| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 03/31/2010 | CN101685091A Method of manufacturing an ultra-microelectrode |
| 03/30/2010 | US7687380 Laser annealing method and laser annealing device |
| 03/25/2010 | WO2009158598A3 Evanescent microwave microscopy probe and methodology |
| 03/25/2010 | US20100077515 Microchannel forming method and nanotipped dispensing device having a microchannel |
| 03/25/2010 | US20100071477 Flow Velocity and Pressure Measurement Using a Vibrating Cantilever Device |
| 03/24/2010 | CN201429627Y Large-sample and large-scale high-resolution atomic force microscopy detection device |
| 03/23/2010 | US7684956 Image reconstruction method |
| 03/23/2010 | US7681439 Measuring apparatus |
| 03/18/2010 | US20100071099 Atomic force microscope and interaction force measurement method using atomic force microscope |
| 03/18/2010 | US20100071098 Scanning probe epitaxy |
| 03/18/2010 | US20100068124 Nanostructure devices and fabrication method |
| 03/17/2010 | EP2163907A2 Cantilever with paddle for operation in dual-frequency mode |
| 03/17/2010 | CN100594385C 扫描探针显微镜 Scanning probe microscopy |
| 03/16/2010 | US7678357 Electrical connection structure, production method thereof, and electric wiring method |
| 03/11/2010 | WO2009157648A3 Scanning ion conductance microscope operating in high-speed constant current mode |
| 03/11/2010 | US20100064397 Controlled atomic force microscope |
| 03/11/2010 | US20100064396 Scanning probe microscope and sample observing method using the same |
| 03/11/2010 | US20100064395 Monolithic Comb Drive System and method for Large-Deflection Multi-Dof Microtransduction |
| 03/10/2010 | EP2160350A1 Applications for scanning tunnelling microscopy |
| 03/10/2010 | CN100593723C Semiconductor probe and method of writing and reading information using the same |
| 03/09/2010 | US7674447 carbon nanotubes as electrodes; for biopolymers such as DNA and RNA |
| 03/04/2010 | WO2010022521A1 Method for measuring a piezoelectric response by means of a scanning probe microscope |
| 03/04/2010 | DE102008060289A1 Ausgerichtete Nanostrukturen auf einer Spitze Aligned nanostructures on a tip |
| 03/02/2010 | US7671333 Apparatus for observing a sample with a particle beam and an optical microscope |
| 02/23/2010 | US7665889 Quantitative calorimetry signal for sub-micron scale thermal analysis |
| 02/23/2010 | US7665350 Surface scanning method |
| 02/23/2010 | US7665349 Method and apparatus for rapid automatic engagement of a probe |
| 02/18/2010 | WO2010019256A1 Transition temperature microscopy |
| 02/18/2010 | WO2010018514A1 Method and means for near-field microscopy based on transient probes in a phase-change material. |
| 02/18/2010 | US20100043107 Multiple Frequency Atomic Force Microscopy |
| 02/18/2010 | US20100040847 Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
| 02/17/2010 | EP2153198A2 Automatic landing method and apparatus for scanning probe microscope using the same |
| 02/17/2010 | CN100590437C Total reflection near-field microscope combining with magnetic forceps for observing biomacromolecule |
| 02/16/2010 | US7664566 Graphical automated machine control and metrology |
| 02/11/2010 | US20100035277 Method and apparatus for determining the cell activation of a target cell by an activator |
| 02/10/2010 | EP2150799A1 Atomic force microscopy probe |
| 02/10/2010 | EP2150785A1 High frequency deflection measurement of ir absorption |
| 02/10/2010 | CN100589192C Integration piezoelectricity movable micro-lens enhancement type conical second-wavelength near-field light probe array |
| 02/09/2010 | US7659590 DNA-based memory device and method of reading and writing same |
| 02/09/2010 | US7659175 DNA-based memory device and method of reading and writing same |
| 02/04/2010 | US20100031404 Scanning Probe Microscope With Periodically Phase-Shifted AC Excitation |
| 02/04/2010 | US20100031403 Heat Coupling Device |
| 02/03/2010 | CN100587459C Nano material drawing device in scanning electron microscope driven by piezoelectric ceramic piece |
| 02/02/2010 | US7657947 Method and device for the contactless excitation of torsional vibrations in a one-sidedly clamped-in spring cantilever of an atomic force microscope |
| 02/02/2010 | US7656776 Data storing and reading apparatus for storing data in a nano-device |
| 01/28/2010 | WO2010011398A2 Scanning probe epitaxy |
| 01/28/2010 | WO2010011397A2 Scanning probe epitaxy |
| 01/28/2010 | US20100024082 Atomic force microscope |
| 01/27/2010 | CN100585378C Low-frequency send-receive dual-purpose sensor used in scan probe acoustics microscopic-imaging |
| 01/26/2010 | CA2428218C Apparatus for parallel detection of the behaviour of mechanical micro-oscillators |
| 01/21/2010 | US20100017924 Method for using an atomic force microscope |
| 01/21/2010 | US20100017923 Preamplifying cantilever and applications thereof |
| 01/20/2010 | CN100583401C Processes for fabricating conductive patterns using nanolithography as a patterning tool |
| 01/20/2010 | CN100583306C Near field optical head and information recording and reproducing apparatus mounted with the near field optical head |
| 01/20/2010 | CN100582738C Atomic force microscopic imaging method and device based on piezoelectric scanning tube dynamic property |
| 01/19/2010 | US7647848 Integrated system for simultaneous inspection and manipulation |
| 01/14/2010 | US20100011472 Apparatus And Method For The Detection Of Forces In The Sub-Micronewton Range |
| 01/14/2010 | US20100011471 Band excitation method applicable to scanning probe microscopy |
| 01/14/2010 | US20100008211 Information reproducing apparatus and information reproducing method |
| 01/13/2010 | EP2142906A1 Probe microscopy and probe position monitoring apparatus |
| 01/06/2010 | EP2141481A1 Device and method for acquiring a field by measurement |
| 01/06/2010 | EP1386324B1 Actuating and sensing device for scanning probe microscopes |
| 01/06/2010 | CN100578679C Probe position control system and method |
| 01/05/2010 | US7644447 Scanning probe microscope capable of measuring samples having overhang structure |
| 12/31/2009 | US20090324450 Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material |
| 12/30/2009 | WO2009158598A2 Evanescent microwave microscopy probe and methodology |
| 12/30/2009 | WO2009157648A2 Scanning ion conductance microscope operating in high-speed constant current mode |
| 12/30/2009 | WO2009157055A1 Magnetic head, head assembly, and magnetic recording device |
| 12/29/2009 | US7637960 Short and thin silicon cantilever with tip and fabrication thereof |
| 12/29/2009 | US7637149 Integrated displacement sensors for probe microscopy and force spectroscopy |
| 12/24/2009 | US20090320167 Mechanical vibrator and production method therefor |
| 12/24/2009 | DE102008036064A1 Determining the cell activating of a target cell through an activator comprises providing a probe measuring device with a probe-probe device, and loading the probe-probe device with target cells and target cell associated with activator |
| 12/23/2009 | CN100573733C Field optical fibre probe and its production |
| 12/22/2009 | US7635437 Method of manufacturing near field light generation element |
| 12/22/2009 | US7635392 Scanning probe microscopy cantilever, corresponding manufacturing method, scanning probe microscope, and scanning method |
| 12/17/2009 | WO2009070622A3 Cantilever with pivoting actuation |
| 12/17/2009 | US20090313730 Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof |
| 12/17/2009 | US20090313729 Scan type probe microscope and cantilever drive device |
| 12/17/2009 | US20090308844 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 12/16/2009 | EP2133883A2 Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof |
| 12/16/2009 | CN101606051A Atomic microscope and interactive force measuring method using atomic microscope |
| 12/16/2009 | CN101602183A Grinding device for preparing near-field optical probes and method therefor |
| 12/16/2009 | CN100570756C A metal film and its making method |
| 12/16/2009 | CN100570326C Detecting method and device for high density grating polarized relative self imaging |
| 12/15/2009 | US7631548 Scanning probe microscope |
| 12/15/2009 | US7631547 Scanning probe apparatus and drive stage therefor |
| 12/10/2009 | US20090307809 Scanning probe microscope and method for operating the same |
| 12/10/2009 | US20090307808 Measuring scanning probe for scanning a surface to be measured |
| 12/10/2009 | US20090301176 Microelectromechanical System Comprising a Deformable Portion and a Stress Sensor |
| 12/09/2009 | EP2131180A1 Atomic force microscope |
| 12/09/2009 | EP2130093A1 Nanolithography with use of viewports |
| 12/09/2009 | CN100568478C Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semico |
| 12/08/2009 | US7630287 Near field optical head and optical recording device |
| 12/08/2009 | US7628972 Ion flux is directed to a carbon nanotube to permanently shape, straighten and/or bend the carbon nanotube into a desired configuration; use as a probe in an atomic force microscope; Ion Flux Molding |
| 12/03/2009 | WO2009125138A3 Device for positioning a moveable object of submicron scale |
| 12/03/2009 | US20090300807 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope |
| 12/03/2009 | US20090300806 Atomic force microscope |
| 12/03/2009 | US20090300805 Photon-Emission Scanning Tunneling Microscopy |
| 12/02/2009 | EP2125616A2 Method for growing a carbon nanotube on a nanometric tip |
| 12/02/2009 | EP1451848B1 Device and method for reducing the impact of distortions in a microscope |