| Patents for G01Q 60 - Particular types of spm [scanning-probe microscopy] or apparatus therefor; Essential components thereof (7,095) |
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| 04/05/2007 | WO2007036591A1 Method of using an atomic force microscope and microscope |
| 04/05/2007 | US20070075243 Scanning probe microscopy method and apparatus utilizing sample pitch |
| 04/05/2007 | DE10217948B4 Verfahren und Vorrichtung zur Erstellung Raman- und SER-spektroskopischer Messungen biologischer und chemischer Proben Method and apparatus for creating Raman and SER-spectroscopic measurements of biological and chemical samples |
| 04/05/2007 | DE102005043974A1 Micromechanical scanning sensor, especially for raster force microscope, has sensor unit with base consisting of first material connected to sensor arm and functional part consisting of second material joined to base |
| 04/05/2007 | CA2613515A1 Method of using an atomic force microscope and microscope |
| 04/04/2007 | EP1770714A1 Optical device for measuring modulated signal light |
| 04/04/2007 | CN1942753A Optical fiber probe, optical detection device, and optical detection method |
| 04/03/2007 | US7198961 Method for modifying existing micro-and nano-structures using a near-field scanning optical microscope |
| 04/03/2007 | US7198900 forming at least one molecular complex comprising at least one analyte and at least one first probe comprising at least one reaction portion and at least one identity portion comprising at least one coded molecular tag |
| 03/29/2007 | WO2006138593A3 Atom probe component treatments |
| 03/29/2007 | US20070068233 Adhesive compositions and method for selection thereof |
| 03/29/2007 | DE19926601B4 Apertur in einem Halbleitermaterial sowie Herstellung der Apertur und Verwendung Aperture in a semiconductor material and forming the aperture and using |
| 03/28/2007 | EP1767490A2 Nanometric mechanical oscillator, method of fabricating the same, and measurement apparatus using the same |
| 03/28/2007 | CN1937094A Scanning thermal microscope probe |
| 03/27/2007 | US7196321 Fine pattern forming apparatus and fine pattern inspecting apparatus |
| 03/27/2007 | US7194897 Non-contact scanning apparatus using frequency response scheme and scanning method thereof |
| 03/27/2007 | CA2342157C Scanning tunneling microscope, probe for the same, method of treating the probe, and method of fabricating nano-structure |
| 03/22/2007 | US20070064544 Near-field light generating device |
| 03/22/2007 | US20070062266 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 03/22/2007 | US20070062265 Oscillator for atomic force microscope and other applications |
| 03/22/2007 | DE102006039651A1 Cantilever und Prüfvorrichtung Cantilever and Tester |
| 03/20/2007 | US7193424 Electrical scanning probe microscope apparatus |
| 03/20/2007 | US7193224 Scanning microscope and laser microscope |
| 03/15/2007 | WO2005103604A3 Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing spm probes |
| 03/15/2007 | US20070056362 Oscillating probe with a virtual probe tip |
| 03/14/2007 | EP1762838A1 Sample stand arrangement for scanning type probe microscope |
| 03/14/2007 | CN1304867C 扫描探针显微镜及其操作方法 Scanning probe microscopy and its method of operation |
| 03/13/2007 | US7191092 Methods and systems for controlling motion of and tracking a mechanically unattached probe |
| 03/13/2007 | US7189969 Methods and systems for controlling motion of and tracking a mechanically unattached probe |
| 03/08/2007 | US20070052433 Coaxial probe, method for production thereof, and device for measuring in the near electromagnetic field on systems at a submicrometric distance |
| 03/08/2007 | US20070051887 Cantilever and inspecting apparatus |
| 03/08/2007 | US20070051169 Semiconductor probe with high resolution resistive tip and method of fabricating the same |
| 03/07/2007 | EP1054249B1 Electronic device surface signal control probe and method of manufacturing the probe |
| 03/07/2007 | CN1303415C Probe scanning microscope for tunneling loss and measuring method therefor |
| 03/07/2007 | CN1303414C Dielectric loss microscope with scanning probe and measuring method therefor |
| 03/06/2007 | US7186019 Thermal movement sensor |
| 03/01/2007 | WO2007024711A2 Oscillator and method of making for atomic force microscope and other applications |
| 03/01/2007 | US20070044545 Oscillator and method of making for atomic force microscope and other applications |
| 03/01/2007 | US20070044544 Method and apparatus for determining surface characteristics by using spm techniques with acoustic excitation and real-time digitizing |
| 03/01/2007 | DE102005041301A1 Microstructure unit`s surface property measuring system for use during manufacturing of integrated circuit, has signal processing unit designed to digitize and record several frequency components for each scanning position |
| 02/28/2007 | EP1757920A1 Optical waveguide |
| 02/28/2007 | EP1756835A1 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
| 02/28/2007 | EP1756595A2 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 02/27/2007 | US7182876 Cantilever microstructure and fabrication method thereof |
| 02/27/2007 | US7181958 High aspect ratio tip atomic force microscopy cantilevers and method of manufacture |
| 02/22/2007 | WO2007022013A2 Tracking qualification and self-optimizing probe microscope and method |
| 02/22/2007 | WO2007019913A1 Device for the vibration excitation of an elastic bar fixed on one side of an atomic force microscope |
| 02/22/2007 | DE102005038245A1 Vorrichtung zur Schwingungsanregung eines einseitig in einem Rasterkraftmikroskop befestigten Federbalkens Device for oscillation excitation of a cantilevered in an atomic force microscope cantilever |
| 02/20/2007 | US7181122 Zero-mode waveguides |
| 02/15/2007 | WO2007018230A1 Optical probe |
| 02/15/2007 | US20070036502 Zero-mode waveguides |
| 02/15/2007 | US20070034336 Method of, and apparatus for, producing near field optical head |
| 02/15/2007 | US20070033993 Dual tip atomic force microscopy probe and method for producing such a probe |
| 02/15/2007 | US20070033992 Method for attaching rod-shaped nano structure to probe holder |
| 02/15/2007 | US20070033991 Tracking qualification and self-optimizing probe microscope and method |
| 02/14/2007 | EP1588382B1 Probe for an optical near field microscope with improved scattered light suppression and method for producing the same |
| 02/14/2007 | CN1913043A Scanning probe of atomic force microscope |
| 02/14/2007 | CN1912573A Digital closed-loop scanning control system of scanning probe microscope |
| 02/14/2007 | CN1300565C Atomic force microscope measuring device based on angular measurement |
| 02/14/2007 | CN1300564C Atomic force microscope measuring method based on angular measurement |
| 02/13/2007 | US7176457 MEMS differential actuated nano probe and method for fabrication |
| 02/13/2007 | US7176450 Long travel near-field scanning optical microscope |
| 02/13/2007 | US7176118 Circuit constructions |
| 02/13/2007 | CA2382516C High dynamic range mass spectrometer |
| 02/08/2007 | WO2007016299A2 Atom probe evaporation processes |
| 02/07/2007 | EP1750258A2 Distance control in optical near-field recording/reproducing apparatus |
| 02/07/2007 | EP1749185A2 Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing spm probes |
| 02/06/2007 | US7174520 Characterization and verification for integrated circuit designs |
| 02/06/2007 | US7173714 Apparatus for parallel detection of the behaviour of mechanical micro-oscillators |
| 02/01/2007 | WO2007013371A1 Scan tunnel spectral method and scan tunnel microscope |
| 02/01/2007 | WO2005114230A3 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 02/01/2007 | US20070024301 Electrical feedback detection system for multi-point probes |
| 02/01/2007 | US20070024295 Probe for an atomic force microscope |
| 02/01/2007 | US20070022804 Scanning probe microscopy inspection and modification system |
| 01/31/2007 | EP1748447A1 Dual tip atomic force microscopy probe and method for producing such a probe |
| 01/31/2007 | CN1904583A Tunnel current measuring device of scanning tunnel microscope based on mutual incidence amplifier |
| 01/30/2007 | US7170842 Methods for conducting current between a scanned-probe and storage medium |
| 01/30/2007 | US7170054 Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder |
| 01/30/2007 | US7168301 Method and apparatus of driving torsional resonance mode of a probe-based instrument |
| 01/25/2007 | WO2007011405A2 Device and method of use for detection and characterization of microorganisms and microparticles |
| 01/25/2007 | US20070020938 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
| 01/25/2007 | US20070018098 Nanotube probe and method for manufacturing the same |
| 01/25/2007 | US20070018097 Scanning probe microscope and method of operating the same |
| 01/25/2007 | US20070018096 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 01/24/2007 | EP1622500A4 Parallel analysis of molecular interactions |
| 01/23/2007 | US7166325 Carbon nanotube devices |
| 01/23/2007 | US7165445 Digital control of quality factor in resonant systems including cantilever based instruments |
| 01/18/2007 | US20070013999 Multiplex near-field microscopy with diffractive elements |
| 01/18/2007 | US20070013907 Optical measurement method and device |
| 01/18/2007 | US20070012873 Scanning-type probe microscope |
| 01/18/2007 | US20070012095 Scanning probe microscope |
| 01/18/2007 | US20070012094 Integrated displacement sensors for probe microscopy and force spectroscopy |
| 01/17/2007 | EP1744143A1 Scanning probe microscope probe and production method therefor and scanning probe microscope and application method therefor and needle-like element and production method therefor and electron element and production method therefor and charge density wave quantum phase microscope and charge density wave quantum interferomet |
| 01/17/2007 | EP1252634B1 Spectrometer, method of spectroscopic analysis and method of combined surface topography and spectroscopic analysis |
| 01/17/2007 | CN1897170A Microtip end-face array device |
| 01/11/2007 | US20070007142 Methods for assembly and sorting of nanostructure-containing materials and related articles |
| 01/10/2007 | EP1742034A1 Spm cantilever and method of manufacturing the same |
| 01/10/2007 | EP1740933A2 Apparatus and method for transverse characterization of materials |
| 01/04/2007 | WO2007001397A2 Nanostructure devices and fabrication method |
| 01/02/2007 | US7158226 Optical system and method for exciting and measuring fluorescence on or in samples treated with fluorescent |