| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 03/03/2011 | US20110051235 Microscope measurement system |
| 03/03/2011 | US20110048115 Method for analyzing sample in liquid |
| 03/02/2011 | CN101982780A Technique and system for real-time detecting, controlling and diagnosing cells of robot micro nanometer mixed living body |
| 03/02/2011 | CN101363789B Scanning-tunnelling microscope for vibrating example and measurement method thereof |
| 03/01/2011 | US7899100 GaN laser element |
| 02/24/2011 | WO2010059446A3 Method of making and assembling capsulated nanostructures |
| 02/24/2011 | US20110047662 Apparatus and method for investigating surface properties of different materials |
| 02/24/2011 | US20110045246 Silicon single crystal wafer and method for manufacturing silicon single crystal wafer, and method for evaluating silicon single crystal wafer |
| 02/23/2011 | EP2287624A2 Scanning Probe System |
| 02/23/2011 | EP2286413A1 Device for focusing light with sub-wavelength dimensions and high yield |
| 02/17/2011 | US20110041224 Atomic force microscope including accelerometer |
| 02/17/2011 | US20110036169 Scanning Near-Field Ultrasound Holography |
| 02/16/2011 | CN201749130U Magnetic image atomic force microscope |
| 02/16/2011 | CN201749129U Intelligent integral scanning tunnel microscope |
| 02/16/2011 | CN101602183B Grinding device for preparing near-field optical probes and method therefor |
| 02/16/2011 | CN101441160B Continuous imaging automatic area-selecting method suitable for atomic force microscope |
| 02/15/2011 | US7891016 Automatic landing method and apparatus for scanning probe microscope using the same |
| 02/10/2011 | WO2011016256A1 Cantilever excitation device and scanning probe microscope |
| 02/10/2011 | US20110035849 SPM Imaging Apparatus, Probe and Method |
| 02/10/2011 | US20110031398 Imaging Apparatus and Method |
| 02/10/2011 | DE19816914B4 Abtastmikroskop Scanning tunneling microscope |
| 02/09/2011 | CN101026023B Process for assembling zinc oxide nano wire on atomic force microscope tip |
| 02/08/2011 | US7886366 Cantilever device and cantilever controlling method |
| 02/03/2011 | WO2011014315A1 Scanning tunneling microscope assembly, reactor, and system |
| 02/03/2011 | US20110030109 Surface state measuring device, and surface state measuring method using the device |
| 02/03/2011 | US20110024387 Tip type probe manufacturing method, tip type probe and tip type probe manufacturing apparatus |
| 02/02/2011 | CN101294889B Low temperature scanning probe microscope system based on pulsatron refrigeration technology |
| 01/27/2011 | US20110020533 Scanning probe-based lithography method |
| 01/27/2011 | DE112008003233T5 Intermodulationsrasterkraftspektroskopie Intermodulation atomic force spectroscopy |
| 01/26/2011 | CN101960287A Fast-scanning spm and method of operating same |
| 01/19/2011 | EP2275798A1 Dynamic mode afm apparatus |
| 01/19/2011 | EP1269480B1 Atomic force microscope |
| 01/19/2011 | CN101952707A Tip type probe manufacturing method, tip type probe, and tip type probe manufacturing apparatus |
| 01/18/2011 | US7871530 Near-field optical probe based on SOI substrate and fabrication method thereof |
| 01/13/2011 | US20110010809 Device for oscillation excitation of an elastic bar fastened on one side in an atomic force microscope |
| 01/13/2011 | US20110010808 Protected metallic tip or metallized scanning probe microscopy tip for optical applications |
| 01/13/2011 | DE102009029831A1 Vorrichtung und Verfahren für die Mehr-Photonen-Fluoreszenzmikroskopie zur Gewinnung von Informationen aus biologischem Gewebe Apparatus and method for multi-photon fluorescence microscopy for obtaining information from biological tissue |
| 01/11/2011 | US7870616 Probe arrangement |
| 01/11/2011 | US7866205 Sample operation apparatus |
| 01/06/2011 | WO2011002201A9 Method for measuring quantitative temperature and thermal conductivity using a scanning thermal microscope |
| 01/06/2011 | WO2011002201A2 Method for measuring quantitative temperature and thermal conductivity using a scanning thermal microscope |
| 01/06/2011 | US20110004967 Band excitation method applicable to scanning probe microscopy |
| 01/04/2011 | US7865966 Method and apparatus of automatic scanning probe imaging |
| 01/04/2011 | US7862858 scanning probe-based lithography (SPL) method in which patterning of resist medium is produced by Atomic Force Microscope (AFM) probe-surface contact; in particular it relates to "writing" of pattern of lines and similar features in resist; resist polymer contains thermally reversible crosslinkages |
| 01/04/2011 | US7861577 Electric potential difference detection method and scanning probe microscope |
| 12/30/2010 | US20100333240 Fully Digitally Controller for Cantilever-Based Instruments |
| 12/30/2010 | US20100330345 Methods utilizing scanning probe microscope tips and products thereof or produced thereby |
| 12/30/2010 | DE202010013458U1 Sonde für aperturlose Nahfeldmikroskopie und/oder für Ramanspektroskopie Apertureless near-field probe and / or Raman spectroscopy for |
| 12/29/2010 | WO2010150756A1 Scanning probe microscope and probe proximity detection method therefor |
| 12/29/2010 | EP2267428A1 Scanning probe microscope and method of observing sample using the same |
| 12/29/2010 | EP2267189A1 High surface quality gan wafer and method of fabricating same |
| 12/29/2010 | EP2265925A2 Device for positioning a moveable object of submicron scale |
| 12/28/2010 | US7861316 Microscope probe having an ultra-tall tip |
| 12/28/2010 | US7861315 Method for microfabricating a probe with integrated handle, cantilever, tip and circuit |
| 12/28/2010 | US7856866 Method of operating an atomic force microscope in tapping mode with a reduced impact force |
| 12/23/2010 | WO2010147296A1 Afm measuring method and system thereof |
| 12/23/2010 | WO2010146773A1 Microcontact prober |
| 12/23/2010 | US20100325761 Scanning Probe Microscope and Method of Observing Sample Using the Same |
| 12/22/2010 | EP2263071A1 Imaging apparatus and method |
| 12/22/2010 | CN101329247B Combined microscope for scanning atomic force and tunnel current under atmosphere |
| 12/21/2010 | US7856665 Apparatus and method for scanning capacitance microscopy and spectroscopy |
| 12/15/2010 | EP2261678A1 Novel characterization tools for toner adhesion and adhesion distribution |
| 12/15/2010 | CN101915756A High-vacuum pinpoint enhanced Raman device |
| 12/15/2010 | CN101329248B Tunnel-scanning microscope capable of measuring acting force among atomics and measuring method thereof |
| 12/15/2010 | CN101109675B Virus example and its preparing method used for AFM research |
| 12/14/2010 | US7854015 Method for measuring the force of interaction in a scanning probe microscope |
| 12/14/2010 | US7853422 Dynamic-mode atomic-force-microscope probe (Tip) vibration simulation method, program, recording medium, and vibration simulator |
| 12/09/2010 | US20100313312 Method and Apparatus for Characterizing a Probe Tip |
| 12/09/2010 | US20100313311 Scanning probe in pulsed-force mode, digital and in real time |
| 12/09/2010 | US20100312495 Intermodulation scanning force spectroscopy |
| 12/08/2010 | CN1904583B Tunnel current measuring device of scanning tunnel microscope based on mutual incidence amplifier |
| 12/08/2010 | CN101521047B Technology for manufacturing miniature four-point probe working in ultra-high vacuum variable-temperature condition |
| 12/08/2010 | CN101403681B Current fitting curve sudden change elimination method for liquid/liquid interface scanning electro-chemical microscope |
| 12/08/2010 | CN101079331B A tunnel probe for scanning the tunnel microscope and its making method |
| 12/07/2010 | US7849515 Nanotweezer and scanning probe microscope equipped with nanotweezer |
| 12/07/2010 | US7847926 Defining a pattern on a substrate |
| 12/02/2010 | WO2010138904A2 Metrology probe and method of configuring a metrology probe |
| 12/02/2010 | WO2010136581A1 Imaging method and use thereof |
| 12/02/2010 | US20100306888 High Resolution Near Field Scanning Optical Microscopy |
| 12/02/2010 | CA2761957A1 Metrology probe and method of configuring a metrology probe |
| 11/30/2010 | US7842344 Using direct-write lithographic printing to generate protein microarrays; nanoscopic high throughput assy |
| 11/25/2010 | WO2010133217A1 Device and method for metallizing scanning probe tips |
| 11/24/2010 | CN201654064U High resolution patch clamp device based on scanning probe microscopy technology |
| 11/23/2010 | US7841016 Local injector of spin-polarized electrons with semiconductor tip under light excitation |
| 11/23/2010 | US7841015 Method for determining a dopant concentration in a semiconductor sample |
| 11/23/2010 | US7836757 Phase feedback AFM and control method therefor |
| 11/18/2010 | US20100293675 Probe and cantilever |
| 11/18/2010 | US20100291295 Hydrophilic-defogging and dirtproof film and production process for the same |
| 11/18/2010 | US20100290992 Nanoparticle nucleic acid binding compound conjugates forming i-motifs |
| 11/17/2010 | EP2250533A2 Array and cantilever array leveling |
| 11/17/2010 | EP2250480A1 Spm imaging apparatus, probe and method |
| 11/11/2010 | US20100285210 Multifunctional micropipette biological sensor |
| 11/11/2010 | DE102008057100A1 Investigation unit for optical microscope for performing near-field optical microscopy, has holding device and near-field probe that produces optical near field by illuminating with excitation light for investigation of sample |
| 11/11/2010 | DE102008023766A1 Method for detection of functional structures in biological sample e.g. living cells, involves detecting combination of near field-microscopy in infrared or terahertz range and spectroscopy processes e.g. Raman microscopy, in sample |
| 11/10/2010 | CN101881786A Scanning near-field optical microscopy system based on micro-hole laser |
| 11/10/2010 | CN101880024A Preparation method of novel probe based on gold-silver nano-wire optical waveguide |
| 11/09/2010 | US7831528 Optical metrology of structures formed on semiconductor wafers using machine learning systems |
| 11/09/2010 | US7828981 Semiconductor probe with high resolution resistive tip and method of fabricating the same |
| 11/04/2010 | WO2010125844A1 Displacement measuring device and displacement measuring method |
| 11/04/2010 | US20100281586 Method and device to probe a membrane by applying an in-plane electric field |