| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 07/05/2005 | US6914873 Recording apparatus |
| 07/05/2005 | US6912894 Atomic force microscopy measurements of contact resistance and current-dependent stiction |
| 07/05/2005 | US6912892 Atomic force microscope |
| 06/30/2005 | WO2005059514A2 High aspect ratio tip atomic force microscopy cantilevers and method of manufacture |
| 06/30/2005 | WO2005003911A3 Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 06/30/2005 | WO2004102601A3 Nanopost welder and method |
| 06/30/2005 | WO2002009836A3 Methods for solid phase nanoextraction and desorption |
| 06/30/2005 | US20050141397 Data storing and reading apparatus |
| 06/30/2005 | US20050140387 Probe device and method of controlling the same |
| 06/30/2005 | US20050139770 Probe device |
| 06/30/2005 | US20050139767 Multiple directional scans of test structures on semiconductor integrated circuits |
| 06/30/2005 | US20050138996 Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes |
| 06/30/2005 | DE10053034B4 SQUID-Mikroskop SQUID microscope |
| 06/29/2005 | EP1548748A1 A method for making probes for atomic force microscopy |
| 06/29/2005 | EP1548726A1 Data Storing and Reading Apparatus |
| 06/29/2005 | EP1548438A1 Interaction detecting method and bioassay device, and bioassay-use substrate |
| 06/29/2005 | CN1632519A Atomic force microscope measuring device based on angular measurement |
| 06/29/2005 | CN1632518A Atomic force microscope measuring method based on angular measurement |
| 06/29/2005 | CN1632517A Probe scanning microscope for tunneling loss and measuring method therefor |
| 06/29/2005 | CN1632516A Dielectric loss microscope with scanning probe and measuring method therefor |
| 06/29/2005 | CN1632515A Multifunctional nano research and development platform |
| 06/28/2005 | US6912193 Record condition extraction system and method of dielectric recording medium, and information recording apparatus |
| 06/28/2005 | US6911646 Measurements of electromagnetic properties and interactions based on radiation-excited polarizations |
| 06/23/2005 | WO2005057587A1 Height calibration of scanning probe microscope actuators |
| 06/23/2005 | WO2005057128A1 Device for interaction-free measurements |
| 06/23/2005 | US20050135224 Contact probe storage FET sensor |
| 06/23/2005 | US20050135203 Contact probe storage sensor pod |
| 06/23/2005 | US20050133717 Method for manufacturing a split probe |
| 06/22/2005 | EP1544865A1 A method for making probes for atomic force microscopy |
| 06/22/2005 | EP1544864A1 Contact probe storage sensor POD |
| 06/22/2005 | EP1543155A2 Methods and compositions for analyzing polymers using chimeric tags |
| 06/22/2005 | EP1543152A1 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (spm) reading |
| 06/22/2005 | EP1086981B1 Gas-barrier films |
| 06/22/2005 | CN1629960A Contact probe storage sensor pod |
| 06/22/2005 | CN1629959A Contact probe storage FET sensor |
| 06/16/2005 | WO2005055245A1 High sensitivity scanning probe system |
| 06/16/2005 | WO2004042741A3 Topography and recognition imaging atomic force microscope and method of operation |
| 06/16/2005 | US20050127929 Electrical feedback detection system for multi-point probes |
| 06/16/2005 | US20050127926 Method using conductive atomic force microscopy to measure contact leakage current |
| 06/15/2005 | EP1541988A1 Infrared focusing device |
| 06/15/2005 | EP1540661A1 Sensor with cantilever and optical resonator |
| 06/15/2005 | EP1540378A2 Nanotube cantilever probes for nanoscale magnetic microscopy |
| 06/15/2005 | EP1540270A2 Scanning probe microscope |
| 06/15/2005 | EP1539637A2 Fluid delivery for scanning probe microscopy |
| 06/15/2005 | EP1289627B1 Nanodosimeter based on single ion detection |
| 06/15/2005 | CN1628251A Electrical feedback detection system for multi-point probes |
| 06/15/2005 | CN1206261C Gas-barrier films |
| 06/15/2005 | CN1206157C Reversible molecular electronic device based on technique of scan tunnel microscope and its manufacturing method |
| 06/14/2005 | US6906538 Alternating pulse dual-beam apparatus, methods and systems for voltage contrast behavior assessment of microcircuits |
| 06/14/2005 | US6906450 Resonant probe driving arrangement and a scanning probe microscope including such an arrangement |
| 06/14/2005 | US6905760 Multilayer; crystalline polypropylene; alpha-olefin softener and hydrocarbon solvent; core mixture of crystalline polypropylene and hydrocarbon solvent |
| 06/14/2005 | US6904791 Scanning probe microscope |
| 06/09/2005 | US20050123245 Optical probe and optical pick-up apparatus |
| 06/09/2005 | US20050123186 Tape manufacturing system |
| 06/09/2005 | US20050120781 Scanning probe microscope |
| 06/08/2005 | EP1135792A4 Method for manufacturing carbon nanotubes as functional elements of mems devices |
| 06/08/2005 | CN1624452A Scanning probe microscope and scanning method |
| 06/08/2005 | CN1205113C Single molecular array on silicon substrate for quantum computer, its preparation method and quantum computer using the substrate |
| 06/07/2005 | US6903351 Charged particle beam irradiation equipment having scanning electromagnet power supplies |
| 06/02/2005 | WO2005050666A2 An oscillating probe with a virtual probe tip |
| 06/02/2005 | US20050117163 High sensitivity scanning probe system |
| 06/02/2005 | US20050115922 Method of manufacturing optical fiber probe and for finishing micro material |
| 06/02/2005 | DE10321931B4 Verfahren zur berührungslosen Anregung von Torsionsschwingungen in einem einseitig eingespannten Federbalken eines Rasterkraftmikroskops Method for contactless excitation of torsional vibrations in a cantilever cantilever of an atomic force microscope |
| 06/01/2005 | EP1535300A2 Improved method and system for scanning apertureless fluorescence microscope |
| 06/01/2005 | EP1535020A2 Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope |
| 06/01/2005 | CN1621806A Method for making substrate with positioning function applied in atomic force microscope research |
| 05/31/2005 | US6900581 Electron-emitting device, electron source and image-forming apparatus, and manufacturing methods thereof |
| 05/31/2005 | US6900575 Multiple mechanical resonator parametric device |
| 05/31/2005 | US6900446 Charged particle beam irradiation equipment and control method thereof |
| 05/31/2005 | US6900435 Deconvolving far-field images using scanned probe data |
| 05/26/2005 | WO2005046305A2 Method of producing nanostructure tips |
| 05/26/2005 | US20050112505 Direct write nano lithography; atomic force microscope discharges precursor fluid onto target surface in preferred orientation |
| 05/26/2005 | US20050109929 Nanodosimeter based on single ion detection |
| 05/26/2005 | US20050109925 Height calibration of scanning probe microscope actuators |
| 05/26/2005 | US20050109747 Laser scribing and machining of materials |
| 05/25/2005 | EP1532637A2 Method of forming atomic force microscope tips |
| 05/25/2005 | EP1532458A1 Direct, low frequency capacitance measurement for scanning capacitance microscopy |
| 05/25/2005 | EP1532069A1 Thermal movement sensor |
| 05/24/2005 | US6898037 Optical equipment assemblies and techniques |
| 05/24/2005 | US6897015 Detecting target parasite in sample; provide substrate with a surface, deposit gold layer on surface, incubate with sample, image surface under microscope |
| 05/19/2005 | WO2004053928A3 Methods of measuring integrated circuit structure and preparation thereof |
| 05/19/2005 | US20050105453 Recording apparatus |
| 05/19/2005 | US20050103996 Measurement device for electron microscope |
| 05/19/2005 | US20050103994 Conductive transparent probe and probe control apparatus |
| 05/18/2005 | EP1531327A1 SOM cantilever with hole with tip filling with a projected shape |
| 05/18/2005 | CN1202431C Near field optical probe and near field optical microscope and photo recording/reproducing device |
| 05/17/2005 | US6894287 Microfabrication apparatus and microfabrication method |
| 05/17/2005 | US6894272 Device for simultaneously carrying out an electrochemical and a topographical near-field microscopy |
| 05/17/2005 | US6893986 Method of reducing internal stress in materials |
| 05/17/2005 | US6893966 Method of patterning the surface of an article using positive microcontact printing |
| 05/17/2005 | US6893884 Method and apparatus for measuring dopant profile of a semiconductor |
| 05/17/2005 | US6892432 Nanotube cartridge and a method for manufacturing the same |
| 05/12/2005 | WO2004099712A3 Nanomanipulation on a sample surface using atomic force microscopy |
| 05/12/2005 | US20050100974 base plate treated with a solution of mixed self-assembled monolayer of 0.1-20% maleimide-terminal groups in a background of tri(ethylene glycol) terminal groups; self-sealing removable member |
| 05/12/2005 | US20050097944 Software synchronization of multiple scanning probes |
| 05/11/2005 | CN1614390A Quantum interfering microscopic detector |
| 05/10/2005 | US6891613 Method for the detection of dyes in fluorescence microscopy |
| 05/10/2005 | US6891390 Circuit analysis using electric field-induced effects |
| 05/10/2005 | US6891171 Method for repairing a phase shift mask and a focused ion beam apparatus for carrying out method |
| 05/10/2005 | US6891151 Probe with hollow waveguide and method for producing the same |