| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 10/14/2004 | WO2004088650A1 Light irradiation head and information storage device |
| 10/14/2004 | WO2004067162A3 Apparatus for microfluidic processing and reading of biochip arrays |
| 10/14/2004 | US20040203256 Irradiation-assisted immobilization and patterning of nanostructured materials on substrates for device fabrication |
| 10/14/2004 | US20040200261 Scanning tip orientation adjustment method for atomic force microscopy |
| 10/14/2004 | DE10297054T5 Messkopf für ein Rasterkraftmikroskop und weitere Anwendungen Probe for an atomic force microscope and other applications |
| 10/13/2004 | EP1466182A1 Electrical feedback detection system for multi-point probes |
| 10/12/2004 | US6803584 Electron beam control device |
| 10/12/2004 | US6803558 Probe opening fabricating apparatus, and near-field optical microscope using the same |
| 10/12/2004 | US6803205 Monitoring enzyme activity in sample; obtain enzyme sample, insert into resealable apparatus, expose to substrate, measure enzyme activity |
| 10/07/2004 | WO2004085563A1 Adhesive compositions and method for selection thereof |
| 10/07/2004 | WO2004060044A3 Method and apparatus for molecular analysis in small sample volumes |
| 10/07/2004 | WO2004052489A3 Methods for assembly and sorting of nanostructure-containing materials and related articles |
| 10/07/2004 | US20040195523 Device for reducing the impact of distortions in a microscope |
| 10/07/2004 | US20040194705 Apparatus for making carbon nanotube structure with catalyst island |
| 10/05/2004 | US6801396 Substrate independent superpolishing process and slurry |
| 10/05/2004 | US6800913 Hybrid Hall vector magnetometer |
| 10/05/2004 | US6800865 Adhering nanotubes to be used as probe needles to electrode in protruding fashion, adhering base end of nanotube to surface of holder with tip end protruding, irradiating with electron beam to fasten nanotube to holder with coating film |
| 09/30/2004 | WO2004082830A2 Sample manipulation system |
| 09/30/2004 | WO2003101278A3 Device and method of use for detection and characterization of pathogens and biological materials |
| 09/30/2004 | US20040191809 Methods for registration at the nanometer scale |
| 09/29/2004 | EP1461605A2 Protein and peptide nanoarrays |
| 09/28/2004 | US6798513 Measuring module |
| 09/28/2004 | US6797952 Scanning atom probe |
| 09/23/2004 | US20040186215 using an atomic force microscope to examine the debonded surface of the adhesive composition to select the adhesive with the best performance based on size and distribution of the domains |
| 09/23/2004 | US20040185740 Method for rapid screening of emission-mix using a combinatorial chemistry approach |
| 09/23/2004 | US20040185586 Preparation of sample chip, method of observing wall surface thereof and system therefor |
| 09/23/2004 | US20040184214 Methods and systems for controlling motion of and tracking a mechanically unattached probe |
| 09/23/2004 | US20040182140 Heterodyne feedback system for scanning force microscopy and the like |
| 09/22/2004 | EP1460410A1 Delay time modulation femtosecond time-resolved scanning probe microscope apparatus |
| 09/22/2004 | EP1459083A1 Probe for an atomic force microscope and method for making such a probe |
| 09/21/2004 | US6794296 Aperture in a semiconductor material, and the production and use thereof |
| 09/16/2004 | WO2004079405A2 Method and apparatus for imaging using contunuous non-raster patterns |
| 09/16/2004 | US20040180555 Circuit constructions |
| 09/16/2004 | US20040178372 End effector for supporting a microsample |
| 09/16/2004 | US20040178355 Sample manipulation system |
| 09/16/2004 | US20040178353 Positron source |
| 09/14/2004 | US6792022 Semiconductor laser, method of producing the same and evanescent optical head using the same |
| 09/14/2004 | US6791108 Protective fullerene (C60) packaging system for microelectromechanical systems applications |
| 09/14/2004 | US6791081 Method for determining pore characteristics in porous materials |
| 09/14/2004 | US6791071 Apparatus for measuring aperture size of near-field optical probe and method thereof |
| 09/14/2004 | US6790509 Substrate for information recording medium, information recording medium, and method for controlling surface of substrate for information recording medium |
| 09/09/2004 | US20040175631 Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrications |
| 09/09/2004 | US20040174521 Raman imaging and sensing apparatus employing nanoantennas |
| 09/09/2004 | US20040173744 Method of production, method of inspection, and method of use of scanning probe microscope probe |
| 09/09/2004 | US20040173378 Methods for assembly and sorting of nanostructure-containing materials and related articles |
| 09/09/2004 | DE10307561A1 Meßanordnung zur kombinierten Abtastung und Untersuchung von mikrotechnischen, elektrische Kontakte aufweisenden Bauelementen Measuring arrangement for combined sampling and analysis of micro-technical, electrical contacts having components |
| 09/08/2004 | EP1455213A1 Optical waveguide probe and scanning near-field optical microscope |
| 09/08/2004 | EP1454335A1 Measurement device for electron microscope |
| 09/08/2004 | CN2639998Y Optical fiber probe having excellent vibration characteristics |
| 09/08/2004 | CN1166015C Magnetic tunnel device, method of mfg. thereof and magnetic head |
| 09/07/2004 | US6788086 Scanning probe system with spring probe |
| 09/07/2004 | US6787798 Method and system for storing information using nano-pinned dipole magnetic vortices in superconducting materials |
| 09/07/2004 | US6787771 Nanodosimeter based on single ion detection |
| 09/07/2004 | US6787769 Conductive probe for scanning microscope and machining method using the same |
| 09/02/2004 | WO2004075204A2 Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts |
| 09/02/2004 | WO2004074849A1 Thin film spin probe |
| 09/02/2004 | WO2004074816A1 Scanning probe microscope and sample observing method using this and semiconductor device production method |
| 09/02/2004 | WO2004074766A1 Investigation and/or manipulation device |
| 09/02/2004 | US20040170870 Precise surface design |
| 09/02/2004 | US20040169195 Quantum semiconductor device and method for fabricating the same |
| 09/02/2004 | US20040169136 Probe opening fabricating apparatus, and near-field optical microscope using the same |
| 09/02/2004 | US20040169135 Probe opening fabricating apparatus, and near-field optical microscope using the same |
| 09/02/2004 | US20040168527 Coated nanotube surface signal probe |
| 09/02/2004 | DE10038526B4 Verfahren und Anordnung zur Erfassung des wellenlängenabhängigen Verhaltens einer beleuchteten Probe Method and apparatus for detecting the wavelength-dependent behavior of an illuminated sample |
| 09/01/2004 | EP1452337A2 Support for lithographic printing plate and presensitized plate |
| 09/01/2004 | EP1451848A1 Device for reducing the impact of distortions in a microscope |
| 09/01/2004 | EP0650067B1 Electrooptic instrument |
| 09/01/2004 | CN1526142A Actuating and sensing device for scanning probe microscopes |
| 08/31/2004 | US6785445 Near field light probe, near field optical microscope, near field light lithography apparatus, and near field light storage apparatus that have the near field light probe |
| 08/31/2004 | US6784414 Probe opening fabricating apparatus, and near-field optical microscope using the same |
| 08/26/2004 | US20040166442 obtained by electrochemical graining treatment on an aluminum plate, which contains 0.02-0.29 wt % Fe, 0.03-0.15% Si, 0.020-0.040% Cu, and 0.050% or less Ti; surface area ratio and steepness each satisfies specified conditions |
| 08/26/2004 | US20040164244 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same |
| 08/26/2004 | US20040164234 Near field microscope including waveguide resonator |
| 08/26/2004 | DE10303961A1 Sonde für ein optisches Nahfeldmikroskop und Verfahren zu deren Herstellung Probe for an optical near-field microscope and processes for their preparation |
| 08/25/2004 | CN1163740C Contact macroradiography characterization of doped optical fibers |
| 08/24/2004 | US6780766 Methods of forming regions of differing composition over a substrate |
| 08/24/2004 | US6779387 Method and apparatus for the ultrasonic actuation of the cantilever of a probe-based instrument |
| 08/19/2004 | WO2004070765A1 Resistive cantilever spring for probe microscopy |
| 08/19/2004 | WO2003038147A3 High resolution patterning method |
| 08/19/2004 | US20040161332 Positioning and motion control by electrons, Ions, and neutrals in electric fields |
| 08/19/2004 | US20040160604 System for simultaneously measuring thin file layer thickness, reflectivity, roughness, surface profile and magnetic pattern |
| 08/19/2004 | US20040159786 Method of fabricating probe for scanning probe microscope |
| 08/19/2004 | US20040159781 Actuating and sensing device for scanning probe microscopes |
| 08/19/2004 | DE10304532A1 Scanning electron microscope probe tip sharpening method in which the tip is immersed in a soft material, especially single crystal platinum |
| 08/19/2004 | DE10303927A1 Sonde für ein optisches Nahfeldmikroskop mit verbesserter Streulichtunterdrückung und Verfahren zu deren Herstellung Probe for an optical near-field microscope having improved stray light rejection, and methods for their preparation |
| 08/18/2004 | EP1446505A2 Pre-existing nucleic acids covalently attached to a metal surface or a metal cluster, intermediates thereof and methods of using same |
| 08/18/2004 | CN1162911C Rewritable data storage with carbon material and its writing/reading method |
| 08/17/2004 | US6777656 Near-field spectrometer having background spectral information |
| 08/17/2004 | US6777637 Sharpening method of nanotubes |
| 08/17/2004 | US6776031 Submerged sample observation apparatus and method |
| 08/17/2004 | US6776030 Method of information collection and processing of sample's surface |
| 08/12/2004 | WO2004068502A2 Probe for an optical near field microscope with improved scattered light suppression and method for producing the same |
| 08/12/2004 | WO2004068501A2 Probe for an optical near field microscope and method for producing the same |
| 08/12/2004 | WO2004068474A1 Glass substrate for information recording medium and process for producing the same |
| 08/12/2004 | WO2004067162A2 Apparatus for microfluidic processing and reading of biochip arrays |
| 08/12/2004 | WO2004018963A3 Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope |
| 08/12/2004 | US20040155567 Electron-emitting device, electron source and image-forming apparatus, and manufacturing methods thereof |
| 08/12/2004 | US20040154744 Method and system for surface or cross-sectional processing and observation |
| 08/12/2004 | US20040154367 Apparatus for forming optical aperture |
| 08/11/2004 | CN1161605C Apparatus for measuring exchange force |