| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 03/08/2005 | US6864457 Laser machining of materials |
| 03/08/2005 | US6862924 Augmenting reality system for real-time nanomanipulation using atomic force microscopy |
| 03/08/2005 | US6862923 Atomic force microscope |
| 03/08/2005 | US6862921 Method and apparatus for manipulating a sample |
| 03/03/2005 | US20050048411 Methods of patterning a monolayer |
| 03/02/2005 | EP1510806A1 Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using same |
| 03/02/2005 | EP1290404B1 Sample for simultaneously conducting electro-chemical and topographic near-field microscopy |
| 03/02/2005 | EP1135691B1 Electrostatic force detector with cantilever and shield |
| 03/02/2005 | CN1588156A Near field optic microscope |
| 03/02/2005 | CN1587982A Modular atomic force microscope |
| 03/02/2005 | CN1587980A Fully optical fiber probe scan type near-field optical microscope |
| 03/02/2005 | CN1587979A Biological total internal reflection type near-field scan microscope |
| 03/02/2005 | CN1587977A In-situ micro area structure analysis and property detection combined system |
| 03/01/2005 | US6861649 Balanced momentum probe holder |
| 03/01/2005 | US6861648 Scanning probe microscopy inspection and modification system |
| 02/24/2005 | WO2004075204A3 Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts |
| 02/24/2005 | US20050043917 Image reconstruction method |
| 02/24/2005 | US20050039523 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 02/22/2005 | US6859760 Remote semiconductor microscopy |
| 02/22/2005 | US6858852 Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy |
| 02/22/2005 | US6858436 Using spectrum analysis and chromatography to monitor, detect and resolve objects smaller than those visible to the eye |
| 02/22/2005 | US6858423 Optical Amplification of molecular interactions using liquid crystals |
| 02/22/2005 | US6858089 Forming a sacrificial film on the surface of the wafer and then removing it by supercritical fluid cleaning |
| 02/17/2005 | WO2005015570A1 Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device |
| 02/17/2005 | WO2005015188A1 Scanning probe inspection apparatus |
| 02/17/2005 | US20050037560 Data storage medium |
| 02/17/2005 | US20050035288 Delay time modulation femtosecond time-resolved scanning probe microscope apparatus |
| 02/17/2005 | US20050034512 System for wide frequency dynamic nanomechanical analysis |
| 02/16/2005 | EP1506393A1 Molecular topological frationation of macromolecules |
| 02/15/2005 | US6856473 Method of fabricating optical aperture and method of fabricating probe for near field light device |
| 02/15/2005 | US6856145 Direct, low frequency capacitance measurement for scanning capacitance microscopy |
| 02/15/2005 | US6856140 System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes |
| 02/15/2005 | US6855928 Analysis of semiconductor surfaces by secondary ion mass spectrometry and methods |
| 02/15/2005 | US6855926 Instrument and method for combined surface topography and spectroscopic analysis |
| 02/10/2005 | WO2004014785A3 Method for producing at least one small opening in a layer on a substrate and components produced according to said method |
| 02/10/2005 | WO2004001764A3 Method and device for recording optical near field interaction signals |
| 02/10/2005 | US20050030995 GaN laser element |
| 02/10/2005 | US20050030054 Electrical scanning probe microscope apparatus |
| 02/10/2005 | US20050029450 Sensing mode atomic force microscope |
| 02/10/2005 | US20050028583 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
| 02/08/2005 | US6852969 Atmospheric pressure, glow discharge, optical emission source for the direct sampling of liquid media |
| 02/08/2005 | US6852968 Surface-type optical apparatus |
| 02/08/2005 | US6852285 Measuring variations in conformation |
| 02/08/2005 | US6851301 Cantilever for scanning probe microscope |
| 02/03/2005 | WO2005010501A1 Scanning-type probe microscope |
| 02/03/2005 | US20050025032 Near-field optical probe for reproducing information on a recording medium using near-field light |
| 02/03/2005 | US20050023481 Method of and an apparatus for measuring a specimen by means of a scanning probe microscope |
| 02/02/2005 | EP1502306A1 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication |
| 02/02/2005 | EP1502296A1 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
| 02/02/2005 | CN1574161A Preparation of field emission array comprising nanostructures |
| 02/02/2005 | CN1187597C Detector head of doublet atomic force microscope |
| 02/02/2005 | CN1187596C Scanning type probe microscope probe and method of producing the same, and polymer processing method using the same |
| 02/01/2005 | US6850323 Locally enhanced raman spectroscopy with an atomic force microscope |
| 01/27/2005 | WO2005008679A1 Probe for an atomic force microscope |
| 01/27/2005 | WO2004101429B1 Probe |
| 01/27/2005 | WO2004082830A3 Sample manipulation system |
| 01/27/2005 | US20050019997 Laser annealing method and laser annealing device |
| 01/27/2005 | US20050017193 Particle beam processing system |
| 01/27/2005 | US20050017172 Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate |
| 01/26/2005 | EP1501088A1 Optical near-field generating element and optical apparatus including the same |
| 01/26/2005 | CN1570600A Scanning probe and scanning tunneling microscope possessing electron cloud enhancing action |
| 01/26/2005 | CN1186653C Method for mfg. nanotip of optic fiber |
| 01/25/2005 | US6847907 Defect detection and repair of micro-electro-mechanical systems (MEMS) devices |
| 01/25/2005 | US6847029 Multiple-source arrays with optical transmission enhanced by resonant cavities |
| 01/25/2005 | US6845655 Heterodyne feedback system for scanning force microscopy and the like |
| 01/20/2005 | US20050012936 Scanning probe microscope and measurement method using the same |
| 01/20/2005 | US20050011256 Afm cantilevers and methods for making and using same |
| 01/19/2005 | EP1497464A1 Compositions and methods related to two-arm nucleic acid probes |
| 01/18/2005 | US6844983 Near-field objective lens for an optical head |
| 01/13/2005 | WO2005003911A2 Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 01/13/2005 | US20050009206 Using direct-write lithographic printing to generate protein microarrays; nanoscopic high throughput assy |
| 01/13/2005 | US20050009197 Using treated cantilever of an atomic force microscope operating in a tapping mode against a mechanical stop to detect and determine concentration of biopolymers: miniaturized detectors; biosensors |
| 01/13/2005 | US20050008296 Optical near-field generating element and optical apparatus including the same |
| 01/13/2005 | US20050007654 Light condensing method and light condenser as well as near-field optical microscope and storage device formed by applying the same |
| 01/13/2005 | US20050005688 Dual stage instrument for scanning a specimen |
| 01/11/2005 | US6841776 Method and apparatus for high-speed inspection and review |
| 01/06/2005 | WO2005001459A2 Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate |
| 01/06/2005 | US20050000275 Scanning tip orientation adjustment method for atomic force microscopy |
| 01/05/2005 | CN1560594A Spin polarized channel atomic force microtechnic |
| 01/04/2005 | US6839646 Electron beam test system and electron beam test method |
| 01/04/2005 | US6839191 Optical near-field generating element and optical apparatus including the same |
| 01/04/2005 | US6838889 Method and apparatus for reducing the parachuting of a probe |
| 01/04/2005 | US6838676 Particle beam processing system |
| 01/04/2005 | CA2145582C Microfine light source |
| 12/30/2004 | US20040267397 Optical metrology of structures formed on semiconductor wafer using machine learning systems |
| 12/30/2004 | US20040265643 Magnetic tapes having improved running durability after storage, better winding and reduced offset phenomenon by having the density of spines on a back coat layer from 50-200/90 mu m with a height of >100 nm or more and by lessening a thermal shrinkage factor after preservation is 0.4% |
| 12/30/2004 | US20040265486 Placing a material (especially a dichroic molecule material or birefringent material) on a dip-pen; bringing the dip-pen into contact with a base to transfer the material to the base; and hardening the material; does not use an uniaxial stretching apparatus for regularization |
| 12/30/2004 | US20040263185 Dielectric constant measuring apparatus, dielectric constant measuring method, and information recording/reproducing apparatus |
| 12/29/2004 | WO2004113833A1 3-d shape measuring unit, processing unit, and production method for semiconductor device |
| 12/29/2004 | CN1182381C Method for measuring thickness of super thin section based on atomic force microscope |
| 12/28/2004 | US6835925 Signal detector and probe microscope using the same |
| 12/28/2004 | US6835613 Method of producing an integrated circuit with a carbon nanotube |
| 12/28/2004 | US6835438 Magnetic recording tape |
| 12/28/2004 | US6834537 Optical microcantilever |
| 12/23/2004 | US20040258873 Flexible magnetic disc medium |
| 12/23/2004 | US20040256552 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
| 12/23/2004 | US20040255652 Directed growth of nanotubes on a catalyst |
| 12/23/2004 | US20040255651 Dynamic activation for an atomic force microscope and method of use thereof |
| 12/21/2004 | US6834158 Pinhole defect repair by resist flow |
| 12/21/2004 | US6833719 Apparatus for evaluating electrical characteristics |