Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
11/2005
11/24/2005US20050258828 Hybrid hall vector magnetometer
11/23/2005EP0981051B1 Optical probe for proximity field measurements
11/22/2005US6967168 Method to repair localized amplitude defects in a EUV lithography mask blank
11/22/2005US6967074 Methods of detecting immobilized biomolecules
11/17/2005US20050254121 Infrared focusing device
11/17/2005US20050252882 Cantilever-type near-field probe for optical data storage and method of manufacturing the same
11/16/2005EP1436424A4 Differential tagging of polymers for high resolution linear analysis
11/16/2005CN1696653A Method for measuring Kashmir inside rectangular cavity
11/10/2005US20050250097 Methods of arraying biological materials using peelable and resealable devices
11/10/2005US20050247998 Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using same
11/10/2005US20050247875 Conductive transparent probe and probe control apparatus
11/10/2005US20050247874 Scanning probe microscope and molecular structure change observation method
11/10/2005US20050247117 Probe with hollow waveguide and method for producing the same
11/03/2005WO2005104138A1 Method and apparatus for obtaining quantitative measurements using a probe based instrument
11/03/2005WO2005104137A1 Surface scanning method
11/03/2005WO2005103648A1 Spm cantilever and method of manufacturing the same
11/03/2005WO2005103647A1 Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope
11/03/2005WO2005103646A1 Scanning probe microscope probe and production method therefor and scanning probe microscope and application method therefor and needle-like element and production method therefor and electron element and production method tehrefor and charge density wave quantum phase microscope and charge density wave quantum interferomet
11/03/2005WO2005103604A2 Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing spm probes
11/03/2005US20050246129 Near-field scanning microwave microscope using dielectric resonator
11/03/2005US20050243618 DNA-based memory device and method of reading and writing same
11/03/2005US20050242339 Apparatus and method for transverse characterization of materials
11/03/2005US20050242283 Scanning probe microscope and specimen surface structure measuring method
11/03/2005US20050242282 Conductive transparent probe and probe control apparatus
11/03/2005US20050241392 Atomic force microscope tip holder for imaging in liquid
11/03/2005US20050241375 Cantilever probes for nanoscale magnetic and atomic force microscopy
11/03/2005US20050241374 High Aspect Ratio Tip Atomic Force Microscopy Cantilevers and Method of Manufacture
11/03/2005US20050241175 Method and apparatus for removing and/or preventing surface contamination of a probe
11/02/2005EP1592057A2 Method and apparatus for removing and/or preventing surface contamination of a probe
11/02/2005EP1171791B1 Optical microscopy and its use in the study of cells
11/02/2005CN1225560C Inspection method of foreign substance origenated from biological body
11/01/2005US6960765 Probe driving method, and probe apparatus
11/01/2005US6959481 Apertured probes for localized measurements of a material's complex permittivity and fabrication method
10/2005
10/27/2005WO2005101469A1 End-point detection for fib circuit modification
10/27/2005US20050239193 Device and method of use for detection and characterization of microorganisms and microparticles
10/27/2005US20050239047 Methods and devices for determining a cell characteristic, and applications employing the same
10/27/2005DE10393612T5 Rasterkraftmikroskop und Betriebsverfahren zur Topographie- und Erkennungsbildgebung Atomic force microscope and operating procedures for topography and recognition imaging
10/26/2005EP1588383A2 Probe for an optical near field microscope and method for producing the same
10/26/2005EP1588382A2 Probe for an optical near field microscope with improved scattered light suppression and method for producing the same
10/26/2005EP0986058B1 Near-field optical head
10/26/2005CN1689092A Light irradiation head and information storage device
10/26/2005CN1688884A Interaction detecting method and bioassay device, and bioassay-use substrate
10/25/2005US6958811 Method for the detection of dyes in fluorescence microscopy
10/20/2005WO2005097669A1 Method for modifying existing micro- and nano-structures using a near-field scanning optical microscope
10/20/2005US20050232544 Plasmon-enhanced tapered optical fibers
10/20/2005US20050231225 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
10/20/2005US20050230622 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
10/20/2005US20050230619 Method and system for measurement of dielectric constant of thin films using a near field microwave probe
10/20/2005US20050230345 Method of fabricating near field optical probe
10/19/2005EP1513954A4 Device and method of use for detection and characterization of pathogens and biological materials
10/19/2005CN1685195A Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology
10/19/2005CN1683917A United measuring system and its measuring technology for scanning channel microscope and scanning micro electrode
10/18/2005US6956660 System and method for measuring properties of an object using a phase difference between two reflected light signals
10/18/2005US6956210 Methods for preparing samples for atom probe analysis
10/18/2005US6955078 Caliper method, system, and apparatus
10/13/2005WO2005096360A1 Probe for a scanning probe microscope and method for fabricating same
10/13/2005US20050223785 Scanning probe device and processing method by scanning probe
10/12/2005EP1583845A2 Method and apparatus for molecular analysis in small sample volumes
10/12/2005CN2733342Y 模块化原子力显微镜 Modular AFM
10/12/2005CN1682315A Sensor with suspending arm and optical resonator
10/12/2005CN1681944A Controlled alignment of nano-barcodes encoding specific information for scanning probe microscopy (SPM) reading
10/11/2005US6954267 Device for measuring surface defects
10/11/2005US6953930 Conductive transparent probe and probe control apparatus
10/11/2005US6953927 Method and system for scanning apertureless fluorescence microscope
10/11/2005US6953519 making a cantilever using lithographic techniques and forming microscopic electrodes at a distal end of the cantilever by sputtering and gas-assisted etching processing using a focused charge particle beam
10/11/2005US6952952 Topography and recognition imaging atomic force microscope and method of operation
10/06/2005WO2005092559A1 Method and precise laser nanomachining with uv ultrafast laser pulses
10/06/2005US20050221577 Method for modifying existing micro-and nano-structures using a near-field scanning optical microscope
10/06/2005US20050218324 End-point detection for fib circuit modification
10/06/2005US20050217354 Scanning probe microscope
10/06/2005DE102004012740A1 Atomic force microscopy substrate surface or physical reaction sampling unit has inductive, capacitive or strain gauge sensor and oscillator directly connected to cantilever
10/06/2005DE102004012268A1 A micro/nano region thin film tensile test planarity measurement procedure observes three dimensional movement of marker atoms using scanning tunnelling microscopy
10/05/2005EP1583104A2 Nanometric mechanical oscillator, method of fabricating the same, and measurement apparatus using the same
10/05/2005EP1582856A1 Scanning type probe microscope, and method of observing changes in molecular structure
10/05/2005EP1342049B1 Scanning probe with digitised pulsed-force mode operation and real-time evaluation
10/05/2005CN1678512A Thermal movement sensor
10/05/2005CN1677075A Method for rapidly preparing AFM biological sample
10/04/2005US6952651 Measuring the distance between labeled nucleotides, such as nucleotides labeled with bulky groups
10/04/2005US6952014 Constant current supply to energize an integrated circuit during Focused Ion Beam milling; monitoring the change in input voltage from the constant power supply
10/04/2005US6951695 Lapping, mechanical polishing, and reducing internal stress of a gallium, aluminum and indium nitride wafer by thermal annealing or chemical etching; crystallographic plane surfaces
10/04/2005US6951130 Software synchronization of multiple scanning probes
10/04/2005US6951129 Scanning probe microscope with improved probe head mount
09/2005
09/29/2005US20050214966 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
09/29/2005US20050214509 Hydrophilic, anti-fogging, and anti-staining thin film and method for preparation thereof
09/29/2005US20050214452 Method and apparatus for depositing material with high resolution
09/29/2005US20050212529 Method and apparatus for measuring electrical properties in torsional resonance mode
09/29/2005US20050212010 Micro-protruding structure
09/29/2005US20050211915 Probe for an atomic force microscope and method for making such a probe
09/29/2005DE102004012520A1 Punktquelle für Elektronen-Feldemissionen mit lokaler Abschirmung Point source for electron field emission with local shielding
09/29/2005DE102004012044A1 Carbon layer formation, comprises precipitating a layer by introducing a carbon containing gas to a hydrogen atmosphere at high pressure and temperature
09/28/2005EP1580738A1 Near-field optical head and method for manufacturing the same
09/27/2005US6950385 Information recording apparatus
09/27/2005US6950296 Nanoscale grasping device, method for fabricating the same, and method for operating the same
09/27/2005US6950179 Shape measuring apparatus, shape measuring method, and aligning method
09/27/2005US6949732 Optical apparatuses using the near-field light
09/27/2005US6949490 High-TC superconducting ceramic oxide products and macroscopic and microscopic methods of making the same
09/27/2005CA2361759C Method of information collection and processing of sample's surface
09/22/2005US20050208554 Microarray for use in detection, identification and/or sequencing of nucleic acids and/or other biomolecules using coded characterizing elements
09/22/2005US20050208304 Coatings for carbon nanotubes
09/22/2005US20050206877 Shape measuring apparatus, shape measuring method, and aligning method
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