| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 01/17/2008 | US20080011852 Laser-based method and system for processing targeted surface material and article produced thereby |
| 01/17/2008 | US20080011067 Fully digitally controller for cantilever-based instruments |
| 01/17/2008 | US20080011066 Atomic force microscope cantilever and method for manufacturing the same |
| 01/16/2008 | EP1877753A2 Method and device for determining material properties |
| 01/16/2008 | CN100362071C Adhesive compositions and method for selection thereof |
| 01/15/2008 | US7319528 Surface texture measuring instrument |
| 01/15/2008 | US7319527 Sensor with cantilever and optical resonator |
| 01/15/2008 | US7319224 Semiconductor probe with resistive tip and method of fabricating the same |
| 01/15/2008 | US7318907 Apparatus for use in the detection of preferential particles in sample |
| 01/10/2008 | WO2008003796A1 Method for using an atomic force microscope |
| 01/10/2008 | WO2003098208A8 Molecular topological frationation of macromolecules |
| 01/09/2008 | EP1653478B1 Surface texture measuring probe and microscope utilizing the same |
| 01/03/2008 | US20080000293 Spm Cantilever and Manufacturing Method Thereof |
| 01/01/2008 | US7315367 Defining a pattern on a substrate |
| 01/01/2008 | US7313948 Real time detection of loss of cantilever sensing loss |
| 12/27/2007 | WO2007149534A2 Methods of polarization engineering and their applications |
| 12/27/2007 | WO2007109777A3 Stiffness tomography by atomic force microscopy |
| 12/21/2007 | WO2007145012A1 Probe design support system, probe design support method and probe design support program |
| 12/21/2007 | WO2007144313A1 Optical component operating in near field transmission |
| 12/21/2007 | WO2007041556A3 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 12/20/2007 | US20070294042 Cantilever Control Device |
| 12/20/2007 | US20070290130 Scanning probe microscope |
| 12/19/2007 | CN100356542C Method of fabricating semiconductor probe with resistive tip |
| 12/18/2007 | US7309991 Scanning probe inspection apparatus |
| 12/18/2007 | US7309863 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 12/13/2007 | WO2007140497A1 Virus-nanoarray |
| 12/13/2007 | WO2007098237A3 Method and apparatus for characterizing a probe tip |
| 12/13/2007 | WO2007044076A3 Cantilever probes for nanoscale magnetic and atomic force microscopy |
| 12/13/2007 | US20070285078 Probe microscope and measuring method using probe microscope |
| 12/12/2007 | CN200989961Y Bias current type tunnel scanning spetrometer and tunnel flying-spot microscope |
| 12/11/2007 | US7308334 Graphical automated machine control and metrology |
| 12/11/2007 | US7307436 Electrical feedback detection system for multi-point probes |
| 12/06/2007 | WO2007081913A3 Surface plasmon enhanced radiation methods and apparatus |
| 12/06/2007 | US20070279043 Probe, Manufacturing Method of the Probe, Recording Apparatus, and Reproducing Apparatus |
| 12/06/2007 | US20070278405 Multi-tip surface cantilever probe |
| 12/06/2007 | US20070278177 Processing method using atomic force microscope microfabrication device |
| 12/06/2007 | US20070277599 Atomic force microscope technique for minimal tip damage |
| 12/05/2007 | CN101083151A Probe position control system and method |
| 12/04/2007 | US7305319 Methods and systems for three-dimensional motion control and tracking of a mechanically unattached magnetic probe |
| 12/04/2007 | US7302833 Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy |
| 12/04/2007 | US7302832 Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes |
| 11/29/2007 | WO2007135483A2 Biomolecule interaction using atomic force microscope |
| 11/29/2007 | WO2007135345A1 Controlled atomic force microscope |
| 11/29/2007 | US20070272855 Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer |
| 11/29/2007 | US20070272040 Device and Method for Measuring Molecule Using Gel Substrate Material |
| 11/29/2007 | US20070272005 Probe position control system and method |
| 11/29/2007 | CA2653116A1 Controlled atomic force microscope |
| 11/28/2007 | CN101079331A A tunnel probe for scanning the tunnel microscope and its making method |
| 11/27/2007 | US7301888 Recording apparatus |
| 11/27/2007 | US7301336 Magnetic field generator device for calibration of magnetic force microscope |
| 11/27/2007 | US7301146 Probe driving method, and probe apparatus |
| 11/22/2007 | WO2007133585A2 Quantitative calorimetry signal for sub-micron scale thermal analysis |
| 11/22/2007 | WO2007024711A9 Oscillator and method of making for atomic force microscope and other applications |
| 11/22/2007 | US20070267385 Semiconductor probe with high resolution resistive tip and method of fabricating the same |
| 11/22/2007 | US20070266780 Scanning Probe Microscope |
| 11/21/2007 | EP1856701A1 Raster near field microscopy in the microwave and terahertz ranges with a signal processing device integrated in the measuring tip |
| 11/21/2007 | EP1330823B1 Afm-based data storage and microscopy |
| 11/21/2007 | EP1012862B1 Atomic force microscope for generating a small incident beam spot |
| 11/21/2007 | CN101076867A Total internal reflection fluorescent (TIRF) microscope |
| 11/21/2007 | CN101075015A Polarized electronic emitting source and self-rotating polarized scanning tunnel microscope |
| 11/21/2007 | CN100350249C Interaction detecting method and bioassay device, and bioassay-use substrate |
| 11/20/2007 | US7297933 Probe, near-field light generation apparatus including probe, exposure apparatus, and exposing method using probe |
| 11/20/2007 | US7297568 Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using same |
| 11/15/2007 | WO2006034470A3 Sensors for electrochemical, electrical or topographical analysis |
| 11/15/2007 | US20070263696 Quantitative calorimetry signal for sub-micron scale thermal analysis |
| 11/15/2007 | US20070261480 Atomic force microscope tip arrays and methods of manufacturing same |
| 11/08/2007 | WO2007127817A1 Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument |
| 11/08/2007 | WO2007125081A1 Optical scanning probe |
| 11/08/2007 | DE102007019243A1 Scanning unit for micromechanical scanning sensor, has functional part connected with base, and sensor head extending from end region of functional part and arranged in region of short side of rectangular cross section of functional part |
| 11/08/2007 | DE102006021289A1 Angular spacing or angle of e.g. circle, determining method, involves moving sensor relative to atomic lattice on circular path, detecting number and/or position of atoms of lattice, and determining angular spacing or angle by sensor |
| 11/07/2007 | EP1850972A2 Thermal control of deposition in dip pen nanolithography |
| 11/07/2007 | CN100347842C Integrated circuit and method of measurement and preparation of measurement structure |
| 11/06/2007 | US7292742 Waveguides for performing enzymatic reactions |
| 11/01/2007 | US20070255143 Imaging apparatus |
| 11/01/2007 | US20070253001 Three-Dimensional Shape Measuring Unit, Processing Unit, and Semiconductor Device Manufacturing Method |
| 11/01/2007 | US20070251305 Method and Apparatus for Reducing Lateral Interactive Forces During Operation of a Probe-Based Instrument |
| 10/31/2007 | EP1850349A1 Imaging apparatus |
| 10/31/2007 | EP1850335A2 Near field optical head and information recording/reading apparatus |
| 10/31/2007 | EP1430486B1 Method and device for analysing a sample by means of a raster scanning probe microscope |
| 10/31/2007 | DE102006020727A1 Optical near field scanning microscope`s scanning arm, has insulator layer provided on scanning arm covered with metallic layer, spike of probe decomposing into light at plasmon mode and leaked light collected for optical detection |
| 10/31/2007 | CN200969241Y Controllable apparatus for preparing fiber probe |
| 10/31/2007 | CN100345696C Supporting body for lithographic printing plate and lithographic printing original plate |
| 10/30/2007 | US7288774 Transverse magnetic field voltage isolator |
| 10/30/2007 | US7287421 Semiconductor probe with high resolution resistive tip and method of fabricating the same |
| 10/25/2007 | US20070249001 Multiplex Detection Compositions, Methods, and Kits |
| 10/25/2007 | US20070245815 Multiple frequency atomic force microscopy |
| 10/24/2007 | CN101061059A Nano tweezers and scanning probe microscope having the same |
| 10/23/2007 | US7285963 Method and system for measurement of dielectric constant of thin films using a near field microwave probe |
| 10/23/2007 | US7285794 Quantum semiconductor device and method for fabricating the same |
| 10/23/2007 | US7284415 Scanning probe microscope |
| 10/18/2007 | WO2007117138A1 Measuring scanning probe for scanning a surface to be measured |
| 10/18/2007 | US20070242921 Optical Near-Field Generator and Near-Field Optical Recording and Reproduction Apparatus |
| 10/18/2007 | US20070242583 Method and apparatus for measuring surface structure of a near-field object |
| 10/17/2007 | EP1845361A1 Surface position measuring method and surface position measuring device |
| 10/17/2007 | EP1844475A1 Near-field antenna |
| 10/17/2007 | EP1844313A1 Optical fiber probe, optical detection device, and optical detection method |
| 10/17/2007 | EP1532637B1 Method of forming atomic force microscope tips |
| 10/16/2007 | US7283453 Recording/reproducing head |
| 10/16/2007 | US7282157 Method of manufacturing light-propagating probe for near-field microscope |
| 10/11/2007 | US20070235340 Nanotube with with a Y-shaped or V-shaped morphology coated with microparticulate ferromagnetic materials (iron, cobalt, nickel or alloys) capable of generating magnetic field and sensing magnetic response attached to substrate and extending outward; electrical resistance and high mechanical strength |