G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof

Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095)
01/2007
01/02/2007	US7155964 Method and apparatus for measuring electrical properties in torsional resonance mode
12/2006
12/28/2006	WO2006138593A2 Atom probe component treatments
12/28/2006	WO2006136705A1 Higher harmonics atomic force microscope
12/28/2006	US20060289749 Method for determining material interfacial and metrology information of a sample using atomic force microscopy
12/28/2006	DE102005017676B3 Nahfeldoptik für elektromagnetische Strahlung im infraroten THz- und Sub-THz-Bereich Near-field optics for electromagnetic radiation in the infrared THz and sub-THz range
12/26/2006	US7152462 Topography and recognition imaging atomic force microscope and method of operation
12/21/2006	WO2006036217A3 Thermal control of deposition in dip pen nanolithography
12/21/2006	US20060284083 Scanning type probe microscope and probe moving control method therefor
12/21/2006	US20060283240 Force scanning probe microscope
12/20/2006	EP1161669A4 Deconvolving far-field images using scanned probe data
12/19/2006	US7151250 Probe with hollow waveguide and method for producing the same
12/19/2006	US7151244 Method and apparatus for calibration of near-field scanning optical microscope tips for laser machining
12/19/2006	US7150185 Optical microcantilever
12/14/2006	WO2006132075A1 Sample stand arrangement for scanning type probe microscope
12/14/2006	WO2006131639A1 Nanometric emitter/receiver guides
12/14/2006	US20060278825 High aspect ratio micromechanical probe tips and methods of fabrication
12/14/2006	US20060277981 Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure
12/13/2006	EP1732084A2 A method for determining material interfacial and metrology information of a sample using atomic force microscopy
12/13/2006	EP1731895A2 Micro structure, cantilever, scanning probe microscope and a method for measuring deformation quantity for the micro structure
12/13/2006	CN1877745A Controllable device for preparing optical fiber probe and method therefor
12/13/2006	CN1877277A Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure
12/13/2006	CN1877246A A method for determining material interfacial and metrology information of a sample using atomic force microscopy
12/12/2006	US7148619 Electronic device containing a carbon nanotube
12/07/2006	WO2006129561A1 Scan type probe microscope and cantilever drive device
12/07/2006	WO2006128944A1 Sensor device and equipment for measuring resistivity using the four-point method and method of producing said device
12/07/2006	WO2006102600A3 Materials and methods for identifying biointeractive nanostructures and/or nanoparticles
12/07/2006	US20060275703 Recording medium, near field optical head, optical recording device, and method of manufacturing thereof
12/07/2006	US20060274611 Apparatus for focusing plasmon waves
12/07/2006	US20060273445 Three-dimensional structure composed of silicon fine wires, method for producing the same, and device including the same
12/07/2006	US20060272399 System for wide frequency dynamic nanomechanical analysis
12/07/2006	US20060272398 Beam tracking system for scanning-probe type atomic force microscope
12/06/2006	CN1875469A Processes for fabricating conductive patterns using nanolithography as a patterning tool
12/05/2006	US7146034 Tape manufacturing system
11/2006
11/30/2006	WO2006125788A1 Local injector of spin-polarized electrons with semiconductor tip under light excitation
11/30/2006	US20060270101 Patterned functionalized silicon surfaces
11/30/2006	US20060267596 Spring constant calibration device
11/30/2006	DE102006006811A1 Bearbeitungsverfahren mit Rastersonde Processing method with scanning probe
11/29/2006	EP1727138A2 Near-field optical head and method for manufacturing same
11/28/2006	US7143005 Image reconstruction method
11/28/2006	US7141999 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
11/23/2006	WO2006124572A2 Dual wavelength polarized near-field imaging apparatus
11/23/2006	WO2006123239A1 Displacement sensor, its use, and method for making such a sensor
11/23/2006	US20060261264 Feedback influenced increased-quality-factor scanning probe microscope
11/23/2006	US20060261177 Method of manufacturing near field light generation element
11/21/2006	US7138627 Nanotube probe and method for manufacturing same
11/21/2006	US7137291 Multi-dimensional force sensing for scanning probe microscopy using carbon nanotube tips and carbon nanotube oscillators
11/16/2006	WO2006120012A1 Method for determining the state of activation of a protein
11/16/2006	WO2006097800A3 Method and device for determining material properties
11/16/2006	WO2005119728A3 Electron stream apparatus and method
11/16/2006	US20060254348 Scanning probe device and processing method of scanning probe
11/16/2006	US20060254347 Scanning probe device and processing method by scanning probe
11/16/2006	US20060254346 Method to transiently detect sample features using cantilevers
11/15/2006	EP1722374A1 Method for determining the state of activation of a protein
11/15/2006	CN2837831Y Ultra-high vacuum in-situ growth, characterization and test system
11/15/2006	CN1862308A Modularized scanning probe microscope
11/15/2006	CN1284986C 光波导装置 Waveguide devices
11/14/2006	US7135876 Electrical feedback detection system for multi-point probes
11/09/2006	US20060253943 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
11/09/2006	US20060252172 Method of fabricating semiconductor probe with resistive tip
11/09/2006	US20060250686 Optical microscope and method for obtaining an optical image
11/08/2006	CN1858575A Detecting method and device for high density grating polarized relative self imaging
11/07/2006	US7132055 Method of producing near field optical head
11/02/2006	WO2006116738A1 Optical fiber probe tips and methods for fabricating same
11/02/2006	WO2006116673A1 Mutliplex near-field microscopy with diffractive elements
11/02/2006	US20060248619 Method of preparing silver nano-structure by means of scanning turnneling microscopy
11/02/2006	US20060247816 Optical metrology model optimization for process control
11/02/2006	US20060243036 Atomic force microscope with probe with improved tip movement
11/02/2006	US20060243034 Method and apparatus of manipulating a sample
11/01/2006	CN1854794A Method for producing near field optical generator
11/01/2006	CN1854793A Scan probe microscope, sample observation method using same and method for manufacturing the device
10/2006
10/31/2006	US7130755 Near-field scanning microwave microscope using dielectric resonator
10/31/2006	US7129486 Scanning probe with digitized pulsed-force mode operation and real-time evaluation
10/26/2006	US20060239129 Nanometer scale data storage device and associated positioning system
10/26/2006	US20060238758 Near-field polarized-light measurement apparatus
10/26/2006	US20060238206 Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts
10/26/2006	US20060237639 Scanning probe microscope assembly and method for making spectrophotometric, near-filed, and scanning probe measurements
10/26/2006	US20060236757 Torsional Harmonic Cantilevers For Detection Of High Frequency Force Components In Atomic Force Microscopy
10/25/2006	EP1715322A2 Near-field polarized-light measurement apparatus
10/25/2006	EP1714698A2 Device and method for handling liquids
10/19/2006	US20060231757 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
10/19/2006	US20060230819 System for Sensing a Sample
10/18/2006	EP1712892A2 Near field optics for electromagnetic radiation in the infrared spectrum
10/18/2006	EP1711625A2 Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes
10/18/2006	EP0984438B1 Recording apparatus
10/17/2006	US7122796 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same
10/12/2006	WO2006106949A1 Scanning probe microscope, method of measuring sample surface shape, and probe device
10/12/2006	WO2006106818A1 Cantilever for scanning probe microscope and scanning probe microscope equipped with it
10/12/2006	US20060230475 Probe of scanning probe microscope having a field effect transistor channel and fabrication method thereof
10/12/2006	US20060229842 Methods and systems for controlling motion of and tracking a mechanically unattached probe
10/12/2006	DE102006015473A1 Detecting submicroscopic structures involves arranging semiconducting substrate in Atomic Force Microscopes working areas, coarse positioning substrate so each sensor is in surface sub-region, moving substrate to sense sub-regions linewise
10/10/2006	US7119645 Methods and systems for controlling motion of and tracking a mechanically unattached probe
10/10/2006	US7119332 Method of fabricating probe for scanning probe microscope
10/05/2006	WO2006103937A1 Scanning probe microscope system
10/05/2006	US20060219916 Cantilever holder and scanning probe microscope
10/05/2006	US20060219904 Methods and systems for controlling motion of and tracking a mechanically unattached probe
10/05/2006	US20060219901 Working method using scanning probe
10/05/2006	US20060219900 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope
10/05/2006	DE10307561B4 Meßanordnung zur kombinierten Abtastung und Untersuchung von mikrotechnischen, elektrische Kontakte aufweisenden Bauelementen Measuring arrangement for combined sampling and analysis of micro-technical, electrical contacts having components
10/04/2006	EP1012584A4 Object inspection and/or modification system and method
10/03/2006	US7116628 Electroluminescent multilayer optical information storage medium with integrated readout and composition of matter for use therein

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