Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
02/2006
02/02/2006WO2006011714A1 A method for fabricating spm and cd-spm nanoneedle probe using ion beam and spm and cd-spm nanoneedle probe thereby
02/02/2006WO2006011636A1 Sensing apparatus
02/02/2006WO2006011348A1 Molecule measuring device and molecule measuring method
02/02/2006US20060023578 Optical lens, focusing lens, optical pickup device as well as optical recording and reproducing device
02/01/2006CN1727872A Method of using ion beam to analyze defective workmanship of metal silicides
01/2006
01/31/2006US6992842 Optical device, optical system, method of production of same, and mold for production of same
01/31/2006US6991932 Sequence determination; deformation, amplification; recording, displaying
01/31/2006US6990853 Alignment-tolerant lens structures for acoustic force actuation of cantilevers
01/26/2006US20060016986 MEMS differential actuated nano probe and method for fabrication
01/26/2006US20060016251 Topography and recognition imaging atomic force microscope and method of operation
01/25/2006EP1619531A2 Optical waveguide probe and manufacturing method of the same, and scanning near-field optical microscope
01/25/2006CN1726431A Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrications
01/24/2006US6989535 Atomic force microscopy, method of measuring surface configuration using the same, and method of producing magnetic recording medium
01/19/2006US20060014203 carbon nanotubes as electrodes; for biopolymers such as DNA and RNA
01/19/2006US20060014202 production method of electrical connection structure and electric wiring; carbon nanotube as the electrode and contacting the electrode with the biopolymer (DNA, RNA, or a protein) then applying an electric current between the electrode and biopolymer
01/19/2006US20060011830 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus
01/19/2006US20060011467 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus
01/18/2006EP1617439A1 Optical fiber probe, light detection device, and light detection method
01/18/2006EP1617423A2 Information recording medium and information reproducing apparatus
01/18/2006EP1615980A1 Adhesive compositions and method for selection thereof
01/18/2006CN1722310A Near field optical head and information recording and reproducing apparatus mounted with the near field optical head
01/17/2006US6987570 Reference signal for stitching of interferometric profiles
01/17/2006US6987277 scanning probe microscopes
01/17/2006US6986280 Integrated measuring instrument
01/12/2006WO2006004064A1 Scanning probe microscope system
01/12/2006WO2006003789A1 Method and device for analyzing distribution of coercive force in vertical magnetic recording medium using magnetic force microscope
01/12/2006US20060009872 Optical metrology model optimization for process control
01/12/2006US20060006317 Optical fiber probe, light detection device, and light detection method
01/12/2006US20060005634 System and method for confining an object to a region of fluid flow having a stagnation point
01/12/2006US20060005615 Method and apparatus for evanescent field measuring of particle-solid separation
01/12/2006US20060005614 Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
01/11/2006EP1497464A4 Compositions and methods related to two-arm nucleic acid probes
01/11/2006EP1061510B1 Near-field optical head and production method thereof
01/10/2006US6985310 Optical device, optical system, method of production of same, and mold for production of same
01/10/2006US6985223 Raman imaging and sensing apparatus employing nanoantennas
01/10/2006US6984977 Scanning SQUID microscope with improved spatial resolution
01/10/2006US6983644 Specimen observation method in atomic force microscopy and atomic force microscope
01/05/2006WO2006002153A1 Probes for use in scanning probe microscopes and methods of fabricating such probes
01/05/2006US20060000984 Method for increasing the spectral and spatial resolution of detectors
01/05/2006US20060000814 Laser-based method and system for processing targeted surface material and article produced thereby
01/05/2006US20060000263 Method and apparatus for obtaining quantitative measurements using a probe based instrument
01/05/2006DE19714346B4 Verfahren und Vorrichtung zur optischen Mikroskopie mit Subwellenlängenauflösung mittels eines Tieftemperatur-Nahfeldmikroskops Method and apparatus for optical microscopy by means of a low-temperature Subwellenlängenauflösung near-field microscope
01/04/2006EP1611607A1 Method of fabricating semiconductor probe with resistive tip
01/03/2006US6982419 Probe with hollow waveguide and method for producing the same
01/03/2006US6981407 Atomic force microscopy measurements of contact resistance and current-dependent stiction
12/2005
12/29/2005US20050287933 Glass substrate for information recording medium and process for manufacturing the same
12/28/2005EP1610318A1 Light irradiation head and information storage device
12/28/2005EP1609164A1 Resistive cantilever spring for probe microscopy
12/27/2005US6980937 Method and system for quantifying the step profile characteristics semiconductor features using surface analysis data
12/27/2005US6979406 Cantilever-type near-field probe for optical data storage and method of manufacturing the same
12/27/2005US6979244 Method of manufacturing an electronic device containing a carbon nanotube
12/27/2005US6978654 Scanning tip orientation adjustment method for atomic force microscopy
12/22/2005WO2005122182A1 Scanning electrochemical microscope probe
12/22/2005WO2005121748A1 Optical waveguide
12/22/2005WO2005120486A2 Novel use of cytotoxic drugs for treatment and prophylasxis of aging diseases by reversing the loss of elasticity of epithelial cells due to aging
12/22/2005WO2004104516A8 Spring constant calibration device
12/22/2005US20050283335 Integrated circuit and methods of measurement and preparation of measurement structure
12/22/2005US20050280792 Defining a pattern on a substrate
12/22/2005US20050279729 Probes for use in scanning probe microscopes and methods of fabricating such probes
12/22/2005US20050279158 Atomic force microscope and corrector thereof and measuring method
12/21/2005EP1607737A1 Device and method for detection and measurement of nucleic acid strands in solution
12/21/2005EP1606598A2 Raman imaging and sensing apparatus employing nanoantennas
12/21/2005CN1710403A Atomic-force microscope and its operation method
12/21/2005CN1710402A Near-field microscope of optical wave band
12/21/2005CN1232813C Method for preparing probe tip of nano tube
12/20/2005US6978215 Method of determining of true nonlinearity of scan along a selected direction X or Y in scan microscope
12/15/2005WO2005119728A2 Electron stream apparatus and method
12/15/2005WO2005119697A1 Tip structure for scanning devices, method of its preparation and devices thereon
12/15/2005WO2005119206A1 Method and device for controlling photo-excitation q value of vibrator
12/15/2005WO2005119205A1 Instrument for electrical characterisation on a nanometric scale
12/15/2005US20050277696 Novel use of cytotoxic drugs for treatment and prophylasxis of aging diseases by reversing the loss of elasticity of epithelial cells due to aging
12/15/2005US20050276535 Zero-mode metal clad waveguides for performing spectroscopy with confined effective observation volumes
12/14/2005EP1604190A2 Method and apparatus for imaging using contunuous non-raster patterns
12/14/2005CN1708842A Integrated circuit and method of measurement and preparation of measurement structure
12/13/2005US6975129 Electrical scanning probe microscope apparatus
12/13/2005US6974712 Method of fabricating a surface-type optical apparatus
12/13/2005CA2331699C Electrocapasitive type force measuring apparatus
12/08/2005US20050269511 Probe driving method, and probe apparatus
12/08/2005US20050269510 Electrical scanning probe microscope apparatus
12/08/2005US20050269509 Method for manufacturing single wall carbon nanotube tips
12/08/2005US20050269035 Fine pattern forming apparatus and fine pattern inspecting apparatus
12/07/2005CN1706002A Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures
12/07/2005CN1705982A Glass substrate for information recording medium and process for producing the same
12/07/2005CN1230669C Scanning probe-needle microscope
12/06/2005US6972912 Optical device, optical system, method of production of same, and mold for production of same
12/06/2005US6972562 Near-field magneto-optical microscope
12/01/2005WO2005114230A2 Method and apparatus for measuring electrical properties in torsional resonance mode
12/01/2005US20050265209 Electroluminescent multilayer optical information storage medium with integrated readout and composition of matter for use therein
12/01/2005US20050264825 Sensor with cantilever and optical resonator
12/01/2005US20050263700 Processing method using probe of scanning probe microscope
12/01/2005US20050263686 Near field scanning microscope probe and method for fabricating same
12/01/2005US20050262931 System for sensing a sample
12/01/2005US20050262930 Scanning probe microscopy apparatus and techniques
12/01/2005US20050262685 Method of processing vertical cross-section using atomic force microscope
11/2005
11/29/2005US6970307 Optical near-field generating element and optical apparatus including the same
11/29/2005US6969847 High dynamic range mass spectrometer
11/29/2005US6968730 Non-destructive evaluation of thermal barrier coatings in gas turbine engines
11/29/2005CA2392004C Probe for scanning probe microscope and method for producing the same, and scanning probe microscope including the probe and molecular processing method using the scanning probe microscope
11/24/2005WO2005066368A3 Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes
11/24/2005US20050259252 Method and device for recording optical near field interaction signals
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