based data storage and microscopy
11/04/2004	US20040217756 Calibrating a magnetic force microscope for use in detection of macroscopic or microscopic objects in magnetic fields
11/04/2004	US20040217345 DNA-based memory device and method of reading and writing same
11/04/2004	US20040217270 Method and apparatus for imaging using continuous non-raster patterns
11/04/2004	US20040216518 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
11/04/2004	US20040216517 Augmenting reality system for real-time nanomanipulation using atomic force microscopy
11/04/2004	DE10314561A1 Vorrichtung und Verfahren zum Bestimmen einer elektrischen Eigenschaft einer Probe Apparatus and method for determining an electrical property of a sample
11/04/2004	DE10314560A1 Vorrichtung und Verfahren zum Bestimmen einer elektrischen Eigenschaft einer Probe Apparatus and method for determining an electrical property of a sample
11/04/2004	DE10297522T5 Rasterkraftsonden-Mikroskop Atomic force microscope probe
11/02/2004	US6813574 Determines location of metrology mark and compensates for any horizontal shift
11/02/2004	US6813402 Fiber, probe and optical head of multiple optical path array type and methods for manufacturing the same
11/02/2004	US6812460 Nano-manipulation by gyration
11/02/2004	US6812449 Probe opening fabricating apparatus, and near-field optical microscope using the same
11/02/2004	US6810721 Submerged sample observation apparatus and method
11/02/2004	US6810720 Active probe for an atomic force microscope and method of use thereof
10/2004
10/28/2004	WO2004092712A1 Molecule detecting method, molecule counting method, molecule localization detecting method, molecule detection device used for them
10/28/2004	US20040214046 Magnetic recording tape
10/28/2004	US20040213910 tip coated with a monolayer of ethylene glycol derivatives resists the adsorption of proteins
10/28/2004	US20040213443 Model-based fusion of scanning probe microscopic images for detection and identificaton of molecular structures
10/28/2004	US20040211919 Convergent charged particle beam apparatus and inspection method using same
10/28/2004	US20040211271 Method for attaching rod-shaped nano structure to probe holder
10/27/2004	EP1141673B1 Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface
10/27/2004	CN1541287A High surface quality GaN wafer and method of fabricating same
10/26/2004	US6810354 Image reconstruction method
10/26/2004	US6809324 Scanning device, especially for detecting fluorescent light
10/21/2004	WO2004090971A1 Method of fabricating semiconductor probe with resistive tip
10/21/2004	US20040206903 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
10/21/2004	US20040206166 Fully digital controller for cantilever-based instruments
10/20/2004	EP1468472A1 Optical disc head including a bowtie grating antenna and slider for optical focusing, and method for making
10/20/2004	CN1172175C Attaching method of superthin slice for microscope obsservation onto mica surface based on interatomic force
10/19/2004	US6806958 Microforce measurement method and apparatus
10/19/2004	US6805942 Magnetic recording tape
10/19/2004	CA2188848C Analytical method and device for precise analysis with a simple sensor
10/14/2004	WO2004088669A1 Scanning probe microwave microscope comprising means for determining the sample distance
10/14/2004	WO2004088668A2 Device and method for determining an electrical property of a sample

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