Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
11/2010
11/03/2010CN101876667A Atomic force microscope probe based on structures of carbon nano tube and planar wave guide
11/02/2010US7823470 Cantilever and cantilever manufacturing method
10/2010
10/28/2010WO2010123120A1 Immersion measurement probe, cantilever, and immersion measurement method
10/28/2010US20100275334 Modular atomic force microscope
10/27/2010CN101869137A Preparation method of compound stabilizer for dairy product and analysis method of casein stability
10/26/2010US7823216 Probe device for a metrology instrument and method of fabricating the same
10/26/2010US7823215 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents
10/21/2010US20100267164 Liquid cell and passivated probe for atomic force microscopy and chemical sensing
10/20/2010EP1850972B1 Thermal control of deposition in dip pen nanolithography
10/20/2010EP1181611B2 Scanning device, especially for detecting fluorescent light
10/20/2010CN101029862B Weak-signal detector for acoustic image based on atomic force microscope
10/14/2010WO2010057052A3 Method and apparatus of operating a scanning probe microscope
10/14/2010US20100263098 Method and apparatus for the combined analysis of a sample with objects to be analyzed
10/14/2010US20100263097 Method for examining a sample
10/14/2010US20100263096 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
10/13/2010EP2238428A2 Scanning ion conductance microscopy
10/13/2010CN101861513A Method for examining a sample using a scanning tunneling microscope
10/12/2010US7812347 Integrated circuit and methods of measurement and preparation of measurement structure
10/12/2010US7810382 Method and device for determining material properties
10/07/2010WO2010112440A1 Apparatus and method for the functionalisation of afm tips
10/07/2010US20100257643 Ultrasoft atomic force microscopy device and method
10/06/2010EP2237050A1 Apparatus and method for the functionalisation of afm tips
10/06/2010EP2235723A1 Method of fabricating a probe device for a metrology instrument and probe device produced thereby
10/06/2010EP1141753B1 Method for producing optical fibers with subwavelength apertures
10/06/2010CN101855534A Method and apparatus of automatic scanning probe imaging
10/05/2010US7810166 Device and method for scanning probe microscopy
10/05/2010US7808656 Probe sensor with multi-dimensional optical grating
09/2010
09/30/2010WO2010110452A1 Fluorescent thin film, method for manufacturing fluorescent thin film, fine light source excitation apparatus, and optical microscope
09/30/2010WO2010108796A1 Near field optical microscope
09/30/2010US20100251439 Large area, homogeneous array fabrication including leveling with use of bright spots
09/30/2010US20100251437 Method and Apparatus for Characterizing a Sample with Two or More Optical Traps
09/29/2010EP2232544A1 Defect classification utilizing data from a non-vibrating contact potential difference sensor
09/29/2010CN101846760A Method for making nano-grating
09/29/2010CN101275895B Sample platform system for in-situ measuring Na electronic device property in transmission electron microscope
09/28/2010US7805173 Tape manufacturing system
09/28/2010US7804067 Method of observing and method of working diamond stylus for working of atomic force microscope
09/23/2010US20100239775 Applications for scanning tunnelling microscopy
09/23/2010DE102009008251A1 Flexibel verschiebbare Kopplungseinrichtung für die akustisch angeregte Rasterkraftmikroskopie mit akustischer Anregung der Probe Flexible movable coupling means for acoustically excited atomic force microscopy with acoustic excitation of the sample
09/22/2010CN1965226B 光波导装置 Optical waveguide device
09/21/2010US7798001 Scanning near field ultrasound holography
09/21/2010US7797991 Rocking Y-shaped probe for critical dimension atomic force microscopy
09/21/2010US7797850 Contact type measuring instrument
09/16/2010US20100235954 Dual-tip cantilever
09/16/2010DE102006020727B4 Abtastausleger für die optische Nahfeldmikroskopie Abtastausleger for optical near-field microscopy
09/16/2010DE102005038245B4 Vorrichtung zur Schwingungsanregung eines einseitig in einem Rasterkraftmikroskop befestigten Federbalkens Device for oscillation excitation of a cantilevered in an atomic force microscope cantilever
09/15/2010EP2227718A2 Cantilever with pivoting actuation
09/15/2010CN201583553U Optical fiber fixer for near field scanning optical microscope
09/15/2010CN101833019A Science popularization demonstration robot for scanning tunnel microscope
09/15/2010CN101447235B Localized surface plasma resonance enhanced near-field optical probe
09/14/2010US7795593 Surface contamination analyzer for semiconductor wafers
09/09/2010US20100229264 Large area, homogeneous array fabrication including controlled tip loading vapor deposition
09/09/2010US20100229263 Protein microscope
09/02/2010WO2010098000A1 Device for examining pattern on surface of substrate and method for examining pattern
09/02/2010US20100223698 High Resolution Wide Angle Tomographic Probe
09/02/2010US20100219819 Apparatus and method of obtaining field by measurement
09/01/2010CN1747071B Method of fabricating semiconductor probe with resistive tip
09/01/2010CN101819219A Method for preparing high-density super sharp silicon probe array
09/01/2010CN101819218A Light collection device for scanning tunnel microscope
08/2010
08/31/2010US7788732 Method and apparatus for two-dimensional profiling of doping profiles of a material sample with scanning capacitance microscope
08/31/2010US7787133 Optical displacement-detecting mechanism and probe microscope using the same
08/31/2010US7786402 Nanospot welder and method
08/26/2010US20100218287 Scanning probe microscope and method of observing sample using the same
08/26/2010US20100218286 Modulated microwave microscopy and probes used therewith
08/25/2010CN101075015B Polarized electronic emitting source and self-rotating polarized scanning tunnel microscope
08/24/2010US7781764 Nanometric device for the measurement of the conductivity and quantum effects of individual molecules and methods for the manufacture and use thereof
08/19/2010WO2010092470A1 Multifunctional scanning probe microscope
08/19/2010WO2010092004A1 Method for automatic adjustment of the applied force and control of the force drift in an atomic force microscope during contact mode imaging.
08/19/2010WO2010091754A1 Photoconductive measurement tip, measurement setup, and use of the photoconductive measurement tip and/or the measurement setup
08/19/2010US20100207039 Probe Microscopy and Probe Position Monitoring Apparatus
08/18/2010EP2219035A1 Method for automatic adjustment of the applied force and control of the force drift in an Atomic Force Microscope during contact mode imaging.
08/18/2010EP2218075A1 Device and method for an atomic force microscope for the study and modification of surface properties
08/18/2010CN1628251B Electrical feedback detection system for multi-point probes
08/17/2010US7775088 Atomic force microscope tip arrays and methods of manufacturing same
08/17/2010US7775087 Microchannel forming method and nanotipped dispensing device having a microchannel
08/17/2010US7775086 Band excitation method applicable to scanning probe microscopy
08/12/2010US20100205699 Magnetic device inspection apparatus and magnetic device inspection method
08/12/2010US20100205698 Atomic force microscopy probe
08/12/2010US20100204968 Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program
08/12/2010US20100200770 Solid Immersion Lens and Related Method for Making Same
08/11/2010CN1769860B Surface texture measuring probe and microscope utilizing the same
08/11/2010CN101802588A Probe device for a metrology instrument and method of fabricating the same
08/11/2010CN101799482A Nano operating device with near-field optical tweezers and AFM probe
08/10/2010US7770474 Sample operation apparatus
08/10/2010US7770439 Method and apparatus of scanning a sample using a scanning probe microscope
08/05/2010WO2010087889A1 Scanning probe microscope with independent force control and displacement measurements
08/05/2010WO2010087114A1 Scanning probe microscope
08/05/2010WO2010086759A1 High-speed scanning probe microscope
08/05/2010WO2010085948A1 Flexibly sliding coupling device for acoustically excited raster force microscopy having acoustic excitation of the sample
08/04/2010EP2212679A1 Methods, systems and apparatus for light concentrating mechanisms
08/04/2010CN101113946B Force and electrical behavior testing device under Nanometer lines in-situ compressing in transmission electron microscope
08/03/2010US7770232 Scanning probe microscope system
08/03/2010US7770231 Fast-scanning SPM and method of operating same
08/03/2010US7767961 Method for determining material interfacial and metrology information of a sample using atomic force microscopy
08/03/2010US7767101 Method for fabricating probe for use in scanning probe microscope
08/03/2010US7765855 Adhesive compositions and method for selection thereof
07/2010
07/29/2010WO2010085767A1 Large area, homogeneous array fabrication including controlled tip loading vapor deposition
07/29/2010CA2750425A1 Large area, homogeneous array fabrication including controlled tip loading vapor deposition
07/28/2010EP2210258A1 Solid immersion lens and related method for making same
07/28/2010CN101788572A Kelvin probe force microscopy and measuring method thereof
07/28/2010CN101788571A Nanomanipulation method for compounding laser near-field optical tweezers and AFM probe
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