| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 10/10/2007 | EP1841883A1 A method for analyzing nucleobases on a single molecular basis |
| 10/09/2007 | US7280578 Near-field light source device, and optical head, optical device, exposure apparatus and microscope device having such a near-field light source device |
| 10/09/2007 | US7278301 System for sensing a sample |
| 10/09/2007 | US7278299 Method of processing vertical cross-section using atomic force microscope |
| 10/09/2007 | US7278297 Oscillating probe with a virtual probe tip |
| 10/09/2007 | US7278296 Scanning probe microscope |
| 10/04/2007 | US20070231795 Methods and apparatus for nucleic acid sequencing by signal stretching and data integration |
| 10/04/2007 | US20070227273 Integrated system for simultaneous inspection and manipulation |
| 10/02/2007 | CA2406697C Nanodosimeter based on single ion detection |
| 09/27/2007 | WO2007109777A2 Stiffness tomography by atomic force microscopy |
| 09/27/2007 | US20070225851 Optical metrology model optimization for process control |
| 09/27/2007 | US20070221841 Method and apparatus for two-dimensional profiling of doping profiles of a material sample with scanning capacitance microscope |
| 09/27/2007 | US20070221840 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 09/27/2007 | US20070220958 Optical detection alignment/tracking method and apparatus |
| 09/27/2007 | DE102006013588A1 Zweidimensinale Profilierung von Dotierungsprofilen einer Materialprobe mittels Rastersondenmikroskopie Zweidimensinale profiling of doping profiles of a material sample by scanning probe microscopy |
| 09/26/2007 | CN101042326A Total reflection near-field microscope combining with magnetic forceps for observing biomacromolecule |
| 09/26/2007 | CN100339967C Ion irradiating device |
| 09/25/2007 | US7274012 Optical fiber probe, light detection device, and light detection method |
| 09/20/2007 | WO2007104452A1 Cantilever of a scanning probe microscope |
| 09/20/2007 | WO2007104432A1 Method for determining a dopant concentration in a semiconductor sample |
| 09/20/2007 | WO2005076832A3 Method for manufacturing single wall carbon nanotube tips |
| 09/20/2007 | US20070216422 Probe and near-field microscope |
| 09/20/2007 | US20070216412 Magnetic resonance force microscope |
| 09/20/2007 | US20070215804 Quantum Beam Aided Atomic Force Microscopy and Quantum Beam Aided Atomic Force Microscope |
| 09/20/2007 | US20070214875 Cantilever and cantilever manufacturing method |
| 09/19/2007 | CN101040346A Device and method for scanning probe microscopy |
| 09/19/2007 | CN100338687C Actuating and sensing device for scanning probe microscopes |
| 09/19/2007 | CN100338432C System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques |
| 09/18/2007 | US7271897 Method for increasing the spectral and spatial resolution of detectors |
| 09/18/2007 | US7271882 Shape measuring apparatus, shape measuring method, and aligning method |
| 09/18/2007 | US7271042 Laser annealing method and laser annealing device |
| 09/13/2007 | WO2007102324A1 Phase lock-in type high-frequency scanning tunnel microscope |
| 09/13/2007 | US20070211986 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 09/13/2007 | DE102006011660A1 Verfahren zur Ermittlung einer Dotierungsdichte in einer Halbleiterprobe A method for determining a dopant concentration in a semiconductor sample |
| 09/13/2007 | DE102006011598A1 Cantilever eines Rastersondenmikroskops Cantilever of a scanning probe microscope |
| 09/12/2007 | EP1185857B1 Method and apparatus for enhancing yield of secondary ions |
| 09/06/2007 | US20070208533 Image reconstruction method |
| 09/06/2007 | US20070205707 Electronic device containing a carbon nanotube |
| 09/06/2007 | US20070204681 Carbon thin line probe |
| 09/05/2007 | EP1830367A2 Carbon nanotube probe |
| 09/05/2007 | EP1830172A2 Magnetic resonance force microscope |
| 09/05/2007 | EP1830171A1 Dynamic- mode atomic force- microscope probe(tip) vibration simulation method, program, recording medium, and vibration simulator |
| 09/05/2007 | EP1502306A4 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication |
| 09/05/2007 | EP1502296A4 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
| 09/05/2007 | CN101030455A Field optical fibre probe and its production |
| 09/05/2007 | CN101029862A Weak-signal detector for acoustic image based on atomic force microscope |
| 08/30/2007 | WO2007098237A2 Method and apparatus for characterizing a probe tip |
| 08/30/2007 | WO2007098028A2 Photoluminescent point light source |
| 08/29/2007 | EP1826552A1 Mechanical vibrator and production method therefor |
| 08/29/2007 | CN101026023A Process for assembling zinc oxide nano wire on atomic force microscope tip |
| 08/28/2007 | US7260980 Liquid cell and passivated probe for atomic force microscopy and chemical sensing |
| 08/23/2007 | WO2007094365A1 Measuring probe, sample surface measuring apparatus and sample surface measuring method |
| 08/23/2007 | US20070195333 Atomic force microscope |
| 08/22/2007 | EP1821288A2 Magnetic head and information storage apparatus |
| 08/22/2007 | CN101022023A Magnetic head and information storage apparatus |
| 08/21/2007 | US7259372 Processing method using probe of scanning probe microscope |
| 08/16/2007 | US20070188922 Magnetic head and information storage apparatus |
| 08/16/2007 | DE112005002187T5 Vorrichtung und Verfahren zur Molekülmessung unter Verwendung eines Gelsubstratmaterials Apparatus and method for measurement using a molecule Gelsubstratmaterials |
| 08/14/2007 | US7256950 Optical device, optical system, method of production of same, and mold for production of same |
| 08/09/2007 | WO2007088018A1 Miniaturized spring element and method for producing the latter |
| 08/09/2007 | WO2007087653A1 Method for detecting 5-methylcytosine |
| 08/09/2007 | US20070183060 Mirror optic for near-field optical measurements |
| 08/09/2007 | US20070182971 Reference specimen for microscope and manufacturing method thereof |
| 08/09/2007 | US20070181870 Nanometric Device for the Measurement of the Conductivity and Quantum Effects of Individual Molecules and Methods for the Manufacture and Use Thereof |
| 08/09/2007 | DE102006004922A1 Miniaturisiertes Federelement und Verfahren zu dessen Herstellung Miniaturized spring element and process for its preparation |
| 08/09/2007 | CA2640702A1 Miniaturized spring element and method for producing the latter |
| 08/08/2007 | EP1816642A1 Near-field optical head and method for manufacturing same |
| 08/08/2007 | EP1816100A1 Nano tweezers and scanning probe microscope having the same |
| 08/02/2007 | US20070176616 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same |
| 08/01/2007 | CN101010751A Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy |
| 07/31/2007 | US7250602 Probe device |
| 07/31/2007 | US7250598 Plasmon enhanced near-field optical probes |
| 07/31/2007 | US7249494 Beam tracking system for scanning-probe type atomic force microscope |
| 07/25/2007 | EP1811524A1 Nanometric device for the measurement of the conductivity and quantum effects of individual molecules and methods for the manufacture and use thereof |
| 07/25/2007 | EP1810296A1 Total internal reflectance fluorescence (tirf) microscope |
| 07/24/2007 | US7247384 tip coated with a monolayer of ethylene glycol derivatives resists the adsorption of proteins |
| 07/24/2007 | US7247248 Method of forming atomic force microscope tips |
| 07/24/2007 | US7246517 Atomic force microscope with probe with improved tip movement |
| 07/24/2007 | US7246513 Lateral calibration device and method |
| 07/19/2007 | WO2007081913A2 Surface plasmon enhanced radiation methods and apparatus |
| 07/19/2007 | WO2007080259A1 Micro-electromechanical system comprising a deformable portion and a stress sensor |
| 07/19/2007 | US20070164214 Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip |
| 07/19/2007 | US20070163335 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 07/19/2007 | DE102006002461A1 Mirror optics for near-field optical microscope, has reflector that is provided in form of paraboloid, where reflector comprises edge section, and focus is illuminated by illumination beam path that is different from another beam path |
| 07/18/2007 | EP1807684A2 Method and apparatus for enhanced nano-spectroscopic scanning |
| 07/12/2007 | WO2007079269A2 Atomic force microscope tip arrays and methods of manufacturing same |
| 07/12/2007 | WO2007078979A2 Probe module with integrated actuator for a probe microscope |
| 07/12/2007 | WO2007077842A1 Nano probe and fabrication method thereof |
| 07/12/2007 | US20070158554 Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device |
| 07/12/2007 | US20070157711 Digital Q Control for Enhanced Measurement Capability in Cantilever-Based Instruments |
| 07/11/2007 | EP1806572A1 Measuring device with daisy type cantilever wheel |
| 07/11/2007 | EP0978829B1 Near field optical memory head |
| 07/10/2007 | US7243316 Test masks for lithographic and etch processes |
| 07/10/2007 | US7241994 Scanning probe microscope and specimen surface structure measuring method |
| 07/10/2007 | US7241987 Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe |
| 07/10/2007 | US7240541 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 07/10/2007 | US7240428 Method for making probes for atomic force microscopy |
| 07/05/2007 | WO2007074228A1 Improved photon-emission scanning tunnel microscopy |
| 07/04/2007 | EP1804050A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
| 07/04/2007 | CN1993609A A method for fabricating spm and cd-spm nanoneedle probe using ion beam and spm and cd-spm nanoneedle probe thereby |