| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 05/30/2012 | CN1963451B Vibration-type cantilever holder and scanning probe microscope |
| 05/30/2012 | CN102483428A Method for measuring the force interaction that is caused by a sample |
| 05/29/2012 | US8187673 Methods utilizing scanning probe microscope tips and products thereof or produced thereby |
| 05/24/2012 | US20120131703 Quantitative analysis of mrna and protein expression |
| 05/24/2012 | DE102010052037A1 Sensor zum berührungslosen Abtasten einer Oberfläche Sensor for contactless scanning a surface |
| 05/23/2012 | EP2141481B1 Device and method for acquiring a field by measurement |
| 05/22/2012 | US8185968 Magnetic head inspection method and magnetic head manufacturing method |
| 05/16/2012 | CN102455371A Device and method for evaluating malignancy degree of neuroblastoma |
| 05/15/2012 | US8181268 Scanning probe microscope and method of observing sample using the same |
| 05/10/2012 | WO2012060033A1 Device for measuring in-liquid electric potential, and atomic force microscope |
| 05/10/2012 | US20120117695 Afm measuring method and system thereof |
| 05/09/2012 | EP2450687A1 Method for determining the spring constant of a cantilever device |
| 05/09/2012 | CN102445568A Ultrahigh vacuum four-probe scanning tunneling microscope for multi-probe common imaging |
| 05/03/2012 | WO2012057723A1 Thermal measurements using multiple frequency atomic force microscopy |
| 05/02/2012 | EP2447723A1 Scanning probe microscope and probe proximity detection method therefor |
| 05/02/2012 | CN102439462A Method and apparatus of operating a scanning probe microscope |
| 05/02/2012 | CN102435785A Tilting AFM probe with huge aspect ratio and preparation method thereof |
| 05/02/2012 | CN102434621A Vibration reduction structure of low-temperature scanning near-field optical microscope |
| 05/01/2012 | US8170076 GaN laser element |
| 04/26/2012 | DE102010052318A1 Interatomare Kraftmessungen mittels passiv Drift-kompensierter in-situ kalibrieer Rasterkraftmikroskopie-Quantifizierung chemischer Bindungskräfte zwischen elektronischen Orbitalen mittels direkter Kraftmessung bei subatomarer lateraler Auflösung Interatomic force measurements by passive drift-compensated in situ atomic force microscopy kalibrieer quantification of chemical bonding forces between electronic orbitals using direct force measurement in subatomic lateral resolution |
| 04/25/2012 | CN102426270A Optical system for low-temperature scanning near-field optical microscope |
| 04/25/2012 | CN102426269A 一种低温扫描近场光学显微镜 A cryogenic scanning near-field optical microscopy |
| 04/24/2012 | US8166567 Fast-scanning SPM scanner and method of operating same |
| 04/24/2012 | US8161805 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 04/19/2012 | WO2011136527A3 Nanofluidic fluorescence apertureless near-field scanning optical miscroscope |
| 04/19/2012 | US20120096602 Apparatus and method for the functionalisation of afm tips |
| 04/19/2012 | US20120096601 Method and system for near-field optical imaging |
| 04/19/2012 | DE102009023796B4 Vorrichtung und Verfahren zur Metallisierung von Rastersondenspitzen Apparatus and method for metallization of scanning probe tips |
| 04/12/2012 | WO2012045986A1 Near-field optical microscope |
| 04/12/2012 | US20120090057 Production scale fabrication method for high resolution afm tips |
| 04/12/2012 | DE102007056992B4 Verfahren zur Erzeugung von Submikrometer-Strukturen an einer ausgeprägten Topographie A process for the production of submicron structures on a pronounced topography |
| 04/04/2012 | EP2435829A1 Imaging method and use thereof |
| 04/04/2012 | CN1811944B Semiconductor probe with resistive tip and method of fabricating the same |
| 04/04/2012 | CN102401843A 一种基于原子力显微术的单克隆抗体靶向药疗效检测方法 The efficacy of monoclonal antibody targeted drug detection method based on atomic force microscopy |
| 04/03/2012 | US8151368 Dynamic mode AFM apparatus |
| 03/29/2012 | US20120079636 Magnetic sensor and scanning microscope |
| 03/29/2012 | US20120079635 Methods and devices for correcting errors in atomic force microscopy |
| 03/29/2012 | US20120079634 Tandem piezoelectric actuator and single drive circuit for atomic force microscopy |
| 03/29/2012 | US20120079633 Apparatus and Method for Isolating and Measuring Movement in Metrology Apparatus |
| 03/29/2012 | US20120079632 Method to measure 3 component of the magnetic field vector at nanometer resolution using scanning hall probe microscopy |
| 03/29/2012 | US20120079631 Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy |
| 03/28/2012 | EP1063641B1 Information recording apparatus |
| 03/27/2012 | US8143601 Nanoscale imaging via absorption modulation |
| 03/22/2012 | WO2012035491A1 Electro-active microelectromechanical device and corresponding detection process |
| 03/22/2012 | US20120071443 Nanoparticles |
| 03/21/2012 | EP1779286B1 Laser-based method and system for processing targeted surface material and article produced thereby |
| 03/21/2012 | CN102384986A Scanning tunneling microscope having large-scope and high depth-to-width ratio measurement capabilities |
| 03/21/2012 | CN102384985A Raman atomic force microscopic detection device and method |
| 03/20/2012 | US8136385 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection |
| 03/15/2012 | WO2012033131A1 Surface treatment device using scanning probe microscope |
| 03/15/2012 | WO2011126232A3 Atomic force microscope |
| 03/15/2012 | WO2011116389A3 Low drift scanning probe microscope |
| 03/15/2012 | US20120066800 Fluid delivery for scanning probe microscopy |
| 03/14/2012 | EP1370690B1 Arrays and methods of use |
| 03/08/2012 | WO2012029973A1 Magnetic field observation device and magnetic field observation method |
| 03/07/2012 | EP2225549B1 Device and method for the evanescent illumination of a sample |
| 03/06/2012 | US8132268 Apparatus and method for the detection of forces in the sub-micronewton range |
| 03/01/2012 | US20120050718 High Frequency Deflection Measurement of IR Absorption |
| 02/29/2012 | EP2423676A1 Probe apparatus |
| 02/28/2012 | US8124417 Method for analyzing nucleobases on a single molecular basis |
| 02/23/2012 | WO2011145802A3 Ultrasonic atomic force microscope device |
| 02/22/2012 | CN102360028A Vacuum chamber of low-temperature scanning nearfield optical microscope |
| 02/16/2012 | WO2012021727A2 Image force microscopy of molecular resonance |
| 02/16/2012 | WO2012020264A1 Pipets containing electrolyte and electrodes |
| 02/15/2012 | CN102353818A Device and method for evaluating neuron-like differentiation degree of PC12 cell |
| 02/15/2012 | CN102353817A Probe of conducting atomic force microscope and measuring methods employing probe |
| 02/15/2012 | CN102353816A Probe scanning atomic force microscope (AMF) |
| 02/15/2012 | CN102353815A Device and method for measuring surface local electronic state of material |
| 02/14/2012 | US8117668 Optical scanning probe |
| 02/14/2012 | US8115921 Probe for near-field light scattering and process for production thereof |
| 02/09/2012 | US20120036602 Video rate-enabling probes for atomic force microscopy |
| 02/08/2012 | EP2416164A2 Band excitation method applicable to scanning probe microscopy |
| 02/08/2012 | CN102347318A All-piezoelectric abreast pushing three-friction-force stepper and scanning probe microscope body |
| 02/07/2012 | CA2537023C Processes for fabricating conductive patterns using nanolithography as a patterning tool |
| 02/02/2012 | US20120026510 Optical Scanning Probe |
| 02/01/2012 | EP2411818A1 Near field optical microscope |
| 02/01/2012 | CN101846760B 一种纳米光栅的制作方法 A method of making nano-grating |
| 01/31/2012 | US8108943 Method and system for near-field spectroscopy using targeted deposition of nanoparticles |
| 01/31/2012 | US8104332 Probe and cantilever |
| 01/25/2012 | EP2409165A1 Scanning force microscope |
| 01/24/2012 | US8104093 Magnetic sensor and scanning microscope |
| 01/19/2012 | WO2011103049A3 Method for screening receptors/ligands interactions |
| 01/19/2012 | US20120016110 Method of immobilizing and stretching a nucleic acid on a substrate |
| 01/12/2012 | WO2011121097A3 Method and device for analysing molecular bonds |
| 01/12/2012 | US20120011624 Micro/nano devices fabricated from cu-hf thin films |
| 01/12/2012 | DE102010026703A1 Device for scanning surfaces using atomic force microscopy, utilized in sensor for e.g. biological detection of various mediums, has static and dynamic actuators electrically connected with cantilever |
| 01/10/2012 | US8095231 Graphical automated machine control and metrology |
| 01/05/2012 | US20120005793 Near field optical microscope |
| 01/04/2012 | CN202101642U High-precision atomic force profiler |
| 01/03/2012 | US8091143 Atomic force microscopy probe |
| 01/03/2012 | US8087288 Scanning stylus atomic force microscope with cantilever tracking and optical access |
| 12/29/2011 | WO2011136527A9 Nanofluidic fluorescence apertureless near-field scanning optical miscroscope |
| 12/29/2011 | US20110321204 Near-field optical microscope, near-field optical probe, and sample observation method |
| 12/28/2011 | CN202093046U Device for estimating malignant degree of neuroblastoma |
| 12/28/2011 | CN102301245A 高速扫描探针显微镜 High-speed scanning probe microscope |
| 12/28/2011 | CN101606051B 原子间力显微镜以及采用原子间力显微镜的相互作用力测定方法 Atomic force microscopy and interaction using an atomic force microscope measurement method |
| 12/27/2011 | US8087093 Mechanically-coupled tuning fork-scanning probe vibrating system |
| 12/27/2011 | US8085406 Ultrafast microscopy of surface electromagnetic fields |
| 12/22/2011 | US20110309265 Diamond nanowires |
| 12/21/2011 | EP2396664A1 Method for automatic adjustment of the applied force and control of the force drift in an atomic force microscope during contact mode imaging. |