Patents
Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
12/2011
12/21/2011CN202083708U 一种台式一体化原子力显微镜 Integration of an atomic force microscope is a table
12/20/2011US8082593 Atomic force microscopy devices, arrangements and systems
12/20/2011US8080431 Nanoparticles
12/15/2011WO2011154877A1 Device for topographical characterisation and chemical mapping of surfaces
12/15/2011US20110307980 High-speed and high-resolution atomic force microscope
12/14/2011CN102279289A 一种基于(110)单晶硅的微悬臂梁探针制作方法 Based on (110) single crystal silicon microcantilever probe production methods
12/14/2011CN102279288A 采用原子力显微镜测量样品界面势垒的装置以及方法 AFM measurement sample interface barrier device and method
12/14/2011CN102279287A 亚像元分割编码显微成像装置 Sub-pixel segmentation coding microscopy imaging device
12/13/2011US8079093 Dual tip atomic force microscopy probe and method for producing such a probe
12/08/2011US20110302677 Detection and characterization of laser-induced heat affected zones on polymer based devices
12/08/2011US20110302676 Method and Device for Examining a Sample with a Probe Microscope
12/08/2011US20110297084 Apparatus for Direct Fabrication of Nanostructures
12/07/2011EP2392930A1 Scanning probe microscope
12/07/2011CN102272610A 动态探针检测系统 Dynamic Probe Detection System
12/06/2011US8074292 High resolution wide angle tomographic probe
12/01/2011US20110296564 Scanning probe microscope with current controlled actuator
12/01/2011US20110296563 Flexibly displaceable coupling device for acoustically excited atomic force microscopy with acoustic excitation of the sample
12/01/2011US20110296562 Method and device for acquiring signals in laser scanning microscopy
11/2011
11/30/2011EP2389613A1 Large area, homogeneous array fabrication including controlled tip loading vapor deposition
11/29/2011US8069493 Atomic force microscope apparatus
11/29/2011US8069492 Spin-torque probe microscope
11/29/2011US8065908 Scan type probe microscope
11/24/2011WO2011145305A1 Temperature measuring probe, temperature measuring apparatus, and temperature measuring method
11/24/2011US20110289636 High-speed scanning probe microscope
11/23/2011CN102253245A Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
11/22/2011US8062494 Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method
11/17/2011WO2011141602A1 Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source
11/17/2011WO2011089439A3 A miniature low- energy electron beam generator
11/17/2011US20110283428 High frequency deflection measurement of IR absorption
11/16/2011CN102243253A Scanning probe microscope body with isolated imaging scanning and rough approximation
11/15/2011US8058002 Using solid support to amplify preferential nucleotide sequences; screening for genetic polymorphisms and aberrations
11/10/2011WO2011138738A1 Apparatus for measuring the local electrical resistance of a surface
11/10/2011WO2011138564A1 Methods of surface measurement and modification by local-probe microscopy operating in continuous curvilinear mode, local-probe microscope and device enabling the implementation of said methods
11/10/2011WO2011138385A1 Near field sensor for locally measuring dielectric properties
11/10/2011DE102010019525A1 Nahfeldsensor zur lokalen Messung von dielektrischen Eigenschaften Near field for local measurement of dielectric properties
11/09/2011EP2384442A1 High-speed scanning probe microscope
11/09/2011CN202027562U Sample load disk of atomic force microscope
11/03/2011WO2011136527A2 Nanofluidic fluorescence apertureless near-field scanning optical miscroscope
11/03/2011WO2011135922A1 Near-field light-source two-dimensional array and process for producing same, two-dimensional array type surface plasmon resonator, solar cell, light sensor, and biosensor
11/03/2011WO2011134593A1 Photoconducting measuring tip, measurement arrangement, and method for producing and/or detecting electromagnetic field signals
11/03/2011US20110271412 Method for Measuring a Piezoelectric Response by Means of a Scanning Probe Microscope
11/01/2011US8051493 Probe microscopy and probe position monitoring apparatus
10/2011
10/27/2011US20110265227 Piezoelectric microcantilevers and uses in atomic force microscopy
10/25/2011US8046843 Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material
10/25/2011US8042383 Digital Q control for enhanced measurement capability in cantilever-based instruments
10/20/2011WO2011128694A1 Scanning electrochemical microscopy
10/18/2011US8040784 Read/write tip, head and device, and use thereof, and method for manufacturing same
10/18/2011US8037739 Method for analyzing sample in liquid
10/13/2011WO2011126232A2 Atomic force microscope
10/12/2011EP2374011A1 Dynamic probe detection system
10/12/2011CN202008492U Imaging device with optical microscopic probe and atomic force microscopic probe
10/11/2011US8033184 Quantum-based force realization apparatus and force measurer using the same
10/11/2011CA2424734C Nanoparticles comprising a metallic or semiconductor core which is covalently bound to a plurality of carbohydrate ligands
10/06/2011WO2011121097A2 Method and device for analysing molecular bonds
10/06/2011US20110247108 Sample inspection apparatuses and sample inspection methods
10/06/2011DE102010014657A1 Verfahren und Vorrichtung zur Untersuchung von Molekülbindungen Method and apparatus for the investigation of molecular bonds
10/04/2011US8030604 Optical component operating in near-field transmission
10/04/2011US8028567 AFM tweezers, method for producing AFM tweezers, and scanning probe microscope
09/2011
09/29/2011US20110236984 Dna sequencing methods and detectors and systems for carrying out the same
09/28/2011CN102200543A AFM (Atomic Force Microscope)-based device for performing nanoindentation measurement on surface of microparticle
09/28/2011CN101220244B High surface quality GaN wafer and method of fabricating same
09/27/2011US8024963 Material property measurements using multiple frequency atomic force microscopy
09/22/2011WO2011116389A2 Low drift scanning probe microscope
09/22/2011US20110231966 Scanning probe microscopy with spectroscopic molecular recognition
09/20/2011US8022610 Electronic device containing carbon nanotubes
09/15/2011WO2011068905A3 Method and apparatus of operating a scanning probe microscope
09/15/2011US20110225684 Magnetic head inspection method and magnetic head manufacturing method
09/15/2011US20110223596 Multiplex Detection Compositions, Methods, and Kits
09/15/2011DE10228123B4 Verfahren und Vorrichtungen zur Erfassung von optischen Nahfeldwechselwirkungssignalen Methods and apparatus for detection of optical near-field interaction
09/14/2011EP1680788B1 Cantilever assembly
09/14/2011CN102183679A In-situ quasi synchronous detection method for detecting physicochemical properties of micro and nano structures
09/14/2011CN102183450A Characterization method of atomic force microscope for micro-pore structure of reservoir rock core
09/14/2011CN102181914A Preparation process for tunneling scanning microscope probe with reverse exponent shape and depth-to-length-diameter ratio
09/14/2011CN101231262B Method for unicell group logistics
09/13/2011US8016277 Flexure based macro motion translation stage
09/07/2011CN102175894A Method for preparing miniature thermocouple probe of scanning thermal microscopy
09/07/2011CN102175727A Method for measuring low background carrier concentration by utilizing optical excitation differential capacitance method
09/06/2011US8012755 Water quality evaluation method and substrate contacting apparatus used
09/06/2011US8011230 Scanning probe microscope
09/01/2011WO2011104195A1 Near field optical microscope with optical imaging system
09/01/2011WO2011103691A1 Method for spatially manipulating a microscopic object and device for conducting said method
09/01/2011US20110211197 Heterodyne detection device for imaging an object by re-injection
08/2011
08/31/2011CN201955352U 超微型扫描隧道显微镜 Ultra-miniature scanning tunneling microscope
08/31/2011CN201955323U Device for rapidly assessing influence of nanometer material on organism security of breathing system
08/30/2011US8011016 SPM probe with shortened cantilever
08/25/2011WO2011103049A2 Method for screening receptors/ligands interactions
08/25/2011WO2011101702A1 System for illuminating an object with a wave or for imaging an object with a wave
08/25/2011US20110207163 Method for and material of a shape standard
08/24/2011EP2360481A1 Near field optical microscope with optical imaging system
08/24/2011EP2359149A1 Scanning probe microscope with current controlled actuator
08/24/2011EP2359148A2 Method and apparatus of operating a scanning probe microscope
08/23/2011US8006316 Scanning ion conductance microscopy for the investigation of living cells
08/23/2011US8006315 Photon-emission scanning tunneling microscopy
08/23/2011US8003283 System and a method for improved crosshatch nanomachining of small high aspect three dimensional structures by creating alternating superficial surface channels
08/23/2011US8001830 High frequency deflection measurement of IR absorption
08/18/2011WO2011098720A1 Measurement of the surface potential of a material
08/16/2011US7998528 Method for direct fabrication of nanostructures
08/16/2011US7997125 Miniaturized spring element and method for producing the spring element
08/16/2011US7997124 Scanning probe microscope
08/16/2011US7997123 Nanotipped device and method
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