| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
|---|
| 04/30/2009 | US20090110951 Atomically Sharp Iridium Tip |
| 04/29/2009 | EP2053379A1 Method and apparatus for analysis of force traces |
| 04/28/2009 | US7526158 System and method for high resolution optical imaging, data storage, lithography, and inspection |
| 04/28/2009 | US7525880 Near-field information reproducing apparatus and near-field information reproducing method |
| 04/28/2009 | US7524534 coating microscope tips with patterning compounds and using the coated tip to apply the compounds to substrate so as to produce a desired patterns; nanolithography |
| 04/23/2009 | WO2009052338A2 Dual-tipped probe for atomic force microscopy |
| 04/23/2009 | WO2009018575A3 Fast-scanning spm and method of operating same |
| 04/23/2009 | WO2009001220A8 Functionalization of microscopy probe tips |
| 04/23/2009 | WO2007024711A3 Oscillator and method of making for atomic force microscope and other applications |
| 04/23/2009 | WO2007022013A3 Tracking qualification and self-optimizing probe microscope and method |
| 04/23/2009 | US20090106869 Method for fabricating spm and cd-spm nanoneedle probe using ion beam and spm and cd-spm nanoneedle probe thereby |
| 04/23/2009 | US20090101815 Cantilever for near field optical microscopes, plasmon enhanced fluorescence microscope employing the cantilever, and fluorescence detecting method |
| 04/23/2009 | US20090100917 Rocking y-shaped probe for critical dimension atomic force microscopy |
| 04/22/2009 | EP2051060A2 Cantilever for near field optical microscopes, plasmon enhanced fluorescence microscope employing the cantilever, and fluorescence detecting method |
| 04/21/2009 | US7523027 Visual inspection and verification system |
| 04/21/2009 | US7521257 Using treated cantilever of an atomic force microscope operating in a tapping mode against a mechanical stop to detect and determine concentration of biopolymers: miniaturized detectors; biosensors |
| 04/21/2009 | US7520165 Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure |
| 04/16/2009 | US20090100554 Method for determining a dopant concentration in a semiconductor sample |
| 04/16/2009 | US20090100553 Scanning probe-based lithography method |
| 04/15/2009 | EP2048487A1 Scanning probe microscope |
| 04/15/2009 | EP2047231A1 Scanning ion conductance microscopy for the investigation of living cells |
| 04/15/2009 | CN100478666C Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure |
| 04/14/2009 | US7518111 Magnetic electron microscope |
| 04/09/2009 | WO2009043368A1 Colloid-sensor for afm |
| 04/09/2009 | WO2006047337A3 Near-field aperture having a fractal iterate shape |
| 04/09/2009 | DE102007045860A1 Schaltungsanordnung für parallele Cantilever-Arrays für die Raster-Kraft-Mikroskopie Circuitry for parallel cantilever arrays for atomic force microscopy |
| 04/08/2009 | EP2045818A1 Method for using an atomic force microscope |
| 04/08/2009 | EP1425729A4 Graphical automated machine control and metrology |
| 04/08/2009 | CN101403681A Current fitting curve sudden change elimination method for liquid/liquid interface scanning electro-chemical microscope |
| 04/08/2009 | CN100477067C Software synchronization of multiple scanning probes |
| 04/07/2009 | US7514678 Probe for scanning thermal microscope |
| 04/07/2009 | US7514214 coating a nanostructure with a passivation layer and altering the passivation layer to form biosensors capable of detecting specific molecules and changes in (inter)molecular dynamics in combination with fluorescence detection |
| 04/07/2009 | US7513142 Tracking qualification and self-optimizing probe microscope and method |
| 04/02/2009 | WO2009040236A1 Circuit arrangement for parallel cantilever arrays for the scanning force microscopy |
| 04/02/2009 | US20090084952 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 04/01/2009 | EP2041546A1 Scanning probe microscope and method for operating the same |
| 04/01/2009 | EP1523652B1 Method for locally highly resolved, mass-spectroscopic characterisation of surfaces using scanning probe technology |
| 03/31/2009 | US7511828 Three-dimensional shape measuring unit, processing unit, and semiconductor device manufacturing method |
| 03/31/2009 | US7511512 Probe and near-field microscope |
| 03/31/2009 | US7511270 Nanotube probe and a method for manufacturing the same |
| 03/31/2009 | US7509844 Atomic force microscope technique for minimal tip damage |
| 03/26/2009 | WO2009038791A1 Methods, systems and apparatus for light concentrating mechanisms |
| 03/26/2009 | WO2009037249A1 Solid immersion lens and related method for making same |
| 03/26/2009 | WO2009018571A3 Probe device for a metrology instrument and method of fabricating the same |
| 03/26/2009 | US20090078869 Magnetic electron microscope |
| 03/25/2009 | EP2040265A2 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 03/25/2009 | EP2038894A2 Methods of polarization engineering and their applications |
| 03/25/2009 | EP2038087A2 Multiple frequency atomic force microscope |
| 03/24/2009 | US7507958 Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip |
| 03/24/2009 | US7507957 Probe microscope system suitable for observing sample of long body |
| 03/24/2009 | US7507591 Methods of measurement and preparation of measurement structure of integrated circuit |
| 03/19/2009 | WO2009036365A2 Method and apparatus of automatic scanning probe imaging |
| 03/19/2009 | WO2009008915A3 Tunable bio-functionalized nanoelectromechanical systems having superhydrophobic surfaces for use in fluids |
| 03/19/2009 | US20090077697 Method and apparatus of automatic scanning probe imaging |
| 03/17/2009 | US7503206 Fluid delivery for scanning probe microscopy |
| 03/12/2009 | US20090070904 Oscillating scanning probe microscope |
| 03/12/2009 | US20090066963 Ultrafast microscopy of surface electromagnetic fields |
| 03/12/2009 | US20090064771 Method of operating an atomic force microscope in tapping mode with a reduced impact force |
| 03/11/2009 | EP1949055B1 Optical heterodyne sampling device |
| 03/11/2009 | CN100467595C A method of immobilizing and stretching a nucleic acid on a substrate |
| 03/10/2009 | US7500387 Dual tip atomic force microscopy probe and method for producing such a probe |
| 03/05/2009 | WO2009029092A1 A cantilever probe and applications of the same |
| 03/04/2009 | EP2029998A1 Controlled atomic force microscope |
| 03/04/2009 | CN101379383A Miniaturized spring element and method for producing the spring element |
| 03/04/2009 | CN101377460A Method for analyzing specimen in liquid |
| 03/04/2009 | CN100465627C A scanning probe inspection apparatus |
| 03/04/2009 | CN100465356C A GaN wafer with high surface quality and a production method thereof |
| 03/03/2009 | US7498564 Resonant scanning near-field optical microscope |
| 02/26/2009 | US20090055977 Scanning nanotube probe device and associated method |
| 02/25/2009 | EP2027450A1 Optical component operating in near field transmission |
| 02/25/2009 | EP1841883A4 A method for analyzing nucleobases on a single molecular basis |
| 02/24/2009 | US7496250 Optical microcantilever |
| 02/24/2009 | US7495215 Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes |
| 02/24/2009 | US7494575 Method for manufacturing a split probe |
| 02/24/2009 | US7493794 Method of calibrating a caliper AFM |
| 02/19/2009 | WO2009023489A1 Nanoscale imaging via absorption modulation |
| 02/19/2009 | WO2009004107A3 Digital interface device for incorporating the image mode into a single-molecule force-clamp spectroscope |
| 02/19/2009 | US20090046299 Nanoscale imaging via absorption modulation |
| 02/19/2009 | US20090045336 Scanning probe microscopy cantilever, corresponding manufacturing method, scanning probe microscope, and scanning method |
| 02/17/2009 | US7491425 Scanning probe-based lithography method |
| 02/12/2009 | WO2009020658A1 Independently-addressable, self-correcting inking for cantilever arrays |
| 02/12/2009 | WO2009018795A1 Device and method for locating inhomogeneities in a sample |
| 02/12/2009 | US20090039274 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 02/12/2009 | US20090038382 Probe and cantilever |
| 02/12/2009 | CA2690723A1 Independently-addressable, self-correcting inking for cantilever arrays |
| 02/11/2009 | CN101363789A Scanning-tunnelling microscope for vibrating example and measurement method thereof |
| 02/05/2009 | WO2009018575A2 Fast-scanning spm and method of operating same |
| 02/05/2009 | WO2009018571A2 Probe device for a metrology instrument and method of fabricating the same |
| 02/05/2009 | US20090032706 Fast-Scanning SPM and Method of Operating Same |
| 02/05/2009 | US20090031792 Probe Device for a Metrology Instrument and Method of Fabricating the Same |
| 02/05/2009 | DE102007036654A1 Vorrichtung und Verfahren zur Lokalisierung von Inhomogenitäten in einer Probe Apparatus and method for localization of inhomogeneities in a sample |
| 02/05/2009 | DE102007034853A1 Verfahren und Vorrichtung zur verbesserten mikrofluidischen Versorgung von Proben und Messeinrichtung Method and apparatus for improved microfluidic supply of samples and measuring device |
| 02/04/2009 | EP1243915B1 Apparatus for evaluating electrical characteristics |
| 02/04/2009 | CN100458431C Devices of biochemical detection by using micro cantilever |
| 02/03/2009 | US7485857 Microcoaxial probes made from strained semiconductor bilayers |
| 02/03/2009 | US7485856 Scanning probe microscopy inspection and modification system |
| 01/29/2009 | WO2009014801A2 Scanning nanotube probe device and associated method |
| 01/29/2009 | WO2009012766A1 Method and apparatus for the combined analysis of a sample with objects to be analysed |
| 01/29/2009 | WO2009012765A2 Measurement probe apparatus for a probe microscope, measurement cell and scanning probe microscope |
| 01/29/2009 | US20090027690 Measuring probe, sample surface measuring apparatus and sample surface measuring method |