| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 01/29/2009 | US20090025465 Miniaturized Spring Element and Method for Producing the Spring Element |
| 01/29/2009 | DE102007034854A1 Verfahren und Vorrichtung zur automatisierten Messung und Kombination von Bildaufnahme und Kraftmessung Method and apparatus for automated measurement and combination of imaging and force measurements |
| 01/28/2009 | EP2018512A1 Measuring scanning probe for scanning a surface to be measured |
| 01/22/2009 | WO2009012180A1 Ultrananocrystalline diamond film deposition for spm probes |
| 01/22/2009 | US20090022456 Optical fiber probe tips and methods for fabricating same |
| 01/22/2009 | US20090021747 Shape measuring apparatus |
| 01/21/2009 | EP2017610A1 Ionizing method and device by electrospray |
| 01/21/2009 | EP2017599A2 Shape measuring apparatus |
| 01/20/2009 | US7478552 Optical detection alignment/tracking method and apparatus |
| 01/15/2009 | WO2009008915A2 Tunable bio-functionalized nanoelectromechanical systems having superhydrophobic surfaces for use in fluids |
| 01/15/2009 | US20090015912 Total Internal Reflectance Fluorescence (TIRF) Microscope |
| 01/15/2009 | US20090013770 Material property measurements using multiple frequency atomic force microscopy |
| 01/14/2009 | EP2013609A2 Atomic force microscope tip arrays and methods of manufacturing same |
| 01/14/2009 | EP1532069B1 Thermal movement sensor |
| 01/14/2009 | EP1430485B1 Device and method for scanning probe microscope |
| 01/13/2009 | US7477817 Probe for an optical near field microscope with improved scattered light suppression and method for producing the same |
| 01/13/2009 | US7476786 Using nanoparticles to identify and/or sequence biomolecules; forensic analysis; medical diagnostics |
| 01/13/2009 | US7476418 Etching and planarizing a substrate by irradiation with a focused ion beam, decomposing and depositing an organic gas into a columnar electrode, and then attaching the nanotubes to the electrode; maintained electroconductivity between nanotubes and electrodes |
| 01/08/2009 | WO2009004107A2 Digital interface device for incorporating the image mode into a single-molecule force-clamp spectroscope |
| 01/08/2009 | US20090009924 Nanoscale grasping device, method for fabricating the same, and method for operating the same |
| 01/08/2009 | US20090007645 Piezoelectric microcantilevers and uses in atomic force microscopy |
| 01/07/2009 | EP2010863A1 Optical scanning probe |
| 01/07/2009 | EP1428058A4 Diffractive optical position detector |
| 01/07/2009 | CN101341388A Optical apparatus comprising cantilever, method for manufacturing and using the same |
| 01/07/2009 | CN101339816A Two-dimensional micro-motion platform for atomic force microscope and micro-mechanical parameter test method |
| 01/07/2009 | CN100449257C A method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 01/06/2009 | US7473894 Apparatus and method for a scanning probe microscope |
| 01/06/2009 | US7473887 Resonant scanning probe microscope |
| 01/02/2009 | DE102007031112A1 Vorrichtung und Verfahren zur Untersuchung von Oberflächeneigenschaften verschiedenartiger Materialien Device and method for the examination of surface properties of various materials |
| 01/01/2009 | US20090002714 Optical Device Comprising a Cantilever and Method of Fabrication and Use Thereof |
| 01/01/2009 | US20090000365 AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope |
| 01/01/2009 | US20090000363 Materials and Methods for Identifying Biointeractive Nanostructures and/or Nanoparticles |
| 01/01/2009 | US20090000362 Nanotweezer And Scanning Probe Microscope Equipped With Nanotweezer |
| 12/31/2008 | WO2009001220A2 Functionalization of microscopy probe tips |
| 12/31/2008 | WO2009000885A1 Apparatus and method for investigating surface properties of different materials |
| 12/31/2008 | EP1556737B1 Methods for fabrication of nanometer-scale engineered structures for mask repair application |
| 12/30/2008 | US7469831 Laser-based method and system for processing targeted surface material and article produced thereby |
| 12/25/2008 | US20080315745 Electronic device containing carbon nanotubes and method for manufacturing the same |
| 12/25/2008 | US20080315092 Scanning probe microscopy inspection and modification system |
| 12/25/2008 | US20080314131 Sample manipulating apparatus |
| 12/24/2008 | DE102007063066A1 Verfahren und Vorrichtung zur Charakterisierung einer Probe mit zwei oder mehr optischen Fallen Method and device for characterization of a sample with two or more optical traps |
| 12/24/2008 | CN101329248A Tunnel-scanning microscope capable of measuring acting force among atomics and measuring method thereof |
| 12/24/2008 | CN101329247A Combined microscope for scanning atomic force and tunnel current under atmosphere |
| 12/23/2008 | US7467542 Alignment-tolerant lens structures for acoustic force actuation of cantilevers |
| 12/18/2008 | US20080309688 Nanolithography with use of viewports |
| 12/18/2008 | US20080307864 Scan Type Probe Microscope |
| 12/18/2008 | DE102007027508A1 Device for production of optically sensitive probes for scanning probe microscopy, has substrate, which is formed transparently, and immersion fluid is placed on substrate and below transparent substrate |
| 12/17/2008 | EP1953763A4 Scanning nanojet microscope and the operation method thereof |
| 12/17/2008 | CN101326433A Method for examining a measurement object, and apparatus |
| 12/16/2008 | US7464584 Semiconductor probe and method of writing and reading information using the same |
| 12/11/2008 | WO2008148951A1 Atomic force microscopy probe |
| 12/11/2008 | WO2008054467A3 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 12/11/2008 | US20080302960 Probe arrangement |
| 12/11/2008 | DE102007027509A1 Device for manufacturing particle probe for scanning probe microscopy using raster corroded plateau probes on plate made of semiconductor material, has lateral positioner for plate with multiple raster corroded plateau probes |
| 12/10/2008 | EP1999458A2 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 12/10/2008 | CN101322030A Biomolecule interaction using atomic force microscope |
| 12/09/2008 | US7462270 Nanotube with with a Y-shaped or V-shaped morphology coated with microparticulate ferromagnetic materials (iron, cobalt, nickel or alloys) capable of generating magnetic field and sensing magnetic response attached to substrate and extending outward; electrical resistance and high mechanical strength |
| 12/09/2008 | CA2331585C Apparatus and method for measuring intermolecular interactions by atomic force microscopy |
| 12/04/2008 | WO2008145110A1 Method and apparatus for characterizing a sample with two or more optical traps |
| 12/04/2008 | WO2008145109A1 Method device for the probe microscopic examination of a sample using luminescent microscopy |
| 12/04/2008 | WO2008145108A1 Method and device for examining a sample with a probe microscope |
| 12/04/2008 | WO2008145103A1 Microforce sensor, particularly for cmm and afm applications |
| 12/04/2008 | WO2008144906A1 Applications for scanning tunnelling microscopy |
| 12/04/2008 | WO2008031076A3 Atomic force microscope |
| 12/04/2008 | US20080296489 Atom Probe Evaporation Processes |
| 12/04/2008 | US20080295585 Tweezer-Equipped Scanning Probe Microscope and Transfer Method |
| 12/04/2008 | US20080295583 Surface Scanning Method |
| 12/04/2008 | DE102007063065A1 Verfahren und Vorrichtung zum sondenmikroskopischen Untersuchen einer Probe Method and apparatus for probe microscopic examination of a sample |
| 12/04/2008 | DE102007024992A1 Mikrokraftsensor, insbesondere für CMM- und AFM-Anwendungen Micro force sensor, in particular for CMM and AFM applications |
| 12/04/2008 | CA2688576A1 Applications for scanning tunnelling microscopy |
| 12/03/2008 | EP1779286A4 Laser-based method and system for processing targeted surface material and article produced thereby |
| 12/03/2008 | EP1341183B1 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory |
| 12/02/2008 | US7459682 Spin-polarized electron source and spin-polarized scanning tunneling microscope |
| 11/27/2008 | WO2008143817A1 High frequency deflection measurement of ir absorption |
| 11/27/2008 | US20080291789 Apparatus For Focusing Plasmon Waves |
| 11/27/2008 | US20080289404 Molecule Measuring Device and Molecule Measuring Method |
| 11/26/2008 | EP1994395A1 Method for determining a dopant concentration in a semiconductor sample |
| 11/26/2008 | CN101313206A Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography |
| 11/26/2008 | CN100437791C Conducting current method between scanning contact and storage medium |
| 11/25/2008 | US7456400 Scanning probe microscope and scanning method |
| 11/20/2008 | WO2008105919A3 Nanomechanical characterization of cellular activity |
| 11/20/2008 | US20080288186 Dynamic-Mode Atomic-Force-Microscope Probe (Tip) Vibration Simulation Method, Program, Recording Medium, And Vibration Simulator |
| 11/20/2008 | US20080285041 Optical Device for Measuring Modulated Signal Light |
| 11/20/2008 | US20080284446 Determination of Field Distribution |
| 11/20/2008 | US20080284422 Method and Device for Analyzing Distribution of Coercive Force in Vertical Magnetic Recording Medium Using Magnetic Force Microscope |
| 11/20/2008 | US20080283755 High frequency deflection measurement of IR absorption |
| 11/19/2008 | EP1991991A2 Method and apparatus for characterizing a probe tip |
| 11/19/2008 | EP1570514A4 Integrated circuit and methods of measurement and preparation of measurement structure |
| 11/18/2008 | US7453193 Electronic device containing a carbon nanotube |
| 11/18/2008 | US7451638 Harmonic cantilevers and imaging methods for atomic force microscopy |
| 11/13/2008 | WO2008104672A3 Method for growing a carbon nanotube on a nanometric tip |
| 11/12/2008 | EP1990626A1 Probe arrangement for electrophysiological analysis in an AFM |
| 11/12/2008 | EP1989535A2 Variable density scanning |
| 11/12/2008 | CN101303903A Apparatus for driving microminiature atomic force microscope |
| 11/11/2008 | US7449688 Deconvolving far-field images using scanned probe data |
| 11/11/2008 | US7448269 Scanning near field ultrasound holography |
| 11/06/2008 | WO2007078979B1 Probe module with integrated actuator for a probe microscope |
| 11/06/2008 | US20080272301 Micro-protruding structure |
| 11/06/2008 | US20080272087 Method for fabricating probe for use in scanning probe microscope |
| 11/06/2008 | DE10026911B4 Verfahren zur Herstellung eines Halbleiter-Superatoms und eines Aggregats davon A process for producing a semiconductor superatom and an aggregate thereof |