| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 09/22/2005 | US20050205776 AFM-based lithography metrology tool |
| 09/21/2005 | EP1577660A1 Measuring method and device for vibration frequency of multi-cantilever |
| 09/21/2005 | CN1672011A 扫描探针显微镜 SPM |
| 09/21/2005 | CN1670505A Multiple-pattern atomic force probe scanning system |
| 09/20/2005 | US6947634 Optical waveguide device |
| 09/20/2005 | US6947133 Method for increasing the spectral and spatial resolution of detectors |
| 09/20/2005 | US6945100 Scanning probe microscope with improved probe tip mount |
| 09/20/2005 | US6945099 Torsional resonance mode probe-based instrument and method |
| 09/15/2005 | WO2005085801A1 Method and apparatus for detection of biomolecular interaction using near-field light |
| 09/15/2005 | WO2004104516A3 Spring constant calibration device |
| 09/15/2005 | WO2004079405A3 Method and apparatus for imaging using contunuous non-raster patterns |
| 09/15/2005 | US20050199047 Liquid cell and passivated probe for atomic force microscopy and chemical sensing |
| 09/15/2005 | US20050199046 Scanning probe microscope |
| 09/15/2005 | DE10259118B4 Mikroskopie und Spektroskopie elektromagnetischer Nahfelder thermischen Ursprungs Microscopy and spectroscopy of electromagnetic near fields of thermal origin |
| 09/14/2005 | EP1574815A2 A dual stage instrument for scanning a specimen |
| 09/14/2005 | EP1573299A2 Fully digital controller for cantilever-based instruments |
| 09/14/2005 | CN1219296C Equipment and method for preparing fibre-optical microprobe by siphon lifting method corrosion |
| 09/13/2005 | US6944117 Information recording medium and information recording device |
| 09/13/2005 | US6943417 DNA-based memory device and method of reading and writing same |
| 09/13/2005 | US6943043 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 09/13/2005 | US6942914 Dielectric recording medium, and method of and apparatus for producing the same |
| 09/13/2005 | US6941798 Scanning probe microscope and operation method |
| 09/09/2005 | WO2005062029A3 A tape manufacturing system |
| 09/08/2005 | US20050194534 Method of operating a probe microscope |
| 09/08/2005 | US20050194365 Method of precise laser nanomachining with UV ultrafast laser pulses |
| 09/08/2005 | DE10314560B4 Vorrichtung und Verfahren zum Bestimmen einer elektrischen Eigenschaft einer Probe Apparatus and method for determining an electrical property of a sample |
| 09/08/2005 | DE10304532B4 Verfahren zur Schärfung einer Spitze sowie geschärfte Spitze A method for sharpening a tip and sharpened tip |
| 09/07/2005 | EP1571691A2 Point source for electron field emission with local shielding. |
| 09/07/2005 | EP1570514A2 Integrated circuit and methods of measurement and preparation of measurement structure |
| 09/07/2005 | EP1569733A2 Methods for assembly and sorting of nanostructure-containing materials and related articles |
| 09/07/2005 | CN1666312A Software synchronization of multiple scanning probes |
| 09/06/2005 | US6940681 Optical to magnetic alignment in magnetic tape system |
| 09/01/2005 | US20050191434 controlling deposition from scanning probe microscope tips to substrates, using electrical, magnetic, chemical or analogous forces |
| 09/01/2005 | US20050191427 Selective functionalization of carbon nanotube tips allowing fabrication of new classes of nanoscale sensing and manipulation tools |
| 09/01/2005 | US20050190684 Nanometer scale data storage device and associated positioning system |
| 09/01/2005 | US20050189491 Deconvolving far-field images using scanned probe data |
| 09/01/2005 | US20050189490 Scanning probe microscopy and method of measurement by the same |
| 09/01/2005 | US20050189480 Long travel near-field scanning optical microscope |
| 09/01/2005 | US20050188752 Digital control of quality factor in resonant systems including cantilever based instruments |
| 08/31/2005 | EP0986057B1 Near-field optical head |
| 08/31/2005 | CN1662662A Nucleic acid sequencing by signal stretching and data integration |
| 08/31/2005 | CN1661355A Probe unit of microscope with atomic force and manufacturing method |
| 08/30/2005 | US6935167 Harmonic cantilevers and imaging methods for atomic force microscopy |
| 08/25/2005 | WO2005076832A2 Method for manufacturing single wall carbon nanotube tips |
| 08/25/2005 | US20050188309 Graphical automated machine control and metrology |
| 08/23/2005 | US6933153 Metal ion specific capacity affinity sensor |
| 08/23/2005 | US6932504 Heated self-detecting type cantilever for atomic force microscope |
| 08/23/2005 | US6931917 System for sensing a sample |
| 08/18/2005 | US20050181132 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 08/18/2005 | US20050180028 Optical device, optical system, method of production of same, and mold for production of same |
| 08/17/2005 | CN1656236A Device and method of use for detection and characterization of pathogens and biological materials |
| 08/17/2005 | CN1656035A Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof |
| 08/17/2005 | CN1654230A Method for manufacturing nanometer pattern by nanometer etching technology dipping in dynamic combination mode |
| 08/16/2005 | US6930502 Method using conductive atomic force microscopy to measure contact leakage current |
| 08/16/2005 | US6930479 High resolution scanning magnetic microscope operable at high temperature |
| 08/16/2005 | US6930316 Ion implantation system and ion implantation method |
| 08/16/2005 | US6930307 Method of production, method of inspection, and method of use of scanning probe microscope probe |
| 08/16/2005 | US6929934 apparatus for imaging an object, comprising a probe via which an assay component may be delivered; a sensor to detect ion current; and means for controlling the position of the probe relative to the object in response to the ion current |
| 08/16/2005 | US6928863 Apparatus and method for isolating and measuring movement in a metrology apparatus |
| 08/11/2005 | US20050176154 Using flow through separation mixture to characterize a population of linear macromolecules and long chain branched macromolecules of interest; size exclusion chromatography |
| 08/11/2005 | US20050174130 Spatially resolved electromagnetic property measurement |
| 08/11/2005 | US20050172704 Methods utilizing scanning probe microscope tips and products thereof or produced thereby |
| 08/11/2005 | US20050172703 Scanning probe microscopy inspection and modification system |
| 08/10/2005 | CN1653620A Method of fabricating probe for SPM having FET channel structure utilizing self-aligned fabrication |
| 08/10/2005 | CN1653605A Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semico |
| 08/09/2005 | US6927400 Sample manipulation system |
| 08/09/2005 | US6925860 Leveling a measured height profile |
| 08/04/2005 | US20050170216 Magnetic recording tape |
| 08/04/2005 | US20050167576 Near-field optical probe |
| 08/03/2005 | EP1560204A1 Magnetic recording tape |
| 08/02/2005 | US6924489 Device for reducing the impact of distortions in a microscope |
| 07/28/2005 | WO2005046305A3 Method of producing nanostructure tips |
| 07/28/2005 | US20050161594 Plasmon enhanced near-field optical probes |
| 07/28/2005 | US20050161430 Method of forming atomic force microscope tips |
| 07/28/2005 | US20050160802 SPM cantilever and fabricating method thereof |
| 07/28/2005 | DE19900114B4 Verfahren und Vorrichtung zur gleichzeitigen Bestimmung zumindest zweier Materialeigenschaften einer Probenoberfläche, umfassend die Adhäsion, die Reibung, die Oberflächentopographie sowie die Elastizität und Steifigkeit Method and apparatus for the simultaneous determination of at least two material properties of a sample surface, comprising the adhesion, friction, the surface topography as well as the elasticity and stiffness |
| 07/27/2005 | EP1557843A2 Directed growth of nanotubes on a catalyst |
| 07/27/2005 | EP1556737A2 Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrication |
| 07/27/2005 | EP1141753A4 Lensed optical fibers & unique micropipettes with subwavelength apertures |
| 07/27/2005 | EP0996122B1 Near-field optical head |
| 07/26/2005 | US6921578 Low-reflection glass article |
| 07/21/2005 | WO2005066609A1 Afm cantilever with nanoindentation test functionality |
| 07/21/2005 | WO2005066368A2 Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes |
| 07/20/2005 | EP1555676A2 Method of operating a probe microscope |
| 07/19/2005 | US6920088 Assembly for writing and/or erasing high density data on a media |
| 07/19/2005 | US6918286 SPM cantilever |
| 07/14/2005 | US20050151536 Magnetic carbon nanotube |
| 07/14/2005 | US20050151077 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope |
| 07/13/2005 | EP1553048A1 Nanometric mechanical oscillator |
| 07/13/2005 | EP1553047A1 Nanometric mechanical oscillator |
| 07/12/2005 | US6917726 Zero-mode clad waveguides for performing spectroscopy with confined effective observation volumes |
| 07/12/2005 | US6917198 Hybrid hall vector magnetometer |
| 07/07/2005 | WO2005062029A2 A tape manufacturing system |
| 07/07/2005 | WO2005020803A3 Raman imaging and sensing apparatus employing nanoantennas |
| 07/07/2005 | WO2004088668A3 Device and method for determining an electrical property of a sample |
| 07/07/2005 | US20050147981 Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes |
| 07/07/2005 | US20050146046 Method for making probes for atomic force microscopy |
| 07/07/2005 | US20050145788 High dynamic range mass spectrometer |
| 07/07/2005 | US20050145021 Method and apparatus for manipulating a sample |
| 07/06/2005 | EP1550846A1 Contact probe storage FET sensor |