| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 06/28/2007 | WO2007072706A1 Scan type probe microscope |
| 06/28/2007 | WO2007072621A1 Scanning probe microscope |
| 06/28/2007 | US20070144244 Probe module with integrated actuator for a probe microscope |
| 06/28/2007 | US20070144243 Scanning probe apparatus and drive stage therefor |
| 06/27/2007 | CN2916659Y Modular scanning probe microscope |
| 06/26/2007 | US7236889 Method of examining foreign matter derived from living body |
| 06/26/2007 | US7235807 Near field analysis apparatus having irradiation-side guide light and light-collection-side guide light |
| 06/26/2007 | US7234343 Method and apparatus for evanescent filed measuring of particle-solid separation |
| 06/26/2007 | US7234342 Fully digital controller for cantilever-based instruments |
| 06/20/2007 | EP1797567A1 Device and method for scanning probe microscopy |
| 06/20/2007 | EP1797393A2 Sensors for electrochemical, electrical or topographical analysis |
| 06/20/2007 | CN1322323C Multiple-pattern atomic force probe scanning system |
| 06/20/2007 | CN1322322C Quantum interfering microscopic detector |
| 06/19/2007 | US7232645 obtained by electrochemical graining treatment on an aluminum plate, which contains 0.02-0.29 wt % Fe, 0.03-0.15% Si, 0.020-0.040% Cu, and 0.050% or less Ti; surface area ratio and steepness each satisfies specified conditions |
| 06/14/2007 | WO2007065802A1 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography |
| 06/14/2007 | US20070134716 Cladding surrounding a core where the cladding is configured to preclude propagation of electromagnetic energy of a frequency less than a cutoff frequency longitudinally through the core of the zero-mode waveguide |
| 06/14/2007 | DE112005001585T5 Verfahren zur Herstellung von SPM- und CD-SPM-Nanonadel-Sonden unter Einsatz von Ionenstrahlen und dadurch hergestellte SPM- und CD-SPM-Nanonadel-Sonden Process for the preparation of SPM and SPM CD nanoneedle probes using ion beams produced thereby and SPM and SPM CD nanoneedle probes |
| 06/13/2007 | CN2911666Y Detector for HD raster polarized relation self imaging |
| 06/12/2007 | US7230719 High sensitivity scanning probe system |
| 06/07/2007 | US20070128854 Near-field optical probe based on SOI substrate and fabrication method thereof |
| 06/07/2007 | US20070128623 Biomolecule interaction using atomic force microscope |
| 06/07/2007 | US20070125946 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography |
| 06/07/2007 | US20070125753 Nanospot welder and method |
| 06/07/2007 | US20070125160 Short and thin silicon cantilever with tip and fabrication thereof |
| 06/06/2007 | EP1332509A4 Focused ion beam system |
| 06/06/2007 | EP1330651A4 Evaluating binding affinities by force stratification and force planning |
| 06/06/2007 | CN1320349C Scanning device of tunnel scanning microscope |
| 06/05/2007 | US7227830 Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording / reproducing apparatus |
| 05/31/2007 | WO2007061383A1 Determination of field distribution |
| 05/31/2007 | WO2007061286A1 Optical device comprising a cantilever and method of fabrication and use thereof |
| 05/31/2007 | WO2007001397A3 Nanostructure devices and fabrication method |
| 05/31/2007 | US20070119241 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
| 05/31/2007 | US20070119240 Semiconductor probe and method of writing and reading information using the same |
| 05/31/2007 | DE102005057218A1 Sondenvorrichtung und Messanordnung zur Messung von Mikro- und/oder Nanostrukturen A probe assembly and measuring arrangement for measurement of micro- and / or nano-structures |
| 05/31/2007 | CA2631179A1 Optical device comprising a cantilever and method of fabrication and use thereof |
| 05/30/2007 | EP1789853A1 A method of aligning a first article relative to a second article and an apparatus for aligning a first article relative to a second article. |
| 05/30/2007 | EP1218947A4 Force sensing devices with multiple filled and/or empty channels and other attributes |
| 05/30/2007 | EP1130379B1 Optical cantilever for scanning microscope and method of its production |
| 05/30/2007 | CN1971845A Overlay alignment method and device using atomic force microscope |
| 05/29/2007 | US7223438 depositing a hard magnet nanostructure precursor barium ferrite on substrate from a tip; converting the precursor to form the hard magnet nanostructure on the substrate |
| 05/24/2007 | US20070114400 Probe |
| 05/24/2007 | DE102005055460A1 Laser microscope pulse forced mode raster surface inspection process, digitizing information to generate real time force-time graph profile |
| 05/23/2007 | EP1370839A4 Apertureless near-field scanning raman microscopy using reflection scattering geometry |
| 05/22/2007 | US7221989 Optical metrology model optimization for process control |
| 05/22/2007 | US7221639 Pickup device |
| 05/22/2007 | US7220962 Cantilever array and scanning probe microscope including a sliding, guiding, and rotating mechanism |
| 05/22/2007 | US7220446 Management technique of friction coefficient based on surface roughness, substrate for information recording medium, information recording medium and manufacture method thereof |
| 05/22/2007 | US7219538 Balanced momentum probe holder |
| 05/18/2007 | WO2007018230A9 Optical probe |
| 05/17/2007 | US20070109636 Specimen stage array for scanning probe microscope |
| 05/16/2007 | CN1965226A Optical waveguide |
| 05/16/2007 | CN1963953A Semiconductor probe and method of writing and reading information using the same |
| 05/16/2007 | CN1963452A Offset current mode spectrograph for scan tunnel and microscope for scan tunnel |
| 05/16/2007 | CN1963451A Vibration-type cantilever holder and scanning probe microscope |
| 05/16/2007 | CN1963450A Low-frequency send-receive dual-purpose sensor used in scan probe acoustics micro-imaging |
| 05/15/2007 | US7218600 Dielectric constant measuring apparatus, dielectric constant measuring method, and information recording/reproducing apparatus |
| 05/10/2007 | WO2007051275A1 Scanning nanojet microscope and the operation method thereof |
| 05/10/2007 | US20070104079 Vibration-type cantilever holder and scanning probe microscope |
| 05/10/2007 | DE102004056241B4 Nahfeldsonde Near-field probe |
| 05/09/2007 | EP1782432A1 Tip structure for scanning devices, method of its preparation and devices thereon |
| 05/09/2007 | EP1782431A1 Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy |
| 05/09/2007 | EP1782078A1 A method for providing alignment of a probe |
| 05/09/2007 | CN1315169C Parallel, individually addressable probes for nanolithography |
| 05/09/2007 | CN1315116C Glass substrate for information recording medium and process for producing the same |
| 05/09/2007 | CN1314954C Multifunctional nano research and development platform |
| 05/09/2007 | CN1314578C Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 05/08/2007 | US7214303 Branched cantilever comprising ferromagnetic material and tubules attached to electrode pair coupled to electrical circuit; Magnetic (Resonance) Force Microscopy |
| 05/02/2007 | EP1780529A1 Molecule measuring device and molecule measuring method |
| 05/02/2007 | EP1780173A1 Nanometric mechanical oscillator, method of fabricating the same, and measurement apparatus using the same |
| 05/02/2007 | EP1779286A2 Laser-based method and system for processing targeted surface material and article produced thereby |
| 05/02/2007 | EP1779127A2 Evanescent microwave probe with enhanced resolution and sensitivity |
| 05/02/2007 | EP1203749B1 Nanometer-order mechanical vibrator, production method thereof and measuring device using it |
| 05/02/2007 | CN1957444A End-point detection for FIB circuit modification |
| 05/01/2007 | US7211795 Method for manufacturing single wall carbon nanotube tips |
| 05/01/2007 | US7210339 Adhesive compositions and method for selection thereof |
| 04/26/2007 | WO2007045773A1 Optical heterodyne sampling device |
| 04/26/2007 | WO2007045739A1 Reading/writing tip, head and device, and use thereof, and method for making same |
| 04/26/2007 | US20070093376 Tape manufacturing system |
| 04/26/2007 | US20070089497 Method and device for the contactless excitation of torsional vibrations in a one-sidedly clamped-in spring cantilever of an atomic force microscope |
| 04/19/2007 | WO2007044076A2 Cantilever probes for nanoscale magnetic and atomic force microscopy |
| 04/19/2007 | WO2007041976A1 Method for examining a measurement object, and apparatus |
| 04/19/2007 | US20070086005 Optical System and Method for Exciting and Measuring Fluorescence on or in Samples Treated with Fluorescent Pigments |
| 04/19/2007 | US20070085002 Probe for scanning thermal microscope |
| 04/18/2007 | EP1775570A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever |
| 04/18/2007 | EP1775569A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever |
| 04/18/2007 | EP1775568A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever |
| 04/18/2007 | EP1775567A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever |
| 04/18/2007 | EP1775258A1 Nanometric mechanical oscillator, method of fabricating the same, and measurement apparatus using the same |
| 04/18/2007 | EP1774288A1 Sensing apparatus |
| 04/18/2007 | CN1950516A Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes |
| 04/18/2007 | CN1311221C Scanning forcing power microscope device and its use |
| 04/17/2007 | US7204131 Dynamic activation for an atomic force microscope and method of use thereof |
| 04/17/2007 | CA2373134C Method of forming a polymer chain |
| 04/12/2007 | WO2007041556A2 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 04/12/2007 | WO2007040283A1 Probe and cantilever |
| 04/12/2007 | WO2007039210A1 Optical device for measuring modulated signal light |
| 04/11/2007 | EP0760109B1 Method for particle wave reconstruction in a particle-optical apparatus |
| 04/11/2007 | CN1310024C Probe unit of microscope with atomic force and manufacturing method thereof |
| 04/10/2007 | US7202541 Apparatus and method for transverse characterization of materials |
| 04/05/2007 | WO2007036614A1 Measuring system |