| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 05/05/2005 | US20050092907 Oscillating scanning probe microscope |
| 05/04/2005 | EP1527012A2 Method for producing at least one small opening in a layer on a substrate and components produced according to said method |
| 05/04/2005 | CN1200261C Superfine indentation tester |
| 05/03/2005 | US6889113 Graphical automated machine control and metrology |
| 05/03/2005 | US6888150 Method for defect and conductivity engineering of a conducting nanoscaled structure |
| 05/03/2005 | US6888135 Scanning probe microscope with probe formed by single conductive material |
| 05/03/2005 | US6887365 Branched cantilever comprising ferromagnetic material and tubules attached to electrode pair coupled to electrical circuit; Magnetic (Resonance) Force Microscopy |
| 05/03/2005 | US6886238 Method for manufacturing a head for recording and reading optical data |
| 04/28/2005 | WO2005037418A2 Processes for fabricating conductive patterns using nanolithography as a patterning tool |
| 04/28/2005 | US20050089463 Etching and planarizing a substrate by irradiation with a focused ion beam, decomposing and depositing an organic gas into a columnar electrode, and then attaching the nanotubes to the electrode; maintained electroconductivity between nanotubes and electrodes |
| 04/28/2005 | US20050088173 Method and apparatus for tunable magnetic force interaction in a magnetic force microscope |
| 04/28/2005 | US20050087749 Electroluminescent multilayer optical information storage medium with integrated readout and composition of matter for use therein |
| 04/27/2005 | CN1609211A A method of immobilizing and stretching a nucleic acid on a substrate |
| 04/26/2005 | US6885808 Optical probe and optical pick-up apparatus |
| 04/26/2005 | US6885445 Electron microscope and spectroscopy system |
| 04/26/2005 | US6885012 Convergent charged particle beam apparatus and inspection method using same |
| 04/26/2005 | US6884999 Use of scanning probe microscope for defect detection and repair |
| 04/26/2005 | US6884981 Diffractive optical position detector |
| 04/21/2005 | US20050084620 Method for applying a layer containing at least polymeric material |
| 04/21/2005 | US20050083826 Optical fiber probe using an electrical potential difference and an optical recorder using the same |
| 04/21/2005 | US20050082476 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same |
| 04/21/2005 | US20050082475 Methods for preparing samples for atom probe analysis |
| 04/21/2005 | US20050082474 MEMS differential actuated nano probe and method for fabrication |
| 04/21/2005 | US20050081610 Force scanning probe microscope |
| 04/21/2005 | US20050081609 Atomic force microscope and method for determining properties of a sample surface using an atomic force microscope |
| 04/21/2005 | US20050081608 System and method for the analysis of atomic force microscopy data |
| 04/20/2005 | EP1523652A1 Method for locally highly resolved, mass-spectroscopic characterisation of surfaces using scanning probe technology |
| 04/19/2005 | US6881970 Charged particle beam irradiation equipment and control method thereof |
| 04/19/2005 | US6881954 Scanning probe microscope and method of measurement |
| 04/19/2005 | US6881947 Near-field optical probe |
| 04/19/2005 | US6881687 Method for laser cleaning of a substrate surface using a solid sacrificial film |
| 04/19/2005 | US6880389 Software synchronization of multiple scanning probes |
| 04/19/2005 | US6880386 Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface |
| 04/14/2005 | WO2005034206A2 Selective functionalization of carbon nanotube tips allowing fabrication of new classes of nanoscale sensing and manipulation tools |
| 04/14/2005 | WO2004105046A3 Scanning probe microscopy probe and method for scanning probe contact printing |
| 04/14/2005 | WO2004099107A3 Dna-based memory device and method of reading and writing same |
| 04/14/2005 | US20050078411 Head for recording and reading optical data and method of manufacturing the same |
| 04/14/2005 | US20050077915 Method for measuring nm-scale tip-sample capacitance |
| 04/14/2005 | US20050077468 System and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces |
| 04/14/2005 | US20050077460 High capacity and scanning speed system for sample handling and analysis |
| 04/12/2005 | US6879152 Evaluation system and method of measuring a quantitative magnetic field of a magnetic material |
| 04/12/2005 | US6878444 Magnetic carbon nanotube |
| 04/12/2005 | US6877365 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 04/07/2005 | WO2005031468A1 Near-field light generating method near-field exposure mask and near-field exposure method and apparatus |
| 04/07/2005 | WO2005031430A1 Optical microscope and method for obtaining an optical image |
| 04/07/2005 | WO2005001459A3 Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate |
| 04/07/2005 | WO2003102966A8 Method of forming atomic force microscope tips |
| 04/07/2005 | US20050074973 Method of fabricating a surface-type optical apparatus |
| 04/07/2005 | US20050074774 Multiplex detection compositions, methods, and kits |
| 04/07/2005 | DE10342644A1 Raster force microscopy probe has nano structure probe tip arm with integrated CMOS piezoelectric sensor |
| 04/07/2005 | CA2540710A1 Optical microscope and method for obtaining an optical image |
| 04/06/2005 | EP1520292A2 Software synchronization of multiple scanning probes |
| 04/06/2005 | EP1274966B1 Resonant probe driving arrangement and scanning probe microscope |
| 04/06/2005 | CN1196197C Data storage medium based on diode, cathodic conductivity and cathodic luminescence |
| 04/05/2005 | US6875981 Scanning atom probe and analysis method utilizing scanning atom probe |
| 03/31/2005 | US20050068052 Alternating pulse dual-beam apparatus, methods and systems for voltage contrast behavior assessment of microcircuits |
| 03/31/2005 | US20050066714 Active probe for an atomic force microscope and method for use thereof |
| 03/31/2005 | US20050066713 Method to transiently detect samples in atomic force microscopes |
| 03/31/2005 | DE10303927B4 Sonde für ein optisches Nahfeldmikroskop mit verbesserter Streulichtunterdrückung und Verfahren zu deren Herstellung Probe for an optical near-field microscope having improved stray light rejection, and methods for their preparation |
| 03/30/2005 | EP1519388A1 Manufacturing method for a near-field optical probe |
| 03/30/2005 | EP1518837A1 Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof |
| 03/29/2005 | US6873747 Method for measurement of pitch in metrology and imaging systems |
| 03/29/2005 | US6873165 Near-field probe for use in scanning system |
| 03/29/2005 | US6873163 Spatially resolved electromagnetic property measurement |
| 03/29/2005 | US6871559 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 03/29/2005 | US6871528 Method of producing a branched carbon nanotube for use with an atomic force microscope |
| 03/29/2005 | US6871527 Measurement head for atomic force microscopy and other applications |
| 03/24/2005 | WO2004005844A3 Scanning probe microscope |
| 03/24/2005 | US20050064487 Using solid support to amplify preferential nucleotide sequences; screening for genetic polymorphisms and aberrations |
| 03/24/2005 | US20050063445 Near-field light source device, and optical head, optical device, exposure apparatus and microscope device having such near-field light source device |
| 03/24/2005 | US20050062116 Field effect transistor sensor |
| 03/24/2005 | US20050061970 Apparatus and method for a scanning probe microscope |
| 03/24/2005 | DE10303961B4 Sonde für ein optisches Nahfeldmikroskop und Verfahren zu deren Herstellung Probe for an optical near-field microscope and processes for their preparation |
| 03/24/2005 | DE10300988B4 Vorrichtung zur Bestimmung topologischer und elektrischer Eigenschaften eines Probenkörpers Apparatus for determining topological and electrical properties of a specimen |
| 03/23/2005 | EP1516665A1 A method of immobilizing and stretching a nucleic acid on a substrate |
| 03/22/2005 | US6869810 Manufacturing method of semiconductor device |
| 03/22/2005 | US6869807 Method and its apparatus for manufacturing semiconductor device |
| 03/17/2005 | WO2005024392A1 Nanotube probe and method of manufacturing the same |
| 03/17/2005 | WO2005024391A1 Optical measurement method and device |
| 03/17/2005 | US20050059091 using a scanning probe microscope to determine and calculate the binding affinity between the first object and the first material from the force applied to remove the object from the first material. |
| 03/17/2005 | US20050056782 Near field acoustic holography with scanning probe microscope (SPM) |
| 03/17/2005 | DE102004039692A1 Tastkopfmikroskop und Abtastverfahren Tastkopfmikroskop and scanning |
| 03/16/2005 | EP1513957A2 Nucleic acid sequencing by signal stretching and data integration |
| 03/16/2005 | EP1513954A2 Device and method of use for detection and characterization of pathogens and biological materials |
| 03/16/2005 | EP1468472A4 Optical disc head including a bowtie grating antenna and slider for optical focusing, and method for making |
| 03/15/2005 | US6867606 Multiple directional scans of test structures on semiconductor integrated circuits |
| 03/15/2005 | US6867443 Parallel, individually addressable probes for nanolithography |
| 03/15/2005 | US6867429 Arrangements of microscopic particles for performing logic computations, and method of use |
| 03/15/2005 | US6867407 Light probe microscope including picture signal processing means |
| 03/10/2005 | WO2005022124A1 Scanning type probe microscope and probe moving control method therefor |
| 03/10/2005 | WO2005021804A1 Multiplex detection compositions, methods, and kits |
| 03/10/2005 | WO2005020803A2 Raman imaging and sensing apparatus employing nanoantennas |
| 03/10/2005 | WO2004015455A3 Improved method and system for scanning apertureless fluorescence microscope |
| 03/10/2005 | US20050054215 Patterned functionalized silicon surfaces |
| 03/10/2005 | US20050051515 Cantilever microstructure and fabrication method thereof |
| 03/10/2005 | US20050050947 Scanning probe microscope and scanning method |
| 03/09/2005 | EP1513162A1 Method of manufacturing optical fiber probe, and method of finishing micro material |
| 03/08/2005 | US6864483 Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device |
| 03/08/2005 | US6864481 Probe for scanning probe microscope |
| 03/08/2005 | US6864479 High dynamic range mass spectrometer |